Sample cell for x-ray analyzer

Description

FIG. 1 is a first perspective view of a sample cell for x-ray analyzer comprising the new design;

FIG. 2 is second perspective view thereof;

FIG. 3 is a front side elevational view thereof, the rear side elevational view being a mirror image thereof;

FIG. 4 is a right side elevational view thereof, the left side elevational view being a mirror image thereof;

FIG. 5 is a top view thereof; and,

FIG. 6 is a bottom view thereof.

The broken lines in the drawing views are included for the purpose of illustrating portions of the sample cell for x-ray analyzer that form no part of the claimed design.

Claims

CLAIM The ornamental design for a sample cell for x-ray analyzer, as shown and described.

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Inventors:	Burdett, Jr.; John H. (Charlton, NY), Dunham; Daniel L. (Averill Park, NY), Quinn; James B. (Ravena, NY)
Assignee:	X-Ray Optical Systems, Inc. (East Greenbush, NY)
Appl. No.:	D/359,297
Filed:	April 8, 2010

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Related U.S. Patent Documents

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	Application Number	Filing Date	Patent Number	Issue Date
	29298204	Nov 30, 2007

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Current U.S. Class:	D24/216
Current International Class:	2401
Field of Search:	;D24/216,222-226,227,229,230,231,232,169,112-114,130 ;D10/81 ;D3/203.1-203.8 ;422/99,102 ;D9/503,504,505,529,530,549 ;435/288.1,288.3,288.4,304.1,305.1,305.3,305.4 ;604/195,218,232

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References Cited [Referenced By]

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U.S. Patent Documents

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D467502	December 2002	Keller et al.
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Other References

Office Action for U.S. Appl. No. 29/298,204, dated Apr. 28, 2009. cited by other . Office Action for U.S. Appl. No. 29/298,204, dated Oct. 15, 2009. cited by other.

Primary Examiner: Nelson; T. Chase
Assistant Examiner: Doan; Anhdao
Attorney, Agent or Firm: Klembczyk, Esq.; Jeffrey Radigan, Esq.; Kevin P. Heslin Rothenberg Farley & Mesiti P.C.