Sample holder for an electron microscope

Description

FIG. 1 is a front, top and right side perspective view of a sample holder for an electron microscope showing our/my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines in FIGS. 2-5 and 7 views are included for the purpose of illustrating a portion of the sample holder for an electron microscope that forms no part of the claimed design.

Claims

CLAIM We claim the ornamental design for a sample holder for an electron microscope, as shown and described.

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Inventors:	Hosoya; Kotaro (Hitachinaka, JP), Takahoko; Yoshihiro (Hitachinaka, JP)
Applicant:	Name City State Country Type Hosoya; Kotaro Takahoko; Yoshihiro Hitachinaka Hitachinaka N/A N/A JP JP
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/411,275
Filed:	January 19, 2012

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Foreign Application Priority Data

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Sep 30, 2011 [JP]			2011-022528

Current U.S. Class:	D24/224
Current International Class:	2401
Field of Search:	;D24/216-217,219,223-226,227,229-231,232,107,121-123 ;D10/81 ;422/547-554,556,558,559,500,560,561 ;359/391,398

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References Cited [Referenced By]

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U.S. Patent Documents

D249708	September 1978	Smith et al.
D290042	May 1987	Ford
4981345	January 1991	Berry et al.
D333187	February 1993	Omi
D431300	September 2000	Fisch
D628709	December 2010	Burdett et al.

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.