U.S. patent application number 14/162855 was filed with the patent office on 2014-05-22 for spin coating method and spin coating apparatus.
This patent application is currently assigned to Kabushiki Kaisha Toshiba. The applicant listed for this patent is Kabushiki Kaisha Toshiba. Invention is credited to Keisuke Nakazawa.
Application Number | 20140137796 14/162855 |
Document ID | / |
Family ID | 41053861 |
Filed Date | 2014-05-22 |
United States Patent
Application |
20140137796 |
Kind Code |
A1 |
Nakazawa; Keisuke |
May 22, 2014 |
SPIN COATING METHOD AND SPIN COATING APPARATUS
Abstract
A spin coating apparatus that supplies a coating liquid to a
substrate and rotating the substrate to form a coating film, has a
holding part that holds the substrate mounted thereon in a
horizontal position; a rotationally driving source that
rotationally drives the holding part about a rotational axis
parallel with the vertical direction, thereby rotating the
substrate; and a coating liquid supplying part that supplies the
coating liquid to the substrate held by the holding part.
Inventors: |
Nakazawa; Keisuke;
(Yokohama-shi, JP) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Kabushiki Kaisha Toshiba |
Tokyo |
|
JP |
|
|
Assignee: |
Kabushiki Kaisha Toshiba
Tokyo
JP
|
Family ID: |
41053861 |
Appl. No.: |
14/162855 |
Filed: |
January 24, 2014 |
Related U.S. Patent Documents
|
|
|
|
|
|
Application
Number |
Filing Date |
Patent Number |
|
|
12396706 |
Mar 3, 2009 |
8652571 |
|
|
14162855 |
|
|
|
|
Current U.S.
Class: |
118/52 |
Current CPC
Class: |
G03F 7/162 20130101;
B05C 11/08 20130101; B05D 1/005 20130101; H01L 21/6715
20130101 |
Class at
Publication: |
118/52 |
International
Class: |
B05C 11/08 20060101
B05C011/08 |
Foreign Application Data
Date |
Code |
Application Number |
Mar 4, 2008 |
JP |
2008-053404 |
Claims
1.-10. (canceled)
11. A spin coating apparatus that supplies a coating liquid to a
substrate and rotating the substrate to form a coating film,
comprising: a holding part that holds the substrate mounted thereon
in a horizontal position; a rotationally driving source that
rotationally drives the holding part about a rotational axis
parallel with the vertical direction, thereby rotating the
substrate; and a coating liquid supplying part that supplies the
coating liquid to the substrate held by the holding part, wherein
the coating liquid supplying part dispenses a first amount of
coating liquid to a central part of the substrate while the
rotationally driving source is rotating the substrate about the
central part of the substrate at a first number of revolutions, the
coating liquid supplying part dispenses a second amount of coating
liquid to the central part of the substrate while the rotationally
driving source is rotating the substrate at a second number of
revolutions that is lower than the first number of revolutions
after the first amount of coating liquid is dispensed, the
rotationally driving source rotates the substrate at a third number
of revolutions for determining the film thickness of the coating
liquid after the second amount of coating liquid is dispensed, and
the first number of revolutions is a number of revolutions at which
the first amount of coating liquid does not uniformly spread over
the substrate because of air resistance.
12. The apparatus according to claim 11, wherein the first amount
is equal to or larger than the second amount.
13. The apparatus according to claim 11, wherein a pattern is
formed on the substrate.
14. The apparatus according to claim 12, wherein a pattern is
formed on the substrate.
15. The apparatus according to claim 11, wherein the coating liquid
is any of a photoresist, an antireflection material, a photoresist
protective material, a resist pattern shrinkable material, a
protective material for immersion exposure, polyimide, SOG, a low-k
material and a sol-gel material.
16. The apparatus according to claim 12, wherein the coating liquid
is any of a photoresist, an antireflection material, a photoresist
protective material, a resist pattern shrinkable material, a
protective material for immersion exposure, polyimide, SOG, a low-k
material and a sol-gel material.
17. The apparatus according to claim 13, wherein the coating liquid
is any of a photoresist, an antireflection material, a photoresist
protective material, a resist pattern shrinkable material, a
protective material for immersion exposure, polyimide, SOG, a low-k
material and a sol-gel material.
18. The apparatus according to claim 11, wherein the coating liquid
is a planarizing material or a filler material.
19. The apparatus according to claim 12, wherein the coating liquid
is a planarizing material or a filler material.
20. The apparatus according to claim 13, wherein the coating liquid
is a planarizing material or a filler material.
21. A spin coating apparatus that supplies a coating liquid to a
substrate and rotating the substrate to form a coating film,
comprising: a holding part that holds the substrate mounted thereon
in a horizontal position; a rotationally driving source that
rotationally drives the holding part about a rotational axis
parallel with the vertical direction, thereby rotating the
substrate; and a coating liquid supplying part that supplies the
coating liquid to the substrate held by the holding part, and has a
discharge controlling apparatus, wherein the coating liquid
supplying part dispenses a first amount of coating liquid to a
central part of the substrate while the rotationally driving source
is rotating the substrate about the central part of the substrate
at a first number of revolutions, and maintaining the rotations at
the first number of revolutions during said dispensing, the coating
liquid supplying part dispenses a second amount of coating liquid
to the central part of the substrate while the rotationally driving
source is rotating the substrate at a second number of revolutions
that is lower than the first number of revolutions after the first
amount of coating liquid is dispensed, and maintaining the
rotations at the second number of revolutions during said
dispensing, and the rotationally driving source rotates the
substrate at a third number of revolutions after rotating the
substrate at the second number of revolutions, wherein the third
number of revolutions is lower than the first number of
revolutions, and wherein a first discharge rate of the first amount
of coating liquid is lower than a second discharge rate of the
second amount of coating liquid.
22. The apparatus according to claim 21, wherein the first amount
is equal to or larger than the second amount.
23. The apparatus according to claim 21, wherein a pattern is
formed on the substrate.
24. The apparatus according to claim 22, wherein a pattern is
formed on the substrate.
25. The apparatus according to claim 21, wherein the coating liquid
is any of a photoresist, an antireflection material, a photoresist
protective material, a resist pattern shrinkable material, a
protective material for immersion exposure, polyimide, SOG, a low-k
material and a sol-gel material.
26. The apparatus according to claim 21, wherein the coating liquid
is a planarizing material or a filler material.
27. The apparatus according to claim 21, wherein the rotationally
driving source rotates the substrate at the third number of
revolutions after dispensing the second amount of coating
liquid.
28. The apparatus according to claim 27, wherein the third number
of revolutions is lower than the second number of revolutions.
Description
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is based upon and claims the benefit of
priority from the prior Japanese Patent Application No.2008-53404,
filed on Mar. 4, 2008, the entire contents of which are
incorporated herein by reference.
BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] The present invention relates to a spin coating method and a
spin coating apparatus that involves supplying a coating liquid to
a substrate and forming a coating film thereon by rotating the
substrate.
[0004] 2. Background Art
[0005] The spin coating method is a method of forming a coating
film by dispensing a coating liquid onto a substrate and then
rotating the substrate at a number of revolutions for determining
the thickness of the coating film.
[0006] The spin coating method is characterized in that the
thickness of the film formed depends only on the number of
revolutions and is highly uniform, and the process time is short.
The spin coating method has a wide variety of applications, such as
manufacture of semiconductor devices or liquid crystal
displays.
[0007] A first representative application is patterning by
lithography. A representative lithography process in manufacture of
a semiconductor device involves spin-coating a substrate with a
photoresist, drying the photoresist on a hot plate, exposing the
photoresist to light, and performing post baking on the hot plate.
Then, the photoresist is developed using a developer to form a
pattern on the substrate.
[0008] In order to prevent reflection of light from the substrate
in the exposure described above, an antireflection film is also
formed by spin coating. There are two types of antireflection
films. One is underlies the resist, and the other overlies the
resist. In addition, in order to prevent volatilization of gas from
the photoresist or provide protection against contaminants in the
external environment, a protective film is also formed on the
photoresist by spin coating. This is common practice in the
immersion exposure process.
[0009] The resist process can be classified according to the
layered structure of films. For example, if a photoresist film is
formed by itself, it can be classified as a single-layer resist. If
a photoresist film is formed on a thick base film (organic film),
it can be classified as a double-layer resist. If a photoresist
film is formed on a thin layer of an inorganic material stacked on
a thick base film (organic film), it can be classified as a
multilayer resist. The base film and the film of an inorganic
material can also be formed by spin coating.
[0010] Furthermore, photoresists are classified as an organic
photoresist or an inorganic photoresist according to the
composition of the material. A commonly used inorganic photoresist
is the silicon-based photoresist. The photoresist film of any
material can be formed by spin coating. The photoresist film may be
formed on a flat substrate or a stepped substrate.
[0011] In order to further reduce the size of fine patterns, a
shrinkable material is used. For example, if a shrinkable material
is applied on a resist pattern having a hole, and only the
shrinkable material is removed using a developer after heat
treatment, the diameter of the hole can be reduced. This is because
the part of the resist that thermally reacts with the shrinkable
material becomes insoluble in the developer.
[0012] A second application is formation of a polyimide film.
Polyimide is a thermosetting resin. A polyimide film is formed by
spin-coating a substrate with a polyimide solution, drying the
polyimide solution on a hot plate and making the polyimide set by
thermal treatment. The film is used as a passivation film, an
interlayer insulating film, a stress buffer film or the like.
[0013] Furthermore, various kinds of patterns can be formed by
lithography using a photosensitive polyimide.
[0014] A third application is formation of insulating films of spin
on glass (SOG) or a low-k material, which has a low dielectric
constant, for example. Any of these films is made of a material
primarily containing silicon and is formed by spin coating and
oxidation by thermal treatment or the like. The oxidized film is
used as an interlayer insulating film, a pre-metal dielectric (PMD)
film or an inter-metal dielectric (IMD) film or for shallow trench
isolation, for example. The material of these insulating films may
be applied to a flat substrate or a stepped substrate.
[0015] A fourth application is a formation of a thin film by a
sol-gel method. The sol-gel method is a method of forming a metal
oxide film, a dielectric film, a ferroelectric film, a conductive
film or the like by sintering an organic solution containing a
metal alkoxide in a gas phase containing water. That is, a thin
film is formed by performing spin coating with a metal alkoxide
solution, drying the metal alkoxide solution on a hot plate and
sintering the metal alkoxide. This method is used for forming a
ferroelectric film for a ferroelectric memory, for example.
[0016] Such a spin coating method is used in wide variety of
applications other than those described above, such as application
of an organic EL material, MEMS, and manufacture of an optical
material.
[0017] A representative spin coating method involves dispensing a
coating liquid to a central part of a surface of a substrate at
rest and then rotating the substrate to uniformly spread the
coating liquid over the entire substrate. However, this method
requires a large amount of coating liquid for processing one
substrate.
[0018] To overcome the disadvantage, a conventional spin coating
method involves dispensing a coating liquid to a semiconductor
substrate while rotating the semiconductor substrate at a low
number of revolutions and then forming a coating film by rotating
the substrate at a number of revolutions for determining the
thickness of the coating film.
[0019] The conventional spin coating method has a problem that a
considerable amount of coating liquid is required, and the
peripheral part of the substrate cannot be coated when the
substrate has a large area.
[0020] To overcome the disadvantage, another conventional spin
coating method involves setting the number of revolutions in
dispensing the coating liquid higher than the number of revolutions
in determining the film thickness. This method can solve the
problem to some extend and can be used for a large substrate (see
Japanese Patent Laid-Open Nos. 8-330206 and 2004-64071, for
example).
[0021] However, the spin coating method described above has a
problem that a large amount of coating liquid is used.
[0022] By the way, if the wettability of the substrate to the
coating liquid is poor, the coating liquid is repelled, so that a
coating unevenness occurs, and the film thickness uniformity is
degraded. To prevent the degradation of the film thickness
uniformity, there is proposed a precoating method that wets the
substrate with a solvent (flux) before coating (see Japanese Patent
Laid-Open Nos. 5-123632 and 5-243140, for example).
[0023] The spin coating method is a method that involves
spin-coating a surface of a substrate with a solvent before
dispensing a coating liquid and spin-coating the surface of the
substrate with the coating liquid (precoating method).
[0024] The precoating method requires a smaller amount of coating
liquid and can make the film thickness uniform. Therefore, the
precoating method is commonly used in cutting-edge photoresist
processes.
[0025] The precoating method has a disadvantage that it requires an
additional solvent supplying mechanism and a larger amount of
solvent. In addition, in the case where a stepped substrate or a
substrate made of different kinds of materials is used, the
dispensed solvent may induce a coating unevenness.
[0026] To overcome the disadvantage, another spin coating method
involves dispensing a coating liquid to a substrate while rotating
the substrate at a first number of revolutions and then dispensing
the coating liquid to the substrate while rotating the substrate at
a second number of revolutions (see Japanese Patent No. 2638969,
for example). That is, according to this method, dispensing of the
coating liquid is divided into two or more steps in which the
substrate is rotated at different numbers of revolutions.
[0027] This spin coating method cannot sufficiently spread the
coating liquid over the entire substrate and can result in an
incomplete coating because the first number of revolutions is
low.
[0028] On the other hand, there is a spin coating method that
involves dispensing a coating liquid to a substrate while rotating
the substrate at a higher first number of revolutions and then
dispensing the coating liquid while rotating the substrate at a
lower second number of revolutions (see Japanese Patent Laid-Open
Nos. 2000-157922, 2000-279874 and 2006-156565, for example).
[0029] According to the spin coating method described in the
Japanese Patent Laid-Open No. 2000-279874, the coating liquid is
spread over the entire surface of the substrate when the substrate
is rotated at the first number of revolutions.
[0030] To the contrary, according to the spin coating methods
described in the Japanese Patent Laid-Open Nos. 2000-157922 and
2006-156565, the number of revolutions is changed from the first
number of revolutions to the second number of revolutions before
the coating liquid is spread over the entire surface of the
substrate. However, the amount of coating liquid dispensed when the
substrate rotates at the first number of revolutions is enough to
coat the entire substrate, and therefore, the coating liquid
dispensed when the substrate rotates at the second number of
revolutions is extra. In addition, the number of revolutions after
dispensing (such as the number of revolutions for determining the
film thickness) is set higher than the number of revolutions during
dispensing, so that an excessive amount of coating liquid is
discharged to the outside of the substrate when the substrate
rotates at the higher number of revolutions.
[0031] In manufacture of a semiconductor device, a circular
substrate is used. To the contrary, in manufacture of a photomask
substrate, a liquid crystal display or the like, a rectangular
substrate is used.
[0032] However, the spin coating method can be applied to any
substrates. In particular, coating a stepped substrate requires a
larger amount of coating liquid than coating a flat substrate.
[0033] In addition, as the diameter of the substrate or the size of
the apparatus increases, the effect of the turbulence during
rotation of the substrate increases, and there arises a possibility
that the substrate flies when the substrate rotates at high
speed.
[0034] As a result, the maximum value of the number of revolutions
is lower than that for the old type apparatus, and the number of
process restrictions increases.
SUMMARY OF THE INVENTION
[0035] According to one aspect of the present invention, there is
provided: a spin coating method that supplies a coating liquid to a
substrate and rotating the substrate to form a coating film,
comprising:
[0036] dispensing a first amount of coating liquid to a central
part of the substrate while rotating the substrate about the
central part of the substrate at a first number of revolutions;
[0037] dispensing a second amount of coating liquid to the central
part of the substrate while rotating the substrate at a second
number of revolutions that is lower than the first number of
revolutions after dispensing the first amount of coating liquid;
and
[0038] rotating the substrate at a third number of revolutions for
determining the film thickness of the coating liquid after
dispensing the second amount of coating liquid,
[0039] wherein the first number of revolutions is a number of
revolutions at which the first amount of coating liquid does not
uniformly spread over the substrate because of air resistance.
[0040] According to other aspect of the present invention, there is
provided: a spin coating apparatus that supplies a coating liquid
to a substrate and rotating the substrate to form a coating film,
comprising:
[0041] a holding part that holds the substrate mounted thereon in a
horizontal position;
[0042] a rotationally driving source that rotationally drives the
holding part about a rotational axis parallel with the vertical
direction, thereby rotating the substrate; and
[0043] a coating liquid supplying part that supplies the coating
liquid to the substrate held by the holding part,
[0044] wherein the coating liquid supplying part dispenses a first
amount of coating liquid to a central part of the substrate while
the rotationally driving source is rotating the substrate about the
central part of the substrate at a first number of revolutions,
[0045] the coating liquid supplying part dispenses a second amount
of coating liquid to the central part of the substrate while the
rotationally driving source is rotating the substrate at a second
number of revolutions that is lower than the first number of
revolutions after the first amount of coating liquid is
dispensed,
[0046] the rotationally driving source rotates the substrate at a
third number of revolutions for determining the film thickness of
the coating liquid after the second amount of coating liquid is
dispensed, and
[0047] the first number of revolutions is a number of revolutions
at which the first amount of coating liquid does not uniformly
spread over the substrate because of air resistance.
BRIEF DESCRIPTION OF THE DRAWINGS
[0048] FIG. 1A is a cross-sectional view showing a distribution of
a coating liquid immediately after the coating liquid is dispensed
to the center of a substrate when the substrate is rotating at low
speed;
[0049] FIG. 1B is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 1A;
[0050] FIG. 1C is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 1A.
[0051] FIG. 2A is a cross-sectional view showing a distribution of
a coating liquid immediately after the coating liquid is dispensed
to the center of a substrate when the substrate is rotating at high
speed;
[0052] FIG. 2B is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 2A;
[0053] FIG. 2C is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 2A;
[0054] FIG. 2D is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 2A;
[0055] FIG. 2E is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 2A;
[0056] FIG. 2F is a cross-sectional view showing a distribution of
the coating liquid when a certain length of time have elapsed after
the state shown in FIG. 2A;
[0057] FIG. 3A is a top plan view of the substrate in the state
shown in FIG. 2D;
[0058] FIG. 3B is a top plan view of the substrate in the state
shown in FIG. 2F;
[0059] FIG. 4 is a diagram showing a configuration of essential
parts of a spin coating apparatus 100 according to an embodiment 1
of the present invention;
[0060] FIG. 5 shows an exemplary recipe for the spin coating method
according to the embodiment 1;
[0061] FIG. 6 is a diagram showing an exemplary sequence of
operation of the spin coating apparatus 100 according to the recipe
shown in FIG. 5;
[0062] FIG. 7 is a diagram showing another exemplary sequence of
operation of the spin coating apparatus 100 according to the recipe
shown in FIG. 5;
[0063] FIG. 8 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first number of revolutions
"N.sub.1" and the second number of revolutions "N.sub.2";
[0064] FIG. 9 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first and second discharge
rates "V.sub.1" and "V.sub.2";
[0065] FIG. 10 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first and second amounts
"M.sub.1" and "M.sub.2";
[0066] FIG. 11 is a graph showing relationships between the
thickness of coating films formed by changing the first and second
amount "M.sub.1" and "M.sub.2" and the measurement position thereof
in the wafer surface;
[0067] FIG. 12 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the acceleration and
deceleration of discharge of the coating liquid;
[0068] FIG. 13 is a graph showing relationships between the
thickness of coating films formed by changing the acceleration and
deceleration of discharge of the coating liquid and the measurement
position thereof in the wafer surface;
[0069] FIG. 14 is a graph showing relationships between the
thickness of coating films formed by changing the first number of
revolutions "N.sub.1" and the measurement position thereof;
[0070] FIG. 15 is a top plan view of the substrate on which 0.4 ml
of coating liquid is dispensed;
[0071] FIG. 16A is a graph showing relationships between the
thickness of coating films formed by changing the duration of
rotation at the first number of revolutions "N.sub.1" of 3000 rpm
and the measurement position thereof;
[0072] FIG. 16B is a graph showing relationships between the
thickness of coating films formed by changing the duration of
rotation at the first number of revolutions "N.sub.1" of 4000 rpm
and the measurement position thereof;
[0073] FIG. 17 is a figure showing an allocation of the L18
orthogonal table.
[0074] FIG. 18 is a factorial effect diagram showing the SN ratio
obtained by analysis of the number of chips that suffer uneven
coating in terms of smaller-the-better characteristic;
[0075] FIG. 19 is a factorial effect diagram showing the SN ratio
obtained by analysis of the film thickness uniformity at a recess
of a stepped part in terms of smaller-the-better
characteristic;
[0076] FIG. 20 is a diagram showing a coating sequence of the spin
coating method according to the comparison example 1;
[0077] FIG. 21 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the amount of coating liquid
dispensed according to the coating sequence of the comparison
example 1;
[0078] FIG. 22 is a graph showing relationships between the
thickness of coating films formed by changing the amount of coating
liquid dispensed according to the coating sequence of the
comparison example 1 and the measurement position thereof in the
wafer surface.
[0079] FIG. 23 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first number of revolutions
"N.sub.1" according to the coating sequence shown in FIG. 20;
and
[0080] FIG. 24 is a graph showing relationships between the
thickness of coating films formed by changing the first number of
revolutions "N.sub.1" according to the coating sequence shown in
FIG. 20 and the measurement position thereof in the wafer
surface.
DETAILED DESCRIPTION
[0081] As the diameter of the substrate increases, the sensitivity
of the spin coating method to the atmosphere when the substrate is
rotating also increases. In particular, at the peripheral part of
the substrate, the atmospheric resistance is high, and thus it
becomes more difficult to spread the coating liquid as the number
of revolutions increases.
[0082] FIG. 1A is a cross-sectional view showing a distribution of
a coating liquid immediately after the coating liquid is dispensed
to the center of a substrate when the substrate is rotating at low
speed. FIGS. 1B and 1C are cross-sectional views showing
distributions of the coating liquid when certain lengths of time
have elapsed after the state shown in FIG. 1A.
[0083] In the case where coating is performed by rotating the
substrate at low speed, uniform coating over the entire surface of
the substrate can be accomplished as shown in FIG. 1C by transition
from the state shown in FIG. 1A to the state shown in FIG. 1B and
then to the state shown in FIG. 1C.
[0084] However, in the case where the substrate is rotated at high
speed, the coating liquid spreads in a different way from the case
of low-speed rotation described above.
[0085] FIG. 2A is a cross-sectional view showing a distribution of
a coating liquid immediately after the coating liquid is dispensed
to the center of a substrate when the substrate is rotating at high
speed. FIGS. 2B to 2F are cross-sectional views showing
distributions of the coating liquid when certain lengths of time
have elapsed after the state shown in FIG. 2A.
[0086] In the case of high-speed rotation, the coating liquid
spreads in a similar way to the case of low-speed rotation
immediately after the coating liquid is dispensed. That is, the
coating liquid spreads by transition from the state shown in FIG.
2A to the state shown in FIG. 2B.
[0087] However, before the coating liquid reaches the peripheral
part of the substrate, the coating liquid experiences the
atmospheric resistance, and the edge of the coating liquid is
swollen (FIG. 2C).
[0088] When the substrate is rotating at high speed, the coating
liquid cannot move on the substrate from the state shown in FIG. 2C
and thus is spattered to the peripheral part or outside of the
substrate. Even if the duration of the rotation is elongated, the
coating liquid cannot be further moved to spread on the
substrate.
[0089] Therefore, as shown in FIGS. 2D to 2F, the spattered coating
liquid is accumulated at the peripheral part of the substrate, or
no coating liquid exists at the peripheral part of the
substrate.
[0090] FIG. 3A is a top plan view of the substrate in the state
shown in FIG. 2D. FIG. 3B is a top plan view of the substrate in
the state shown in FIG. 2F.
[0091] In some cases, as shown in FIG. 3A, at the peripheral part
of the substrate, the coating liquid may be streaked by the effect
of the atmospheric resistance. In other cases, as shown in FIG. 3B,
the coating liquid may be swollen by the spattered coating liquid
in an area of the coated part close to the boundary between the
coated part and the peripheral part of the substrate.
[0092] As described above, even if an amount of coating liquid
enough to coat over the entire surface of the substrate when the
substrate is rotating at low speed is dispensed, the coating liquid
cannot practically be spread over the entire surface of the
substrate when the substrate is rotating at high speed.
[0093] Thus, according to an embodiment of the present invention,
(1) a first amount "M.sub.1" of coating liquid is dispensed to a
central part of the substrate while rotating the substrate at a
first number of revolutions "N.sub.1", at which the coating liquid
cannot practically spread over the entire substrate.
[0094] The number of revolutions of the substrate has to be enough
for the coating liquid to experience a sufficient atmospheric
resistance at the peripheral part of the substrate.
[0095] For example, when the substrate has a diameter of 300 mm,
the number of revolutions is preferably equal to or higher than
3000 rpm
[0096] This process can keep the peripheral part of the substrate
substantially uncoated. As the number of revolutions increases, the
time taken for the coating liquid to reach the boundary between the
coated part and the uncoated part decreases, and the amount of
swelling of the coating liquid at the edge thereof increases. The
first amount "M.sub.1" is preferably a small amount that does not
suffice for coating the entire substrate even when the substrate is
rotating at low speed.
[0097] Then, (2) a second amount "M.sub.2" of coating liquid is
dispensed while rotating the substrate at a second number of
revolutions "N.sub.2", which is lower than the first number of
revolutions "N.sub.1". The dispensing process (1) and the
dispensing process (2) are preferably carried out successively.
[0098] The coating liquid that has spread partway on the substrate
when the substrate is rotating at the first number of revolutions
is further pushed toward the peripheral part when the dispensing
process (2) is carried out. In this process, since the second
number of revolutions is lower than the first number of
revolutions, the air resistance at the peripheral part is reduced,
so that the coating liquid can more easily move toward the
peripheral part.
[0099] In addition, the coating liquid can move by reducing the
height of the swelling at the edge thereof, so that the coating
liquid forming the swelling can be used to coat the peripheral
part.
[0100] Therefore, a large second amount is not needed, and the
second amount "M.sub.2" can be smaller than the first amount
"M.sub.1". In this way, the coating liquid is spread over the
entire surface of the substrate or to the vicinity of the
peripheral part of the substrate.
[0101] Then, (3) the substrate is rotated at a number of
revolutions that produces a predetermined thickness, thereby
controlling the thickness of the coating liquid to be a
predetermined value.
[0102] Before the process (3) of rotating the substrate is carried
out, for example, reflow can be carried out at a very low number of
revolutions of 100 rpm or so for several seconds.
[0103] Then, edge cutting is carried out, and baking is carried out
to evaporate the solvent to complete the formation of the coating
film.
[0104] In this way, the entire surface of the substrate can be
coated with a small amount of coating liquid.
[0105] In the following, embodiments of the present invention will
be described with reference to the drawings.
Embodiment 1
[0106] FIG. 4 is a diagram showing a configuration of essential
parts of a spin coating apparatus 100 according to an embodiment 1
of the present invention, which is an aspect of the present
invention.
[0107] As shown in FIG. 4, the spin coating apparatus 100 has a
holding part 2 that holds a wafer 1, which is a substrate, mounted
thereon in a horizontal position, a motor 4 that is a rotationally
driving source that rotationally drives the holding part 2 about a
rotational axis 3 parallel with the vertical direction to rotate
the wafer 1, a coating liquid supplying part 5 that supplies a
coating liquid to the wafer 1 held by the holding part 2, and a
controlling part 10.
[0108] As shown in FIG. 4, a spin coating method according to this
embodiment is used to dispense the coating liquid to one of the
opposite surfaces of the wafer 1 in the thickness direction
(referred to simply as front surface, hereinafter) to form a
coating film 6, for example.
[0109] In particular, the spin coating method according to this
embodiment is suitably used in a case where the coating liquid used
is made of an organic material, inorganic material or the like that
has a viscosity equal to or higher than 0.1 mPa*s and equal to or
lower than 1000 mPa*s. However, the viscosity may be out of the
range.
[0110] The wafer 1 is held by the holding part 2 in such a manner
that the other surface thereof (referred to simply as back surface,
hereinafter) is in contact with the holding part 2. The wafer 1
used in this embodiment is a circular substrate, and the diameter
is 300 mm, for example. However, the shape of the wafer 1 is not
limited thereto, and other polygonal shapes, such as a rectangular
shape, are possible. The wafer 1 is mounted on the holding part 2
in such a manner that a central part thereof is located on the
rotational axis 3.
[0111] The holding part 2 is connected to a sucking source 8 via a
vacuum line 9. The wafer 1 mounted on the holding part 2 is held by
vacuum suction by the suction force of the sucking source 8.
[0112] The motor 4 has a rotating shaft 7. The holding part 2 is
fixed to the rotating shaft 7. The motor 4 is capable of changing
the rotational speed.
[0113] The coating liquid supplying part 5 has an arm 5a. A coating
liquid supplying source 5c is connected to the arm 5a via a coating
liquid supplying pipe 5b. The arm 5a has a nozzle 5d opening toward
the holding part 2, or in other words, downward in the sheet of
FIG. 4 at a free end 5a1 thereof.
[0114] The arm 5a is connected to an arm operating mechanism (not
shown). The arm operating mechanism has capabilities of moving the
nozzle 5d from a storage site for the nozzle 5d at a distance from
the wafer 1 (not shown) to a central part of the wafer where the
coating liquid is to be dispensed and of adjusting the vertical
position of the nozzle 5d at the position where the coating liquid
is to be dispensed.
[0115] A discharge controlling apparatus 5e that adjusts the flow
rate of the coating liquid is disposed between the coating liquid
supplying source 5c and the arm 5a. The discharge controlling
apparatus 5e is implemented by a pressure pump, for example.
[0116] The coating liquid supplied from the coating liquid
supplying source 5c is a photoresist when the coating film 6 to be
formed is a resist film, for example.
[0117] However, the coating liquid is not limited to the
photoresist and may be an antireflection material, a photoresist
protective material, a resist pattern shrinkable material, a
protective material for immersion exposure, polyimide, SOG, a low-k
material or a sol-gel material, for example.
[0118] Alternatively, the coating liquid may be a
photoresist-underlying layer material or a photoresist-overlying
layer material. Alternatively, the coating liquid may be a
planarizing material or a filler material.
[0119] The controlling part 10 has a computer or the like, has a
capability of controlling the operation of each part of the spin
coating apparatus 100 and can be programmed by an operator to make
the wafer processing smoother, for example. The controlling part 10
can additionally has a capability of monitoring the operation of
the spin coating apparatus 100. More specifically, the controlling
part 10 controls the speed or duration of rotation of the motor 4
that rotationally drives the holding part 2, for example.
Furthermore, the controlling part 10 controls the operation of the
discharge controlling apparatus 5e that adjusts the amount of
coating liquid supplied to the arm 5a of the coating liquid
supplying part 5.
[0120] Furthermore, the controlling part 10 controls the operation
of the arm 5a of the coating liquid supplying part 5.
[0121] Next, exemplary conditions for the spin coating method
implemented by the spin coating apparatus 100 configured as
described above will be described.
[0122] FIG. 5 shows an exemplary recipe for the spin coating method
according to the embodiment 1. FIG. 6 is a diagram showing an
exemplary sequence of operation of the spin coating apparatus 100
according to the recipe shown in FIG. 5. FIG. 7 is a diagram
showing another exemplary sequence of operation of the spin coating
apparatus 100 according to the recipe shown in FIG. 5. In the
experiment in this embodiment, a material having a viscosity of 1
mPa*s is used as the coating material.
[0123] In FIG. 6, it is supposed that the first number of
revolutions "N.sub.1" is higher than the second number of
revolutions "N.sub.2". On the other hand, in FIG. 7, it is supposed
that the first number of revolutions "N.sub.1" is lower than the
second number of revolutions "N.sub.2".
[0124] As shown in FIGS. 6 and 7, first, the coating liquid is
dispensed while the wafer is rotated at the first number of
revolutions "N.sub.1" (step S1).
[0125] That is, in the spin coating apparatus 100, the motor 4
rotates the wafer 1 about the central part thereof at the first
number of revolutions "N.sub.1", and at the same time, the coating
liquid supplying part 5 dispenses the first amount "M.sub.1" of
coating liquid to the central part of the wafer 1.
[0126] The first number of revolutions "N.sub.1" is set at a value
at which the first amount "M.sub.1" of coating liquid does not
uniformly spread over the entire substrate because of the air
resistance. For example, in a case where the substrate (wafer) has
a diameter of 300 mm, as described later, the first number of
revolutions "N.sub.1" is set at 3000 rpm, and the first amount
"M.sub.1" is set at 0.4 ml. The state in which the first amount
"M.sub.1." of coating liquid does not uniformly spread over the
entire substrate because of the air resistance is any of the states
shown in FIGS. 2D to 2F described above, for example.
[0127] Then, the wafer 1 is rotated at the second number of
revolutions "N.sub.2", and the coating liquid is further dispensed
(step S2). Steps 1 and 2 of dispensing of coating liquid can be
carried out successively.
[0128] More specifically, referring to FIG. 6, in the spin coating
apparatus 100, after the first amount "M.sub.1" of coating liquid
is dispensed, the coating liquid supplying part 5 dispenses the
second amount "M.sub.2" of coating liquid to the central part of
the wafer 1 while the motor 4 is rotating the wafer 1 at the second
number of revolutions "N.sub.2" lower than the first number of
revolutions "N.sub.1". On the other hand, referring to FIG. 7, in
the spin coating apparatus 100, after the first amount "M.sub.1" of
coating liquid is dispensed, the coating liquid supplying part 5
dispenses the second amount "M.sub.2" of coating liquid to the
central part of the wafer 1 while the motor 4 is rotating the wafer
1 at the second number of revolutions "N.sub.2" higher than the
first number of revolutions "N.sub.1".
[0129] Then, a reflow processing is carried out by rotating the
wafer 1 at a number of revolutions "N.sub.3" (step S3). The
reflowing processing improves the uniformity of the thickness of
the film of the coating liquid on the wafer 1.
[0130] Then, a processing of determining the film thickness is
carried out by rotating the wafer 1 at a number of revolutions
"N.sub.4" (step S4).
[0131] That is, in the spin coating apparatus 100, after the second
amount "M.sub.2" of coating liquid is dispensed, the motor 4
rotates the wafer 1 at a third number of revolutions for
determining the thickness of the film of the coating liquid. Thus,
the thickness of the coating film formed on the wafer 1 is
controlled to be a desired value.
[0132] After the coating liquid is applied to the substrate as
described above, the spin coating apparatus 100 carries out edge
cutting with a thinner (not shown), and the substrate is
automatically transferred to a hot plate, baked and then cooled
down.
[0133] Next, a result of analysis of variations of coating
characteristics in the case where the rotational speed of the
substrate is changed will be described.
[0134] Of the conditions in the recipe shown in FIG. 5, the first
number of revolutions "N.sub.1", the duration "T.sub.1" of
dispensing of the coating liquid, and the second number of
revolutions "N.sub.2" and the duration "T.sub.2" of dispensing of
the coating liquid are changed, and coating films formed by the
flows shown in FIGS. 6 and 7 are analyzed.
[0135] FIG. 8 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first number of revolutions
"N.sub.1" and the second number of revolutions "N.sub.2".
[0136] The wafer used is a circular silicon substrate having a
diameter of 300 mm on which no pattern is formed. The number of
revolutions "N.sub.3" in step S3 is fixed at 100 rpm, and the
number of revolutions "N.sub.4" in step S4 is fixed at 694 rpm. The
duration of coating in step S1 is 0.4 seconds (the amount of
coating liquid dispensed is 0.4 ml), the duration of coating in
step S2 is 0.3 seconds (the amount of coating liquid dispensed is
0.3 ml), and the total duration of coating is 0.7 seconds (the
total amount of coating liquid dispensed is 0.7 ml).
[0137] As shown in FIG. 8, when the first number of revolutions
"N.sub.1" is high, and the second number of revolutions "N.sub.2"
is low, the unevenness of coating is reduced, and the wafer edge
can be coated. In particular, as the difference between the first
number of revolutions "N.sub.1" and the second number of
revolutions "N.sub.2" increases, the in-plane uniformity of the
film thickness is improved.
[0138] Therefore, to coat the entire surface (or a wider area) of
the wafer, it can be effective to set the first number of
revolutions "N.sub.1" higher than the second number of revolutions
"N.sub.2".
[0139] Next, a result of analysis of variations of coating
characteristics in the case where the rate of discharge of the
coating liquid is changed will be described.
[0140] Of the conditions for the recipe shown in FIG. 5, the
discharge rate "V.sub.1" in step S1 and the discharge rate
"V.sub.2" in step S2 are changed, and coating films formed by the
flow shown in FIG. 6 are analyzed.
[0141] FIG. 9 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first and second discharge
rates "V.sub.1" and "V.sub.2".
[0142] The wafer used is a circular silicon substrate having a
diameter of 300 mm on which no pattern is formed. In each of steps
S1 and S2, the discharge rate in dispensing the coating liquid
(dispensing rate) is set at 0.5 ml/second, 1.0 ml/second and 2.0
ml/second. Coating is performed under the conditions that the
number of revolutions "N.sub.1" and the amount of coating liquid
dispensed in step S1 are 3000 rpm and 0.6 ml, respectively, the
number of revolutions "N.sub.2" and the amount of coating liquid
dispensed in step S2 are 1500 rpm and 0.4 ml, respectively, the
number of revolutions "N.sub.3" in step S3 is 100 rpm, and the
number of revolutions "N.sub.4" in step S4 is 694 rpm.
[0143] As shown in FIG. 9, when the discharge rate "V.sub.1" in
step S1 is set at 2.0 ml/second, and the discharge rate "V.sub.2"
in step S2 is set at 1.0 ml/second, the edge part of the wafer can
be coated with the coating liquid. Furthermore, under this
condition, the best in-plane uniformity of the film thickness
results.
[0144] That is, the discharge rate "V.sub.1" in step S1 has no
effect on the coating evenness or the in-plane uniformity of the
film thickness. However, as the discharge rate "V.sub.2" in step S2
increases, the coating unevenness is reduced, and the film
thickness uniformity is improved.
[0145] Next, a result of analysis of variations of coating
characteristics in the case where the amount of coating liquid
dispensed (discharged) is changed will be described.
[0146] Of the conditions for the recipe shown in FIG. 5, the first
amount "M.sub.1" in step S1 and the second amount "M.sub.2" in step
S2 are changed, and coating films formed by the flow shown in FIG.
6 are analyzed.
[0147] FIG. 10 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first and second amounts
"M.sub.1" and "M.sub.2". FIG. 11 is a graph showing relationships
between the thickness of coating films formed by changing the first
and second amount "M.sub.1" and "M.sub.2" and the measurement
position thereof in the wafer surface.
[0148] The wafer used is a circular silicon substrate having a
diameter of 300 mm on which no pattern is formed. When the wafer is
rotating at the first number of revolutions "N.sub.1", the coating
liquid is dispensed in amounts of 0.2 ml to 0.5 ml and when the
wafer is rotating at the second number of revolutions "N.sub.2",
the coating liquid is dispensed in amounts of 0.5 ml to 0.2 ml. The
total amount of coating liquid dispensed is set at 0.7 ml. The
first number of revolutions "N.sub.1" is set at 3000 rpm, and the
second number of revolutions "N.sub.2" is set at 1500 rpm.
[0149] As shown in FIG. 10, when the first amount "M.sub.1" is
small, and the second amount "M.sub.2" is large, the coating film
cannot be formed in the edge part of the wafer.
[0150] On the other hand, when the first amount "M.sub.1" is large,
and the second amount "M.sub.2" is small, the coating film can be
formed in the edge part of the wafer. In particular, under the
conditions that the first amount "M.sub.1" is 0.4 ml, and the
second amount "M.sub.2" is 0.3 ml, the best result is obtained in
terms of visual check and in-plane uniformity of the film
thickness.
[0151] As described above, to coat the entire surface (or a wider
area) of the wafer with the coating liquid, the duration "T.sub.1"
has to be longer than the duration "T.sub.2", or in other words,
the first amount "M.sub.1" has to be larger than the second amount
"M.sub.2".
[0152] Next, a result of analysis of variations in coating
characteristics in the case where the acceleration and deceleration
of discharge of the coating liquid are changed will be
described.
[0153] Of the conditions for the recipe shown in FIG. 5, the
acceleration and deceleration of discharge of the coating liquid in
step S1 and the acceleration and deceleration of discharge of the
coating liquid in step S2 are changed, and coating films formed by
the flow shown in FIG. 6 are analyzed.
[0154] FIG. 12 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the acceleration and
deceleration of discharge of the coating liquid. FIG. 13 is a graph
showing relationships between the thickness of coating films formed
by changing the acceleration and deceleration of discharge of the
coating liquid and the measurement position thereof in the wafer
surface.
[0155] The wafer used is a circular silicon substrate having a
diameter of 300 mm on which no pattern is formed. When the coating
liquid is dispensed for 0.4 seconds while the wafer is rotating at
the first number of revolutions "N.sub.1", the acceleration of
discharge is set at 40 ml/second.sup.2, and the deceleration of
stopping discharge is set at 0 (no deceleration) or 40
ml/second.sup.2. Then, when the wafer is rotating at the second
number of revolutions "N.sub.2", the acceleration of discharge is
set at 80 ml/second.sup.2 or 40 ml/second.sup.2, and the
deceleration of stopping discharge is set at 40 ml/second.sup.2.
The first number of revolutions "N.sub.1" is set at 3000 rpm, and
the second number of revolutions "N.sub.2" is set at 1500 rpm.
[0156] As shown in FIG. 12, there is no significant difference in
numerical value. However, the visual check shows that the coating
unevenness in the peripheral part is reduced when discharge is not
decelerated in step S1, and the acceleration of discharge is raised
in step S2 (or in other words, discharge is successively and
smoothly carried out).
[0157] Next, a result of analysis of variations of the thickness of
the coating film in the case where the first amount "M.sub.1" is
fixed, and the first number of revolutions "N.sub.1" is changed
will be described.
[0158] FIG. 14 is a graph showing relationships between the
thickness of coating films formed by changing the first number of
revolutions "N.sub.1" and the measurement position thereof. The
wafer used is a circular silicon substrate having a diameter of 300
mm on which no pattern is formed.
[0159] FIG. 14 shows three cases where the first number of
revolutions "N.sub.1" is 3000 rpm, 3500 rpm and 4000 rpm. The
amount of coating liquid dispensed (the first amount "M.sub.1") and
the duration of coating are 0.4 ml and 0.4 seconds, respectively,
which produce the best result under the conditions described
earlier. The thickness of the coating film is measured after the
coating film is baked to remove the solvent of the coating liquid
dispensed.
[0160] As shown in FIG. 14, when the amount of coating liquid
dispensed is 0.4 ml, as the number of revolutions increases, the
edge of the coating film moves outwardly. However, the coating film
does not spread over the entire surface of the substrate.
[0161] Next, a result of analysis of variations of the thickness of
the coating film in the case where the first amount "M.sub.1" is
fixed, and the first number of revolutions "N.sub.1" is changed
will be described.
[0162] As described above, after 0.4 ml of coating liquid is
dispensed onto the silicon substrate while rotating the silicon
substrate at the first number of revolutions "N.sub.1" of 3000 rpm
or 4000 rpm, the substrate is rotated for 10 or more seconds at the
same number of revolutions and then baked.
[0163] FIG. 15 is a top plan view of the substrate on which 0.4 ml
of coating liquid is dispensed. FIG. 16A is a graph showing
relationships between the thickness of coating films formed by
changing the duration of rotation at the first number of
revolutions "N.sub.1" of 3000 rpm and the measurement position
thereof. FIG. 16B is a graph showing relationships between the
thickness of coating films formed by changing the duration of
rotation at the first number of revolutions "N.sub.1" of 4000 rpm
and the measurement position thereof. The wafer used is a circular
silicon substrate having a diameter of 300 mm on which no pattern
is formed.
[0164] Regardless of whether the first number of revolutions
"N.sub.1" is 3000 rpm or 4000 rpm, the coating film is formed as
shown in FIG. 15, and the coating liquid at the peripheral part of
the substrate is streaked by the effect of the air resistance.
[0165] As shown in FIG. 16A, when the first number of revolutions
"N.sub.1" is 3000 rpm, it is observed that no coating film is
formed in the peripheral part of the wafer, or any coating film
formed in the peripheral part of the wafer has a larger thickness
than in the central part thereof because the coating liquid is
spattered to the peripheral part of the wafer and accumulated
there.
[0166] As shown in FIG. 16B, when the first number of revolutions
"N.sub.1" is 4000 rpm, it is observed that any coating film formed
in the peripheral part of the wafer has a larger thickness than in
the central part thereof because the coating liquid is spattered to
the peripheral part of the wafer and accumulated there.
[0167] As described above, it can be considered that, even if the
wafer is continued to rotate at the number of revolutions described
above, the entire surface of the substrate cannot be substantially
coated with the coating liquid.
[0168] Next, a result of analysis of the coating unevenness and the
in-plane uniformity in a case where a wafer having a pattern formed
thereon is coated with the coating liquid will be described.
[0169] Using a stepped (patterned) wafer having 280 chips
(including 72 defective chips in the peripheral part) mounted
thereon, optimal values of the number of revolutions, the amount of
chemical dispensed, the rate of discharge, the acceleration of
discharge and the deceleration of discharge are determined
according to a quality engineering method (Taguchi methods).
[0170] In the experiment, the L18 orthogonal table is used. FIG. 17
shows an allocation of the L18 orthogonal table. In this
experiment, the deceleration of discharge in step S2 is 40
ml/second.sup.2, and the total amount of coating liquid dispensed
is 1 ml. The wafer used as a base is a circular silicon substrate
having a diameter of 300 mm.
[0171] FIG. 18 is a factorial effect diagram showing the SN ratio
obtained by analysis of the number of chips that suffer uneven
coating in terms of smaller-the-better characteristic. In FIG. 18,
the abscissa indicates the factor symbols and levels thereof shown
in FIG. 17. In FIG. 18, higher SN ratios indicate lower coating
unevenness.
[0172] As shown in FIG. 18, as the number of revolutions "N.sub.1"
becomes higher, the number of revolutions "N.sub.2" becomes higher,
or the amount of coating liquid dispensed in step S1 becomes
larger, or when the coating liquid dispensing steps S1 and S2 are
successively carried out, the coating unevenness is reduced (that
is, the coating film formed on the substrate comes closer to the
outer edge of the substrate).
[0173] As for the number of revolutions, this result is
inconsistent with the result obtained under the conditions
described earlier that the coating unevenness is reduced as the
first number of revolutions "N.sub.1" becomes higher, and the
second number of revolutions "N.sub.2" becomes lower. This
inconsistency is probably because, although a flat substrate
(without a pattern) is used under the conditions described earlier,
a patterned substrate is used under the conditions for this
experiment, and therefore, a different tendency occurs.
[0174] It can be considered that, regardless of whether the
substrate has a pattern formed thereon or not, the coating film can
be formed on a wider area of the substrate by setting the first
number of revolutions "N.sub.1" higher than the second number of
revolutions "N.sub.2".
[0175] In addition, as shown in FIG. 18, both for steps S1 and S2,
as the discharge rate becomes lower, the coating unevenness is
reduced. As for the discharge rate, again, the result is
inconsistent with the result of the experiment carried out with the
substrate without a pattern. This is probably because a patterned
substrate is used in this experiment.
[0176] Therefore, it is preferred that the number of revolutions
and the discharge rate are approximately optimized depending on the
condition of the surface of the substrate used.
[0177] FIG. 19 is a factorial effect diagram showing the SN ratio
obtained by analysis of the film thickness uniformity at a recess
of a stepped part in terms of smaller-the-better characteristic. In
FIG. 19, the abscissa indicates the factor symbols and levels
thereof shown in FIG. 17. In FIG. 19, higher SN ratios indicate
higher film thickness uniformity.
[0178] As shown in FIG. 19, as the number of revolutions "N.sub.1"
becomes higher, or the number of revolutions "N.sub.2" becomes
higher, the film thickness uniformity is improved. As the amount of
coating liquid dispensed in step S1 becomes smaller, the film
thickness uniformity is improved. Furthermore, when the coating
liquid dispensing steps S1 and S2 are carried out at an interval,
the film thickness uniformity is improved. As the discharge rate in
step S1 or S2 becomes higher, the film thickness uniformity is
improved. Both for steps S1 and S2, as the discharge rate becomes
higher, the film thickness uniformity is improved.
[0179] In the case of the substrate without a pattern described
above, the discharge rate in step S1 has no effect on the film
thickness uniformity. In the case of the substrate without a
pattern, as the discharge rate in step S2 becomes higher, the film
thickness uniformity is improved. That is, this result is
inconsistent with the quality engineering result shown in FIG. 19.
This is probably because a substrate having a pattern formed
thereon is used in the experiment shown in FIG. 19.
[0180] Therefore, it is preferred that the discharge rate is
approximately optimized depending on the condition of the surface
of the substrate used.
[0181] Comparison between FIGS. 18 and 19 shows that the
requirements for reducing the coating unevenness and the
requirements for improving the film thickness uniformity are
incompatible. More specifically, from the viewpoint of reducing the
coating unevenness, it is preferred that the first and second
numbers of revolutions "N.sub.1" and "N.sub.2" are increased, the
first amount "M.sub.1" is increased (the second amount "M.sub.2" is
reduced), and the first and second discharge rates "V1" and "V2"
are reduced. To the contrary, from the viewpoint of improving the
film thickness uniformity, it is preferred that the first and
second numbers of revolutions "N.sub.1" and "N.sub.2" are reduced,
the first amount "M.sub.1" is reduced (the second amount "M.sub.2"
is increased), and the first and second discharge rates "V1" and
"V2" are increased. Therefore, in practice, each parameter has to
be approximately optimized so that the coating unevenness is
prevented while keeping the film thickness uniformity within an
allowable range.
[0182] Next, there will be shown an example in which parameters
optimized as described above are applied to a patterned substrate.
A circular silicon substrate having a diameter of 300 mm is used as
a base wafer. A pattern having a height difference of 500 nm and a
space dimension of 50 nm or more is formed on this substrate, and a
coating liquid is applied thereto. In this process, the first
number of evolutions "N.sub.1", the amount of coating liquid
dispensed and the duration of coating in step S1 are 3500 rpm, 0.4
ml and 0.4 seconds, respectively, the second number of evolutions
"N.sub.2", the amount of coating liquid dispensed and the duration
of coating in step S2 are 1500 rpm, 0.4 ml and 0.4 seconds,
respectively (the amounts of coating liquid dispensed "M.sub.1" and
"M.sub.2" are equal to each other, and the total amount of coating
liquid dispensed is 0.8 ml), and the number of revolutions
"N.sub.4" for determining the film thickness is 1563 rpm. The first
number of revolutions "N.sub.1", which has a significant effect on
the coating unevenness, is set as high as possible, and the second
number of revolutions "N.sub.2" is set lower from the viewpoint of
the film thickness uniformity. On the other hand, the first and
second amounts of coating liquid dispensed are set equal to each
other from the viewpoint of the film thickness uniformity.
[0183] In addition, for the sake of comparison, a sample produced
by coating a substrate having the same pattern height difference
with a coating liquid by a conventional spin coating method (under
the conditions that the number of revolutions in dispensing is 1200
rpm, and the amount of coating liquid dispensed is 2.0 ml) is also
prepared.
[0184] According to the conditions described above, the total
amount of coating liquid dispensed by the spin coating method
according to this embodiment is 0.8 ml, although the total amount
of coating liquid dispensed by the conventional spin coating method
is 2.0 ml. Thus, even though the spin coating method according to
this embodiment requires a reduced amount of coating liquid, the
spin coating method according to this embodiment can evenly form a
coating film having a uniform thickness over the entire surface of
the substrate as with the conventional coating method.
Comparison Example 1
[0185] As a comparison example 1, according to the conventional
spin coating method, an experiment is carried out by changing the
amount of coating liquid dispensed (the duration of discharge).
[0186] FIG. 20 is a diagram showing a coating sequence of the spin
coating method according to the comparison example 1. In the
comparison example 1, the first number of revolutions "N.sub.1" is
set at 1200 rpm, and the number of revolutions "N.sub.4" for
determining the film thickness is set at 694 rpm. The wafer used is
a circular silicon substrate without a pattern having a diameter of
300 mm.
[0187] FIG. 21 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the amount of coating liquid
dispensed according to the coating sequence of the comparison
example 1. FIG. 22 is a graph showing relationships between the
thickness of coating films formed by changing the amount of coating
liquid dispensed according to the coating sequence of the
comparison example 1 and the measurement position thereof in the
wafer surface.
[0188] As shown in FIG. 21, even if the amount of coating liquid
dispensed (the duration of discharge) is changed, the film
thickness and the film thickness uniformity do not significantly
vary. However, when the amount of coating liquid dispensed is equal
to or smaller than 1.0 ml (the duration of discharge is equal to or
less than 1.0 second), the coating film cannot be formed in the
edge part of the wafer. As described above, according to this
embodiment, the coating film can be formed in the edge part of the
wafer if the total amount of coating liquid dispensed is 0.7 ml,
for example.
[0189] Thus, according to the conventional spin coating method, the
coating film cannot be formed over the entire surface of the wafer
even if the amount of coating liquid dispensed is larger than the
amount of coating liquid dispensed in this embodiment.
Comparison Example 2
[0190] As a comparison example 2, an experiment is carried out
according to the same coating sequence as in the comparison example
1 shown in FIG. 20 by setting the amount "M.sub.1" of coating
liquid dispensed at 0.7 ml and changing the first number of
revolutions "N.sub.1". The wafer used is a circular silicon
substrate without a pattern having a diameter of 300 mm.
[0191] FIG. 23 is a table showing the in-plane uniformity
3.sigma./<x> of the thickness and the result of visual check
of coating films formed by changing the first number of revolutions
"N.sub.1" according to the coating sequence shown in FIG. 20. FIG.
24 is a graph showing relationships between the thickness of
coating films formed by changing the first number of revolutions
"N.sub.1" according to the coating sequence shown in FIG. 20 and
the measurement position thereof in the wafer surface.
[0192] As shown in FIG. 23, at all the number of revolutions, the
edge part cannot be coated. Furthermore, as the first number of
revolutions "N.sub.1" increases, the film thickness uniformity is
degraded.
[0193] In addition, as shown in FIG. 24, the film thickness at the
central part of the wafer does not significantly vary regardless of
the first number of revolutions "N.sub.1". However, as the first
number of revolutions "N.sub.1" increases, the film thickness of
the coating film at the edge part thereof increase, and the
thickness of the coating film varies in a bowl-shaped curve.
[0194] As described above, according to the conventional spin
coating method, if the total amount of coating liquid dispensed is
set at 0.7 ml as in this embodiment, the coating film cannot be
formed over the entire surface of the wafer even if the number of
revolutions of the substrate is changed.
[0195] As described above, according to the spin coating method and
the spin coating apparatus according to this embodiment, a coating
film can be formed on a wider area while reducing the amount of
coating liquid dispensed.
[0196] As described above, the coating material used in the
experiment in this embodiment is a material having a viscosity of 1
mPa*s.
[0197] However, the same effects or advantages can be achieved even
if a coating material having a viscosity equal to or higher than
0.1 mPa*s and equal to or lower than 1000 mPa*s at 25 degrees
Celsius is used. The viscosity may be out of the range described
above.
* * * * *