U.S. patent application number 13/034758 was filed with the patent office on 2012-08-30 for method for managing circuit reliability.
This patent application is currently assigned to INTERNATIONAL BUSINESS MACHINES CORPORATION. Invention is credited to Fen Chen, Kai D. Feng, Zhong-Xiang He.
Application Number | 20120218030 13/034758 |
Document ID | / |
Family ID | 46583229 |
Filed Date | 2012-08-30 |
United States Patent
Application |
20120218030 |
Kind Code |
A1 |
Chen; Fen ; et al. |
August 30, 2012 |
METHOD FOR MANAGING CIRCUIT RELIABILITY
Abstract
Managing reliability of a circuit that includes a plurality of
duplicate components, with less than all of the components being
active at any time during circuit operation, where reliability is
managed by operating, by the circuit, with a first set of
components that includes a predefined number of components;
selecting, without altering circuit performance and in accordance
with a circuit reliability protocol, a second set of components
with which to operate, including activating an inactive component
and deactivating an active component of the first set of
components; and operating, by the circuit, with the second set of
components.
Inventors: |
Chen; Fen; (Williston,
VT) ; Feng; Kai D.; (Hopewell Junction, NY) ;
He; Zhong-Xiang; (Essex Junction, VT) |
Assignee: |
INTERNATIONAL BUSINESS MACHINES
CORPORATION
Armonk
NY
|
Family ID: |
46583229 |
Appl. No.: |
13/034758 |
Filed: |
February 25, 2011 |
Current U.S.
Class: |
327/526 |
Current CPC
Class: |
H03K 19/00307
20130101 |
Class at
Publication: |
327/526 |
International
Class: |
H03K 19/003 20060101
H03K019/003 |
Claims
1. A method for managing reliability of a circuit, the circuit
comprising a plurality of duplicate components, each of the
components comprising one or more modules of electronic circuitry
and each of the components having a same operating characteristic,
less than all of the components being active at any time during
circuit operation, the method comprising: operating the circuit
with a first set of the components; selecting a second set of the
components with which to operate without altering circuit
performance and in accordance with a circuit reliability protocol,
including deactivating at least one component of the first set and
activating at least one other component of the circuit as part of
the second set; and operating the circuit with the second set of
components.
2. The method of claim 1 wherein selecting a second set of
components with which to operate further comprises: selecting the
second set of components with which to operate the circuit upon
expiration of a predefined period of time.
3. The method of claim 2 wherein: the circuit further comprises a
timer module, a circular shift register, and a plurality of
switches, each switch configured to electrically couple a component
for circuit operation; and the timer module is configured to signal
the circular shift register upon the expiration of the predefined
period of time; the circular shift register, responsive to the
timer module's signaling, is configured to signal a switch to
decouple a component from circuit operation and signal another
switch to couple another component for circuit operation.
4. The method of claim 1, further comprising accumulating, for each
component during circuit operation, an active time, wherein:
selecting a second set of components with which to operate further
comprises: detecting a power-on of the circuit; and responsive to
detecting the power-on, selecting, from among all components, a
predefined number of components having the lowest accumulated
active times.
5. The method of claim 4 wherein the circuit further comprises a
controller, non-volatile memory and a plurality of switches, the
controller operatively coupled to the non-volatile memory and the
plurality of switches, each switch configured to electrically
couple a component for circuit operation, the controller configured
to: accumulate each component's active time; store each component's
active time in the non-volatile memory; detect the power-on;
responsive to detecting the power-on, select the predefined number
of components having the lowest accumulated active times; signal
one or more switches to couple the selected components for circuit
operation; and signal one or more switches to decouple from circuit
operation components of the first set not identified as having the
lowest accumulated active times.
6. The method of claim 1 wherein: operating with the first set of
components further comprises monitoring, in real-time, a health
indicator of each component of the first set; and selecting the
second set of components with which to operate further comprises:
discovering that the health indicator of a component of the first
set does not meet acceptability criteria; and selecting, for
deactivation, the component having the unacceptable health
indicator.
7. The method of claim 4 wherein: the circuit further comprises a
controller, non-volatile memory, health monitoring logic, and a
plurality of switches, the health monitoring logic operatively
coupled to the controller, the controller operatively coupled to
the non-volatile memory and the plurality of switches, wherein:
each switch is configured to electrically couple a component for
circuit operation; the health monitoring logic is configured to
monitor the health indicator of each component of the first set,
discover that the health indicator of a component of the first set
does not meet acceptability criteria, and signal the controller
upon the discovery; and the controller is configured to store in
non-volatile memory an identification of the component having the
unacceptable health indicator, select a component not previously
having an unacceptable health indicator, signal a switch to couple
the selected component for circuit operation, and signal a switch
to decouple the component having the unacceptable health indicator
from circuit operation.
8. The method of claim 7 wherein the plurality of duplicate
components comprises a plurality of capacitor having the same
capacitance and the health monitoring logic monitors current
leakage of each active capacitor during circuit operation.
9. The method of claim 1 wherein the plurality of duplicate
components comprises a plurality of capacitors having the same
capacitance.
10. A circuit with managed reliability, the circuit comprising: a
plurality of duplicate components, each of the components
comprising one or more modules of electronic circuitry and each of
the components having a same operating characteristic, less than
all of the components being active at any time during circuit
operation; a first set of the components operating in the circuit;
and component selection logic configured to select a second set of
components with which to operate without altering circuit
performance and in accordance with a circuit reliability protocol,
including deactivating at least one component of the first set and
activating at least one other component of the circuit as part of
the second set.
11. The circuit of claim 10 wherein the component selection logic
is further configured to: selecting the second set of components
with which to operate the circuit upon expiration of a predefined
period of time.
12. The circuit of claim 11 wherein the component selection logic
further comprises: a timer module, a circular shift register, and a
plurality of switches, each switch configured to electrically
couple a component for circuit operation; wherein: the timer module
is configured to signal the circular shift register upon the
expiration of the predefined period of time; and the circular shift
register, responsive to the timer module's signaling, is configured
to signal a switch to decouple one component from circuit operation
and signal another switch to couple another component for circuit
operation.
13. The circuit of claim 10, wherein the component selection logic
further comprises: accumulation logic configured to accumulate, for
each component during circuit operation, an active time, wherein
the component selection logic is further configured to: detect a
power-on of the circuit; and responsive to detecting the power-on,
select, from among all components, a predefined number of
components having the lowest accumulated active times.
14. The circuit of claim 13 wherein the component selection logic
further comprising a controller, non-volatile memory and a
plurality of switches, the controller operatively coupled to the
non-volatile memory and the plurality of switches, each switch
configured to electrically couple a component for circuit
operation, wherein the controller is configured to: accumulate each
component's active time; store each component's active time in the
non-volatile memory; detect the power-on; responsive to detecting
the power-on, select the predefined number of components having the
lowest accumulated active times; signal one or more switches to
couple only the selected components for circuit operation.
15. The circuit of claim 10 wherein the component selection logic
further comprises: health monitoring logic configured to monitor,
in real-time, a health indicator of each component of the first
set; and discover that the health indicator of a component of the
first set does not meet acceptability criteria; wherein the
component selection logic is further configured to: deactivate the
component having the unacceptable health indicator; and activate
another component.
16. The circuit of claim 15, wherein the component selection logic
further comprises a controller, non-volatile memory, and a
plurality of switches, the controller operatively coupled to the
health monitoring logic, the non-volatile memory and the plurality
of switches, wherein: each switch is configured to electrically
couple a component for circuit operation; and the controller is
configured to store in non-volatile memory an identification of the
component having the unacceptable health indicator, select a
component not previously having an unacceptable health indicator,
signal a switch to couple the selected component for circuit
operation, and signal a switch to decouple the component having the
unacceptable health indicator from circuit operation.
17. The circuit of claim 16 wherein the plurality of duplicate
components comprises a plurality of capacitors having the same
capacitance and the health monitoring logic monitors current
leakage of each active capacitor during circuit operation.
18. The circuit of claim 10 wherein the plurality of duplicate
components comprises a plurality of capacitors having the same
capacitance.
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of the Invention
[0002] The field of the invention is circuit reliability, or, more
specifically, methods for managing circuit reliability and circuits
with managed reliability.
[0003] 2. Description Of Related Art
[0004] Integrated circuits are employed in various technologies,
apparatus, and systems. Such integrated circuits are often
characterized by several different parameters including yield,
performance, and reliability of the circuit. Reliability of
integrated circuits is increasingly becoming a more important
parameter to those selecting circuits for use in various
implementations.
SUMMARY OF THE INVENTION
[0005] Methods of managing reliability of a circuit are disclosed
in which the circuit includes a plurality of duplicate components,
with less than all of the components being active at any time
during circuit operation. Managing reliability of such a circuit in
accordance with embodiments of the present invention includes:
operating, by the circuit, with a first set of components, the
first set of components including a predefined number of
components; selecting, without altering circuit performance and in
accordance with a circuit reliability protocol, a second set of
components with which to operate, including activating an inactive
component and deactivating an active component of the first set of
components, the second set of components also including the
predefined number of components; and operating, by the circuit,
with the second set of components.
[0006] Circuits with managed reliability are also disclosed. Such
circuits include: a plurality of duplicate components, with less
than all of the components being active at any time during circuit
operation; a first set of the components operating in the circuit,
the first set including a predefined number of components; and
component selection logic configured to select, without altering
circuit performance and in accordance with a circuit reliability
protocol, a second set of components with which to operate,
including activating an inactive component and deactivating an
active component of the first set of components, the second set of
components also including the predefined number of components.
[0007] The foregoing and other objects, features and advantages of
the invention will be apparent from the following more particular
descriptions of exemplary embodiments of the invention as
illustrated in the accompanying drawings wherein like reference
numbers generally represent like parts of exemplary embodiments of
the invention.
BRIEF DESCRIPTION OF THE DRAWINGS
[0008] FIG. 1 sets forth a functional block diagram of an exemplary
circuit with managed reliability with a single-ended structure in
accordance with embodiments of the present invention.
[0009] FIG. 2 sets forth a functional block diagram of another
exemplary circuit with managed reliability with a differential
structure in accordance with embodiments of the present
invention.
[0010] FIG. 3 sets forth a functional block diagram of another
exemplary circuit with managed reliability in dependence upon
accumulated operating time in accordance with embodiments of the
present invention.
[0011] FIG. 4 sets forth a functional block diagram of another
exemplary circuit with managed reliability in dependence upon
health parameter monitoring in accordance with embodiments of the
present invention.
[0012] FIG. 5 sets forth a flow chart illustrating an exemplary
method for managing circuit reliability according to embodiments of
the present invention.
[0013] FIG. 6 sets forth a flow chart illustrating a further
exemplary method for managing circuit reliability according to
embodiments of the present invention.
[0014] FIG. 7 sets forth a flow chart illustrating a further
exemplary method for managing circuit reliability according to
embodiments of the present invention.
[0015] FIG. 8 sets forth a flow chart illustrating a further
exemplary method for managing circuit reliability according to
embodiments of the present invention.
DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS
[0016] Exemplary methods for managing reliability of a circuit and
circuits with managed reliability in accordance with the present
invention are described with reference to the accompanying
drawings, beginning with FIG. 1. FIG. 1 sets forth a functional
block diagram of an exemplary circuit with managed reliability in
accordance with embodiments of the present invention. The term
`reliability` is used in this specification to refer to a circuit's
operational time without failure--the greater the time before
failure, the greater the reliability of a circuit. One way to
increase reliability of a circuit is to reduce failure of
components forming the circuit.
[0017] The circuit (102) in the example of FIG. 1 includes a
plurality of duplicate components (106, 108, 110, and 112). A
`component` as the term is used here refers to one or more modules
of digital or analog circuitry. Examples of components include
resistors, capacitors, inductors, diodes, transistors, gates,
operational amplifiers, filters, digital-to-analog converters, and
so on as will occur to readers of skill in the art. Two or more
components may be duplicates in that the components have the same
primary operating characteristics: same capacitance for a
capacitor, same resistance for a resistor, same center frequency
and bandwidth for a notch filter, and so on as will occur to
readers of skill in the art. In the example circuit (102) each of
the duplicate components is formed by a switch consisting of a
field-effect-transistor (FET) (126) and a capacitor (128).
[0018] In the example circuit of FIG. 1, less than all of the
components are active at any time during circuit operation.
Described another way, at any given time during circuit operation,
only a predefined number of the duplicate components may be active.
The term `active` is used here to describe a component that is
coupled for operation in the circuit. In the example circuit (102)
of FIG. 1, a component is active, when the FET (126) of the
component couples the capacitor (128) of the component to the
signal source (104). The signal source (104) may be any source of
any electrical signal--digital or analog--in a circuit.
[0019] Reliability of the example circuit (102) of FIG. 1 is
managed in accordance with embodiments of the present invention, in
that a first set of the components (106, 108, 110, 112) operates in
the circuit. The first set of components includes a predefined
number of components. Consider, as an example for purposes of
explanation rather than limitation, that at any given time during
circuit (102) operation, only two of the four duplicate components
(106, 108, 110, and 112) in the circuit may be active--coupled for
operation. The first set of component may, in this example, may
include component (106) and component (108).
[0020] The circuit (102) of FIG. 1 also includes component
selection logic (114) configured to select, without altering
circuit performance and in accordance with a circuit reliability
protocol, a second set of components with which to operate. `Logic`
as the term is used here may refer to one or more modules of
digital or analog circuitry. The component selection logic (114)
may, for example, be formed of any combination of resistors,
capacitors, gates, switches, microprocessors, non-volatile or
volatile computer memory, diodes, transistors, and so on as will
occur to readers of skill in the art. In selecting the second set
of components with which to operate the circuit, the example
component selection logic (114) of FIG. 1 activates an inactive
component and deactivates an active component of the first set of
components. Continuing with the above example in which the first
set of components includes component (106) and component (108), the
component selection logic may activate component (110)--a
previously inactive component--and deactivate component (106) in
selecting the second set of components. Described another way, the
first set of components includes component (106) and component
(108) and the second set of components includes component (108) and
component (110). The `set of components` includes all active
components, while all of the other duplicate components are
inactive. Each of the duplicate components (106, 108, 110, 112) may
be activated or deactivated in the example of FIG. 1 by signaling
the component through the component's corresponding enable line
(116, 118, 120, 122).
[0021] The component selection logic operates in accordance with a
circuit reliability protocol. A circuit reliability protocol as the
term is used in this specification is a predefined method or
process specifying components to be selected for operation in a
circuit. Examples of circuit reliability protocols include a
protocol that specifies component to be selected in a rotational
manner, a protocol that specifies components having least
accumulated active times to be selected, a protocol that specifies
component selection upon discovery of a component having an
unacceptable health indicator, and so on. The term `health` refers
to a component's possibility to fail Many of these protocols are
described in detail below.
[0022] Regardless of the specifics of the circuit reliability
protocol employed by the component selection logic to select a
second set of components, the selection of the second set of
components does not alter the circuit's performance. That is, from
a circuit user's perspective, the circuit performs as expected
after selection. In fact, from a circuit user's perspective, the
selection may be completely unrecognized or undiscoverable.
Consider, as an example that as part of the selection of the second
set of components the capacitor forming the component (106) is
deactivated concurrently with an activation of the capacitor
forming the component (110). In this way, component (106) and
component (108)--being identical in primary operating
characteristics--operate in parallel as the first set of components
in exactly the same way that the component (108) and component
(110) of the second set of components operate: as two parallel
capacitors having the same capacitance. In effect, operational
workload of the circuit is distributed amongst different sets of
duplicate components over time. By distributing circuit workload
amongst various duplicate components, failures of individual
components of the circuit may be managed or reduced. In this
way--managing failures of individual components--reliability of the
overall circuit (102) is managed.
[0023] The example first and second set of components are described
here as a set of two components each. The example circuit (102) is
illustrated with four duplicate components. Readers of skill in the
art will recognize that a circuit configured in accordance with
embodiments of the present invention may include any number of
duplicate components and a `set` of components for operation in the
circuit may include any number of components--one or more. Further,
the arrangement of components (106, 108, 110, and 112), enable
lines (116, 118, 120, and 122), signal source (104), and component
selection logic (114) illustrated in the example circuit of FIG. 1
is for explanation, not for limitation. Readers of skill in the art
will recognize that circuits with reliability managed in accordance
with embodiments of the present invention may include a greater or
lesser number of duplicate components as well as other circuitry,
signal lines, logic, and so on. The circuit (102) in the example of
FIG. 1 may also be implemented in a variety of fashions, including
for example, as an integrated circuit, as a Field Programmable Gate
Array (FPGA), and so on as will occur to readers of skill in the
art.
[0024] FIG. 2 sets forth a functional block diagram of another
exemplary circuit with managed reliability in accordance with
embodiments of the present invention. The example circuit (102) of
FIG. 2 is similar to the circuit of FIG. 1 in that the circuit
(102) of FIG. 2 includes a plurality of duplicate components, a
first set of the components operating in the circuit, and component
selection logic configured to select, without altering circuit
performance and in accordance with a circuit reliability protocol,
a second set of components with which to operate.
[0025] In the example circuit of FIG. 2, the circuit reliability
protocol employed by the component selection logic specifies
selection of the second set of components with which to operate the
circuit upon expiration of a predefined period of time and further
specifies a rotational selection of subsequent sets of components.
That is, the example circuit of FIG. 2 operates in accordance with
a periodically rotating component selection circuit reliability
protocol, described in detail below.
[0026] The example circuit (102) of FIG. 2 operates in accordance
with such a circuit reliability protocol in that the component
selection logic includes a timer module (214), a circular shift
register (204), and a plurality of switches (206, 216, 208, 218,
210, 220, 212, and 222). Each switch is configured to electrically
couple a component (106, 108, 110, and 112) for circuit operation.
In fact, in the example of FIG. 2, each component is configured to
be coupled and decoupled to a signal source (104) by two
switches.
[0027] The example timer module (214) of the circuit (102) is
configured to signal the circular shift register upon the
expiration of a predefined period of time. The timer module (214)
may be implemented in various ways including for example: as a
frequency divider configured to divide a clock signal of the
circuit (102) into a low frequency signal, as a programmable timer,
or in other ways as will occur to readers of skill in the art.
[0028] The circular shift register (204), responsive to the timer
module's (214) signaling, is configured to signal a switch (206,
216, 208, 218, 210, 220, 212, and 222) to decouple a component
(106, 108, 110, and 112) from circuit operation and signal another
switch to couple another component for circuit operation. In the
example circuit (102) of FIG. 2, the circular shift register (204)
is configured to signal two switches concurrently, through an
enable (116, 118, 120, and 122) to couple or decouple a component
for circuit operation.
[0029] Consider, for further explanation of the component selection
in accordance with the periodically rotating component selection
component reliability protocol, the following table.
TABLE-US-00001 TABLE 1 Example Component States For A Periodically
Rotating Component Circuit Reliability Protocol With Sets Of Two
Active Components Comp. (106) Comp. (108) Comp. (110) Comp. (112)
T.sub.1 Active Active Inactive Inactive T.sub.2 Inactive Active
Active Inactive T.sub.3 Inactive Inactive Active Active T.sub.4
Active Inactive Inactive Active
[0030] Table 1 above sets forth component states for the duplicate
components of the example circuit (102) of FIG. 2 at four
subsequent periods of time. At T.sub.1, component (106) and
component (108) are active; all others are inactive. At T.sub.2,
component (108) and component (110) are active; all others are
inactive. At T.sub.3, component (110) and component (112) are
active; all others are inactive. At T.sub.4, component (112) and
component (106) are active; all others are inactive. This
rotational selection of components may continuing the same manner
over many time periods, effectively distributing operational
workload over several redundant and duplicate components.
[0031] FIG. 3 sets forth a functional block diagram of another
exemplary circuit with managed reliability in accordance with
embodiments of the present invention. The example circuit (102) of
FIG. 3 is similar to the circuit of FIG. 1 in that the circuit
(102) of FIG. 3 includes a plurality of duplicate components, a
first set of the components operating in the circuit, and component
selection logic configured to select, without altering circuit
performance and in accordance with a circuit reliability protocol,
a second set of components with which to operate.
[0032] In the example circuit of FIG. 3, the circuit reliability
protocol employed by the component selection logic specifies
selection of the second set of components with which to operate the
circuit in dependence upon the components' accumulated active time.
That is, the example circuit of FIG. 3 operates in accordance with
a least active component selection circuit reliability protocol.
This type of protocol may be employed in various implementations of
the circuit (102). For example, one circuit implementation in which
the least active component selection circuit reliability protocol
may be employed is an implementation in which the circuit
experiences a power cycle (a power-off followed by a power on) on a
regular basis.
[0033] In the example circuit (102) of FIG. 3, however, the
component selection logic includes a controller (306), accumulation
logic (302), non-volatile memory (308), and a plurality of switches
(206, 208, 210, 212, 216, 218, 220, and 222). Each switch (206,
216, 208, 218, 210, 220, 212, 222) is configured to electrically
couple a component for circuit operation.
[0034] The controller (306) is operatively coupled to the
non-volatile memory (308), the plurality of switches, and the
accumulation logic (302). In the example of FIG. 3, the controller
(306) is described here as `operatively coupled` to the
non-volatile memory (308) and the accumulation logic (302) in that
the controller (306) includes the non-volatile memory (308) and
accumulation logic (302). In fact, in some embodiments, the
accumulation logic may be implemented as software executing in a
computer processor of the controller (306) or as one or more
modules of digital or analog circuitry.
[0035] The accumulation logic (302) in the example of FIG. 3 is
configured to accumulate, for each component during circuit
operation, an active time (102). Consider, for example, that
component (106) operates for two days during a first period of
operation and later, after a power cycle (power-off followed by a
power-on), operates for another day. The accumulation logic (302)
is configured to accumulate three days of active time for the
component (106). Accumulation logic (302) in some embodiments is
formed of a timer or counter that tracks the active time of a
component. The controller (306) in the example circuit (102) of
FIG. 3, through use of the accumulation logic (302), is configured
to store each component's active time (310) in the non-volatile
memory (308).
[0036] The example controller (306) of FIG. 3 is also configured to
detect a power-on (304) of the circuit, and, responsive to
detecting the power-on, select the predefined number of components
having the lowest accumulated active times (310). The example
controller (306) then signals one or more switches to couple only
the selected components for circuit operation.
[0037] FIG. 4 sets forth a functional block diagram of another
exemplary circuit with managed reliability in accordance with
embodiments of the present invention. The example circuit (102) of
FIG. 4 is similar to the circuit of FIG. 1 in that the circuit
(102) of FIG. 4 includes a plurality of duplicate components, a
first set of the components operating in the circuit, and component
selection logic configured to select, without altering circuit
performance and in accordance with a circuit reliability protocol,
a second set of components with which to operate.
[0038] In the example circuit of FIG. 4, the circuit reliability
protocol employed by the component selection logic specifies
selection of the second set of components with which to operate the
circuit in dependence upon real-time indicators of the components'
health. The term `health` refers to a component's possibility to
fail.
[0039] The component selection logic in the example circuit (102)
of FIG. 4 includes health monitoring logic (404, 406, 408, and
410), a controller (36), non-volatile memory (308), and a plurality
of switches (206, 216, 208, 218, 210, 220, 212, 222). The
controller (306) in the example of FIG. 4 is operatively coupled to
the health monitoring logic (404, 406, 408, and 410), the
non-volatile memory (408), and the plurality of switches (206, 216,
208, 218, 210, 220, 212, 222).
[0040] The example health monitoring logic (404, 406, 408, 410) of
FIG. 4 is configured to monitor, in real-time, a health indicator
of each component of the first set. A health indicator is an
operating characteristic that, when measured, indicates whether a
component is near failure. One example of a health indicator is
leakage current of a capacitor. If the leakage current is greater
than a predefined threshold, the capacitor is likely near
failure.
[0041] The health monitoring logic (406) in the example of FIG. 4
is also configured to discover that the health indicator of a
component of the first set of active components does not meet
acceptability criteria. Acceptability criteria is a specification
of an acceptable health indicator for a component.
[0042] The controller (306) in the example of FIG. 4 is configured
to store in non-volatile memory (308) an identification (402) of
the component having the unacceptable health indicator. The
controller is also configured to select a component not previously
having an unacceptable health indicator. The controller may select
a component not previously having an unacceptable health indicator
in dependence upon the component identifiers (402) stored in
non-volatile memory. The controller (306) may then signal one or
more switches to couple the selected component for circuit
operation and signal one or more switches to decouple the component
having the unacceptable health indicator from circuit
operation.
[0043] For further explanation, FIG. 5 sets forth a flow chart
illustrating an exemplary method for managing circuit reliability
according to embodiments of the present invention. The example
method of FIG. 5 may be carried out with regard to a circuit
similar to the circuit depicted in FIG. 1, which includes a
plurality of duplicate components, with less than all of the
components being active at any time during circuit operation.
[0044] The method of FIG. 5 includes operating (502), by the
circuit, with a first set of components. In the example of FIG. 5,
the first set of components includes a predefined number of
components. The circuit may operate (502) with a set of components
by electrically or operatively coupling each of the components in
the set of components into main circuit operation with one or more
switches.
[0045] The method of FIG. 5 also includes selecting (504), without
altering circuit performance and in accordance with a circuit
reliability protocol (512), a second set of components with which
to operate. In the method of FIG. 5, selecting (504) a second set
of components with which to operate is carried out by activating
(506) an inactive component and deactivating (508) an active
component of the first set of components. In the method of FIG. 5,
the second set of components includes the predefined number of
components--that is, the same number of components as the first
set.
[0046] The method of FIG. 5 continues by operating (510), by the
circuit, with the second set of components. The method of FIG. 5
may be repeated for subsequent sets of components in dependence
upon the specification of the circuit reliability protocol (512).
Various specifications of the circuit reliability protocol (512)
are presented in greater detail with respect to FIGS. 6-8.
[0047] For further explanation, therefore, FIG. 6 sets forth a flow
chart illustrating a further exemplary method for managing
reliability of a circuit according to embodiments of the present
invention. The method of FIG. 6 is similar to the method of FIG. 5,
including as it does, operating (502), by the circuit, with a first
set of components, selecting (504) a second set of components with
which to operate, and operating (510), by the circuit, with the
second set of components.
[0048] The method of FIG. 6 differs from the method of FIG. 5,
however, in that selecting (504) a second set of components with
which to operate is carried out by selecting (602) the second set
of components with which to operate the circuit upon expiration of
a predefined period of time. Selecting (602) the second set of
components with which to operate the circuit upon expiration of a
predefined period of time may be carried by various circuit
elements including a timer module, a circular shift register, and a
plurality of switches, where each switch configured to electrically
couple a component for circuit operation. In such an example
circuit, the timer module may be configured to signal the circular
shift register upon the expiration of the predefined period of time
and the circular shift register, responsive to the timer module's
signaling, may be configured to signal a switch to decouple a
component from circuit operation and signal another switch to
couple another component for circuit operation.
[0049] For further explanation, therefore, FIG. 7 sets forth a flow
chart illustrating a further exemplary method for managing
reliability of a circuit according to embodiments of the present
invention. The method of FIG. 7 is similar to the method of FIG. 5,
including as it does, operating (502), by the circuit, with a first
set of components, selecting (504) a second set of components with
which to operate, and operating (510), by the circuit, with the
second set of components.
[0050] The method of FIG. 7 differs from the method of FIG. 6,
however, in that the method of FIG. 7 includes accumulating (702),
for each component during circuit operation, an active time. The
method of FIG. 7 also differs from the method of FIG. 6 in that, in
the method of FIG. 7, selecting (504) the second set of components
with which to operate is carried out by detecting (704) a power-on
(708) of the circuit and, responsive to detecting the power-on,
selecting (706), from among all components, the predefined number
of components having the lowest accumulated active times (702).
Accumulating (702) active times, detecting (704) a power-on (708),
and selecting (706) components having the lowest accumulated active
times (702), may be carried out with various circuit elements
including a controller, non-volatile memory, and a plurality of
switches. The controller may be operatively coupled to the
non-volatile memory and the plurality of switches, with each switch
configured to electrically couple a component for circuit
operation. The controller may also be configured to accumulate
(702) each component's active time; store each component's active
time in the non-volatile memory; detect (704) the power-on; select
(706) the predefined number of components having the lowest
accumulated active times; signal one or more switches to couple the
selected components for circuit operation; and signal one or more
switches to decouple from circuit operation components of the first
set not identified as having the lowest accumulated active
times.
[0051] For further explanation, therefore, FIG. 8 sets forth a flow
chart illustrating a further exemplary method for managing
reliability of a circuit according to embodiments of the present
invention. The method of FIG. 8 is similar to the method of FIG. 5,
including as it does, operating (502), by the circuit, with a first
set of components, selecting (504) a second set of components with
which to operate, and operating (510), by the circuit, with the
second set of components.
[0052] The method of FIG. 8 differs from the method of FIG. 7,
however, in that in the method of FIG. 8 operating (502) with the
first set of components includes monitoring (802), in real-time, a
health indicator (806) of each component of the first set. In
embodiments in which the duplicate components includes capacitors
having the same capacitance, monitoring (802) a health indicator
includes monitoring current leakage of each active capacitor during
circuit operation.
[0053] In the method of FIG. 8, selecting (504) the second set of
components with which to operate includes discovering (808) that
the health indicator of a component of the first set does not meet
acceptability criteria (804) and selecting (810), for deactivation,
the component having the unacceptable health indicator.
[0054] The method of FIG. 8 may be carried out with circuit
elements including a controller, non-volatile memory, health
monitoring logic, and a plurality of switches. The health
monitoring logic may be operatively coupled to the controller, and
the controller may be operatively coupled to the non-volatile
memory and the plurality of switches. Each switch may be configured
to electrically couple a component for circuit operation; the
health monitoring logic may be configured to monitor the health
indicator of each component of the first set, discover that the
health indicator of a component of the first set does not meet
acceptability criteria, and signal the controller upon the
discovery; and the controller may be configured to store in
non-volatile memory an identification of the component having the
unacceptable health indicator, select a component not previously
having an unacceptable health indicator, signal a switch to couple
the selected component for circuit operation, and signal a switch
to decouple the component having the unacceptable health indicator
from circuit operation.
[0055] It will be understood from the foregoing description that
modifications and changes may be made in various embodiments of the
present invention without departing from its true spirit. The
descriptions in this specification are for purposes of illustration
only and are not to be construed in a limiting sense. The scope of
the present invention is limited only by the language of the
following claims.
* * * * *