Test meter

Description

FIG. 1 is a perspective view of the test meter having a transparent cover;

FIG. 2 is a front elevational view of the test meter;

FIG. 3 is a rear elevational view of the test meter;

FIG. 4 is a left side elevational view of the test meter;

FIG. 5 is a right side elevational view of the test meter;

FIG. 6 is a top plan view of the test meter;

FIG. 7 is bottom plan view of the test meter;

FIG. 8 is a perspective view of the test meter emphasizing the transparent cover; and,

FIG. 9 is a perspective view of the test meter without the transparent cover.

The broken lines showing various surface details in FIGS. 3 7 are for the purpose of illustration only and form no part of the claimed design.

Claims

CLAIM The ornamental design for a test meter, as shown and described.

---

Inventors:	Fukuzawa; Masahiro (Kyoto, JP)
Assignee:	ARKRAY, Inc. (Kyoto, JP)
Appl. No.:	D/327,968
Filed:	November 17, 2008

---

Foreign Application Priority Data

---

May 19, 2008 [JP]			D2008-012445

Current U.S. Class:	D24/186
Current International Class:	2401
Field of Search:	;D24/169,186,231 ;D10/81 ;600/301,309,316,318,322,324,347,365-366,368,583-584 ;422/55-56,58,61,68.1,102 ;436/66-68

---

References Cited [Referenced By]

---

U.S. Patent Documents

D393313	April 1998	Meisner et al.
D444235	June 2001	Roberts et al.
D484600	December 2003	Kaar et al.
D495418	August 2004	Rounds et al.
D537164	February 2007	Shigemori et al.
D545438	June 2007	Huang et al.
D546216	July 2007	Bolognesi et al.
D546454	July 2007	Gutmann et al.
D546457	July 2007	Hannant et al.
D546458	July 2007	Hannant
D549830	August 2007	Behar et al.
D550364	September 2007	Glover et al.
D551350	September 2007	Lorimer et al.
D567125	April 2008	Okabe et al.

Primary Examiner: Delehanty; Robert A.
Assistant Examiner: Cavanna; Mark
Attorney, Agent or Firm: Studebaker & Brackett PC Studebaker; Donald R.