U.S. patent number D766,753 [Application Number D/529,894] was granted by the patent office on 2016-09-20 for optical measuring thedolite using light wave.
This patent grant is currently assigned to KABUSHIKI KAISHA TOPCON. The grantee listed for this patent is KABUSHIKI KAISHA TOPCON. Invention is credited to Takeo Aoki, Mitsuo Ishii.
United States Patent |
D766,753 |
Ishii , et al. |
September 20, 2016 |
Optical measuring thedolite using light wave
Claims
CLAIM The ornamental design for an optical measuring theodolite
using light wave, as shown and described.
Inventors: |
Ishii; Mitsuo (Tokyo,
JP), Aoki; Takeo (Tokyo, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
KABUSHIKI KAISHA TOPCON |
Tokyo |
N/A |
JP |
|
|
Assignee: |
KABUSHIKI KAISHA TOPCON (Tokyo,
JP)
|
Appl.
No.: |
D/529,894 |
Filed: |
June 11, 2015 |
Foreign Application Priority Data
|
|
|
|
|
Mar 20, 2015 [JP] |
|
|
2015-006085 |
|
Current U.S.
Class: |
D10/66 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/66 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Oliff PLC
Description
FIG. 1 is a front elevational view of the optical measuring
theodolite using light wave;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left-side elevational view thereof;
FIG. 4 is a right-side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a front, right-side, top perspective view thereof;
and,
FIG. 8 is a rear, left-side, top perspective view thereof.
The broken lines depict environmental subject matter only and form
no part of the claimed design.
* * * * *