Optical measuring thedolite using light wave

Ishii , et al. September 20, 2

Patent Grant D766753

U.S. patent number D766,753 [Application Number D/529,894] was granted by the patent office on 2016-09-20 for optical measuring thedolite using light wave. This patent grant is currently assigned to KABUSHIKI KAISHA TOPCON. The grantee listed for this patent is KABUSHIKI KAISHA TOPCON. Invention is credited to Takeo Aoki, Mitsuo Ishii.


United States Patent D766,753
Ishii ,   et al. September 20, 2016

Optical measuring thedolite using light wave

Claims

CLAIM The ornamental design for an optical measuring theodolite using light wave, as shown and described.
Inventors: Ishii; Mitsuo (Tokyo, JP), Aoki; Takeo (Tokyo, JP)
Applicant:
Name City State Country Type

KABUSHIKI KAISHA TOPCON

Tokyo

N/A

JP
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo, JP)
Appl. No.: D/529,894
Filed: June 11, 2015

Foreign Application Priority Data

Mar 20, 2015 [JP] 2015-006085
Current U.S. Class: D10/66
Current International Class: 1004
Field of Search: ;D10/66

References Cited [Referenced By]

U.S. Patent Documents
D453478 February 2002 Ishii
D563247 March 2008 Ishii
D723398 March 2015 Ishii
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Oliff PLC

Description



FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

* * * * *


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