loadpatents
name:-0.033122062683105
name:-0.029371976852417
name:-0.0020828247070312
MATSUMURA; Shigeru Patent Filings

MATSUMURA; Shigeru

Patent Applications and Registrations

Patent applications and USPTO patent grants for MATSUMURA; Shigeru.The latest application filed is for "combination drug for treating malignant tumor, pharmaceutical composition for treating malignant tumor, and pharmaceutical composition for malignant tumor treatment".

Company Profile
2.27.29
  • MATSUMURA; Shigeru - Nagoya-shi Aichi
  • Matsumura; Shigeru - Okazaki N/A JP
  • Matsumura; Shigeru - Okazaki-shi JP
  • - Saitama JP
  • Matsumura; Shigeru - Saitama JP
  • Matsumura; Shigeru - Kumagayashi JP
  • Matsumura; Shigeru - Tokyo JP
  • Matsumura; Shigeru - Yokohama JP
  • Matsumura; Shigeru - Masashino JP
  • Matsumura, Shigeru - Yokohama-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Combination Drug For Treating Malignant Tumor, Pharmaceutical Composition For Treating Malignant Tumor, And Pharmaceutical Composition For Malignant Tumor Treatment
App 20220273739 - KASUYA; Hideki ;   et al.
2022-09-01
Vehicle control system
Grant 9,242,637 - Miyamoto , et al. January 26, 2
2016-01-26
Vehicle Control System
App 20150051768 - Miyamoto; Tomohiko ;   et al.
2015-02-19
Test-use individual substrate, probe, and semiconductor wafer testing apparatus
Grant 08922232 -
2014-12-30
Test-use individual substrate, probe, and semiconductor wafer testing apparatus
Grant 8,922,232 - Matsumura , et al. December 30, 2
2014-12-30
Wafer Tray, Semiconductor Wafer Test Apparatus, And Test Method Of Semiconductor Wafer
App 20130082727 - Matsumura; Shigeru
2013-04-04
Fixing apparatus for a probe card
Grant 8,212,579 - Abe , et al. July 3, 2
2012-07-03
Connection board, probe card, and electronic device test apparatus comprising same
Grant 8,134,381 - Abe , et al. March 13, 2
2012-03-13
Test-use Individual Substrate, Probe, And Semiconductor Wafer Testing Apparatus
App 20120049876 - MATSUMURA; Shigeru ;   et al.
2012-03-01
Fixing Apparatus For A Probe Card
App 20100127726 - Abe; Yoshihiro ;   et al.
2010-05-27
Connection Board, Probe Card, And Electronic Device Test Apparatus Comprising Same
App 20100102837 - Abe; Yoshihiro ;   et al.
2010-04-29
Connector assembly, receptacle type connector, and interface apparatus
Grant 7,690,944 - Matsumura , et al. April 6, 2
2010-04-06
Interface apparatus for electronic device test apparatus
Grant 7,611,377 - Matsumura , et al. November 3, 2
2009-11-03
Calibration Board For Electronic Device Test Apparatus
App 20090128172 - Takaki; Shintaro ;   et al.
2009-05-21
System for mating and demating multiple connectors mounted on board of semiconductor test apparatus
Grant 7,484,285 - Kaneko , et al. February 3, 2
2009-02-03
Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus
Grant 7,474,109 - Kuitani , et al. January 6, 2
2009-01-06
Folding-type portable information device provided with image capturing function
Grant 7,373,186 - Watanabe , et al. May 13, 2
2008-05-13
Infrared Gas Analyzer
App 20080093556 - Yamagishi; Hideaki ;   et al.
2008-04-24
Foam coaxial cable and method of manufacturing the same
Grant 7,355,123 - Kimura , et al. April 8, 2
2008-04-08
Connector assembly, receptacle type connector, and interface apparatus
App 20080076298 - Matsumura; Shigeru ;   et al.
2008-03-27
Interface apparatus for electronic device test apparatus
App 20080076297 - Matsumura; Shigeru ;   et al.
2008-03-27
infrared gas analyzer and infrared gas analysis method
Grant 7,323,687 - Nanko , et al. January 29, 2
2008-01-29
Infrared gas analyzer
App 20070046925 - Yamagishi; Hideaki ;   et al.
2007-03-01
Connector
App 20070004254 - Murayama; Shigeru ;   et al.
2007-01-04
Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus
App 20060279304 - Kuitani; Tetsuya ;   et al.
2006-12-14
Connector
Grant 7,144,260 - Murayama , et al. December 5, 2
2006-12-05
Foam coaxial cable and method of manufacturing the same
App 20060254792 - Kimura; Hiroyuki ;   et al.
2006-11-16
Connector
Grant 7,125,264 - Murayama , et al. October 24, 2
2006-10-24
Bump and method of forming bump
Grant 7,084,657 - Matsumura August 1, 2
2006-08-01
Infrared gas analyzer and infrared gas analysis method
App 20060118724 - Nanko; Tomoaki ;   et al.
2006-06-08
Connector, electronic component fixing device, and tester
Grant 7,033,196 - Murayama , et al. April 25, 2
2006-04-25
Connector
App 20060057874 - Murayama; Shigeru ;   et al.
2006-03-16
High accuracy foamed coaxial cable and method for manufacturing the same
Grant 6,963,032 - Yamaguchi , et al. November 8, 2
2005-11-08
Connector, electronic component fixing device, and tester
App 20050159034 - Murayama, Shigeru ;   et al.
2005-07-21
Device interface apparatus
App 20050159050 - Hama, Hiroyuki ;   et al.
2005-07-21
High accuracy foamed coaxial cable and method for manufacturing the same
App 20050115738 - Yamaguchi, Tetsuo ;   et al.
2005-06-02
Connector connecting /disconnecting tool
App 20050081372 - Kaneko, Masanori ;   et al.
2005-04-21
Connector
App 20050054224 - Murayama, Shigeru ;   et al.
2005-03-10
Connector
Grant 6,846,189 - Murayama , et al. January 25, 2
2005-01-25
Connector
App 20040242035 - Murayama, Shigeru ;   et al.
2004-12-02
Folding-type portable information device provided with image capturing function
App 20040090552 - Watanabe, Takaaki ;   et al.
2004-05-13
Boundary line detecting method and apparatus, image processing method and apparatus, non-boundary line detecting method and apparatus
Grant 6,724,938 - Matsumura April 20, 2
2004-04-20
Bump and method of forming bump
App 20030101584 - Matsumura, Shigeru
2003-06-05
Semiconductor device testing apparatus and its calibration method
Grant 6,417,682 - Suzuki , et al. July 9, 2
2002-07-09
Signal processing method and apparatus and imaging system
App 20020009204 - Matsumura, Shigeru
2002-01-24
Semiconductor Package And Device Socket
App 20010046127 - MATSUMURA, SHIGERU
2001-11-29
Socket and connector therefor for connecting with an electrical component
App 20010010980 - Matsumura, Shigeru
2001-08-02
Contactor for semiconductor IC testers
Grant D426,522 - Matsumura June 13, 2
2000-06-13
Contactor for semiconductor IC testers
Grant D421,968 - Matsumura March 28, 2
2000-03-28
Image reconstruction process and apparatus using interpolated image reconstructed data
Grant 5,148,499 - Matsumura September 15, 1
1992-09-15
Convolution processing method for X-ray tomographic apparatus
Grant 5,140,520 - Matsumura August 18, 1
1992-08-18
X-ray computerized tomograph
Grant 5,065,436 - Matsumura November 12, 1
1991-11-12
X-ray computerized tomographic device
Grant 4,894,778 - Matsumura January 16, 1
1990-01-16

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