Light wave distance measuring theodolite

Description

FIG. 1 is a perspective view of a light wave distance measuring theodolite;

FIG. 2 is a front view thereof;

FIG. 3 is a top view thereof;

FIG. 4 is a right-side view thereof;

FIG. 5 is a left-side view thereof;

FIG. 6 is a rear view thereof; and,

FIG. 7 is a bottom view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

The claimed light wave distance measuring theodolite is for use in measuring distances and angles, wherein measurement data and architectonics data can also be transmitted and received to other instruments.

Claims

CLAIM The ornamental design for a light wave distance measuring theodolite, as shown and described.

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Inventors:	Ishii; Mitsuo (Tokyo, JP)
Applicant:	Name City State Country Type Kabushiki Kaisha Topcon Tokyo N/A JP
Assignee:	Kabushiki Kaisha Topcon (Tokyo, JP)
Appl. No.:	D/470,412
Filed:	October 21, 2013

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Foreign Application Priority Data

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Aug 6, 2013 [JP]			2013-017935

Current U.S. Class:	D10/66; D10/70; D10/69
Current International Class:	1004
Field of Search:	;D10/66,69,70 ;33/276,277,281,285,286,290,291-299,DIG.21 ;340/539,825.36,825.46,825.49 ;356/5.15,4.01,5.01,4.05,5.05-5.09,5.12,28.5,345,375,3.01,128-155,399-400 ;385/83,97-99,134-139 ;264/1.24-1.25

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References Cited [Referenced By]

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U.S. Patent Documents

D563247	March 2008	Ishii
D581819	December 2008	Banba et al.
RE44751	February 2014	Riegl
D699768	February 2014	Zhang et al.
D708970	July 2014	Ishii

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Oliff PLC