Contactor for semiconductor IC testers

Description

FIG. 1 is a perspective view of another embodiment of FIG. 1;

FIG. 2 is a top plan view in a reduced scale of FIG. 1;

FIG. 3 is a bottom plan in a reduced scale of FIG. 1;

FIG. 4 is a front elevational view in a reduced scale of FIG. 1, the rear elevational view being a mirror image of the front elevational view;

FIG. 5 is a left side elevational view in a reduced scale of FIG. 1, the right side elevational view being a mirror image of the left side view; and,

FIG. 6 is a center horizontal cross-sectional view in an enlarged scale of FIG. 2.

Claims

The ornamental design for a contactor for semiconductor IC testers, as shown and described.

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Inventors:	Matsumura; Shigeru (Tokyo, JP)
Assignee:	Advantest Corporation (Tokyo, JP)
Appl. No.:	D/109,356
Filed:	August 13, 1999

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Related U.S. Patent Documents

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	Application Number	Filing Date	Patent Number	Issue Date
	095314	Oct 20, 1998

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Foreign Application Priority Data

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Apr 21, 1998 [JP]			10-11416
Apr 21, 1998 [JP]			10-11417
Apr 21, 1998 [JP]			10-11418

Current U.S. Class:	D13/182; D13/147
Current International Class:	1303
Field of Search:	;D13/147,182,184 ;D10/75 ;257/48,690,692,693,697

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References Cited [Referenced By]

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U.S. Patent Documents

D239006	March 1976	Kelley
D305224	December 1989	Iwashita
D312816	December 1990	Huang
D404710	January 1999	Lai et al.

Primary Examiner: Aronovich; Adir
Attorney, Agent or Firm: Christie, Parker & Hale, LLP