Wakayama; Ikuo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wakayama; Ikuo.The latest application filed is for "light scattering measuring apparatus and measuring jig".
- Wakayama; Ikuo - Osaka JP
- Wakayama; Ikuo - Hirakata JP
- WAKAYAMA; Ikuo - Hirakata-shi JP
| Patent | Date |
|---|---|
| Sample analyzer Grant D962,096 - Obana , et al. August 30, 2 | 2022-08-30 |
| Light Scattering Measuring Apparatus And Measuring Jig App 20220155203 - IZUTANI; Yusuke ; et al. | 2022-05-19 |
| Zeta-potential Measurement Jig App 20210325340 - NAGASAWA; Hiroya ; et al. | 2021-10-21 |
| Particle Size Measurement Method, Particle Size Measurement Apparatus, And Particle Size Measurement Program App 20210310929 - WAKAYAMA; Ikuo | 2021-10-07 |
| Optical measurement apparatus, and optical measurement method Grant 10,788,412 - Izutani , et al. September 29, 2 | 2020-09-29 |
| Sample analyzer Grant D869,310 - Nagasawa , et al. Dec | 2019-12-10 |
| Optical Measurement Apparatus, And Optical Measurement Method App 20190011351 - IZUTANI; Yusuke ; et al. | 2019-01-10 |
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