Sample analyzer

Description

FIG. 1 is a front view of a sample analyzer showing our new design;

FIG. 2 is a rear view of the sample analyzer of FIG. 1;

FIG. 3 is a right side view of the sample analyzer of FIG. 1;

FIG. 4 is a left side view of the sample analyzer of FIG. 1;

FIG. 5 is a top plan view of the sample analyzer of FIG. 1;

FIG. 6 is a bottom plan view of the sample analyzer of FIG. 1;

FIG. 7 is a cross-sectional view of the sample analyzer taken along the lines 7--7 in FIG. 1;

FIG. 8 is a cross-sectional view of the sample analyzer taken along the lines 8--8 in FIG. 1; and,

FIG. 9 is a perspective view of the sample analyzer of FIG. 1 in which a vessel accommodation rack is attached to the sample analyzer and the opening/closing port is open.

The broken lines in FIG. 9 are for illustrative purposes only and form no part of the claimed design.

Claims

The ornamental design for a sample analyzer, as shown and described.

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Inventors:	Oyama; Yasuhiro (Kobe, JP), Sakurai; Kazuyuki (Akashi, JP), Nakamura; Yoichi (Kobe, JP), Yoshida; Noriyoshi (Kobe, JP), Tokunaga; Kazutoshi (Kakogawa, JP), Ishizaki; Masami (Fujimi, JP)
Assignee:	Sysmex Corporation (Hyogo, JP)
Appl. No.:	D/156,653
Filed:	March 4, 2002

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Foreign Application Priority Data

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Sep 11, 2001 [JP]			2001-026683

Current U.S. Class:	D24/232
Current International Class:	2401
Field of Search:	;D24/231,232,186 ;D10/81 ;422/102,100,67,68.1,99,81,63,89,69.1

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References Cited [Referenced By]

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U.S. Patent Documents

D381749	July 1997	Lawrence et al.
D381756	July 1997	Ohnuma et al.
D424956	May 2000	von Buelow et al.
D467349	December 2002	Niedbala et al.

Primary Examiner: Simmons; Ian
Attorney, Agent or Firm: Cohen, Pontani, Lieberman & Pavane