Specimen analyzer

Description

FIG. 1 is a front view of a specimen analyzer of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a first side view thereof;

FIG. 4 is a second side view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a bottom view thereof; and,

FIG. 7 is a front and top perspective view thereof.

The broken lines in the drawing views are included for the purpose of illustrating portions of the specimen analyzer that form no part of the claimed design.

Claims

CLAIM I claim the ornamental design for a specimen analyzer, as shown and described.

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Inventors:	Shibata; Fumie (Tokyo, JP)
Assignee:	Sysmex Corporation (Kobe, JP)
Appl. No.:	D/382,021
Filed:	December 28, 2010

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Foreign Application Priority Data

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Jun 29, 2010 [JP]			2010-15855

Current U.S. Class:	D24/216
Current International Class:	2401
Field of Search:	;D24/216,224,231,232,186,107,169,217,233 ;D10/46,81 ;422/500,547,62-65,67 ;435/287.1,287.3 ;436/43,45,47

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References Cited [Referenced By]

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U.S. Patent Documents

4039286	August 1977	Keller et al.
D280662	September 1985	Bartfay et al.
D328794	August 1992	Frenkel et al.
D404140	January 1999	Meguro
D482796	November 2003	Oyama et al.
D588276	March 2009	Isozaki et al.
7678331	March 2010	Shanafelter
D637098	May 2011	Oonuma et al.
2009/0269841	October 2009	Wojciechowski et al.
2009/0325299	December 2009	Hamada et al.
2010/0210019	August 2010	Kurono et al.

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Brinks Hofer Gilson & Lione