U.S. patent number D628,709 [Application Number D/359,297] was granted by the patent office on 2010-12-07 for sample cell for x-ray analyzer. This patent grant is currently assigned to X-Ray Optical Systems, Inc.. Invention is credited to John H. Burdett, Jr., Daniel L. Dunham, James B. Quinn.
United States Patent | D628,709 |
Burdett, Jr. , et al. | December 7, 2010 |
Inventors: | Burdett, Jr.; John H. (Charlton, NY), Dunham; Daniel L. (Averill Park, NY), Quinn; James B. (Ravena, NY) |
---|---|
Assignee: | X-Ray Optical Systems, Inc.
(East Greenbush, NY) |
Appl. No.: | D/359,297 |
Filed: | April 8, 2010 |
Application Number | Filing Date | Patent Number | Issue Date | ||
---|---|---|---|---|---|
29298204 | Nov 30, 2007 | ||||
Current U.S. Class: | D24/216 |
Current International Class: | 2401 |
Field of Search: | ;D24/216,222-226,227,229,230,231,232,169,112-114,130 ;D10/81 ;D3/203.1-203.8 ;422/99,102 ;D9/503,504,505,529,530,549 ;435/288.1,288.3,288.4,304.1,305.1,305.3,305.4 ;604/195,218,232 |
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