U.S. patent number D657,067 [Application Number D/382,021] was granted by the patent office on 2012-04-03 for specimen analyzer.
This patent grant is currently assigned to Sysmex Corporation. Invention is credited to Fumie Shibata.
United States Patent |
D657,067 |
Shibata |
April 3, 2012 |
Specimen analyzer
Claims
CLAIM I claim the ornamental design for a specimen analyzer, as
shown and described.
Inventors: |
Shibata; Fumie (Tokyo,
JP) |
Assignee: |
Sysmex Corporation (Kobe,
JP)
|
Appl.
No.: |
D/382,021 |
Filed: |
December 28, 2010 |
Foreign Application Priority Data
|
|
|
|
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Jun 29, 2010 [JP] |
|
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2010-15855 |
|
Current U.S.
Class: |
D24/216 |
Current International
Class: |
2401 |
Field of
Search: |
;D24/216,224,231,232,186,107,169,217,233 ;D10/46,81
;422/500,547,62-65,67 ;435/287.1,287.3 ;436/43,45,47 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Brinks Hofer Gilson & Lione
Description
FIG. 1 is a front view of a specimen analyzer of the present
invention;
FIG. 2 is a rear view thereof;
FIG. 3 is a first side view thereof;
FIG. 4 is a second side view thereof;
FIG. 5 is a top view thereof;
FIG. 6 is a bottom view thereof; and,
FIG. 7 is a front and top perspective view thereof.
The broken lines in the drawing views are included for the purpose
of illustrating portions of the specimen analyzer that form no part
of the claimed design.
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