Electron microscope

Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is an enlarged view of the portion indicated by lines 8 in FIG. 2.

The broken lines of FIG. 8 are for illustrative purposes of the boundaries of the enlarged view and form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for an electron microscope, as shown and described.

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Inventors:	Matoba; Kosuke (Tokyo, JP), Suzuki; Hiroyuki (Hitachinaka, JP), Sato; Hirofumi (Hitachinaka, JP), Sakamoto; Naoki (Naka, JP), Moriya; Toshiyuki (Tokorozawa, JP)
Applicant:	Name City State Country Type Hitachi High-Technologies Corporation Tokyo N/A JP
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Family ID:	50982581
Appl. No.:	D/456,320
Filed:	May 30, 2013

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Foreign Application Priority Data

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Nov 30, 2012 [JP]			2012-029392

Current U.S. Class:	D16/131
Current CPC Class:	H01J37/26 20130101
Current International Class:	1601
Field of Search:	;D16/131,130 ;250/310,311,440.11 ;D24/216,232 ;D10/81 ;422/63,66 ;248/636,550

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References Cited [Referenced By]

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U.S. Patent Documents

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D223669	May 1972	Nishino et al.
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D303267	September 1989	Takahashi et al.
4961003	October 1990	Yonezawa
D332616	January 1993	Hashimoto et al.
5350921	September 1994	Aoyama et al.
D381031	July 1997	Miyata et al.
6084239	July 2000	Miyata et al.
D638046	May 2011	Noda et al.
D644258	August 2011	Noda et al.
D687475	August 2013	Oonuma et al.
2002/0148961	October 2002	Nakasuji et al.
2005/0029452	February 2005	Furukawa et al.

Other References

Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English. cited by applicant . Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation. cited by applicant . Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new S-5500, Scanning Electron Microscope, Recorded World-Leading Resolution in 30 kV, Oct. 19, 2004 with partial translation. cited by applicant . Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English. cited by applicant . Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English. cited by applicant . JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation. cited by applicant.

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.