U.S. patent application number 16/417827 was filed with the patent office on 2019-09-05 for delay modulated clock division.
The applicant listed for this patent is TEXAS INSTRUMENTS INCORPORATED. Invention is credited to Nagalinga Swamy Basayya AREMALLAPUR, Jaiganesh BALAKRISHNAN, Shagun DUSAD, Sarma Sundareswara GUNTURI, Srinivas Kumar Reddy NARU, Visvesvaraya PENTAKOTA.
Application Number | 20190273601 16/417827 |
Document ID | / |
Family ID | 67069469 |
Filed Date | 2019-09-05 |
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United States Patent
Application |
20190273601 |
Kind Code |
A1 |
BALAKRISHNAN; Jaiganesh ; et
al. |
September 5, 2019 |
DELAY MODULATED CLOCK DIVISION
Abstract
A clock divider comprises a clock delay line that comprises a
plurality of delay elements, a clock delay selector coupled to the
clock delay line and configured to select one of the plurality of
delay elements and a bit pattern source coupled to the clock delay
selector. The clock delay line is configured to generate a
modulated divided clock signal with a suppressed fundamental
spectral component.
Inventors: |
BALAKRISHNAN; Jaiganesh;
(Bangalore, IN) ; DUSAD; Shagun; (Bangalore,
IN) ; PENTAKOTA; Visvesvaraya; (Bangalore, IN)
; NARU; Srinivas Kumar Reddy; (Markapur, IN) ;
GUNTURI; Sarma Sundareswara; (Bangalore, IN) ;
AREMALLAPUR; Nagalinga Swamy Basayya; (Bangalore,
IN) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
TEXAS INSTRUMENTS INCORPORATED |
Dallas |
TX |
US |
|
|
Family ID: |
67069469 |
Appl. No.: |
16/417827 |
Filed: |
May 21, 2019 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
15906000 |
Feb 27, 2018 |
10341082 |
|
|
16417827 |
|
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
H04B 1/16 20130101; H04L
7/0037 20130101; H04L 9/3247 20130101; H04L 7/0087 20130101; H03K
5/14 20130101; H04B 1/0007 20130101; H03K 2005/00019 20130101 |
International
Class: |
H04L 7/00 20060101
H04L007/00; H03K 5/14 20060101 H03K005/14 |
Claims
1. A clock divider, comprising: a clock delay line comprising a
plurality of delay elements; a clock delay selector coupled to the
clock delay line and configured to select one of the plurality of
delay elements; and a bit pattern source coupled to the clock delay
selector, wherein the clock delay line is configured to generate a
modulated divided clock signal with a suppressed fundamental
spectral component.
2. The clock divider of claim 1, wherein the bit pattern source is
a bit pattern generator.
3. The clock divider of claim 1, wherein the bit pattern source is
a bit pattern storage element configured to store a pre-defined bit
pattern.
4. The clock divider of claim 1, further comprising a second bit
pattern source and a multiplexer, wherein the bit pattern source is
coupled to a first input of the multiplexer, the second bit pattern
source is coupled to a second input of the multiplexer, and an
output of the multiplexer is coupled to the clock delay
selector.
5. The clock divider of claim 1, wherein the clock delay line is
configured to: receive a division factor and a clock signal;
receive a delay element selection signal from the clock delay
selector; and modulate the clock signal according to the clock
delay selector to form the modulated divided clock signal with the
suppressed fundamental spectral component.
6. The clock divider of claim 5, wherein the clock delay selector
generates the delay element selection signal according to one or
more bits of a binary sequence received from the bit pattern
source.
7. A radio frequency (RF) sampling receiver, comprising: a RF
sampling analog-to-digital converter (ADC) configured to sample an
RF signal at a sampling rate to form a sampled signal; a clock
generator coupled to the RF sampling ADC and configured to generate
a root clock signal at the sampling rate for use by the RF sampling
ADC in sampling the RF signal; a clock divider configured to divide
the root clock signal according to delay modulated clock division
to form a modulated divided clock signal; and digital logic coupled
to the RF sampling ADC and the clock divider and configured to
process the sampled signal at a frequency of the modulated divided
clock signal.
Description
CROSS REFERENCE TO RELATED APPLICATION(S)
[0001] This continuation application claims priority to U.S. patent
application Ser. No. 15/906,000, filed Feb. 27, 2018, which
application is hereby incorporated herein by reference in its
entirety.
SUMMARY
[0002] According to aspects of the disclosure, a clock divider
comprising a clock delay line comprising a plurality of delay
elements, a clock delay selector coupled to the clock delay line
and configured to select one of the plurality of delay elements,
and a bit pattern source coupled to the clock delay selector. The
clock delay line is configured to generate a modulated divided
clock signal with a suppressed fundamental spectral component.
[0003] In other aspects of the disclosure, a radio frequency (RF)
sampling receiver comprising a RF sampling analog-to-digital
converter (ADC) configured to sample an RF signal at a sampling
rate to form a sampled signal. The RF sampling receiver further
comprises a clock generator coupled to the RF sampling ADC and
configured to generate a root clock signal at the sampling rate for
use by the RF sampling ADC in sampling the RF signal. The RF
sampling receiver further comprises a clock divider configured to
divide the root clock signal according to delay modulated clock
division to form a modulated divided clock signal. The RF sampling
receiver further comprises digital logic coupled to the RF sampling
ADC and the clock divider and configured to process the sampled
signal at a frequency of the modulated divided clock signal.
[0004] In other aspects of the disclosure, a method comprising
generating a modulated divided clock signal with a rising edge
delay of 0 for a first number of clock cycles, receiving a binary
sequence, and determining whether a first bit of the binary
sequence is a 1. The method further comprises generating the
modulated divided clock signal with a rising edge delay of 0 for
the first number of clock cycles when the first bit of the binary
sequence is not a 1, generating the modulated divided clock signal
by increasing the rising edge delay by an amount .tau..sub.high for
each clock cycle with respect to a previous clock cycle such that
the clock period is 8T-.tau..sub.high for a second number of clock
cycles when the first bit of the binary sequence is a 1, and
generating the modulated divided clock signal with a rising edge
delay of 4T for a third number of clock cycles subsequent to an end
of the second number of clock cycles, wherein T is a period of a
root clock on which the modulated divided clock signal is at least
partially based. The method further comprises determining whether a
second bit of the binary sequence is a 0, generating the modulated
divided clock signal with a rising edge delay of 4T for the fourth
number of clock cycles when the second bit of the binary sequence
is not a 0, generating the modulated divided clock signal by
decreasing the rising edge delay by an amount .tau..sub.low for
each clock cycle with respect to another previous clock cycle such
that the clock period is 8T-.tau..sub.low for a fifth number of
clock cycles when the second bit of the binary sequence is a 0, and
generating the modulated divided clock signal with a rising edge
delay of 0 for a sixth number of clock cycles subsequent to an end
of the fifth number of clock cycles.
BRIEF DESCRIPTION OF THE DRAWINGS
[0005] For a detailed description of various examples, reference
will now be made to the accompanying drawings in which:
[0006] FIG. 1 shows a block diagram of an illustrative radio
frequency (RF) sampling receiver;
[0007] FIG. 2 shows a block diagram of an illustrative clock
divider;
[0008] FIG. 3 shows an illustrative waveform of clock signals in a
clock divider; and
[0009] FIG. 4 shows a flowchart of an illustrative method of delay
modulated clock division.
DETAILED DESCRIPTION
[0010] In some examples, an RF sampling receiver is implemented
(such as in a wireless base station receiver) to sample a received
RF signal directly with a high-speed RF sampling analog-to-digital
converter (ADC). The sampling is performed, for example, utilizing
digital down-converters (DDC) and without utilizing mixers in the
RF or analog domains, thereby facilitating simultaneous (or
substantially simultaneous) multi-band reception of RF signals by
the RF sampling receiver. In some examples, the RF sampling
receiver has strict performance requirements, such as spurious-free
dynamic range (SFDR) performance, spectral density performance,
etc.
[0011] In at least one example, the RF sampling receiver includes
both the RF sampling ADC as well as additional digital logic and/or
modules that further process the RF signal after conversion to the
digital domain by the RF sampling ADC. In some examples, a sampling
rate (fs) of the RF sampling ADC is large (e.g., on an order of
giga-samples per second) while the remaining digital logic operates
at a slower rate such as, in one example, a frequency of fs/8
(which in some examples is derived by dividing another clock having
a frequency of fs/4). Simply dividing a clock signal that is
provided to the RF sampling ADC to sample the RF signal at fs to
form a divided clock (e.g., the fs/8 clock), in some examples,
results in clock mixing spurs in an output of the RF sampling ADC.
For example, when the digital logic is clocked at a particular
frequency (e.g., fs/8), the digital operations of that digital
logic occur with a periodicity corresponding to a clock period of
8T, where T is a period of the clock signal that is provided to the
RF sampling ADC. This periodic activity couples to the analog
circuitry and, in some circumstances, disturbs the clock signal
received by the RF sampling ADC. In various example, the
disturbance includes spurious components at multiples of fs/8. If
the digital logic is clocked at a higher frequency of fs/4 (having
a periodicity of 4T, where T=1/fs), the spurious component at
frequency fs/8 is not present. However, such a higher clocking of
the digital logic would require the digital logic to be synthesized
at twice the original clock frequency. This doubling of synthesis
frequency, in at least some examples, increases a size (e.g., area)
of the digital logic, increase power consumed by the digital logic,
and/or prevent a timing closure of the digital logic resulting in
the digital logic being non-realizable. In at least one example,
when the digital logic toggles on a clock edge, the spurious
component (e.g., a clock mixing spur) occurs in the analog domain.
For example, for an RF signal having a frequency of fin, the
digital logic toggles result in spurious frequency components at
frequencies of fin.+-.fs/8, fin.+-.fs/4, fin.+-.2fs/8,
fin.+-.3fs/8, fin.+-.2fs/4, etc. in the RF signal. In at least one
example, these spurious frequency components limit SFDR performance
and/or adversely affect an output of the RF sampling ADC.
[0012] At least some aspects of the present disclosure provide for
a delay modulation clock division to generate a divided digital
clock. In at least one example, a delay modulated divided clock is
generated to have an average frequency of fs/8. In at least one
example, the modulation of the delay modulated clock signal
modulates the clock signal delay between 0 and 4T for the delay
modulated divided clock such that edges of the delay modulated
clock signal align with both the odd and even edges of a fs/4
digital clock across time. In this way, the digital operations of
that digital logic clocked by the delay modulated clock signal
occur at both the odd and even edges of the fs/4 digital clock,
thereby mitigating spurious components that occur at a frequency of
fs/8. This alignment of clock edges is further illustrated and
described below with respect to FIG. 3. The delay modulation clock
division, in at least some examples, mitigates spurious frequency
components (e.g., clock mixing spurs) resulting from digital logic
operating at a divided clock rate, as discussed above. In at least
one example, a clock divider circuit implements the delay
modulation clock division. In various examples, the clock divider
circuit is implemented in a receiver, an RF sampling receiver, or
any other digital device that is susceptible to clock mixing spurs.
In at least one example, the delay modulation clock division is
performed (for a divided clock frequency of fs/8) to mitigate clock
mixing spurs at fs/8 frequencies for frequencies lower than fs such
that the clock mixing spurs only remain at fs/4 frequencies. While
illustrated and discussed herein for the sake of simplicity and
ease of understanding as mitigating spurious components at fs/8
frequencies, at least some aspects of the present disclosure are
equally applicable to mitigating spurious components at other
frequencies. For example, at least some aspects of the present
disclosure provide for implementing a clock division factor of n to
mitigate fs/n spurious components such that delay modulation
according to the present disclosure spans a range of 0, T, 2T, . .
. , (n-1)T.
[0013] Referring now to FIG. 1, a block diagram of an illustrative
RF sampling receiver 100 is shown. In at least one example, the RF
sampling receiver 100 includes a first RF sampling ADC 105, a
second RF sampling ADC 110, a clock generator 115, a clock divider
120, and digital logic 125. In at least one example, the clock
divider 120 implements delay modulation clock division as described
in the present disclosure. In various examples, the digital logic
125 includes any one or more digital logic components or devices
suitable for processing a RF signal converted into the digital
domain, the scope of which is not limited herein. In at least one
example, the digital logic 125 includes parallel paths coupled to
each of the first RF sampling ADC 105 and the second RF sampling
ADC 110. In at least one example, the parallel paths include
(although not shown) any one or more of a digital down-conversion
(DDC) mixer, a digital filter, a digital re-sampler, and/or a
digital automatic gain control (AGC), and a scope of the digital
logic and/or the parallel paths is not limited herein.
[0014] In at least one example, the first RF sampling ADC 105 and
the second RF sampling ADC 110 operate at a first sampling rate and
the digital logic 125 operates at a clock frequency less than fs
(e.g., a divided clock). In at least one example, the clock
generator 115 generates a first clock signal (CLK) at a frequency
of fs and the clock divider 120 generates the divided clock based
at least partially on CLK. In at least one example, the clock
generator 115 further generates a partially divided clock based on
CLK and the clock divider 120 generates the divided clock based at
least partially on the partially divided clock. In at least one
example, the first RF sampling ADC 105 and the second RF sampling
ADC 110 are replaced and/or supplemented (e.g., combined) with a
first RF sampling digital to analog converter (DAC) (not shown) and
a second RF sampling DAC (not shown) such that the RF sampling
receiver 100 is instead an RF sampling transmitter (not shown)
and/or an RF sampling transceiver (not shown). The first RF
sampling DAC and the second RF sampling DAC, in at least one
example, convert a digital signal received from the digital logic
125 to a RF signal, at least partially according to the first
sampling rate based on the first clock signal, for
transmission.
[0015] Referring now to FIG. 2, a block diagram of an illustrative
clock divider 200 is shown. In at least one example, the clock
divider 200 is suitable for implementation as the clock divider
120, as discussed above with respect to FIG. 2. In another example,
the clock divider 200 is suitable for implementation in any device
in which a root clock signal is generated and one or more other
clock signals are generated at least partially based on the root
clock signal (e.g., by dividing the root clock signal to form the
one or more other clock signals, for example, at least partially
based on the clock divider 200 and/or according to various aspects
of the present disclosure).
[0016] In at least one example, the clock divider 200 includes a
clock delay line 210 and a clock delay selector 220. In at least
one example, the clock divider 200 further includes a bit pattern
generator 230 (which in some examples is generally referred to as a
bit pattern source). In another example, the clock divider 200
further includes a bit pattern storage element 240 (which in some
examples is generally referred to as a bit pattern source). In yet
another example, the clock divider 200 includes both the bit
pattern generator 230 and the bit pattern storage element 240. In
at least one example, the clock delay line 210 is configured to
couple to a clock generator (or otherwise receive a clock signal
that is to be divided by the clock divider 200). In at least one
example, the clock delay line 210 is further configured to receive
a clock division factor, for example, from a processing element
(not shown) or another device external to the clock divider 200. In
at least one example, the clock delay selector 220 is coupled to
the clock delay line 210 and the bit pattern generator 230 and/or
the bit pattern storage element 240 is coupled to the clock delay
selector 220. In at least one example, the clock divider 200
further includes a multiplexer 260 coupled between the clock delay
selector 220 and the bit pattern generator 230 and/or the bit
pattern storage element 240. In at least one example, a select line
(not shown) of the multiplexer 260 is coupled to and controlled by
any suitable device, located within or external to the clock
divider 200 to select an output of the bit pattern generator 230 or
the bit pattern storage element 240 for input to the clock delay
selector 220. In at least one example, the bit pattern storage
element 240 is configured to store and/or output a pre-defined bit
pattern for controlling the clock delay selector.
[0017] In at least one example, the clock delay line 210 includes
one or more delay elements 250. In various examples, the delay
elements 250 are any one or more components or devices suitable for
implementing an electrical delay (e.g., to delay a signal), such as
an inverter, a buffer (e.g., clock buffer), or any other suitable
device or component capable of implementing a delay. Individually,
or collectively, the delay elements 250, in at least one example,
provide for a delay range of 0 to 4T, where T=1/fs. In at least one
example, an amount of delay provided by the respective delay
elements 250 increases from a first delay element 250 to a second
delay element 250 in a step of .tau., where, in one example,
.tau.=T/10.In other examples, .tau. is any suitable value
determined at least partially according to a desired resolution of
the delay elements 250. In at least one example, the clock delay
selector 220 includes logic configured to control selection of a
delay element 250 of the clock delay line 210, for example, to
control an amount of delay implemented by the clock delay line 210.
In at least one example, the clock delay selector 220 includes
digital logic configured to implement state machine or other
decision based computing to control the amount of delay implemented
by the clock delay line 210.
[0018] In operation, the clock divider 200 is configured to, in at
least one example, divide a clock signal received by the clock
delay line 210 by the clock division factor received by the clock
delay line 210 at a delay selected by the clock delay selector 220.
For example, the clock divider 200 divides the clock signal by
selecting one rising edge out of n consecutive rising edges (where
n is the clock division factor) to generate the divided clock
signal. In at least one example, after a rising edge of the input
clock is selected, a falling edge is selected for the divided clock
signal prior to selecting the next rising edge (e.g., after n
CLKs). In at least one example, the clock delay line 210 generates
multiple delayed versions of the clock signal (e.g., generates
multiple delayed versions of the clock signal), each with a delay
that is a multiple of .tau.. In this way, at least some examples of
the clock delay selector 220 determine which delayed version of the
clock signal generated by the clock delay line 210 (e.g., via at
least some of the delay elements 250) is used to select the rising
edge of the clock signal for the delayed clock signal and the clock
division factor determines the number of rising edges in the clock
signal after which the next rising edge occurs in the divided clock
signal.
[0019] In some examples, delaying the divided clock signal
suppresses and/or mitigates at least some clock mixing spurs of the
divided clock, for example, such that a divided clock generated
with a division factor of 8 has spurious components at fs/4
frequencies but not at fs/8 frequencies less than fs. A delay of
the divided clock signal is modulated, in at least one example,
between 0 and 4T while, for example, preventing a frequency of the
divided clock from exceeding a threshold to minimize an increase in
complexity of the digital logic that might increase an area of the
digital logic and/or an amount of power consumed by the digital
logic, as described above. The threshold is, for example,
1/(8T-.tau..sub.low) when the division factor is 8. In at least one
example, .tau..sub.low is a predetermined value determined
according to a desired complexity of the digital logic and maximum
instantaneous frequency of operation of the digital logic. For
example, a .tau..sub.low having a low value provides for an
increased time (e.g., number of clock cycles) to transition from a
delay of 0 to a delay of 4T, thereby reducing the level of
mitigation of spurious frequency components according to the
present disclosure, but is capable of implementation with low
digital logic complexity (e.g., digital logic area and/or power
consumption). As another example, a .tau..sub.low having a high
value provides for a decreased time to transition from a delay of 0
to a delay of 4T, thereby increasing the level of mitigation of
spurious frequency components according to the present disclosure
and also increasing the digital logic complexity. During a
decreasing transition in delay in the generated clock (e.g., from
4T to 0), a period of the divided clock generated by the clock
divider 200 is less than, for example, 8T. During an increasing
transition in delay in the generated clock (e.g., from 0 to 4T), a
period of the divided clock generated by the clock divider is
greater than, for example, 8T. In at least one example, after the
decreasing transition has completed (e.g., the delay has reached 0)
and/or the increased transition has completed (e.g., the delay has
reached 4T), a period of the divided clock generated by the clock
divider is 8T. In a generalized form, in at least some examples the
clock divider 200 modulated the delay of the divided clock between
0 and NT/2
[0020] Referring now to FIG. 3, an illustrative waveform 300 of
clock signals in a clock divider is shown. In at least one example,
the clock signals are representative of clock signals received by
and/or generated by the clock divider 200 of FIG. 2 and/or the
clock divider 120 of FIG. 1. The waveform 300 illustrates a
partially divided clock signal 310, a modulated partially divided
clock signal 320, a modulated divided clock signal 330, a first
phase of the divided clock signal 340, and a second phase of the
divided clock signal 350. The waveform 300 illustrates four
sections of the clock signals. In at least one example, during a
first section 360, a period of the modulated divided clock signal
330 is 8T with a modulated delay of 4T. During a second section
370, for example, a transition period from a delay of 4T to a delay
of 0, a period of the modulated divided clock signal 330 is
8T-.tau..sub.low. During a third section 380, a period of the
modulated divided clock signal 330 is once again 8T with a
modulated delay of 0. During a fourth section 390, for example, a
transition period from a delay of 0 to a delay of 4T, a period of
the modulated divided clock signal 330 is 8T+.tau..sub.high. In at
least one example, T.sub.high is a programmable value (e.g.,
programmable at a time of manufacture and/or at a time of
implementation by a user). In various examples, .tau..sub.high is
selected to determine a number of clock cycles elapsed to
transition from a delay of 0 to a delay of 4T. In at least one
example, a value of .tau..sub.high is independent of considerations
of complexity of the digital logic (e.g., in contrast to
.tau..sub.low, as discussed above) such that a variation in the
value of .tau..sub.high improves mitigation of spurious frequency
components without corresponding design trade-offs. Each of the
first section 360, second section 370, third section 380, and
fourth section 390 are, for example, consecutively aligned amounts
of time.
[0021] As illustrated in FIG. 3, during the first section 360,
rising clock edges of the modulated divided clock signal 330 are
aligned with rising clock edges of the first phase of the divided
(but unmodulated) clock signal 340. During the second section 370,
the period of the modulated divided clock signal 330 decreases with
respect to the period of the modulated divided clock signal 330
during the first section 360. During the third section 380, rising
clock edges of the modulated divided clock signal 330 are aligned
with rising clock edges of the second phase of the divided (but
unmodulated) clock signal 350. During the fourth section 390, the
period of the modulated divided clock signal 330 increases with
respect to the period of the modulated divided clock signal 330
during the first section 360 and the third section 380. In at least
one example, while the period (e.g., instantaneous period) of the
modulated divided clock signal 330 varies by section, an average
period of the modulated divided clock signal 330 remains the same.
In at least one example, the modulated divided clock signal 330 as
illustrated in FIG. 3 includes spurious components at fs/4
frequencies without including spurious components at fs/8
frequencies, at least partially according to the present disclosure
as discussed above.
[0022] Referring now to FIG. 4, a flowchart of an illustrative
method 400 of delay modulated clock division is shown. At least
some aspects of the method 400 are implemented, for example, by a
clock divider, such as the clock divider 200 of FIG. 2, for
example, in the RF sampling receiver 100 of FIG. 1. The method 400
is implemented, for example, to generate a modulated divided clock
signal by delay modulated clock division such that at least a
portion of spurious components (e.g., at fundamental spectral
frequencies) of the modulated divided clock signal are suppressed,
at least partially according to the present disclosure as discussed
above. In at least some examples, the modulated divided clock
signal is at least partially based on a root clock signal. In at
least some examples, the root clock signal has a frequency greater
than a frequency of the modulated clock signal.
[0023] At operation 410, the method 400 begins with a rising clock
edge of the modulated divided clock signal having a delay (and/or
advance) of 0 for a pre-defined number (e.g., N.sub.0) of clock
cycles (e.g., rising edges). N.sub.0 is, in at least one example, a
programmable value (e.g., programmable at a time of manufacture
and/or at a time of implementation by a user) selected to maximize
an amount of mitigation of spurious frequency components according
to aspects of the present disclosure. During the operation 410, in
at least one example, an instantaneous period of the modulated
divided clock signal is 8T (e.g., for an fs/8 modulated divided
clock signal).
[0024] At operation 420, a bit pattern (e.g., binary sequence) is
received and a determination of whether a new bit of the bit
pattern is a "1" is made. In at least one example, the bit pattern
is a pre-configured and stored bit pattern, for example, as
discussed above. In another example, the bit pattern is a
newly-generated bit pattern. When the new bit of the bit pattern is
not "1," the method 400 returns to operation 410. When the new bit
of the bit pattern is "1," the method 400 proceeds to operation
430.
[0025] At operation 430, the rising edge of the modulated divided
clock signal is delayed by a time .tau..sub.high (e.g., with
respect to the previous rising edge of the modulated divided clock
signal) for N.sub.high cycles of the modulated divided clock signal
(e.g., N.sub.high rising edges of the modulated divided clock
signal). N.sub.high is selected, for example, such that a
cumulative delay of 4T is achieved during the transition time of
N.sub.high modulated divided clock signals when the instantaneous
clock period is increased from 8T to 8T+.tau..sub.high. In at least
one example, when each rising edge of the modulated divided clock
signal is delayed by .tau..sub.high (e.g., with respect to the
previous rising edge of the modulated divided clock signal), an
instantaneous period of the modulated divided clock signal is
8T+.tau..sub.high. Following the N.sub.high cycles, in at least one
example, the rising edge of the modulated divided clock signal is
delayed by a time 4T for N.sub.h-N.sub.high cycles of the modulated
divided clock signal (e.g., N.sub.h-N.sub.high rising edges of the
modulated divided clock signal). In at least some examples,
N.sub.h=N.sub.high. In another example, N.sub.h is a programmable
value (e.g., programmable at a time of manufacture and/or at a time
of implementation by a user) other than N.sub.high that is
programmable to vary (e.g., maximize) an amount of mitigation of
spurious components of the modulated divided clock signal, at least
partially according to the present disclosure as discussed above.
In at least one example, when the rising edge of the modulated
divided clock signal is delayed by a time 4T, an instantaneous
period of the modulated divided clock signal is 8T.
[0026] At operation 440, a determination of whether a new bit of
the bit pattern is a "0" is made. When the new bit of the bit
pattern is "0," the method 400 proceeds to operation 450.
[0027] At operation 450, the rising edge of the modulated divided
clock signal is advanced by a time .tau..sub.low, with respect to
the previous rising edge of the modulated divided clock signal, for
N.sub.low cycles of the modulated divided clock signal (e.g.,
N.sub.low rising edges of the modulated divided clock signal).
N.sub.low is selected, for example, such that a cumulative delay of
-4T is achieved during the transition time of N.sub.low modulated
divided clock signals when the instantaneous clock period is
increased from 8T to 8T-.tau..sub.low. In at least one example,
when the rising edge of the modulated divided clock signal is
advanced by .tau..sub.low, an instantaneous period of the modulated
divided clock signal is 8T-.tau..sub.low. Following the N.sub.low
cycles, in at least one example, the rising edge of the modulated
divided clock signal is returned to having a delay (and/or advance)
of 0 for N.sub.l-N.sub.low cycles of the modulated divided clock
signal (e.g., N.sub.l-N.sub.low rising edges of the modulated
divided clock signal). In at least some examples,
N.sub.l=N.sub.low. In another example, N.sub.l is a programmable
value (e.g., programmable at a time of manufacture and/or at a time
of implementation by a user) other than N.sub.low that is
programmable to vary (e.g., maximize) an amount of mitigation of
spurious components of the modulated divided clock signal, at least
partially according to the present disclosure as discussed above.
In at least one example, when the rising edge of the modulated
divided clock signal is delayed by 0,an instantaneous period of the
modulated divided clock signal is 8T. Following the
N.sub.l-N.sub.low cycles, in at least one example the method 400
returns to operations 420.
[0028] Returning now to operation 440, when the new bit of the bit
pattern is not "0," the method 400 proceeds to operation 460. At
operation 460, the rising edge of the modulated divided clock
signal is delayed by a time 4T for N.sub.4T cycles of the modulated
divided clock signal (e.g., N.sub.4T rising edges of the modulated
divided clock signal). In at least some examples, N.sub.4T is a
programmable value (e.g., programmable at a time of manufacture
and/or at a time of implementation by a user) that is programmable
to vary (e.g., maximize) an amount of mitigation of spurious
components of the modulated divided clock signal, at least
partially according to the present disclosure as discussed above.
In at least one example, when the rising edge of the modulated
divided clock signal is delayed by a time 4T, an instantaneous
period of the modulated divided clock signal is 8T. In at least
some examples, throughout the method 400 an average clock frequency
of the modulated divided clock signal is approximately 1(nT).
Following the N.sub.4T cycles, in at least one example the method
400 returns to operations 440.
[0029] While the operations of the method 400 have been discussed
and labeled with numerical reference, in various examples the
method 400 includes additional operations that are not recited
herein, any one or more of the operations recited herein include
one or more sub-operations, any one or more of the operations
recited herein are omitted, and/or any one or more of the
operations recited herein are performed in an order other than that
presented herein (e.g., in a reverse order, substantially
simultaneously, overlapping, etc.), all of which is intended to
fall within the scope of the present disclosure.
[0030] In the foregoing discussion and in the claims, the terms
"including" and "comprising" are used in an open-ended fashion, and
thus should be interpreted to mean "including, but not limited to .
. . . " Also, the term "couple" or "couples" is intended to mean
either an indirect or direct connection. Thus, if a first device
couples to a second device, that connection is coupled through a
direct connection or through an indirect connection via other
devices and connections. Similarly, a device that is coupled
between a first component or location and a second component or
location is coupled through a direct connection or through an
indirect connection via other devices and connections. A device
that is "configured to" perform a task or function is configured
(e.g., programmed) at a time of manufacturing by a manufacturer to
perform the function and/or configurable (or re-configurable) by a
user after manufacturing to perform the function and/or other
additional or alternative functions. The configuring is through
firmware and/or software programming of the device, through a
construction and/or layout of hardware components and
interconnections of the device, or a combination thereof.
Additionally, uses of the phrase "ground voltage potential" in the
foregoing discussion are intended to include a chassis ground, an
Earth ground, a floating ground, a virtual ground, a digital
ground, a common ground, and/or any other form of ground connection
applicable to, or suitable for, the teachings of the present
disclosure. Unless otherwise stated, "about," "approximately," or
"substantially" preceding a value means +/-10 percent of the stated
value.
[0031] The above discussion is meant to be illustrative of the
principles and various embodiments of the present disclosure.
Numerous variations and modifications will become apparent to those
skilled in the art once the above disclosure is fully appreciated.
It is intended that the following claims be interpreted to embrace
all such variations and modifications.
* * * * *