U.S. patent number D723,398 [Application Number D/470,412] was granted by the patent office on 2015-03-03 for light wave distance measuring theodolite.
This patent grant is currently assigned to Kabushiki Kaisha Topcon. The grantee listed for this patent is Kabushiki Kaisha Topcon. Invention is credited to Mitsuo Ishii.
United States Patent |
D723,398 |
Ishii |
March 3, 2015 |
Light wave distance measuring theodolite
Claims
CLAIM The ornamental design for a light wave distance measuring
theodolite, as shown and described.
Inventors: |
Ishii; Mitsuo (Tokyo,
JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
Kabushiki Kaisha Topcon |
Tokyo |
N/A |
JP |
|
|
Assignee: |
Kabushiki Kaisha Topcon (Tokyo,
JP)
|
Appl.
No.: |
D/470,412 |
Filed: |
October 21, 2013 |
Foreign Application Priority Data
|
|
|
|
|
Aug 6, 2013 [JP] |
|
|
2013-017935 |
|
Current U.S.
Class: |
D10/66; D10/70;
D10/69 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/66,69,70
;33/276,277,281,285,286,290,291-299,DIG.21
;340/539,825.36,825.46,825.49
;356/5.15,4.01,5.01,4.05,5.05-5.09,5.12,28.5,345,375,3.01,128-155,399-400
;385/83,97-99,134-139 ;264/1.24-1.25 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Oliff PLC
Description
FIG. 1 is a perspective view of a light wave distance measuring
theodolite;
FIG. 2 is a front view thereof;
FIG. 3 is a top view thereof;
FIG. 4 is a right-side view thereof;
FIG. 5 is a left-side view thereof;
FIG. 6 is a rear view thereof; and,
FIG. 7 is a bottom view thereof.
The broken lines depict environmental subject matter only and form
no part of the claimed design.
The claimed light wave distance measuring theodolite is for use in
measuring distances and angles, wherein measurement data and
architectonics data can also be transmitted and received to other
instruments.
* * * * *