U.S. patent number D567,125 [Application Number D/258,755] was granted by the patent office on 2008-04-22 for stress meter.
This patent grant is currently assigned to Nipro Corporation. Invention is credited to Naohiro Atsumi, Norio Okabe, Hiroshi Yoshida.
United States Patent |
D567,125 |
Okabe , et al. |
April 22, 2008 |
Stress meter
Claims
CLAIM The ornamental design for a stress meter, as shown and
described.
Inventors: |
Okabe; Norio (Osaka,
JP), Yoshida; Hiroshi (Osaka, JP), Atsumi;
Naohiro (Osaka, JP) |
Assignee: |
Nipro Corporation (Osaka-Shi,
JP)
|
Appl.
No.: |
D/258,755 |
Filed: |
April 27, 2006 |
Foreign Application Priority Data
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|
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Oct 31, 2005 [JP] |
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D2005-031950 |
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Current U.S.
Class: |
D10/81; D10/78;
D24/169 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/83,78,81
;D24/224,232,169 ;205/785.5,787.5,782
;204/415,416,403.2,403.06,409,412,435 ;700/17,431,499,866.3
;600/345,587,595,300,301 ;345/824,156,158 ;455/12.1,86,406
;422/50-58,61-63,67,68.1,80,82.03 ;435/7.21,14,22
;340/573.1,573.3,573.4 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Birch, Stewart, Kolasch &
Birch, LLP
Description
FIG. 1 is a perspective view of a stress meter;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top view thereof; and,
FIG. 7 is a bottom view thereof.
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