Test meter

Description

FIG. 1 is a front elevational view of the test meter;

FIG. 2 is a rear elevational view of the test meter;

FIG. 3 is a left elevational view of the test meter;

FIG. 4 is a right elevational view of the test meter;

FIG. 5 is a top plan view of the test meter;

FIG. 6 is a bottom plan view of the test meter;

FIG. 7 is a bottom frontal perspective view of the test meter;

FIG. 8 is a top frontal perspective view of the test meter;

FIG. 9 is a bottom rear perspective view of the test meter; and,

FIG. 10 is a top rear perspective view of the test meter.

Claims

CLAIM The ornamental design for a test meter, as shown and described.

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Inventors:	Nishiyama; Hisashi (Kyoto, JP), Kurata; Yuji (Kyoto, JP), Yoo; Yeongkyu (Seoul, KR), Song; Youngduk (Seoul, KR), Kwon; Sunman (Seoul, KR)
Applicant:	Name City State Country Type ARKRAY, Inc. Kyoto N/A JP
Assignee:	ARKRAY, Inc. (Kyoto, JP)
Appl. No.:	D/483,653
Filed:	February 28, 2014

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Foreign Application Priority Data

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Sep 4, 2013 [JP]			2013-020408

Current U.S. Class:	D24/169
Current International Class:	2401
Field of Search:	;D24/216,223,231,232,107,169,186 ;D10/81 ;422/68.1,420,500 ;435/287.1,287.3 ;436/43,45,47 ;600/309,365,368,583,584

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References Cited [Referenced By]

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U.S. Patent Documents

D406895	March 1999	Byrd et al.
D545438	June 2007	Huang et al.
D590063	April 2009	Garthoff et al.
D595415	June 2009	Fukuzawa
D670811	November 2012	Fukuzawa
D690422	September 2013	Oka
D696404	December 2013	Golnik et al.
2011/0257533	October 2011	Nishiyama

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Studebaker & Brackett PC