U.S. patent number D426,522 [Application Number D/109,356] was granted by the patent office on 2000-06-13 for contactor for semiconductor ic testers.
This patent grant is currently assigned to Advantest Corporation. Invention is credited to Shigeru Matsumura.
United States Patent |
D426,522 |
Matsumura |
June 13, 2000 |
Contactor for semiconductor IC testers
Claims
The ornamental design for a contactor for semiconductor IC testers,
as shown and described.
Inventors: |
Matsumura; Shigeru (Tokyo,
JP) |
Assignee: |
Advantest Corporation (Tokyo,
JP)
|
Appl.
No.: |
D/109,356 |
Filed: |
August 13, 1999 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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095314 |
Oct 20, 1998 |
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Foreign Application Priority Data
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Apr 21, 1998 [JP] |
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10-11416 |
Apr 21, 1998 [JP] |
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10-11417 |
Apr 21, 1998 [JP] |
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10-11418 |
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Current U.S.
Class: |
D13/182;
D13/147 |
Current International
Class: |
1303 |
Field of
Search: |
;D13/147,182,184 ;D10/75
;257/48,690,692,693,697 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Aronovich; Adir
Attorney, Agent or Firm: Christie, Parker & Hale,
LLP
Description
FIG. 1 is a perspective view of another embodiment of FIG. 1;
FIG. 2 is a top plan view in a reduced scale of FIG. 1;
FIG. 3 is a bottom plan in a reduced scale of FIG. 1;
FIG. 4 is a front elevational view in a reduced scale of FIG. 1,
the rear elevational view being a mirror image of the front
elevational view;
FIG. 5 is a left side elevational view in a reduced scale of FIG.
1, the right side elevational view being a mirror image of the left
side view; and,
FIG. 6 is a center horizontal cross-sectional view in an enlarged
scale of FIG. 2.
* * * * *