U.S. patent number 8,411,521 [Application Number 13/150,576] was granted by the patent office on 2013-04-02 for system and method for controlling timing of output signals.
This patent grant is currently assigned to Micron Technology, Inc.. The grantee listed for this patent is Paul A. LaBerge. Invention is credited to Paul A. LaBerge.
United States Patent |
8,411,521 |
LaBerge |
April 2, 2013 |
System and method for controlling timing of output signals
Abstract
The timing of output signals can be controlled by coupling a
digital signal through a signal distribution tree having a
plurality of branches extending from an input node to respective
clock inputs of a plurality of latches. A phase interpolator is
included in a signal path common to all of the branches, and a
respective delay line is included in each of the branches. Each of
the latches couples a signal applied to its data input to an output
terminal responsive to a transition of the digital signal applied
to its clock input. The delay lines are adjusted so that the
latches are simultaneously clocked. The delay of the phase
interpolator is adjusted so that the signals are coupled to the
output terminals of the latches with a predetermined timing
relationship relative to signals coupled to output terminals of a
second signal distribution tree.
Inventors: |
LaBerge; Paul A. (Shoreview,
MN) |
Applicant: |
Name |
City |
State |
Country |
Type |
LaBerge; Paul A. |
Shoreview |
MN |
US |
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Assignee: |
Micron Technology, Inc. (Boise,
ID)
|
Family
ID: |
37996098 |
Appl.
No.: |
13/150,576 |
Filed: |
June 1, 2011 |
Prior Publication Data
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Document
Identifier |
Publication Date |
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US 20110231143 A1 |
Sep 22, 2011 |
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Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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12956791 |
Jun 28, 2011 |
7969815 |
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12122414 |
Dec 21, 2010 |
7855928 |
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11262275 |
May 27, 2008 |
7379382 |
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Current U.S.
Class: |
365/201; 365/194;
365/193 |
Current CPC
Class: |
G11C
29/022 (20130101); G11C 29/028 (20130101); H03K
5/06 (20130101); G11C 7/106 (20130101); G11C
7/1066 (20130101); G11C 29/50012 (20130101); G11C
7/1051 (20130101); G11C 7/22 (20130101); G11C
29/02 (20130101); G11C 7/222 (20130101); G11C
7/04 (20130101) |
Current International
Class: |
G11C
7/00 (20060101) |
Field of
Search: |
;365/201,193,194 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Dinh; Son
Assistant Examiner: Nguyen; Nam
Attorney, Agent or Firm: Dorsey & Whitney LLP
Parent Case Text
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a divisional of U.S. patent application Ser.
No. 12/956,791, filed Nov. 30, 2010, and issued as U.S. Pat. No.
7,969,815 on Jun. 28, 2011, which is a divisional of U.S. patent
application Ser. No. 12/122,414, filed May 16, 2008, and issued as
U.S. Pat. No. 7,855,928 B2 on Dec. 21, 2010, which is a divisional
of U.S. patent application Ser. No. 11/262,275, filed Oct. 28,
2005, and issued as U.S. Pat. No. 7,379,382 on May 27, 2008. These
applications and patents are each incorporated herein by reference,
in their entirety, for any purpose.
Claims
I claim:
1. A testing system, comprising: testing circuitry for generating
test signals; a test signal output circuit coupled to the testing
circuitry, the test signal output circuit being operable to
transmit the test signals from the testing system, the test signal
output circuit comprising: a plurality of data latches, each of the
data latches having a clock input, a data input, and a test signal
output, each of the data latches being operable to receive at its
data input a respective bit of test data from the testing
circuitry; a signal distribution tree having an input node coupled
to receive a first digital signal and a plurality of output nodes
each of which is coupled to the clock input of a respective one of
the data latches; a phase interpolator between the input node and
each of the output nodes of the signal distribution tree; and a
delay line between the input node and at least one of the output
nodes of the signal distribution tree.
2. The testing system of claim 1, further comprising a plurality of
delay lines, individual ones of the plurality of delay lines
coupled between the phase interpolator and a respective one of the
plurality of data latches.
3. The testing system of claim 1, further comprising control
circuitry coupled to the phase interpolator and the delay line and
configured to control the delay of the phase interpolator and the
delay line.
4. The testing system of claim 3, further comprising: an input node
coupled to receive a strobe signal and a strobe output terminal
configured to provide the strobe signal; and at least one delay
line coupled between the input node and the strobe output terminal,
the delay of the at least one delay line being controlled by the
control circuitry.
5. The testing system of claim 4, further comprising a second phase
interpolator in series with the delay line, the delay of the second
phase interpolator being controlled by the control circuitry.
6. The testing system of claim 5 wherein the control circuitry is
operable to adjust the delays of at least one of the first and
second phase interpolators so that the timing of the test signals
at the outputs of the respective data latches varies over a range
relative to the timing of the strobe signal provided at the strobe
output terminal.
7. The testing system of claim 6, wherein the control circuitry is
configured to determine a data set-up time of a memory device
based, at least in part, on a timing relationship between the
outputs of the respective data latches and the strobe signal.
8. The testing system of claim 6, wherein the control circuitry is
configured to determine a data hold time of a memory device based,
at least in part, on a timing relationship between the outputs of
the respective data latches and the strobe signal.
9. A method of testing an integrated circuit, comprising: coupling
test signals along a plurality of first signal paths to respective
input terminals of the integrated circuit; using a first phase
interpolator to delay the test signals coupled to the input
terminals of the integrated circuit; coupling a strobe signal along
a second signal path to a strobe terminal of the integrated
circuit; and adjusting the delay of the first phase interpolator
over a predetermined range to provide a predetermined range of
timing relationships between the timing at which the test signals
are coupled to the input terminals of the integrated circuit and
the timing at which the strobe signal is coupled to the strobe
terminal of the integrated circuit.
10. The method of claim 9, further comprising: using a second phase
interpolator to delay the strobe signal coupled to the strobe
terminal of the integrated circuit; and adjusting the delays of the
first and second phase interpolators over predetermined ranges to
provide a predetermined range of timing relationships between the
timing at which the test signals are coupled to the input terminals
of the integrated circuit and the timing at which the strobe signal
is coupled to the strobe terminal of the integrated circuit.
11. The method of claim 9 wherein the act of coupling a strobe
signal along a second signal path to a strobe terminal of the
integrated circuit comprises coupling a pair of complementary
strobe signals along a respective second signal paths to respective
strobe terminals of the integrated circuit.
12. The method of claim 9 wherein the integrated circuit comprises
an integrated circuit memory device, wherein the test signals
comprise write data signals, wherein the strobe signal comprises a
write strobe signal.
13. The method of claim 9, further comprising receiving results
signals from the integrated circuit for each delay of the first
phase interpolator, the results signal indicating the response of
the integrated circuit to the test signals and the strobe signal
for each timing relationship between the test signals and the
strobe signal.
14. The method of claim 13, wherein the integrated circuit
comprises an integrated circuit memory device, wherein the test
signals comprise write data signals, wherein the strobe signal
comprises a write strobe signal, and wherein the results signals
comprise read data signals.
15. The method of claim 9, further comprising: using a plurality of
first delay lines in the respective first signal paths to delay the
test signals coupled to the input terminals of the integrated
circuit; and adjusting the delays of the first delay lines so that
the test signals are coupled to all of the input terminals of the
integrated circuit at substantially the same time.
16. The method of claim 15, further comprising: using a plurality
of second delay lines in the respective second signal paths to
delay the strobe signals coupled to the strobe terminals of the
integrated circuit; and adjusting the delays of the second delay
lines so that the strobe signals are coupled to all of the strobe
terminals of the integrated circuit at substantially the same
time.
17. The method of claim 9, further comprising: testing an ability
of the integrated circuit to capture the test signals at a
plurality of timing relationships within the predetermined range of
timing relationships.
18. The method of claim 17, further comprising: determining a data
set-up time of the integrated circuit based, at least in part, on
the testing.
19. The method of claim 17, further comprising: determining a data
hold time of the integrated circuit based, at least in part, on the
testing.
20. The method of claim 9, wherein said adjusting the delay of the
first phase interpolator over a predetermined range to provide a
predetermined range of timing relationships between the timing at
which the test signals are coupled to the input terminals of the
integrated circuit and the timing at which the strobe signal is
coupled to the strobe terminal of the integrated circuit comprises
providing the strobe signal with a constant timing and varying a
timing of the test signals.
Description
TECHNICAL FIELD
This invention relates to transmitting digital signals from
electronic devices such as testers, memory devices, etc., and, more
particularly, to a system and method for precisely controlling the
timing at which a digital signals are output from the electronic
devices.
BACKGROUND OF THE INVENTION
Digital signals are received and transmitted by many types of
digital electronic devices at ever increasing rates. For example,
the rate at which command, address and write data signals are
applied to memory devices, such as dynamic random access memory
("DRAM") devices, continues to increase, as does the rate at which
read data signals are output from memory devices. As the rate at
which such signals are transmitted continues to increase, it has
become more difficult to ensure that the signals are transmitted at
the proper time and in synchronism with each other. For example,
typical clock trees 10, 14 are shown in FIG. 1. The clock tree 10
couples a first internal clock signal ICLK.sub.1 through a series
of symmetrically connected buffers 18, which may be two-transistor
inverters, to the clock inputs of a plurality of latches 20.sub.0,1
. . . N. Each of the latches 20.sub.0,1 . . . N receives at its
data input a respective data bit D.sub.0,1 . . . N, and outputs a
respective data signal DQ.sub.0,1 . . . N, to a respective DQ
terminal responsive to the rising edge of the clock signal applied
to the its clock input. Insofar as all of the latches 20.sub.0,1 .
. . N are driven through the same clock tree 10, the DQ terminals
are considered to be in the same "pin group."
The other clock tree 14 receives a second internal clock signal
ICLK.sub.2, and couples the ICLK.sub.2 signal through buffers 22 to
the clock inputs of respective latches 24a,b. The data inputs of
the latches 24a,b are coupled to a logic "1" level. The latch 24a
therefore outputs a high data strobe signal to the DQS terminal
responsive to the rising edge of the ICLK.sub.2 signal. This high
at the output of the latch 24a also resets the latch 24b. The latch
24b receives the ICLK.sub.2 signal through an odd number of buffers
22 so that it outputs a high complementary data strobe signal DQS*
responsive to the falling edge of the ICLK.sub.2 signal. The high
at the output of the latch 24b also resets the latch 24a. The DQS
and DQS* signals are considered to be in the same pin group, which
is different from the DQ signal pin group.
The clock trees 10, 14 shown in FIG. 1 are typical of those used
in, for example, memory controllers to output write data signals to
memory devices, memory devices to output read data signals to a
memory controller, or testing systems to output digital signals to
devices under test. The data strobe signals DQS, DQS* are typically
used in source synchronous applications to strobe data signals
transmitted from the latches 20 at a receiving device. For example,
in double data rate ("DDR") memory devices, the rising edge of the
DQS signal is used by a serializing device to transmit a first set
of data signals from the latches 20, and the rising edge of the
DQS* signal is used to transmit a second set of data signals from
the latches 20. At a receiving device, the rising edge of the DQS
signal is used to latch the first set of data signals from the
latches 20, and the rising edge of the DQS* signal is used to latch
the second set of data signals from the latches 20. In such memory
devices, the DQ signals can be considered one pin group, the
address signals can be considered another pin set, and the command
signals can be considered still another pin set, insofar as they
are each triggered by an internal clock signal coupled through
different clock trees.
As the speed at which data signals are transmitted continues to
increase, it has become more difficult to ensure that the DQ
signals are all transmitted at the same time, and that the DQS and
DQS* signals have the proper timing relative to the DQ signals.
With further reference to FIG. 1, one problem with ensuring that
the DQ signals are all transmitted at the same time results from
unequal lengths in the signal path from the node to which the
ICLK.sub.1 signal is applied to the clock inputs of the latches 20.
The unequal path lengths can cause the ICLK.sub.1 signal to be
applied to the latches 20 at different times, thereby causing the
latches 20 to output the DQ signals at different times.
It can also be seen from FIG. 1 that the number of buffers 18
through which the ICLK.sub.1 signal propagates is different from
the number of buffers 22 through which the ICLK.sub.2 signal
propagates. This difference can cause the transitions of the DQS
and DQS* signals to occur before or after the DQ signals output by
the latches 20 are valid. The propagation time differences can be
compensated for to some extent by adding delay in the signal path
of the ICLK.sub.2 signal, such as by adding addition buffers.
However, adding buffers that are to be used only for increasing
delay takes up valuable space on a semiconductor die. Also, the
propagation delays through the buffers 18, 22 generally can vary
with process variations, supply voltage fluctuations, and
temperature changes. Therefore, if the propagation delays of the
ICLK.sub.1 and ICLK.sub.2 signals are equalized for one set of
conditions, the propagation delays may no longer be equal for
different processing runs of a device, for different supply
voltages and/or for different temperatures. Alternatively, a
smaller number of buffers 18 could be used in the clock tree 10,
and each buffer 18 could be coupled to a larger number of latches
20. However, the buffers 18 would then be loaded to a greater
extent than the loading of the buffers 22. As a result, the
ICLK.sub.1 signal coupled through the heavily loaded buffers 18
would be delayed to a greater extend than the delay of the
ICLK.sub.2 signal coupled through the lightly loaded buffers 22. As
a result, the transitions of the DQS and DQS* signals might not
occur at a time the DQ signals are valid.
While the number of buffers 22 through which the ICLK.sub.2 signal
propagates is different from the number of buffers 18 through which
the ICLK.sub.1 signal propagates, the number of buffers 18 through
which the ICLK.sub.1 signal propagates to reach each of the latches
20 is the same for all branches of the clock tree 10. Therefore,
the timing at which the ICLK.sub.1 signal reaches each of the
latches 20 will theoretically be the same despite process, voltage
and temperature variations. However, the lengths of the conductors
through which the ICLK.sub.1 signal must propagate to reach each of
the latches 20 will generally not be the same. Furthermore, it is
generally not possible to compensate for these different
propagation times by, for example, inserting additional buffers in
the signal path because the propagation times of the buffers, but
not the propagation time of conductors, will generally vary with
process, voltage and temperature variations.
The manner in which the propagation delay of the buffers 18, 22
vary with, for example, temperature is shown in the graph of FIG.
2, which also shows the relatively constant conductor or wire
propagation delay. As shown in FIG. 2, the total propagation delay
is the sum of the buffer or other semiconductor element delay and
the wire delays. The slope and magnitude of the total propagation
delay curve will vary with the relative contribution of the
semiconductor element delays and the wire delays. In general, the
delay curve will be steeper if the semiconductor element delays are
a higher percentage of the total delay, and it will be shallower if
the wire delays are a higher percentage of the total delay. The
variation in both the slope and magnitude of the total propagation
delay depending on the absolute and relative delay of the
semiconductor element delays and the wire delays makes it very
difficult to control the output times of digital signals both
within each pin group and between different pin groups.
There is therefore a need for a system and method for ensuring that
digital signals are transmitted from electronic devices, such as
memory devices, memory controllers, testing systems and the like,
with precisely controlled timing.
SUMMARY OF THE INVENTION
A system for controlling the timing at which a signal is
transmitted includes a first signal distribution tree having a
plurality of branches. A first digital input signal is applied to
an input node of the tree and is coupled through the respective
branches to a plurality of respective first output nodes. The first
signal distribution tree further includes a phase interpolator
through which the digital input signal is coupled between the input
node and each of the first output nodes. At least one branch
through which the input signal is coupled to at least one of the
first output nodes includes a delay line coupled in series with the
phase interpolator. A second signal distribution tree also has a
plurality of branches. A second digital input signal is applied to
an input node of the second signal distribution tree, and is
coupled through the respective branches to a plurality of
respective second output nodes. The second signal distribution tree
also includes a delay line in at least one of its branches from the
input node to a respective one of the second output nodes. The
delay lines in the first signal distribution tree may be adjusted
so that the input signal is coupled through the first signal
distribution tree from the input node to each of the first output
nodes at substantially the same time. Similarly, the delay lines in
the second signal distribution tree may be adjusted so that the
input signal is coupled through the second signal distribution tree
from the input node to each of the second output nodes at
substantially the same time. The delay of the phase interpolator
may be adjusted to provide a predetermined timing relationship
between the coupling of the input signal to the first output nodes
and the coupling of the input signal to the second output
nodes.
The first and second clock distribution trees may be used in a
memory controller or memory device to control the timing of data
signals coupled between the memory controller and memory device
relative to each other as well as relative to the timing of a data
strobe signal coupled between the memory controller and memory
device.
The first and second clock distribution trees may also be used in
an integrated circuit tester to apply test signals to an integrated
circuit having a range of timing relationships relative to a strobe
signal that is also applied to the integrated circuit being tested.
The tester then receives results signals from the integrated
circuit being tested, which indicate the performance of the
integrated circuit to various timing relationships in the
range.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a logic diagram showing a pair of clock trees
conventionally used to output digital signals in a variety of
electronic devices.
FIG. 2 is a graph showing the relationship between propagation
delay and temperature in the clock trees of FIG. 1.
FIG. 3 is a logic diagram showing a clock tree according to one
example of the invention for controlling the timing of DQ signals
in one pin group relative to each other and to signals in a DQS pin
group.
FIG. 4 is a clock signal path according to another example of the
invention that can be used to generate a delay that varies in a
selected manner as a function of process, supply voltage and
temperature variations.
FIG. 5 is a graph showing two examples of delay functions that can
be achieved using the clock signal path of FIG. 4.
FIG. 6 is a block diagram of a testing system according to one
example of the invention being used to test a memory device.
FIG. 7 is a logic diagram of one example of a write data signal
generator that may be used in the testing system of FIG. 6.
FIG. 8 is a block diagram of a computer system having a memory
controller and a memory device, both of which use a data signal
generator according to one example of the invention.
DETAILED DESCRIPTION
A system and method for controlling the output times of digital
signals according to one example of the invention is shown in FIG.
3. An internal clock signal ICLK is coupled through a first clock
tree 40 to the clock input of a large number of latches 44,
although only one latch 44 and one branch of the tree 40 is shown
in FIG. 3 in the interests of clarity. In the example of FIG. 3,
the latches 44 each output a respective bit of a write data signal
DQ. The tree 40 is considered to be heavily loaded in that the ICLK
signal is coupled to the large number of latches 44 through a large
number of branches, and hence a large number of buffers 48.
The ICLK signal is also coupled through a second clock tree 50 to a
pair of latches, although only one latch 52 is shown for purposes
of clarity. The second clock tree generates complementary DQS and
DQS* signals. The tree 50 is considered to be lightly loaded
because the ICLK signal is coupled to the latches 52 through only
two branches, each containing a single buffer 56. As a result of
the different loadings of the clock trees 40, 50, as well as
differences in the number of buffers and lengths of conductors in
the trees 40, 50, it is difficult to control the timing of the DQ
signals relative to each other and to the DQS signal. According to
one example of the invention, this difficulty is largely overcome
by offsetting the phase of the ICLK signal using a respective phase
interpolator 60, 62 in each of the trees 40, 50. As is well-known
in the art, a phase interpolator is able to interpolate between the
phase of two input signals by a precisely controlled amount. The
phase interpolators 60, 62 each receive the ICLK signal and its
complement ICLK*. The degree of precision of the delay of a signal
generated by a phase interpolator depends on the precision of the
input signal frequency. The phase interpolators 60, 62 can, for
example, interpolate between the phases of the ICLK and ICLK*
signals in 100 increments. If the ICLK and ICLK* signals have a
frequency of 5 mHz, the phase offset of the signals output from the
phase interpolators 60, 62 can then be adjusted in 1 nanosecond
increments. The degree of precision of the delay depends on the
precision of the input signal frequency, and is thus not adversely
affected by process, supply voltage or temperature variations.
The outputs of the interpolators 60, 62 are coupled through
branches of the respective clock trees 40, 50, each of which
contains a buffer, although only one buffer 64, 66 is shown in each
branch in FIG. 3. At least some of the branches in the clock trees
40, 50 contain respective delay lines 68, 70. As is well known in
the art, the delay provided by the delay lines 68, 70 varies with
process, supply voltage, and temperature variations. The delay
provided by a delay line in one branch of a tree can therefore
track semiconductor element delays in another branch of the same or
a different tree.
In operation, the phase interpolators 64, 66 are adjusted to
maintain a predetermined timing relationship between the signals in
the DQ signal pin group and the signal in the DQS pin group. The
phase interpolators 60, 62 primarily compensate for differences in
the wire delays in the clock trees 40, 50. Like the wire delays,
the delays of the phase interpolators 60, 62 are relatively
insensitive to process, supply voltage or temperature variations.
The delay lines 68, 70 primarily compensate for differences in the
delays in each branch of the clock trees 40, 50 so that the DQ
signals all transition at the same time, and both of the DQS
signals transition at the same time. The delay lines 68, 70 are
sensitive to process, supply voltage or temperature variations, and
they roughly therefore track propagation delay variations of the
buffers 48, 56, 64, 66 and other semiconductor circuit elements
resulting from those same factors.
Another advantage to placing a delay line in series with a phase
interpolator in the clock trees is that it is possible to control
the slope and magnitude of the delay as a function of processing,
supply voltage, and temperature variations. For example, with
reference to FIG. 4, an ICLK signal is applied to the series
combination of a phase interpolator 74 and a delay line 76, each of
which provides a controllable delay. As mentioned above, the phase
interpolator 74 is relatively insensitive to process, voltage and
temperature variations. On the other hand, the delay line 76 is
sensitive to process, voltage and temperature variations. In a
first example shown in FIG. 5, the delay of the delay line 76 (and
any semiconductor circuit element in series with the delay line 76)
is 5 ns at a relatively low temperature and doubles with
temperature to 10 ns. In this example, the combined delay of the
wire delay and phase interpolator 74 is a constant 30 ns. The total
delay therefore starts at 35 ns and increases with temperature to
40 ns. In a second example shown in FIG. 5 as a solid line, the
delay of the delay line 76 is 30 ns at a relatively low temperature
and again doubles with temperature to 60 ns. In this example, the
delay of the wire delay and phase interpolator 74 is a constant 5
ns. The total delay therefore starts at 35 ns and increases with
temperature to 65 ns. Therefore, the slope of the total delay in
the second example is substantially greater than the slope of the
total delay in the first example. By combining the phase
interpolator 74 in series with the delay line 76 in this manner, a
delay vs. temperature relationship having virtually any magnitude
and slope can be created.
The system and method for controlling the timing at which digital
signals are output can also be used to test the timing margins of
digital circuits, such as memory devices. For example, two memory
device timing parameters that are normally tested are the maximum
data set-up time, which is abbreviated as t.sub.DS, and the minimum
data hold time, which is abbreviated as t.sub.DH. As mentioned
above, in source synchronous data transfers, write data signals DQ
are transmitted in synchronism with a data strobe signal DQS. The
maximum time needed for the write data signals DQ to become valid
after the transition of DQS, i.e., the data set up time t.sub.DS,
is normally specified for a memory device. Similarly, the minimum
time that the write data signals DQ must remain valid after the
transition of DQS, i.e., the data hold time t.sub.DH, is also
normally specified for a memory device.
The time between t.sub.DS and t.sub.DH is the data valid period.
The length of the data valid period may be excessively reduced by
any increase in the set-up time beyond the specified maximum set-up
time t.sub.DS or any decrease of the data hold time from the
specified minimum data hold time t.sub.DH. As the length of the
data hold period gets smaller, it becomes more difficult for the
memory device to position transitions of the DQS signal in the data
valid period. It is therefore important to determine the data
set-up and data hold times of a memory device being tested to
ensure that a sufficient data valid period can be achieved.
A memory device can be tested to determine the values of t.sub.DS
and T.sub.DH, as well as other timing parameters, by varying the
timing relationship between the write data signals DQ and the data
strobe signal DQS, and determining which relationships allow the DQ
signals to be written to the memory device. For example, with
reference to FIG. 6, a testing system 80 is coupled to a device
under test, which, in this example, is a memory device 84, such as
a DRAM device. The testing system 80 generates and provides to the
memory device 84 memory commands, memory addresses, and write data,
and it receives read data from the memory device 84. The testing
system 80 also generates and provides to the memory device 84 a
data strobe DQS signal. The testing system 80 also includes
circuitry 86 for providing write data signals with precisely
controlled timing. Also included in the testing system 80 is
extensive circuitry of conventional design, which is not shown and
will not be explained for purposes of brevity and clarity.
One example of the write data signal generating circuitry 86 is
shown in FIG. 7. The circuitry 86 includes a phase interpolator 90,
which receives and delays an ICLK signal by a selected delay
amount. The delayed ICLK signal is then distributed through a clock
tree represented by a buffer 92 to four delay lines 94, 96, 98,
100. The delay provided by each of the delay lines 94-100 can be
precisely controlled. The outputs of the delay lines 94-100 are
applied through respective buffers 106, 108, 100, 112 to the clock
inputs of respective latches 120, 122, 124, 126, each of which
receive a respective data signal at their data input. The latches
120-126 output four write data signals DQ. The delays of the phase
interpolator 90 and the delay lines 94-100 are controlled by a
control circuitry 128.
In operation, the delay lines 94-100 are adjusted so that the DQ
signals are output from all of the latches 120-126 at the same
time. The phase interpolator 90 is then adjusted to vary the delay
time of the phase interpolator 90 over a range of delay values. The
timing of a data strobe signal DQS (FIG. 6) is maintained constant
so that the timing relationship between the DQ signals and the DQS
signal is varied. As each delay value, the ability of a memory
device to capture the DQ signals is tested, such as by conducting a
read after each attempted write. The timing margins of the memory
devices, such as the maximum set-up time t.sub.DS and the data hold
time t.sub.DH, can then be determined.
As mentioned above, the system and method for controlling the
output times of digital signals shown in FIG. 3 can be used to
output write data signals from a memory controller and to output
read data signals from a memory device, such as a DRAM device. With
reference to FIG. 8, a computer system 200 is shown that can take
advantage of various examples of the present invention. The
computer system 200 includes a processor 202 for performing various
functions, such as performing specific calculations or tasks. In
addition, the computer system 200 includes one or more input
devices 204, such as a keyboard or a mouse, coupled to the
processor 202 through a memory controller 206 and a processor bus
208 to allow an operator to interface with the computer system 200.
Typically, the computer system 200 also includes one or more output
devices 210 coupled to the processor 202, such output devices
typically being a printer or a video terminal. One or more data
storage devices 212 are also typically coupled to the processor 202
through the memory controller 206 to store data or retrieve data
from external storage media (not shown). Examples of typical data
storage devices 212 include hard and floppy disks, tape cassettes,
and compact disk read-only memories (CD-ROMs).
The computer system 200 also includes a DRAM device 220 that is
coupled to the memory controller 206 through a control bus 222, an
address bus 224 and a data bus 230. The memory controller 206
includes a write data output circuit 234 similar to the circuit
shown in FIG. 3. The write data output circuit 234 is operable to
apply write data signals and at least one write signal to the data
bus 230 at precisely controlled times. Similarly, the DRAM device
220 also includes a read data output circuit 238 that is operable
to apply read data signals and at least one read strobe signal to
the data bus 230 at precisely controlled times. For this reason,
the DRAM device 220 and memory controller 206 are able to operate
at very high speeds without the need to design either the memory
controller 206 or the DRAM device 220 with precisely controlled
signal propagation times. A configuration register 240 in the
memory controller 206 and a mode register 244 in the DRAM device
220 may be programmed to select the delays of the phase
interpolators and delay lines used in the write data output circuit
234 and the read data output circuit 238, respectively. The
computer system 200 may also include a cache memory 248 coupled to
the processor 202 through the processor bus 208 to provide for the
rapid storage and reading of data and/or instructions, as is well
known in the art.
Although the present invention has been described with reference to
the disclosed examples, persons skilled in the art will recognize
that changes may be made in form and detail without departing from
the spirit and scope of the invention. For example, although clock
trees using various examples of the present invention generally
have a phase interpolator in each tree and a delay line in each
branch, it will be understood that it may be possible to omit a
phase interpolator in one or more clock trees and use a phase
interpolator in another tree to match the timing in the clock tree
with the omitted phase interpolator. Similarly, it may be possible
to omit a delay line in one or more branch of a clock tree and use
a delay line in another branch to match the timing in the branch
with the omitted delay line. Such modifications are well within the
skill of those ordinarily skilled in the art. Accordingly, the
invention is not limited except as by the appended claims.
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