U.S. patent number 7,308,065 [Application Number 11/406,557] was granted by the patent office on 2007-12-11 for delay locked loop circuitry for clock delay adjustment.
This patent grant is currently assigned to Rambus Inc.. Invention is credited to Yiu-Fai Chan, Pak Shing Chau, Kevin S. Donnelly, Bruno W. Garlepp, Mark A. Horowitz, Mark G. Johnson, Jun Kim, Benedict C. Lau, Thomas H. Lee, Nhat M. Nguyen, Donald C. Stark, Chanh Vi Tran, Leung Yu.
United States Patent |
7,308,065 |
Donnelly , et al. |
December 11, 2007 |
Delay locked loop circuitry for clock delay adjustment
Abstract
A receiver adapted to be coupled to a data bus and configured to
receive data in accordance with a receive clock includes first and
second delay-locked loops. The first delay-locked loop is
configured to generate a plurality of phase vectors from a first
reference clock, and the second delay-locked loop is coupled to the
first delay-locked loop and configured to generate the receive
clock from at least one phase vector selected from the plurality of
phase vectors and a second reference clock.
Inventors: |
Donnelly; Kevin S. (San
Francisco, CA), Chau; Pak Shing (San Jose, CA), Horowitz;
Mark A. (Palo Alto, CA), Lee; Thomas H. (Cupertino,
CA), Johnson; Mark G. (Los Altos, CA), Lau; Benedict
C. (San Jose, CA), Yu; Leung (Santa Clara, CA),
Garlepp; Bruno W. (Mountain View, CA), Chan; Yiu-Fai
(Los Altos Hills, CA), Kim; Jun (Redwood City, CA), Tran;
Chanh Vi (San Jose, CA), Stark; Donald C. (Palo Alto,
CA), Nguyen; Nhat M. (San Jose, CA) |
Assignee: |
Rambus Inc. (Los Altos,
CA)
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Family
ID: |
25166104 |
Appl.
No.: |
11/406,557 |
Filed: |
April 18, 2006 |
Prior Publication Data
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Document
Identifier |
Publication Date |
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US 20060188051 A1 |
Aug 24, 2006 |
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Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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10366865 |
Feb 14, 2003 |
7039147 |
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09524402 |
Mar 25, 2003 |
6539072 |
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08795657 |
Sep 26, 2000 |
6125157 |
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Current U.S.
Class: |
375/373; 327/158;
327/149 |
Current CPC
Class: |
H03L
7/0814 (20130101); G11C 7/22 (20130101); G11C
7/222 (20130101); H03L 7/0812 (20130101); H03L
7/07 (20130101); G06F 1/10 (20130101); H04L
7/0037 (20130101); H03K 5/2481 (20130101); H03L
7/0805 (20130101); H03K 5/133 (20130101); H04L
7/0008 (20130101); H03K 2005/00052 (20130101); H03K
2005/00026 (20130101); H03K 2005/00032 (20130101); H03K
2005/00208 (20130101); H04L 7/0025 (20130101) |
Current International
Class: |
H03D
3/24 (20060101); H03L 7/06 (20060101) |
Field of
Search: |
;375/371,372,373
;327/149,158 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
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19701937 |
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Jul 1997 |
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DE |
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0116669 |
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Aug 1984 |
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EP |
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0306662 |
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Mar 1989 |
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EP |
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0645888 |
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Mar 1995 |
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EP |
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WO95/22206 |
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Aug 1995 |
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WO |
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WO96/03808 |
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Feb 1996 |
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WO |
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Other References
Lee et al., "A 2.5 V CMOS Delay-Locked Loop for an 18 Mbit, 500
Megabyte/s DRAM," IEEE Journal of Solid-State Circuits,
29(12):1491-1496 (1994). cited by other .
Tanoi et al., "A 250-622 MHz Deskew and Jitter-Suppressed Clock
Buffer Using Two-Loop Architecture," IEEE Journal of Solid-State
Circuits, 31(4):487-493 (1996). cited by other.
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Primary Examiner: Kim; Kevin
Attorney, Agent or Firm: Morgan, Lewis & Bockius LLP
Parent Case Text
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser.
No. 10/366,865, filed Feb. 14, 2003, now U.S. Pat. No. 7,039,147,
which is a continuation of U.S. patent application Ser. No.
09/524,402 filed Mar. 13, 2000, which is now U.S. Pat. No.
6,539,072, issued Mar. 25, 2003, which is a continuation of U.S.
patent application Ser. No. 08/795,657, filed Feb. 6, 1997, which
is now U.S. Pat. No. 6,125,157, issued Sep. 26, 2000, which
applications are incorporated by reference herein in their
entirety.
Claims
What is claimed is:
1. A delay locked loop circuit, comprising: a first loop circuit
including a first adjustable delay section to provide a first clock
signal having a controlled phase relationship with respect to an
external clock signal; and a second loop circuit, coupled to the
first loop circuit, the second loop circuit comprising: a first
phase detector to receive an input clock signal and a first
feedback clock signal, the first phase detector to provide a signal
that is representative of a phase difference between the first
feedback clock signal and the input clock signal; a first control
circuit coupled to the first phase detector, the first control
circuit to provide a plurality of control signals based on the
signal that is representative of the phase difference between the
first feedback clock signal and the input clock signal; and a
selection block coupled to the first adjustable delay section, the
selection block to adjust a phase of a second clock signal based on
the plurality of control signals and the first clock signal,
wherein the second clock signal is distinct from the first clock
signal and is used to generate the first feedback clock signal.
2. The delay locked loop circuit of claim 1, the first loop circuit
further comprising: a second phase detector to receive the external
clock signal and the first clock signal, the second phase detector
to output a signal that is representative of a phase difference
between the first feedback clock signal and the external clock
signal; and a second control circuit coupled to the second phase
detector, the second control circuit to provide a delay adjustment
signal that is based on the signal that is representative of the
phase difference between the first clock signal and the external
clock signal, wherein a delay of the first adjustable delay section
is adjusted based on the delay adjustment signal.
3. The delay locked loop circuit of claim 2, the second loop
circuit further comprising a second adjustable delay section to
receive the second clock signal and provide the first feedback
clock signal, wherein a delay of the second adjustable delay
section is controlled by the delay adjustment signal.
4. The delay locked loop circuit of claim 3, wherein: the first
adjustable delay section includes a plurality of delay elements,
each delay element of the plurality delay elements to provide a
phase vector of a plurality of respective phase vectors, wherein
the first clock signal is a second feedback clock signal selected
from the plurality of phase vectors; and the selection block
includes: selection circuitry to select a pair of phase vectors, of
the plurality of phase vectors, that bracket a phase of the
external clock signal; and interpolator circuitry to interpolate
between the pair of phase vectors and provide the second clock
signal.
5. The delay locked loop circuit of claim 1, further comprising a
buffer, wherein the buffer includes duty cycle correction circuitry
to correct a duty cycle of the external clock signal.
6. The delay locked loop circuit of claim 1, further comprising a
filter selected from the group consisting of a majority-detector
filter and a unanimity-detector filter, the filter to filter the
signal so as to reduce loop jitter.
7. A method of operation in a delay locked loop circuit, the method
comprising: generating a first clock signal in a first loop circuit
such that the first clock signal includes a controlled phase
relationship with respect to an external clock signal; and in a
second loop circuit coupled to the first loop circuit: comparing a
phase of an input clock signal to a phase of a feedback clock
signal to provide a signal that is representative of a phase
difference between the feedback clock signal and the input clock
signal; generating a plurality of control signals based on the
signal that is representative of the phase difference between the
feedback clock signal and the input clock signal; and adjusting a
phase of a second clock signal based on the plurality of control
signals and the first clock signal, wherein the second clock signal
is distinct from the first clock signal and is used to generate the
feedback clock signal.
8. The method of claim 7, further comprising: in the first loop
circuit, performing a comparison between the external clock signal
and the first clock signal to output a signal that is
representative of a phase difference between the first clock signal
and the external clock signal; and generating a delay adjustment
signal that is based on the signal that is representative of the
phase difference between the first clock signal and the external
clock signal; and wherein generating the first clock signal
includes adjusting a delay of the first clock signal relative to
the external clock signal based on the delay adjustment signal.
9. The method of claim 8, further comprising varying a delay of a
second adjustable delay section that receives the second clock
signal and provides the feedback clock signal, wherein the delay of
the second adjustable delay section is controlled by the delay
adjustment signal.
10. The method of claim 7, wherein the first clock signal is a
first vector and the method further comprises generating a
plurality of phase vectors in addition to the first vector; and
adjusting the phase of the second clock signal further comprises:
selecting a pair of phase vectors of the plurality of phase vectors
that bracket a phase of the internal clock signal; and
interpolating between the pair of phase vectors to generate the
second clock signal.
11. The method of claim 7, further comprising performing duty cycle
correction on the external clock signal.
12. The method of claim 7, further comprising filtering the signal
to reduce loop jitter.
13. An integrated circuit memory device, comprising: a first loop
circuit including a first adjustable delay section to provide a
first clock signal having a controlled phase relationship with
respect to an external clock signal; a second loop circuit
including a selection block coupled to the first adjustable delay
section, the selection block to adjust a phase of a second clock
signal based on the first clock signal and a phase difference
between a first feedback clock signal and an input clock signal,
wherein the second clock signal is distinct from the first clock
signal and is used to generate the first feedback clock signal; and
a transmitter circuit to output data on both edges of the second
clock signal.
14. The integrated circuit memory device of claim 13, the second
loop circuit further including: a first phase detector to receive
the input clock signal and the first feedback clock signal, the
first phase detector to provide a signal that is representative of
the phase difference; and a first control circuit coupled to the
first phase detector, the first control circuit to provide a
plurality of control signals based on the signal.
15. The integrated circuit memory device of claim 14, the first
loop circuit further including: a second phase detector, the second
phase detector to receive the external clock signal and the first
clock signal, the second phase detector to output a signal that is
representative of a phase difference between the first clock signal
and the external clock signal; and a second control circuit coupled
to the second phase detector, the second control circuit to provide
a delay adjustment signal that is based on the signal that is
representative of the phase difference between the first clock
signal and the external clock signal, wherein a delay of the first
adjustable delay section is adjusted based on the delay adjustment
signal.
16. The integrated circuit memory device of claim 15, the second
loop circuit further including a second adjustable delay section to
receive the first clock signal and provide the first feedback clock
signal, wherein a delay of the second adjustable delay section is
controlled by the delay adjustment signal.
17. The integrated circuit memory device of claim 16, wherein the
second adjustable delay section includes a plurality of delay
elements, each delay element of the plurality delay elements to
provide a phase vector of a plurality of respective phase vectors,
wherein the second clock signal is selected from the plurality of
phase vectors, the selection circuitry is to select a pair of phase
vectors, of the plurality of phase vectors, that bracket a phase of
the external clock signal, and wherein the selection block further
includes interpolator circuitry to interpolate between the pair of
phase vectors and provide the second clock signal.
18. The integrated circuit memory device of claim 13, the first
loop circuit further including a buffer, wherein the buffer
includes duty cycle correction circuitry to correct a duty cycle of
the external clock signal.
19. The integrated circuit memory device of claim 13, the second
loop circuit further including a filter to filter a signal that is
representative of the phase difference so as to reduce loop jitter,
the filter selected from the group consisting of a
majority-detector filter and a unanimity-detector filter.
Description
BACKGROUND OF THE INVENTION
The present invention relates to clock delay adjustment circuitry.
In particular, the present invention relates to the generation of a
set of phase vectors and the generation of output clocks that have
precise phase relationships to an input clock.
Previous art includes Rambus patent, U.S. Pat. No. 5,485,490, Leung
and Horowitz, which discloses two independent loops, the first of
which creates a fixed number of phase vectors, the second of which
creates an output clock that is in phase with the input clock. Also
disclosed in this patent is the use of separate circuitry to create
a leading phase clock to the output clock by selecting a pair of
phase vectors and interpolating between them to produce an output
that leads the output clock by the delay between phase vectors
available from the first loop.
IEEE Journal of Solid-State Circuits, Vol. 29, No. 12, December
1994, Lee, et. al ("Lee") discloses a pair of delay-locked loops
(DLL) for transmitting and receiving data in DRAMs. IEEE Journal of
Solid-State Circuits, Vol. 31, No. 4, April 1996, Tanoi et. al.
shows a two-loop architecture in which an frequency locked-loop
(FLL) is designed to lock onto an external input frequency and to
control the DLL for lock-in to the phase of the external input
clock.
It is desirable to improve on the generation of a leading output
clock to the in phase output clock. There are several drawbacks to
the invention disclosed in U.S. Pat. No. 5,485,490. Phase locked
loop circuitry employing a VCO and single order loop filter to
create phase vectors is a second order system. This second order
system has stability problems associated with its operation.
Furthermore, the VCO phase lock loop accumulates phase error in
response to sudden change in phase on inputs to the loop, where the
input includes not only the input clock but also the power supplies
to the loop. This occurs because the loop changes the frequency of
the VCO in response to a sudden phase change and this frequency
shift is integrated to become phase error which persists for a time
on the order of the reciprocal loop bandwidth. (See Lee, above).
This causes the loop to be noise sensitive when the noise is in the
form of sudden phase shifts. Another drawback regarding the prior
art patent is that the subloop used for generating the in-phase
clock relies on the accuracy and similarity of a second phase
interpolator (out-of-phase phase interpolator) to produce the
leading clock. Any lack of matching between the out-of-phase phase
interpolator and the in-phase phase interpolator will create a
phase error in the desired phase relationship between the leading
clock and the in-phase clock. Another drawback concerns the
acquisition time of the VCO which can be quite long after
restoration of a lost input clock, depending on how long the input
clock has been absent.
SUMMARY OF THE INVENTION
The present invention provides delay locked loop circuitry for
generating a predetermined phase relationship between a pair of
clocks. A first delay-locked loop (DLL) includes delay elements
arranged in a chain, the chain receiving an input clock and
generating, from the delay elements, a set of phase vectors, each
shifted a unit delay from the adjacent vector. The first
delay-locked loop adjusts the unit delays in the delay chain using
a delay adjustment signal so that the phase vectors span a
predetermined phase shift of the input clock.
In a preferred embodiment, a second DLL is used, although the
second DLL could be used with another circuit which produces two
different delayed clock signals. The second DLL selects, from the
first DLL, a pair of phase vectors which brackets the phase of an
input clock. A phase interpolator receives the selected pair of
vectors and generates an output clock and a delayed output clock,
the amount of the delay being controlled by the delay adjustment
signal of the first delay-locked loop circuitry.
Preferably, a phase detector in the second DLL compares the delayed
output clock with the input clock and adjusts the phase
interpolator, based on the phase comparison, so that the phase of
the delayed output clock is in phase with the input clock. The
phase interpolator is preferably adjusted with a control circuit
including a digital memory for storing a count corresponding to the
delay adjustment, which can be maintained in the absence of the
input clock signal.
Preferably, the first DLL includes a control circuit with a digital
memory for providing the desired delay adjustment to the adjustable
delay elements. A filter is used between the phase detector and the
control circuit to reduce loop jitter.
The present invention is advantageously used for the transmit and
receive clocks in high speed DRAM and a high speed DRAM bus
channel.
Other objects, features, and advantages of the present invention
will be apparent from the accompanying drawings and from the
detailed description which follows below.
BRIEF DESCRIPTION OF THE DRAWINGS
The features and advantages of the present invention are
illustrated by way of example and are by no means intended to limit
the scope of the present invention to the particular embodiments
shown, and in which:
FIG. 1 shows a block diagram of a delay locked loop for generating
phase vectors, K<r:0>.
FIG. 2 shows a more detailed block diagram than FIG. 1 of a delayed
locked loop for generating phase vectors, K<r:0>, according
to one embodiment.
FIG. 3 shows a more detailed architecture than FIG. 2 of a delayed
locked loop for generating phase vectors, K<r:0>, according
to one embodiment.
FIG. 4 shows another embodiment of a delay locked loop for
generating phase vectors using buffered delay elements and a buffer
clock source.
FIG. 5 shows a block diagram of the architecture of a DLL for
generating an output clock in precise phase relationship with an
input clock according to one embodiment.
FIG. 6 shows a more detailed architecture than FIG. 5 of a DLL for
generating an output clock in precise phase relationship with an
input clock according to one embodiment.
FIG. 7 shows another embodiment of a DLL for generating an output
clock in precise phase relationship with an input clock using an
adjustable delay section in the path of both the output clock and
the feedback clock.
FIG. 8 shows another embodiment of an adjustable delay section
having one adjustable delay for use in FIG. 7.
FIG. 9 shows another embodiment of an adjustable delay section
having at least two adjustable delays for use in FIG. 7.
FIG. 10 shows an embodiment for producing a pair of delays from the
same chain for use in FIG. 7.
FIG. 11 shows a set of four phase vectors each separated by a 90
degree interval and spanning 360 degrees shift of the 0 degree
vector.
FIG. 12 shows a set of eight phase vectors each separated by a 45
degree interval and spanning 360 degrees shift of the 0 degree
vector.
FIG. 13 shows a set of 12 phase vectors each separated by a 30
degree interval and spanning 360 degrees shift of the 0 degree
vector.
FIG. 14 shows a set of four phase vectors each separated by a 90
degree interval and spanning 360 degrees shift of the 0 degree
vector, with the input clock and feedback clock between the 90 and
180 degree phase vectors and the output clock between the 0 and 90
degree vectors and 90 degrees earlier in time than the input
clock;
FIG. 15 depicts a case in which the input clock is between the 135
and 180 degree phase vectors, with the initially selected phase
vectors being the 0 and 45 degree vectors.
FIG. 16A shows an embodiment of a delay element for use in a delay
locked loop.
FIG. 16B shows another embodiment of a delay element for use in a
delay locked loop.
FIG. 17 shows an embodiment of a digital to analog converter for
use in a delay locked loop.
FIG. 18 shows an embodiment of a phase interpolator for use in a
delay locked loop.
FIGS. 19A and 19B show an embodiment of a duty cycle correcting
amplifier for use in a delay locked loop. FIG. 19A is the amplifier
in which the duty cycle is corrected and
FIG. 19B is the duty cycle error detecting circuit which applies a
correction signal to the amplifier in FIG. 19A.
FIG. 20 is a block diagram of a TrimAdj circuit for use in one
variation of the embodiment of FIG. 7.
FIG. 21 is a circuit diagram of one embodiment of a phase detector
as set forth in FIG. 6.
FIG. 22 is a block diagram of a DRAM system incorporating the
present invention.
DESCRIPTION OF THE PREFERRED EMBODIMENT
Embodiments of the present invention provide a method and circuitry
to generate a set of phase vectors in a way that is more immune to
noise on loop inputs including the power supplies, leading to a
more stable set of phase vectors. Also, an output clock that has a
predetermined phase relationship with an input clock is provided.
The effect of clock buffer delays between the input clock and
output clock is minimized. The delay of an adjustable delay element
is adjusted with a counter and a digital to analog converter, the
count in the counter digitally representing the current delay
adjustment of the delay locked loop. The digital count is converted
to a signal suitable for adjusting an adjustable delay element used
in a delay locked loop.
The setting of current delay adjustment of the loop is digitally
represented so that the setting may be stored while the loop is in
a powered-down or low power state. There is quick re-acquisition of
the locked state of a delay locked loop after the delay locked loop
has been powered down.
In one embodiment of the present invention a delay locked loop
(DLL) is employed for generating phase vectors. Referring to FIG.
1, the DLL 100 receives an external clock, ClkSrc 101, and
generates phase vectors, K<r:0> 103. A convenient way to
represent the set of phase vectors for a periodic signal is to draw
the vectors in phase space as in FIG. 11. In this figure there are
four vectors each spaced apart by 90 degrees and spanning a 360
degree phase shift of the 0 degree vector. Each vector in this
figure represents a time delay of one fourth of the cycle of the
periodic signal. FIGS. 12 and 13 show alternate sets of phase
vectors. FIG. 12 shows a set of vectors spaced at 45 degree
intervals and spanning a 360 degree phase shift of the 0 degree
vector. FIG. 13 shows a set of vectors spaced at 30 degree
intervals and spanning a 360 degree phase shift of the 0 degree
vector.
Referring to the embodiment shown in FIG. 2, the DLL 100 is a first
order loop comprising a set of adjustable delay section 110, a
control circuit 120 and a phase detector 130. The phase detector
130 receives the external clock, ClkSrc 150 from which it derives a
clock input ClkIn (not shown), a set of phase vector lines 140 and
the last phase vector K<r> on line 160. The output of phase
detector 130 is coupled to the control circuit 120 which processes
the output of the phase detector to generate a delay adjust signal
125 for adjusting the delay of the delay elements. The adjustable
delay elements are adjusted so that the phase of K<r> is the
same as the clock input, ClkIn.
FIG. 3 shows an embodiment of the DLL in more detail. In
particular, adjustable delay section 205 comprise a set of four
identical adjustable delay elements 210 connected in series with
the output of each delay element 210 except the last element
connected to the input of the next element 210. While four delay
elements are shown in the particular embodiment, any number such as
two, three, four, six, eight or twelve, can be used. This
arrangement produces a set of clocks, called phase vectors
K<r:0> 270, each shifted in time from the next by a delay,
called a unit delay, generated by the adjustable delay section 205.
Each adjustable delay element 210 receives the delay adjust signal
DlyAdj 260 from control circuit 230, comprising counter control
circuit 240 and digital to analog converter (DAC) 250. Counter
control circuit 240 receives an input, PhDiff 225, from phase
detector 220 and generates count Cnt<c:0> 245 for input to
the DAC. In one embodiment, control circuit 230 is implemented with
digital circuits to permit the storage of the current delay
adjustment setting of the loop, held by Cnt<c:0> 245, during
times when the ClkSrc 200 is not present, perhaps during a period
when the system is shut down to save power. The saved setting
permits the loop to quickly re-acquire a locked condition when the
ClkSrc is reactivated.
Continuing with FIG. 3, phase detector 220 receives as inputs ClkIn
215 derived from the ClkSrc 200 via buffer 202 and the last phase
vector K<r> 280. In another embodiment, buffer 202 performs
duty cycle correction as well as amplification to assure that ClkIn
215 has a 50% duty cycle. Duty cycle correction is discussed in
greater detail below.
In FIG. 3, adjustable delay element 210 may be implemented
according to the embodiment shown in FIG. 16A, which shows a delay
element 1010 and a bias circuit 1000. In FIG. 16A the delay element
is a differential delay element, having both true and complementary
inputs and outputs. The circuit operates to delay the differential
inputs IN 1005 and IN_B 1015 to produce delayed outputs Out 1130
and Out_B 1140. The amount of delay is adjusted by adjustable
current source 1020, which controls the amount of current switched
by differential pair 1100 and 1110. The greater the amount of
current switched the smaller delay produced by the differential
pair. Transistors 1080 and 1090 act as clamps to limit the swing of
the differential pair allowing small delays to be realized by the
circuit.
The adjustable delay element may also be implemented according to
the embodiment shown in FIG. 16B. In this figure section 1215
functions as a fixed delay comprising a current source 1260 and a
differential pair 1220 and 1230, and section 1225 operates as a
phase interpolator comprising differential pair 1330 and 1340 with
current source 1320 and differential pair 1290 and 1300 with
current source 1310 to produce a delay that is adjustable between a
stage delay to a fixed delay plus the stage delay. The stage delay
represents the fixed delay time through the interpolator stage
1225. The phase interpolator delay stage 1225 is adjusted by
varying the current sources Ix 1320 and Iy 1310. If Ix is at
maximum and Iy is turned off the output signals Out 1380 and Out_B
1370 are produced by transistors 1330 and 1340 in phase with the
input signals but delayed by the stage delay. If Iy 1310 is maximum
and Ix 1320 is off then the output signals Out 1380 and Out_B 1370
are produced by transistors 1290 and 1300 and are delayed by amount
of the fixed delay provided by the 1215 section plus the stage
delay. Therefore, the phase interpolator delay stage 1225 is
adjustable through a range of delay equal to the fixed delay of the
1215 section.
FIG. 3 depicts a DAC which may be implemented according to the DAC
shown in FIG. 17, which depicts a circuit for converting a digital
count Cnt<c:0> 1510 and its complement Cnt_B<c:0> 1500
to a differential current pair, Ictl 1640 and Ictl_B 1590
proportional to the count. FIG. 17 shows three sections of
circuitry, a set of binary weighted current sources 1520, a set of
switches 1540 for producing the true current output Ictl 1640 and a
set of switches 1530 for producing the complement output Ictl_B
1590. If the count input Cnt<c:0> 1510 is all ones then Ictl
1640 has a maximum current, Max_I, which is the sum of all of the
current sources 1650, 1660, 1670 through 1680 and the complementary
current Ictl_B is zero. If the count input Cnt<c:0> 1510 is
all zeros then Ictl_B 1590 has the maximum current, Max I, and Ictl
is zero. Intermediate counts produce intermediate amounts of
current, Im, and (Max_I-Im) on Ictl and Ictl_B respectively. This
DAC is suitable for controlling the differential input delay adjust
signals of the adjustable delay element 210 shown in FIG. 16B for
the delay locked loop shown in FIG. 3.
The system shown in FIG. 3 operates as follows. Phase detector 220
compares the ClkIn signal, with the last phase vector K<r>
280 to determine the phase difference from a predetermined phase
relationship-between the two clocks. In one embodiment the
predetermined phase difference could be zero degrees. In another
embodiment the predetermined phase difference could be 180 degrees.
The phase difference is represented by signal PhDiff 225. Counter
control block then converts the PhDiff signal into a digital count,
Cnt<c:0> 245, and DAC 250 converts the count value into an
analog quantity, DlyAdj 260, for adjusting the adjustable delay
elements. In some embodiments the Cnt<c:0> signal and the
DlyAdj signal may be differential signals. The delay adjustment
operates to change the delay of the adjustable delay elements so
that the phase difference from the predetermined phase relationship
between clock input, ClkIn and K<r> is made close to zero.
When this condition occurs the DLL is locked, and each adjustable
delay element has substantially the same delay. Thus each phase
vector is displaced in time from the adjacent vector by an amount
equal to the setting of the adjustable delay element. This time
displacement is termed a unit delay. The result is that the phase
vectors span a 360 degree phase shift of the ClkIn signal 215.
These phase vectors can now be used in another DLL to lock the
phase of an output clock in precise phase relationship to the
arbitrary phase of an input clock.
For FIG. 3, an alternate embodiment could use fewer delay elements
to produce phase vectors that span the 360 degree phase shift of
the ClkIn if each delay element, such as the ones depicted in FIGS.
16A and 16B, can produce both true and complementary outputs. For
example, instead of using four delay elements each separated by 90
degrees, two delay elements separated by 90 degrees could be used
if the delay element had true outputs yielding delays of 90 and 180
degrees and complementary outputs yielding 270 and 360 degrees,
respectively. Alternatively, fewer delay elements could be used if
the phase detector were designed to detect phase differences from a
predetermined phase relationship of 180 degrees. Using such a phase
detector would only require that two delay elements be used
spanning a 180 degree phase shift of the ClkIn signal. The outputs
of the delay elements could be inverted in a separate circuit which
receives the phase vectors, so that a set of phase vectors spanning
360 degrees is obtained. For embodiments in which the phase shift
of the ClkIn signal spans only 180 degrees buffer 202 may perform a
duty cycle correction function to assure that the ClkIn signal 215
has a 50% duty cycle. This is especially important when the
remaining span of 180 degrees is derived through inversion of the
phase vectors spanning the first 180 degrees, because inversion
will not generate the proper phase shift if the duty cycle is not
substantially close to 50%.
Referring the embodiment in FIG. 4, an additional adjustable delay
element has been placed in the circuit to receive the last phase
vector. This additional delay has the effect of insuring that each
phase vector has the identical loading as the other phase vectors,
so that phase errors caused by loading differences are
substantially eliminated. Rather than connecting the delay adjust
signal 265 to the DlyAdj signal 260, signal 265 may be connected to
a convenient voltage, because the output of the additional delay is
not used. This eliminates some of the loading on the DlyAdj signal
260.
Continuing with the embodiment of FIG. 4, phase vectors 275 are
buffered by buffers 212 in order to further control the loading on
the vectors by isolating the loading of the phase vectors from
other circuits which may receive the vectors. A buffered version of
ClkIn 215 and a buffered version of the last phase vector
K<r> 285 are sent to the phase detector. This guarantees that
buffered version of the phase vectors K<r:0> 275 are
separated in phase by a unit delay and that the set of buffered
phase vectors span a 360 degree or 180 degree shift of the buffered
ClkIn signal depending upon the embodiment chosen.
Also shown in FIG. 4 is a version of buffer 202 which has a duty
cycle correcting circuit 290 attached. The duty cycle correcting
circuit 290 senses signal 214 for a deviation from a 50% duty
cycle. It then feeds a correction signal to buffer 202 to correct
signal 214. In some embodiments signal 214 is a differential signal
and the error signal 295 is a differential signal.
An embodiment of a duty cycle correcting amplifier is shown in
FIGS. 19A and 19B. FIG. 19A shows the correcting stage 2005 and the
buffering stage 2055 and FIG. 19B shows the duty cycle error
detecting stage 2215. In FIG. 19A differential pair 1960 and 1970
receive the input clock differential on In+ 1920 and In- 1930 and
produce a differential output clock on Corr Clock_B 2090 and Corr
Clock 2100. If the duty cycle deviates from 50% then the circuit
shown in FIG. 19B will produce a differential error voltage signal
pair Error+ 2300 and Error- 2200 from the differential pair 2230
and 2250 and capacitor 2260 acting as an integrator. Transistors
2220, 2280, 2290 and 2270 function as a load element especially
suited for controlling the charge leakage across integrating
capacitor 2260. The differential error voltage signal pair is fed
back to the correcting stage 2005 such that the duty cycle error in
the Corr Clock and Corr Clock_B signals is reduced by altering
currents 2110 and 2120 depending on the polarity of the error.
Thus, the output of the buffering stage 2055 is a clock having a
duty cycle substantially close to 50%.
In FIG. 4, as in FIG. 3, phase detector 220 compares the ClkIn
signal, with the last phase vector K<r> 280 to determine the
phase difference from a predetermined phase relationship between
the two clocks, and signal PhDiff 225 represents that difference.
In FIG. 3, PhDiff signal 225 contains random variations due to the
instantaneous phase error which, when used directly by counter
control 240, causes an amount of overall loop jitter, thus
affecting the stability of the phase vectors. In FIG. 4, the amount
of jitter is reduced by filtering the PhDiff signal before
converting it to DlyAdj signal 260. Shown in FIG. 4 is an
embodiment in which control circuit 230 includes filter 235 in
addition to counter control 240 and digital to analog converter
(DAC) 250. Filter circuit 235 receives an input, PhDiff 225, from
phase detector 220 and CntClk 241 from buffer 238 and generates
output PhDiffF 237 for input to the counter control 240, which
receives CntClk 241 and generates count Cnt<c:0> 245 for
input to DAC 250. In an embodiment in which the PhDiff signal is a
digital signal, a digital filter is used, but either analog or
digital filtering may be employed. CntClk 241 operates the
circuitry in both filter 235 and counter control 240. Buffer 238 is
employed when ClkSrc is a small swing signal but counter control
240 and filter 235 require a full swing signal.
Types of digital filters that can be employed to reduce loop jitter
include a majority-detector filter or an unanimity-detector filter.
In either filter type, CntClk 241 operates circuitry which samples
and stores the state, either true or false, of PhDiff 225. A
majority-detector filter saves the last N samples, where N is an
odd number, of PhDiff signal 225 and determines whether a majority
of the last N cycles, say 3 out of 5 (N), are the same. If so, then
the majority-detector filter activates PhDiffF 237 to alter the
count in counter control 240. This type of filter alters the count
in counter control 240 on every sample because there is always a
majority of true or false samples. An unanimity-detector filter
also records the last N samples, where N can be even or odd, of the
PhDiff signal but instead determines whether all N cycles are the
same. If all samples are the same, the unanimity-detector filter
activates the PhDiffF signal 237 to alter the count and at times
during which not all the samples are the same, the PhDiffF signal
will not be activated to alter the count. Both types of filters
have the effect of reducing loop jitter, and either type may be
used.
Turning now to FIG. 5, a pair of delay locked loops is depicted for
generating an output clock having predetermined phase relationship
to an input clock. The first delay locked loop 320 is one which
generates phase vectors K<r:0> 330 from a clock source ClkSrc
300 as described above. The phase vectors and the DlyAdj signal 340
are then used by a second delay locked loop 350 to create a precise
phase relationship between input clock 310 and output clock
360.
FIG. 6 shows an embodiment of the loop of FIG. 5 in more detail.
First loop 400 is the phase vector loop which receives ClkSrc 410
and generates phase vectors K<r:0> 430 and DlyAdj signal 440.
The second loop 500 is the loop for creating the phase relationship
between the input clock 650 and output clock 640. Loop 500
comprises a selection circuitry 510, phase interpolator 560,
adjustable delay section 610 which represents an integer multiple
of adjustable delay elements, clock buffers 620 and 630, control
circuit 570 and phase detector 590.
In FIG. 6, selection circuitry 510 receives the phase vectors 430
and passes along a selected pair of vectors Kx 520 and Ky 530,
which are received by phase interpolator 560. The phase
interpolator generates an interpolated output clock 615 which is
buffered by clock buffer 620 to become the output clock 640.
Adjustable delay section 610 also receives output clock 615 and
feeds the delayed clock to clock buffer 630 to generate FdBkClk
600. Control circuit generates PhAdj signal 550 for controlling the
interpolator 560. Control circuit 570 receives phase difference
information, PhDiff 580, from phase detector 590, which detects the
difference in phase between the input clock 650 and FdBkClk 600. As
described previously, control circuit 570 may comprise counter
control 240 and DAC 250 such as in FIG. 3, to enable the saving of
the setting of the current phase adjustment of the loop or filter
235, counter control 240 and DAC 250 as in FIG. 4 to additionally
reduce loop jitter.
Selection circuitry 510 may be implemented as an analog or digital
set of switches comprising a multiplexer, depending upon whether
the phase vectors are low swing or full swing signals. Phase
interpolator 560 may be implemented as shown in FIG. 18.
Alternately, selection circuitry 510 may be merged or combined with
interpolator 560, shown in FIG. 6 as block 562. In some embodiments
when selection circuitry is combined with the phase interpolator,
the circuit shown in FIG. 18 is duplicated several times, each
duplicate connected to a different set of switches for applying a
particular phase vector to the interpolator.
The operation of the circuit of FIG. 18 is substantially similar to
the circuit shown in FIG. 16B. Differential pair 1800 and 1810
receive one of the selected phase vectors Kx 1700 and Kx_B 1740
which is the complement of the Kx signal. Kx and Kx_B may be
generated from a delay element having differential outputs as shown
in FIG. 16A or 16B. Differential pair 1820 and 1830 receive the Ky
1710 phase vector and the Ky_B 1750 complementary phase vector. The
phase interpolator functions as a weighted integrator using
capacitors C1 1760 and C2 1770 and coincidence detector 1860. If
Ictl 1720 is set at a maximum value and Ictl_B 1730 is zero then
the output signal PIout 1870 is in phase with the Kx clock but
delayed by a stage delay through the interpolator. If Ictl_B 1730
is set a maximum value and Ictl 1720 is zero then the output signal
is in phase with the Ky clock but delayed by a stage delay. By
adjusting the values of adjustable currents 1720 and 1730 any delay
between Kx and Ky may be achieved.
The operation of loop 500 in FIG. 6 is as follows. Phase detector
590 determines what the difference in phase, if any, is between the
input clock 650 and FdBkClk 600. This difference is then processed
by control circuit 570 to select a pair of phase vectors via
selection circuitry 510. The chosen pair of vectors is that pair
between which the phase of input clock 650 lies, after accounting
for fixed delays inherent in circuits in the path of the FdBkClk
signal such as the phase selector, phase interpolator, adjustable
delay section and clock buffer. An example of a pair of vectors
meeting this requirement is shown in FIG. 14, in which the input
clock is shown between the 90 degree and 180 degree vectors and at
a delay of alpha degrees from the 180 degree vector. If the
starting pair of vectors is not the correct pair then the control
circuit steps through the pairs of vectors one step at a time until
the correct pair is discovered. FIG. 15 depicts a circumstance in
which the stepping of several phase vectors must occur if loop 500
starts in the 0 degree state before the correct pair is discovered.
When the first pair of vectors, 0 and 45 degrees, is selected, the
phase interpolator 560 is adjusted so that the phase interpolator
output 615 is in phase with the 45 degree vector. While in this
condition the 0 degree vector is replaced with the 90 degree vector
by the control circuit and selection circuitry. Next, the phase
interpolator is adjusted to produce an output in phase with the 90
degree vector and the 45 degree vector is replaced with the 135
degree vector. The phase interpolator is then adjusted to produce
an output in phase with the 135 degree vector. Finally, the control
circuit replaces the 90 degree vector with the 180 degree vector.
Thus, while this stepping occurs phase interpolator generates an
output clock 615 which is in phase with one of the selected
vectors, in particular, the one that will not be switched in
selecting a new pair of vectors. The constraint that the
interpolator generate the output clock in phase with the
non-switched vector prevents the output clock from glitching during
the stepping process. When the correct pair of vectors is
determined by the loop then the phase interpolator is allowed to be
adjusted by PhAdj signal 550 to precisely align the delayed output
FdBkClk 600 to the phase of the input clock 650, which is at some
phase, alpha degrees, (FIG. 14) from one of the selected phase
vectors. When this occurs the loop is locked. FdBkClk 600 is
delayed by at least one unit delay from adjustable delay section
610, the unit delay being precisely a delay between the any two
adjacent phase vectors 430 from the first loop because it is
adjusted by the same DlyAdj 440 signal of the first loop. Thus, if
the phase vectors from the first loop differ from each other by 90
degrees, then the unit delay is 90 degrees and the FdBkClk is
delayed 90 degrees from the output of the phase interpolator 615,
assuming one delay element in block 610. FIG. 14 shows this
condition.
It will be noted that not only is a unit delay included in the
feedback path of the second loop but so are the clock buffer and
other fixed delays inherent in the phase selector and phase
interpolator. Clock buffers 620 and 630 are matched buffers having
the same physical construction. FdBkClk is thus delayed by an
amount equal to a unit delay and a clock buffer delay plus the
other fixed delays from the phase selector and phase interpolator.
However, because the output clock 640 is delayed by the same amount
of fixed delays, the clock buffer delays and fixed delays cancel
and the difference between the output clock 640 and the input clock
650 is only the unit delay.
It should be noted that adjustable delay section 610 could comprise
an integer multiple of unit delays, in which case the delay between
the input clock 650 and output clock 640 would then be the integer
multiple of unit delays. For example, if the multiple of the unit
delay is 3 and the value of the unit delay 10 degrees then the
output Clock would lead the input Clock by 30 degrees. If the
multiple of the unit delay is zero, then the input clock and output
clock would be in phase.
FIG. 7 is an alternate embodiment showing adjustable delay section
612 in the path of the output clock 640. This section has the same
implementation as the section in the path of the FdBkClk 600 and
provides a way for the output clock signal 640 to not only lead the
input clock in phase but to lag it in phase. This latter condition
occurs when the adjustable delay section 612 comprises a larger
multiple of unit delays than adjustable delay section 610.
Adjustable delay sections 612 and 610 may be implemented in a
fashion similar to section 206 in FIG. 4 in order to insure that
phase errors due to loading differences are minimized. The delay
circuits shown in FIGS. 16A and 16B are suitable for implementing
an adjustable delay element employed in the adjustable delay
section 610 or 612. FIG. 7 also shows that buffers 620 and 630 may
be implemented as duty cycle correcting amplifiers with the aid of
duty cycle correction circuit 670. Buffers 620 and 630 may be
implemented according to the circuitry shown in 19A and duty cycle
correction circuit 670 may be implemented as shown in FIG. 19B.
Finally, FIG. 7 shows three more inputs, Fast 575, Test 585 and
ExtIn 595, to the control circuit 570. In one embodiment Fast
signal 575 is used to alter the control circuit so that the loop
can lock more quickly by taking larger phase adjustments toward the
lock condition. In an embodiment in which the control circuit 570
is implemented as a counter, the Fast signal 575 can cause the
counter to count by a multiple of the smallest step between counts.
The Test signal 585 is used to allow the control circuit to be
under the control of external signal ExtIn 595 rather than PhDiff
580 derived from the loop. This allows loop properties to be tested
more easily.
FIG. 8 shows one embodiment of adjustable delay section 612. Block
612 comprises a buffer 702, similar to 202 in FIG. 4, an adjustable
delay element 710 similar to adjustable delay element 210 in FIG.
4, and an output buffer 712 similar to the 212 buffer in FIG. 4.
FIG. 9 shows an embodiment of adjustable delay section 610. This
figure is similar to FIG. 8 but has more adjustable delay elements,
but is still buffered at the front of the chain and has an
additional delay element at the end of the chain. The adjustable
delay sections in both FIG. 8 and FIG. 9 are controlled from an
external delay adjust signal such as 441 as shown in FIG. 7, such
that the setting produces a delay equal to the delay between phase
vectors. If the adjustable delay sections are implemented in this
fashion, loading differences are kept to a minimum and only the
desired phase difference between signal 617 and 618 is generated.
As may be easily seen it is not necessary that adjustable delay
sections 610 and 612 be implemented as two separate and distinct
sections. It is convenient in some embodiments to derive 617 and
618 from the same section 625 as shown in FIGS. 7 and 10. The delay
adjust signal 441 in FIG. 7 is buffered by buffer 442, in some
embodiments, to isolate the loading effects of sections 610 and 612
from section 420.
FIG. 20 discloses circuitry for biasing the predetermined phase
relationship between the input clock and the output clock with a
fixed offset. The fixed offset is necessary when system
requirements dictate that the predetermined phase relationship be
altered by an amount that is smaller than is available from a unit
a delay, for example a one degree phase shift. This fine tuning or
trimming is accomplished by the TrimAdj signal 2300 which is
combined with the DlyAdj signal 441 in FIG. 7. The TrimAdj signal
2300 adds a small amount of adjustment current to the adjustable
delay sections 610 and 612. This causes the delay elements in those
sections to have a delay that is slightly smaller or larger than
the unit delay provided by the delay adjustment signal from the
loop which generates the phase vectors. For example, if the delay
elements in 610 and 612 are increased by one degree and the unit
delay is 90 degrees than each delay element has a delay of 91
degrees. Because the delay between the input clock and the output
clock is the difference in delay between the path of the output
clock and the path of the feedback clock, the output clock is now
91 degrees ahead of the input clock. In FIG. 20, the TrimAdj signal
2300 is derived from DAC 2310 and trim word storage 2320. Trim word
storage in some embodiments is a set of fuses or other permanent
storage for holding a digital code TW<t:0> 2330 for setting
the trim delay. DAC 2310 converts the trim word 2330 to an analog
signal such as a current for controlling the delay elements in
sections 610 and 612.
FIG. 21 is a circuit diagram of a phase detector circuit which
could be used for the phase detector of FIGS. 2, 3, 4, 6 and 7. A
clock input 2530 is shown, and data input 2540 would correspond to
the feedback clock or phase vector. Output 3000 is the phase
difference signal provided to the control circuit. The phase
detector is implemented as three blocks 2500, 2510, and 2520
connected in flip-flop fashion using NAND gates 2550, 2560, 2570,
2580, 2590, and 2595.
FIG. 22 shows a system application for the delay locked loops of
the present invention. In the case shown, master device 3100
communicates with slave device 3110 or slave device 3120. Slave
devices 3110 or 3120 may communicate with master device 3100 but
not with each other. The system operates from a pair of clocks
generated from oscillator 3170 which generates CTM (Clock To
Master) 3140 and CFM (Clock From Master) 3130. CTM travels in the
direction from the slave device to the master device and is used
for transmitting data to the master on data bus 3150. In the
master, CTM is looped back to generate CFM which travels in the
direction from master to slave device and is used for transmitting
data from the master to the slave device. Each device, master or
slave, has a data receiver Rcvr 3180 and a data transmitter Txmtr
3190 for receiving and sending data respectively. The Rcvr 3180
uses a signal rclk 3220 to receive the data from the data bus and
Txmtr 3190 uses tclk 3230 to transmit the data onto the data bus.
Signals rclk and tclk are generated from a pair of delay locked
loops 3200 and 3205 in the slave and from a single delay locked
loop 3235 in the master, because the master makes no distinction
between CTM and CFM.
In FIG. 22 DLLR 3210 is the delay locked loop for generating the
phase vectors and is called the reference loop. Each device uses a
single DLLR loop. DLLF 3200 is the delay locked loop for generating
a predetermined phase relationship between the input clock and the
output clock. The DLLF 3200 loop is used to generate a 90 degree
phase relationship between CTM and tclk, because data is always
transmitted in quadrature to the receive clock. The DLLF 3205 is
used to generate a zero degree phase relationship between CFM and
rclk. Thus, when a slave sends data to the master, the data changes
occur 90 degrees out of phase with the CTM clock, the clock
traveling toward the master. The master receives the clock CTM and
generates the rclk signal for operating its receiver. Signal rclk
in the master is in a 0 degree phase relationship with CTM so that
the data is sampled when it is not changing. Similarly, when the
master sends data to a slave, it clocks its transmitter changing
the data on the data bus with tclk which is in a 90 degree phase
relationship with the CFM. A slave 3110 receiving the data in its
receiver 3180 operates its receiver using rclk which has a 0 degree
phase relationship with the CFM. Thus, the receiver will sample the
data when it is not changing. In this manner, data may be
transmitted using both edges of the CTM or CFM clocks and safely
sampled in the receiver.
In one embodiment, the master of FIG. 22 is an intelligent device,
such as a microprocessor, an application specific integrated
circuit (ASIC), a memory controller, or a graphics engine. The
slave devices may be DRAMs, SRAMs, ROMs, EPROMs, flash memories, or
other memory devices.
In the foregoing specification the invention has been described
with reference to specific exemplary embodiments thereof. It will,
however, be evident that various modifications and changes may be
made thereto without departing from the broader spirit and scope of
the invention. The specification and drawings are, accordingly, to
be regarded in an illustrative rather than restrictive sense.
* * * * *