Sample analyzer

Description

FIG. 1 is a front, top, and left side perspective view of a sample analyzer showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 a rear elevational view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines illustrate portions of the sample analyzer and form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for a sample analyzer, as shown and described.

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Inventors:	Nagasawa; Hiroya (Kyoto, JP), Wakayama; Ikuo (Osaka, JP), Kamekawa; Kazuyoshi (Kyoto, JP)
Applicant:	Name City State Country Type Otsuka Electronics Co., Ltd. Osaka N/A JP
Assignee:	Otsuka Electronics Co., Ltd. (Osaka, JP)
Appl. No.:	D/641,363
Filed:	March 21, 2018

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Foreign Application Priority Data

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Sep 29, 2017 [JP]			2017-021531

Current U.S. Class:	D10/81; D24/216
Current International Class:	1004
Field of Search:	;D10/81 ;D24/232,233,234,216-230

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References Cited [Referenced By]

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U.S. Patent Documents

D261033	September 1981	Armbruster
D261034	September 1981	Armbruster
D285113	August 1986	Williams
D285114	August 1986	Collister
D303569	September 1989	Eberle
D383548	September 1997	Hoelbl
D848880	May 2019	Smith
D853873	July 2019	Schueren

Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Fitch, Even, Tabin & Flannery LLP

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