Stress meter

Okabe , et al. April 22, 2

Patent Grant D567125

U.S. patent number D567,125 [Application Number D/258,755] was granted by the patent office on 2008-04-22 for stress meter. This patent grant is currently assigned to Nipro Corporation. Invention is credited to Naohiro Atsumi, Norio Okabe, Hiroshi Yoshida.


United States Patent D567,125
Okabe ,   et al. April 22, 2008

Stress meter

Claims

CLAIM The ornamental design for a stress meter, as shown and described.
Inventors: Okabe; Norio (Osaka, JP), Yoshida; Hiroshi (Osaka, JP), Atsumi; Naohiro (Osaka, JP)
Assignee: Nipro Corporation (Osaka-Shi, JP)
Appl. No.: D/258,755
Filed: April 27, 2006

Foreign Application Priority Data

Oct 31, 2005 [JP] D2005-031950
Current U.S. Class: D10/81; D10/78; D24/169
Current International Class: 1004
Field of Search: ;D10/83,78,81 ;D24/224,232,169 ;205/785.5,787.5,782 ;204/415,416,403.2,403.06,409,412,435 ;700/17,431,499,866.3 ;600/345,587,595,300,301 ;345/824,156,158 ;455/12.1,86,406 ;422/50-58,61-63,67,68.1,80,82.03 ;435/7.21,14,22 ;340/573.1,573.3,573.4

References Cited [Referenced By]

U.S. Patent Documents
D309867 August 1990 Johnson
D318245 July 1991 Sierra et al.
D418134 December 1999 Crump
D459811 July 2002 Maus et al.
7183069 February 2007 Yamaguchi et al.
Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Birch, Stewart, Kolasch & Birch, LLP

Description



FIG. 1 is a perspective view of a stress meter;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

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