U.S. patent application number 13/358752 was filed with the patent office on 2012-05-31 for auto-calibrating a magnetic field sensor.
Invention is credited to Mustafa Badaroglu, Olivier Charlier, Francois Laulanet.
Application Number | 20120133356 13/358752 |
Document ID | / |
Family ID | 37491439 |
Filed Date | 2012-05-31 |
United States Patent
Application |
20120133356 |
Kind Code |
A1 |
Charlier; Olivier ; et
al. |
May 31, 2012 |
AUTO-CALIBRATING A MAGNETIC FIELD SENSOR
Abstract
In one embodiment a method to compensate for the sensitivity
drift of a magnetic field sensor for sensing a magnetic field
comprises forming a reference magnetic field having first magnetic
field parameters, e.g. a first amplitude and/or direction, in a
first step and second magnetic field parameters, a second amplitude
and/or direction, in a second step and a bias signal is formed
without adjusting the bias signal with a feedback signal derived
from an output signal of the magnetic field sensor.
Inventors: |
Charlier; Olivier; (Brussel,
BE) ; Laulanet; Francois; (Bruxelles, BE) ;
Badaroglu; Mustafa; (Waterlelielaan, BE) |
Family ID: |
37491439 |
Appl. No.: |
13/358752 |
Filed: |
January 26, 2012 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
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11873331 |
Oct 16, 2007 |
8134358 |
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13358752 |
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Current U.S.
Class: |
324/202 |
Current CPC
Class: |
G01R 33/0035 20130101;
G01R 33/07 20130101; G01R 33/0017 20130101; G01R 33/0206
20130101 |
Class at
Publication: |
324/202 |
International
Class: |
G01R 35/00 20060101
G01R035/00 |
Foreign Application Data
Date |
Code |
Application Number |
Oct 16, 2006 |
GB |
0620307.9 |
Claims
1. (canceled)
2. (canceled)
3. (canceled)
4. (canceled)
5. (canceled)
6. (canceled)
7. (canceled)
8. (canceled)
9. (canceled)
10. (canceled)
11. (canceled)
12. (canceled)
13. A method to compensate the sensitivity drift of a magnetic
field sensor for sensing a magnetic field, the sensor comprising at
least four electrodes, the method comprising: a first step where a
first set of two electrodes is used to bias the sensor and a second
set of two electrodes is used to sense an output signal of the
magnetic field sensor; and a second step where the second set of
two electrodes is used to bias the sensor and the first set of two
electrodes is used to sense an output signal of the magnetic field
sensor; the method being characterized in that: a reference
magnetic field is formed having first magnetic field parameters in
the first step and second magnetic field parameters in the second
step; and the output signal is sensed in the first and in the
second steps wherein during both the first and second steps the
bias signal is formed without adjusting the bias signal with a
feedback signal that is derived from the output signal.
14. A method according to claim 13, characterized in that the
second step includes first and second sub-steps and wherein during
both the first step and one of the first and second sub-steps of
the second step the reference magnetic field has a first amplitude
and a first phase that are substantially equal and during only one
of the first or second sub-steps the reference magnetic field has
one of a) an amplitude that is different than the first magnetic
field parameters, b) a zero amplitude, or c) the first amplitude
and an opposite phase to the first phase.
15. A method according to claim. 13, characterized in that the
second step includes first and second sub-steps and wherein during
both the first step and one of the first and second sub-steps of
the second step the reference magnetic field has a first amplitude
and a first phase that are substantially equal and during only one
of the first or second sub-steps the reference magnetic field has
one of a) a greater amplitude than the first amplitude and has the
first phase, or b) a zero amplitude.
Description
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This patent application claims the benefit of British Patent
Application Serial No. 0620307.9, filed Oct. 16, 2006, which patent
application is incorporated herein by reference in its
entirety.
DESCRIPTION
[0002] 1. Field of the Invention
[0003] The present invention proposes hardware and associated
methods to eliminate the offset and the variation of sensitivity
affecting magnetic sensors, e.g. integrated Hall sensors. The
invention is also of application to other magnetic sensors for
which an offset value can be isolated from an output value by using
two phases that differ by the direction or the amplitude of a bias
signal.
[0004] 2. Background of the Invention
[0005] A Hall sensor for sensing magnetic fields is advantageously
integrated in a semiconductor substrate. Such a sensor is typically
a planar region of a semiconductor substrate, typically a square
region of said substrate, also known as Hall plate, that is
implanted with dopant impurities and contacted at least at four
points of the square, typically the corners of the square (see FIG.
1). Two diagonally opposed electrodes are used to bias the sensor
i.e. force a current I.sub.Bias through the doped planar region.
When a magnetic field B.sub.Ext is applied perpendicularly to the
doped planar region, a difference of potential V.sub.H appears
across the plate and can be measured between the two remaining
electrodes (the sense electrodes):
V.sub.H=SB.sub.Ext+Vop
where B.sub.Ext is the component of the magnetic field that is
perpendicular to the plate, S is the sensitivity of the plate and
Vop is an offset, i.e. a non zero voltage that can be measured
between the two sense electrodes when B.sub.Ext=0. The sensitivity
S of the Hall plate is proportional to the bias current I.sub.Bias.
The sensitivity S of the Hall plate is usually a function of the
temperature, the magnitude of B.sub.Ext, thermal shocks, aging of
the semiconductor material from which the substrate is made,
etc.
[0006] In "Monolithic Magnetic Hall Sensor Using Dynamic Quadrature
Offset Cancellation" Alberto Bilotti et al. describe the simplest
dynamic offset cancellation technique. It uses a single square
plate with four contacts where the quadrature states are generated
by periodically connecting the supply voltage and the signal
conditioner input to different pairs of contacts, as shown in FIG.
2. Each state, which will be called from now on a first and a
second state or a 0 deg and a 90 deg state, is defined by the
complementary clock signals ck1 and ck1, respectively. Assuming
B.sub.Ext=0 and an ideal Wheatstone bridge model for the Hall
plate, the voltages appearing at the output contacts are the plate
offsets V.sub.op(0 deg) and V.sub.op(90 deg) which are equal in
magnitude but have opposite polarities (see bottom graph of FIG.
2). This can be verified in very simple way as follows. Assume that
an imbalance, for example due to a stress pattern, occurs such that
the region between the left hand side and the top contacts a and b
shows a resistivity smaller than the rest of the plate and that
this situation does not change when changing states. Then, the
offsets developed at each state have the same magnitude but
opposite polarities, as the same imbalance occurs in adjacent
branches of the equivalent bridge network (the Hi terminal will be
more positive than the Lo terminal in the 0 deg state but more
negative in the 90 deg state). For B.sub.Ext.noteq.0, as the supply
and output connections rotate in the same direction, the
contribution of B.sub.Ext to V.sub.H keeps its polarity unchanged,
making it invariant. This characteristic of the contribution of
B.sub.Ext to V.sub.H derives from the antireciprocal property of a
symmetrical Hall plate. There appears, therefore, a simple way to
discriminate the offset from the useful signal and further
cancelling the offset by appropriate signal conditioning. Although
in FIG. 2, it can be seen that the measured signal V.sub.H is
quasi-constant and the offset signal Vop is an alternating square
wave, waveforms can be interchanged if desired by interchanging
diagonally opposed output contacts a and c during the second or 90
deg phase. As an ideally perfect cancellation is never possible,
there is in practice a residual plate offset V.sub.opr defined as
V.sub.opr=|V.sub.op(0 deg)|-|V.sub.op(90 deg)| where absolute
values have been preferred for emphasizing the polarity reversals
occurring during further signal processing. Depending on the
fabrication process, Hall plate geometry and crystallographic
orientation, and residual wafer and package stresses, the residual
plate offset may range between 50-500 .mu.V for a 5-V supply. For
the sake of simplicity and unless specified otherwise, it is
assumed that |V.sub.op(0 deg)|=|V.sub.op(90 deg)|=Vop. The Hall
voltage measured across the sense electrodes in the 0 deg state
is:
V.sub.H1=SB.sub.Ext+V.sub.op (Eq. 1)
and in the 90 deg state:
V.sub.H2=SB.sub.Ext-V.sub.op (Eq. 2)
By summing Eq. 1 and Eq. 2, the following is obtained:
V.sub.H1+V.sub.H2=2SB.sub.Ext
which is independent of the offset voltage.
[0007] While the dynamic offset cancellation technique explained
here above solves the problem of the offset, it does not solve the
problem of variations of sensitivity. The sensitivity S of any
integrated Hall sensor will vary in function of the temperature, in
function of time (aging of the semi-conductor substrate in which
the Hall sensor is integrated, aging of the packaging protecting
the semiconductor substrate), in function of the amplitude of the
magnetic field (which corresponds to a non linearity of the
sensor). The temperature dependency for instance can be compensated
for by different compensation circuits based on measurements of the
sensitivity at different temperatures. Some compensation circuits
are dimensioned once and for all. If the temperature dependency of
the sensitivity varies for one reason or another, those
compensation circuits will not be able to compensate adequately for
the temperature variations.
[0008] To compensate for the deficiencies of the kind of circuits
briefly covered here above, Demierre et al. propose in "Reference
Magnetic Actuator for Self-Calibration Of a Very Small Hall Sensor
Array", Sensors and Actuators A 97-98 (2002), pages 39-46, to use a
known, well determined reference magnetic field B.sub.Cal to
calibrate the Hall sensor. To differentiate the reference magnetic
field form the external magnetic field that one wants to measure,
Demierre et al. uses an array of 4 Hall sensors, each sensor being
associated with a coil. Each coil generates a known magnetic field.
Hence, separation of the external magnetic field and the reference
magnetic field generated by the coils requires several coils and
several Hall sensors. This is not always desired if the power
available for operation of the sensor is limited and/or if the area
of semiconductor substrate available to integrate the Hall sensors
is limited.
[0009] In "CMOS Integrated Magnetic Field Source Used as a
Reference in Magnetic Field Sensors on Common Substrate" published
in the proceedings of the IMTC 94 (Instrumentation and Measurement
Technology Conference 1994. IMTC/94 Conference Proceedings, 10th
Anniversary, Advanced Technologies in I & M., 1994, IEEE
Publication Date of May 10-12, 1994, pages 461-463. Vol. 2),
Trontelj et al. also rely on a reference magnetic field B.sub.Cal
generated by a coil surrounding the Hall sensor to calibrate the
Hall sensor and to compensate sensitivity drifts. To separate the
external magnetic field B.sub.Ext from the reference magnetic field
B.sub.Cal, the reference magnetic field is modulated at a
pre-determined frequency higher than the clock signal that
determines the 0 deg and 90 deg phase. The contributions to the
Hall voltage of both fields are then separated with a very
selective filter. Such a filter is not always easy to realize and
furthermore consumes additional power and silicon area. There
remains a need for improvement.
SUMMARY OF THE INVENTION
[0010] It is an object of embodiments of the present invention to
provide good magnetic sensor devices or good methods for providing
magnetic sensing.
[0011] The above objective is accomplished by a device and a method
according to the present invention.
[0012] In an aspect, the present invention proposes to isolate the
contribution of a reference magnetic field B.sub.Cal to the output
signal of a magnetic sensor from the contribution of an external
magnetic field B.sub.Ext to the same output signal without having
to use several sensors and/or specific filters as in the prior art.
Having isolated the contribution from the reference magnetic field,
it is easy to evaluate the sensitivity drift of the magnetic sensor
generating the output signal and to compensate for said sensitivity
drift.
[0013] A sensor according to embodiments of the present invention
comprises at least four electrodes, two of which are used to bias
the sensor by circulating a bias current through the sensor and two
of which are used to sense an output signal, e.g. voltage, V.sub.H.
The sensor is surrounded by a reference magnetic field generator,
e.g. a current carrying coil, said reference magnetic field
generator, e.g. coil, being used to generate a reference magnetic
field B.sub.Cal.
[0014] In a first aspect, the present invention provides a method
to compensate the sensitivity drift of a magnetic field sensor for
sensing a magnetic field. The magnetic field sensor comprises at
least four electrodes. The method comprises a first step where a
first set of two electrodes is used to bias the sensor and a second
set of two electrodes is used to sense an output signal, e.g. a
voltage signal, of the magnetic field sensor, and a second step
where the second set of two electrodes is used to bias the sensor
and the first set of two electrodes is used to sense an output
signal of the magnetic field sensor. The method is characterized in
that at least one of the first or the second step is subdivided in
at least a first sub-step and a second sub-step. A reference
magnetic field has first magnetic field parameters, e.g. a first
amplitude and/or direction, in the first sub-step and second
magnetic field parameters, a second amplitude and/or direction, in
the second sub-step. At least one of the first magnetic field
parameters is different from the second magnetic field parameters.
An output signal is sensed in the first and in the second step, and
within the first or the second step an output signal is sensed in
the first and the second sub-step. This means that within the first
or the second step, the output signal is sensed both when the
calibration magnetic field B.sub.Cal assumes the first magnetic
field parameters, e.g. a first amplitude, and when the calibration
magnetic field assumes the second magnetic field parameters, e.g. a
second amplitude.
[0015] In embodiments of the present invention, the reference
magnetic field generated during the first sub-step may have the
same amplitude as the reference magnetic field generated during the
second sub-step, both reference magnetic fields having an opposite
direction.
[0016] In alternative embodiments of the present invention, the
reference magnetic field generated during the first sub-step may
have the same direction as the reference magnetic field generated
during the second sub-step, both reference magnetic fields having a
different amplitude. In particular embodiments, one of the
amplitudes may be zero amplitude (i.e. B.sub.Cal=0).
[0017] In yet other embodiments of the present invention, the
reference magnetic field has a monotonically changing amplitude
during the first or the second sub-step.
[0018] A method according to embodiments of the present invention
may furthermore comprise performing a correlated double sampling on
the sensed output signal of the magnetic field sensor.
[0019] In a specific embodiment, the present invention provides a
method to isolate the contribution of a reference magnetic field to
the output signal of a magnetic field sensor. The method
comprises:
[0020] a first step where a first set of two electrodes is used to
bias the sensor and a second set of two electrodes is used to sense
a voltage; and
[0021] a second step where the second set of two electrodes is used
to bias the sensor and the first set of two electrodes is used to
sense a voltage;
[0022] the method being characterized in that at least one of the
first or the second step is subdivided in at least two sub-steps (a
first sub-step and a second sub-step), the reference magnetic field
generated by the magnetic field generator, e.g. coil, assuming a
first amplitude and/or direction in the first sub-step and a second
amplitude and/or direction in the second sub-step.
[0023] The above-described method embodiments of the present
invention may be implemented in a processing system. One
configuration of a processing system includes at least one
programmable processor coupled to a memory subsystem that includes
at least one form of memory, e.g., RAM, ROM, and so forth. It is to
be noted that the processor or processors may be a general purpose,
or a special purpose processor, and may be for inclusion in a
device, e.g., a chip that has other components that perform other
functions. Thus, one or more aspects of the present invention can
be implemented in digital electronic circuitry, or in computer
hardware, firmware, software, or in combinations of them. The
processing system may include a storage subsystem that has at least
one disk drive and/or CD-ROM drive and/or DVD drive. In some
implementations, a display system, a keyboard, and a pointing
device may be included as part of a user interface subsystem to
provide for a user to manually input information, for example to
input instructions for performing a calibration step. Ports for
inputting and outputting data also may be included. One of such
port may for example receive external triggers, such as e.g.
temperature signals, for triggering a calibration step. More
elements such as network connections, interfaces to various
devices, and so forth, may be included as well, but are not
described in detail. The various elements of the processing system
may be coupled in various ways, including via a bus subsystem,
which may be a single bus, but will be understood to those in the
art to include a system of at least one bus. The memory of the
memory subsystem may at some time hold part or all of a set of
instructions that when executed on the processing system implement
the steps of the method embodiments described herein. Thus, while a
processing system as described above is prior art, a system that
includes the instructions to implement aspects of the methods for
compensating for the sensitivity drift of a magnetic field sensor
device is not prior art.
[0024] The present invention also includes a computer program
product which provides the functionality of any of the methods
according to the present invention when executed on a computing
device. Such computer program product can be tangibly embodied in a
carrier medium carrying machine-readable code for execution by a
programmable processor. The present invention thus relates to a
carrier medium carrying a computer program product that, when
executed on computing means, provides instructions for executing
any of the methods as described above. The term "carrier medium"
refers to any medium that participates in providing instructions to
a processor for execution. Such a medium may take many forms,
including but not limited to, non-volatile media, and transmission
media. Non-volatile media includes, for example, optical or
magnetic disks, such as a storage device which is part of mass
storage. Common forms of computer readable media include, a CD-ROM,
a DVD, a flexible disk or floppy disk, a memory key, a tape, a
memory chip or cartridge or any other medium from which a computer
can read. Various forms of computer readable media may be involved
in carrying one or more sequences of one or more instructions to a
processor for execution. The computer program product can also be
transmitted via a carrier wave in a network, such as a LAN, a WAN
or the Internet. Transmission media can take the form of acoustic
or light waves, such as those generated during radio wave and
infrared data communications. Transmission media include coaxial
cables, copper wire and fibre optics, including the wires that
comprise a bus within a computer.
[0025] In a further aspect, the present invention provides a
magnetic field measurement device. The magnetic field measurement
device according to embodiments of the present invention
comprises:
[0026] a magnetic field sensor, e.g. a Hall sensor, for sensing a
magnetic field, the magnetic field sensor comprising at least four
electrodes;
[0027] a biasing element for biasing the magnetic field sensor;
[0028] a measurement circuit for measuring an output signal of the
magnetic field sensor;
[0029] a switch box for connecting a first set of electrodes to the
biasing element; and
[0030] a second set of electrodes to the readout circuitry during a
first time period, and for connecting the second set of electrodes
to the biasing element and the first set of electrodes to the
readout circuitry during a second time period;
[0031] a reference magnetic field generator for generating a
reference magnetic field; and
[0032] a reference magnetic field biasing element for changing
magnetic field parameters of the reference magnetic field.
[0033] The magnetic field measurement device is adapted for
changing the reference magnetic field parameters within at least
one of the first or the second time period.
[0034] In embodiments of the present invention, the measurement
circuit is adapted to sense an output signal of the magnetic field
sensor at least once during each of the first and the second time
period, and during at least one of the first and the second time
period before and after changing of the reference magnetic field
parameters.
[0035] Particular and preferred aspects of the invention are set
out in the accompanying independent and dependent claims. Features
from the dependent claims may be combined with features of the
independent claims and with features of other dependent claims as
appropriate and not merely as explicitly set out in the claims.
[0036] The above and other characteristics, features and advantages
of the present invention will become apparent from the following
detailed description, taken in conjunction with the accompanying
drawings, which illustrate, by way of example, the principles of
the invention. This description is given for the sake of example
only, without limiting the scope of the invention. The reference
figures quoted below refer to the attached drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0037] FIG. 1 is a schematic presentation of a standard Hall
plate.
[0038] FIG. 2 shows the principle of the dynamic offset
cancellation technique from the prior art.
[0039] FIG. 3 illustrates phase 1 of a first embodiment of a method
according to embodiments of the present invention to isolate the
contributions of the external magnetic field, the reference
magnetic field and the offset to the output of the signal of the
sensor.
[0040] FIG. 4 illustrates phase 2, sub-phase 1 of the first
embodiment of a method according to embodiments of the present
invention.
[0041] FIG. 5 illustrates phase 2, sub-phase 2 of the first
embodiment of a method according to embodiments of the present
invention.
[0042] FIG. 6 illustrates a time chart for a method according to
the first embodiment of the present invention.
[0043] FIG. 7 illustrates a time chart for a method according to a
second embodiment of the present invention.
[0044] FIG. 8 illustrates a time chart for a method according to a
third embodiment of the present invention.
[0045] FIG. 9 illustrates a time chart for a method according to a
fourth embodiment of the present invention.
[0046] FIG. 10 illustrates an implementation of a device according
to an embodiment of the present invention suitable for performing
any of the methods of the present invention.
[0047] FIG. 11 illustrates an embodiment of a current source for
use as a calibration element in a device according to embodiments
of the present invention.
[0048] FIG. 12 illustrates another embodiment of a current source
for use as a calibration element in a device according to
embodiments of the present invention.
[0049] FIG. 13A illustrates a timing chart corresponding to a
method according to the second embodiment of the present
invention.
[0050] FIG. 13B illustrates a digital circuit that will generate
signals for obtaining the timing chart of FIG. 13A.
[0051] FIG. 14 illustrates a timing chart for a method according to
a further embodiment of the present invention.
[0052] FIG. 15A and FIG. 15B illustrate a correlated double
sampling (CDS) stage for use with a device according to embodiments
of the present invention, and the operation thereof.
[0053] FIG. 16 illustrates use of the circuit of FIG. 15A and FIG.
15B in case CDS is not required.
[0054] In the different figures, the same reference signs refer to
the same or analogous elements.
DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS
[0055] The present invention will be described with respect to
particular embodiments and with reference to certain drawings but
the invention is not limited thereto but only by the claims. The
drawings described are only schematic and are non-limiting. In the
drawings, the size of some of the elements may be exaggerated and
not drawn on scale for illustrative purposes. The dimensions and
the relative dimensions do not correspond to actual reductions to
practice of the invention.
[0056] Furthermore, the terms first, second, third and the like in
the description and in the claims, are used for distinguishing
between similar elements and not necessarily for describing a
sequence, either temporally, spatially, in ranking or in any other
manner. It is to be understood that the terms so used are
interchangeable under appropriate circumstances and that the
embodiments of the invention described herein are capable of
operation in other sequences than described or illustrated
herein.
[0057] Moreover, the terms top, bottom, over, under and the like in
the description and the claims are used for descriptive purposes
and not necessarily for describing relative positions. It is to be
understood that the terms so used are interchangeable under
appropriate circumstances and that the embodiments of the invention
described herein are capable of operation in other orientations
than described or illustrated herein.
[0058] It is to be noticed that the term "comprising," used in the
claims, should not be interpreted as being restricted to the means
listed thereafter; it does not exclude other elements or steps. It
is thus to be interpreted as specifying the presence of the stated
features, integers, steps or components as referred to, but does
not preclude the presence or addition of one or more other
features, integers, steps or components, or groups thereof. Thus,
the scope of the expression "a device comprising means A and B"
should not be limited to devices consisting only of components A
and B. It means that with respect to the present invention, the
only relevant components of the device are A and B.
[0059] Similarly, it is to be noticed that the term "coupled", also
used in the claims, should not be interpreted as being restricted
to direct connections only. The terms "coupled" and "connected",
along with their derivatives, may be used. It should be understood
that these terms are not intended as synonyms for each other. Thus,
the scope of the expression "a device A coupled to a device B"
should not be limited to devices or systems wherein an output of
device A is directly connected to an input of device B. It means
that there exists a path between an output of A and an input of B
which may be a path including other devices or means. "Coupled" may
mean that two or more elements are either in direct physical or
electrical contact, or that two or more elements are not in direct
contact with each other but yet still co-operate or interact with
each other.
[0060] Reference throughout this specification to "one embodiment"
or "an embodiment" means that a particular feature, structure or
characteristic described in connection with the embodiment is
included in at least one embodiment of the present invention. Thus,
appearances of the phrases "in one embodiment" or "in an
embodiment" in various places throughout this specification are not
necessarily all referring to the same embodiment, but may.
Furthermore, the particular features, structures or characteristics
may be combined in any suitable manner, as would be apparent to one
of ordinary skill in the art from this disclosure, in one or more
embodiments.
[0061] Similarly it should be appreciated that in the description
of exemplary embodiments of the invention, various features of the
invention are sometimes grouped together in a single embodiment,
figure, or description thereof for the purpose of streamlining the
disclosure and aiding in the understanding of one or more of the
various inventive aspects. This method of disclosure, however, is
not to be interpreted as reflecting an intention that the claimed
invention requires more features than are expressly recited in each
claim. Rather, as the following claims reflect, inventive aspects
lie in less than all features of a single foregoing disclosed
embodiment. Thus, the claims following the detailed description are
hereby expressly incorporated into this detailed description, with
each claim standing on its own as a separate embodiment of this
invention.
[0062] Furthermore, while some embodiments described herein include
some but not other features included in other embodiments,
combinations of features of different embodiments are meant to be
within the scope of the invention, and form different embodiments,
as would be understood by those in the art. For example, in the
following claims, any of the claimed embodiments can be used in any
combination.
[0063] Furthermore, some of the embodiments are described herein as
a method or combination of elements of a method that can be
implemented by a processor of a computer system or by other means
of carrying out the function. Thus, a processor with the necessary
instructions for carrying out such a method or element of a method
forms a means for carrying out the method or element of a method.
Furthermore, an element described herein of an apparatus embodiment
is an example of a means for carrying out the function performed by
the element for the purpose of carrying out the invention.
[0064] In the description provided herein, numerous specific
details are set forth. However, it is understood that embodiments
of the invention may be practiced without these specific details.
In other instances, well-known methods, structures and techniques
have not been shown in detail in order not to obscure an
understanding of this description.
[0065] The invention will now be described by a detailed
description of several embodiments of the invention. It is clear
that other embodiments of the invention can be configured according
to the knowledge of persons skilled in the art without departing
from the true spirit or technical teaching of the invention, the
invention being limited only by the terms of the appended
claims.
[0066] In a first embodiment, the present invention builds on the
dynamic offset compensation method of the prior art described here
above to separate the contribution of the offset, the external
magnetic field B.sub.Ext and the reference magnetic field B.sub.Cal
to the output signal of a Hall sensor.
[0067] In a first phase, e.g. 0.degree. phase, as illustrated in
FIG. 3, a bias signal for biasing the Hall sensor is applied
between a first set of two diagonally opposed electrodes a, c, e.g.
a bias current I.sub.Bias is applied between the electrodes a, c.
The sensor signal V.sub.H is measured between Hi and Lo terminals
connected to a second set of two diagonally opposed electrodes b,
d.
[0068] The reference magnetic field B.sub.Cal is generated by a
magnetic field generator, e.g. a reference current I.sub.Cal
flowing through a coil, in the vicinity of the magnetic sensor
device, e.g. Hall sensor, e.g. a coil surrounding the Hall
plate.
[0069] The reference current I.sub.Cal is kept constant in
magnitude and direction during the first phase, e.g. the 0 deg
state. The Hall voltage V.sub.H across the Hi and Lo terminals is
then:
V.sub.H1=SB.sub.Ext+SB.sub.Cal+V.sub.op (Eq. 3)
[0070] In accordance with embodiments of the present invention, the
second phase or 90 deg phase is subdivided in two sub-phases.
During both sub-phases of the second phase, a bias signal for
biasing the Hall sensor is applied between the second set of two
diagonally opposed electrodes b, d, e.g. a bias current I.sub.Bias
is applied between the electrodes b, d. The sensor signal V.sub.H
is measured between Hi and Lo terminals connected to the first set
of two diagonally opposed electrodes a, c.
[0071] In the first of the two 90 deg sub-phases, as illustrated in
FIG. 4, the reference current I.sub.Cal keeps the magnitude and the
direction it had during the first phase, e.g. 0 deg state. The Hall
voltage V.sub.H across the Hi and Lo terminals is:
V.sub.H2=SB.sub.Ext+SB.sub.Cal-V.sub.op (Eq. 4)
[0072] In the second of the two 90 deg sub-phases, as illustrated
in FIG. 5, the reference current I.sub.Cal keeps the magnitude it
had during the 0 deg state and the first of the two 90 deg
sub-phases, but its direction is changed so that the direction of
the reference or calibration field is rotated by 180 degrees. The
Hall voltage V.sub.H across the Hi and Lo terminals is:
V.sub.H3=SB.sub.Ext-SB.sub.Cal-V.sub.op (Eq. 5)
[0073] The system composed of the three equations Eq. 3, Eq. 4, Eq.
5 is linear in the three unknowns x=S B.sub.Ext, y=S B.sub.Cal and
z=V.sub.op. Its principal determinant is:
1 1 1 1 1 - 1 1 - 1 - 1 ##EQU00001##
which is equal to -4. Since that determinant is non zero, it
guarantees that there exists one and only one solution for the
three unknowns x=S B.sub.Ext, y=S B.sub.Cal and z=V.sub.op
satisfying the three equations Eq. 3, Eq. 4, and Eq. 5
simultaneously.
[0074] If the product y=S B.sub.Cal varies from one instant to
another, the amplitude of the referenced magnetic field B.sub.Cal
being constant (in view of the magnitude of reference current
I.sub.Cal being kept constant), it means that the sensitivity S of
the Hall sensor has varied. Knowledge of the variations of the
sensitivity S through knowledge of variations of y=S B.sub.Cal can
be used to correct the measurements made for the external magnetic
field B.sub.Ext through scaling for instance.
[0075] Comparison of the actual value for the product y=S B.sub.Cal
with a reference value y.sub.0=S.sub.0 B.sub.Cal (corresponding to
a given temperature T.sub.0, a given level of total magnetic field
B.sub.0 crossing the sensor, a given time instant t.sub.0, or a
combination of these initial conditions) makes the determination of
a correction factor .alpha.=y.sub.0/y possible. Having
S.sub.0=.alpha. S, it is possible to correct the variation of
sensitivity S affecting the product x=S B.sub.Ext by multiplying it
by .alpha.. This correction ensures that the measurements made for
the external magnetic field B.sub.Ext will not be affected by
sensitivity drift.
[0076] A timing chart for this first embodiment is illustrated in
FIG. 6. It shows a clock signal CLK determining whether the system
is in the first phase or 0 deg phase, or in the second phase or 90
deg phase. The clock signal CLK, in the embodiment illustrated, may
be a digital signal having only two states, e.g. a high state "1"
and a low state "0". Depending on the value of the clock signal CLK
the first set of diagonally opposed electrodes a, c or the second
set of diagonally opposed electrodes b, d of the magnetic sensor
device is used for measuring, while the other set of diagonally
opposed electrodes is used for biasing the magnetic sensor device.
The timing chart of FIG. 6 also shows the external magnetic field
B.sub.Ext, which is the field to be measured, and which is constant
over the two phases. FIG. 6 also illustrates the reference magnetic
field B.sub.Cal which has a first direction and an amplitude
B.sub.Cal0 during the first phase and the first part of the second
phase, and which has the same amplitude B.sub.Cal0 but a different
direction during the second part of the second phase. Measurements
of the output signal of the magnetic sensor device, e.g. the Hall
voltage between the Hi and Lo terminals, is performed at time
instants t1, t2 and t3, i.e. once (t1) during the first phase, once
(t2) during the first sub-phase of the second phase and once (t3)
during the second sub-phase of the second phase.
[0077] In a second embodiment, as illustrated in the time chart of
FIG. 7, the reference or calibration magnetic field B.sub.Cal is
cancelled (magnitude is zero) during one of the two 90 deg
sub-phases, e.g. during the second 90 deg sub-phase, rather than
being inversed in direction while keeping the same amplitude. In
the first of the two 90 deg sub-phases, in accordance with this
embodiment, the reference current I.sub.Cal keeps the magnitude and
the direction it had during the 0 deg state. The resulting system
of equations is:
V.sub.H1=SB.sub.Ext+SB.sub.Cal+V.sub.op (Eq. 6)
V.sub.H2=SB.sub.Ext+SB.sub.Cal-V.sub.op (Eq. 7)
V.sub.H3=SB.sub.Ext-V.sub.op (Eq. 8)
[0078] The principal determinant of that system of equations on the
unknowns x=S B.sub.Ext, y=S B.sub.Cal and z=V.sub.op is:
1 1 1 1 1 - 1 1 0 - 1 ##EQU00002##
which is equal to -2. Since that determinant is non zero, it
guarantees that there exists one and only one solution for the
three unknowns x=S B.sub.Ext, y=S B.sub.Cal and z=V.sub.op
satisfying the three equations Eq. 6, Eq. 7, and Eq. 8
simultaneously.
[0079] If the product y=S B.sub.Cal varies from one instant to
another, the amplitude of reference magnetic field B.sub.Cal being
constant (in view of the magnitude of the reference current
I.sub.Cal generating the reference magnetic field B.sub.Cal being
kept constant), it means that the sensitivity S of the magnetic
sensor device, e.g. Hall sensor, has varied. Knowledge of the
variations of the sensitivity S through knowledge of variations of
y=S B.sub.Cal can be used to correct the measurements made for the
external magnetic field B.sub.Ext to be measured, through scaling
for instance.
[0080] Again, comparison of the actual value for the product y=S
B.sub.Cal with a reference value y.sub.0=S.sub.0 B.sub.Cal
(corresponding to a given temperature T.sub.0, a given level of
total magnetic field B.sub.0 crossing the sensor, a given time
instant t.sub.0, or a combination of these initial conditions)
makes the determination of a correction factor .alpha.=y.sub.0/y
possible. Having S.sub.0=.alpha. S, it is possible to correct the
variation of sensitivity S affecting the product x=S B.sub.Ext by
multiplying it by .alpha.. This correction ensures that the
measurements made for the external magnetic field B.sub.Ext will
not be affected by sensitivity drift.
[0081] In a third embodiment, the first and second phases, e.g. 0
deg and 90 deg phases, are both divided into two sub-phases where
the direction and/or the magnitude of the calibration field is
changed (see for instance FIG. 8). The resulting values obtained
for the product S B.sub.Cal can be e.g. averaged to determine
whether or not the sensitivity S has varied.
[0082] First the case is considered where the amplitude of the
calibration field is kept constant but its direction is varied from
one sub-phase to another and this for both the 0 deg and the 90 deg
phases (see FIG. 8). Measurements of the output voltages V.sub.H1,
V.sub.H2, V.sub.H3, V.sub.H4 are performed at time instants
t.sub.1, t.sub.2, t.sub.3 and t.sub.4 in each of the sub-phases,
respectively.
[0083] In that case, measuring the output voltages V.sub.H1,
V.sub.H2, V.sub.H3, V.sub.H4 of the Hall sensor in each of the
sub-phases will yield four linear equations. Contrary to what has
been done in the above embodiments, it does not have to be assumed
that the offset V.sub.op is the same in the first and second
phases, e.g. the 0 deg and the 90 deg phases. The following
equations are obtained:
V.sub.H1=SB.sub.Ext-SB.sub.Cal+V.sub.op(0 deg) (Eq. 9)
V.sub.H2=SB.sub.Ext+SB.sub.Cal+V.sub.op(0 deg) (Eq. 10)
V.sub.H3=SB.sub.Ext+SB.sub.Cal-V.sub.op(90 deg) (Eq. 11)
V.sub.H4=SB.sub.Ext-SB.sub.Cal-V.sub.op(90 deg) (Eq. 12)
[0084] Four linear equations are thus obtained (Eq. 9, Eq. 10, Eq.
11, Eq. 12) in the four unknowns S B.sub.Ext, S B.sub.Cal,
V.sub.op(0 deg) and V.sub.op (90 deg).
[0085] The principal determinant of that system of equations in
these 4 unknowns is:
1 - 1 1 0 1 1 1 0 1 1 0 - 1 1 - 1 0 - 1 ##EQU00003##
which is equal to 0, meaning that unique solutions for (each of)
the unknowns S B.sub.Ext, S B.sub.Cal, V.sub.op(0 deg) and
V.sub.op(90 deg) cannot be found by applying the well known
resolution algorithm. Instead of solving the equations for all of
the unknowns, S B.sub.Cal can be estimated by averaging the
measured output voltages as follows:
SB.sub.Cal=1/4(V.sub.H2-V.sub.H1+V.sub.H3-V.sub.H4) (Eq. 13)
[0086] Once the estimated value for S B.sub.Cal is known, it is
possible to evaluate the variation of the sensitivity S of the Hall
sensor and to compensate for it by e.g. scaling as discussed in the
above.
[0087] In a fourth embodiment, as illustrated in the time chart of
FIG. 9, the reference or calibration magnetic field B.sub.Cal is
increased in amplitude during one of the two 90 deg sub-phases,
e.g. during the second 90 deg sub-phase, and not inversed in
direction. In the first of the two 90 deg sub-phases, in accordance
with this embodiment, the reference current I.sub.Cal keeps the
magnitude and the direction it had during the 0 deg state. The
resulting system of equations is:
V.sub.H1=SB.sub.Ext+SB.sub.Cal+V.sub.op (Eq. 14)
V.sub.H2=SB.sub.Ext+SB.sub.Cal-V.sub.op (Eq. 15)
V.sub.H3=SB.sub.Ext+SNB.sub.Cal-V.sub.op (Eq. 16)
[0088] The principal determinant of that system of equations on the
unknowns x=S B.sub.Ext, y=S B.sub.Cal and z=V.sub.op is:
1 1 1 1 1 - 1 1 N - 1 ##EQU00004##
which is equal to 2N-2. The principal determinant Det(N) of the
system is thus function of N. For N=2, the principal determinant is
equal to 2. For N=0.5, the principal determinant is equal to -1 (in
which case no division by the principal determinant is strictly
required when solving the system of equation for its unknowns). For
N=1.5 the principal determinant is equal to 1 (in which case
solving the system for its unknowns, will require no division and
no change of sign). From these examples, it appears that the choice
of N influence the complexity of the digital calculator used to
solve the system. A proper choice for N may also simplify the
design of an analog calculator: analog division is complex and
prone to errors, drift with temperature, and therefore, choosing
N=1.5 or N=0.5 will allow solving the system of equations without
division by Det(N).
[0089] Since the above determinant is non zero if N is different
from 1 (meaning that the amplitude of the external magnetic field
B.sub.Cal during the second sub-phase of the second phase differs
from the amplitude of the external magnetic field B.sub.Cal during
the first phase and the first sub-phase of the second phase), the
set-up where the external magnetic field is changed at the second
sub-phase to a value higher than the value during the other phase
and sub-phase, guarantees that there exists one and only one
solution for the three unknowns x=S B.sub.Ext, y=S B.sub.Cal and
z=V.sub.op satisfying the three equations Eq. 14, Eq. 15, and Eq.
16 simultaneously.
[0090] If the product y=S B.sub.Cal varies between time instant
t.sub.1 and time instant t.sub.2, the amplitude of reference
magnetic field B.sub.Cal being constant (in view of the magnitude
of the reference current I.sub.Cal generating the reference
magnetic field B.sub.Cal being kept constant), it means that the
sensitivity S of the magnetic sensor device, e.g. Hall sensor, has
varied. Knowledge of the variations of the sensitivity S through
knowledge of variations of y=S B.sub.Cal can be used to correct the
measurements made for the external magnetic field B.sub.Ext to be
measured, through scaling for instance.
[0091] Again, comparison of the actual value for the product y=S
B.sub.Cal with a reference value y.sub.0=S.sub.0 B.sub.Cal
(corresponding to a given temperature T.sub.0, a given level of
total magnetic field B.sub.0 crossing the sensor, a given time
instant t.sub.0, or a combination of these initial conditions)
makes the determination of a correction factor .alpha.=y.sub.0/y
possible. Having S.sub.0=.alpha. S, it is possible to correct the
variation of sensitivity S affecting the product x=S B.sub.Ext by
multiplying it by .alpha.. This correction ensures that the
measurements made for the external magnetic field B.sub.Ext will
not be affected by sensitivity drift.
[0092] In the above embodiments where only one phase is divided
into sub-phases where the reference magnetic field B.sub.Cal has
different properties, the reference magnetic field keeps its value
during the first phase, e.g. 0 deg phase, and it is the second
phase, e.g. the 90 deg phase, which is divided in two sub-phases
each having different properties for the reference magnetic field.
This, however, is not intended to be limiting for the invention. In
alternative embodiments, not illustrated in the drawings, the
reference magnetic field could have different properties during two
sub-phases of the first phase, e.g. 0 deg phase, while keeping
constant properties during the complete second phase, e.g. 90 deg
phase.
[0093] Moreover, in the examples illustrated, the first and second
phases have equal time duration, which is not intended to be a
limiting feature for the present invention. Also the sub-phases may
have, but do not need to have, equal time durations.
[0094] Measurements may be performed at about the middle of a time
period of a phase or a sub-phase, but also other moments in time
may be selected for performing the measurement, e.g. more towards
the end of a phase or sub-phase, or more towards the beginning of a
phase or sub-phase.
[0095] Effects that will affect the sensitivity S are for example,
without being exhaustive, temperature, aging, stress applied on a
semiconductor substrate within which the Hall sensor is integrated.
With a notable exception that will be discussed later, those
effects usually have time constants that are far greater than the
typical time it takes to make the measurements V.sub.H1, V.sub.H2,
V.sub.H3 (and optionally V.sub.H4). Therefore, generation of the
calibration field B.sub.Cal and evaluation of the quantity S
B.sub.Cal need not necessarily be carried out every time the
external magnetic field B.sub.Ext is measured. Calibration may be
done on a regular basis at a lower rate than the rate at which the
first and second phases, e.g. 0 deg and 90 deg phases, change.
[0096] An example of hardware that implements the calibration
methods according to embodiments of the present invention is given
in FIG. 10.
[0097] A magnetic sensor device, e.g. a Hall sensor 91, has its
four main electrodes (a, b, c, d) connected to a switch box 92. The
configuration of the switches of the switchbox 92 is determined by
the digital signal CLK. When the signal CLK is in a first state,
e.g. a `1` or high state (H), the switch box 92 will connect the
electrodes a and b to a biasing element 93 (either a bias current
source or a bias voltage supply) and to a reference voltage e.g.
ground as in FIG. 10, and the electrodes c and d to the inputs of
an amplification stage 94 with gain G. When the signal CLK is in a
second state, e.g. a `0` or low state (L), the switch box 92 will
connect the electrodes c and d to the biasing element 93 (either a
bias current source or a bias voltage supply) and to a reference
voltage e.g. ground as in FIG. 10, and the electrodes a and b to
the inputs of the amplification stage 94 with gain G. The gain G is
assumed not to vary with temperature. This assumption is verified
e.g. in an integrated circuit where the gain G is usually
determined by the ratio of two resistances of resistors having the
same temperature coefficient and which age substantially
identically, or by the ratio of two capacitances of capacitors
having the same temperature coefficient and which age substantially
identically. This assumption is made for the sake of clarity only
and does not limit the scope of this invention, as variation of the
gain with a parameter such as e.g. temperature will be compensated
analogously to the variation of sensitivity S of the magnetic
sensor device (to reach that conclusion one will reason on the
quantities G*S B.sub.Ext, G*S B.sub.Cal and G* V.sub.op). In both
states of the signal CLK, the voltage difference between the inputs
of the amplifier 94 is the Hall voltage V.sub.H, i.e. the output
voltage of the magnetic sensor device. The amplified Hall signal
G*V.sub.H at the output of amplifier 94 may be fed to a calculator
unit. The calculator unit may be an analog calculator for
performing calculations on the analog values. In alternative
embodiments, the calculator may comprise an analog to digital
converter (ADC) 95, the output of which is fed to a digital
processing unit. The digital result of the analog to digital
conversion is thus made available/fed to/acquired by a processing
element or calculator 96. The processing element or calculator 96
may be a general purpose or a special purpose processor, and may be
for inclusion in a device, e.g. a chip that has other components
that perform other functions. The processing element may for
example be a microcontroller, a microprocessor or a state machine.
In particular it may include a programmable controller, for
instance a programmable digital logic device such as a Programmable
Array Logic (PAL), a Programmable Logic Array (PLA), a programmable
Gate Array, especially a Field Programmable Gate Array (FPGA). The
processing element or calculator 96 may be adapted to also generate
the signal CLK when that signal is not generated by a distinct
signal generator 97. A reference magnetic field generator, e.g.
coil 98, generates a reference magnetic field B.sub.Cal for example
when a reference current I.sub.Cal is sent through it. The
orientation of the reference magnetic field B.sub.Cal generated by
the coil 98 is such that it will be sensed by the Hall sensor 91.
The amplitude and direction of the reference magnetic field
B.sub.Cal are determined by a biasing element 99 e.g. an electrical
signal source, such as a current source or a voltage source. In
particular embodiments, the amplitude of the reference current
I.sub.Cal may be determined by a DAC i.e. a digital to analog
converter. The direction of the reference current I.sub.Cal
generated by the current source 99 will determine the direction of
the reference magnetic field B.sub.Cal. The amplitude of reference
current I.sub.Cal generated by the current source 99 will determine
the amplitude of the reference magnetic field B.sub.Cal. While
variations of the amplitude of current I.sub.Cal with parameters
like temperature, aging of components, are the general case, it
will be assumed for the sake of clarity that the amplitude of
I.sub.Cal does not vary in function of those parameters. This may
be obtained, for instance, with integrated circuits, which allow
manufacturing current sources that generate currents with
amplitudes that remain substantially constant over wide temperature
intervals.
[0098] FIG. 11 illustrates an example of a current source 99 that
can be used to generate a reference magnetic field B.sub.Cal
considered for example in the first embodiment of methods according
to embodiments of the present invention. Four switches e.g. MOSFET
transistors M1, M2, M3 and M4 are connected to form a full
H-bridge. The coil 98 is connected to the outputs of the full
H-bridge. When the switches M1 and M4 are closed (while switches M2
and M3 are open), the current I.sub.Cal will flow through the coil
98 in a first direction. When the switches M2 and M3 are closed
(while switches M1 and M4 are open), the current I.sub.Cal will
flow through the coil 98 in a second direction. Changing the
direction of the current in the coil 98 results in changing the
polarity of the magnetic field B.sub.Cal (i.e. the change of sign
for B.sub.Cal on FIG. 6 and FIG. 8. The amplitude of the
calibration current I.sub.Cal is determined by (a) a reference
current I.sub.Ref (generated in any suitable way known to the art)
and (b) the ratio of the dimensions of transistors M6 and M5.
Opening and closing of transistors M1, M2, M3 and M4 may be
controlled by e.g. the processing element or calculator 96.
[0099] FIG. 12 illustrates an example of a current source 99 that
can be used to generate a reference magnetic field B.sub.Cal
considered for example in the second embodiment of methods
according to embodiments of the present invention. The amplitude of
the calibration current I.sub.Cal is determined by (a) a reference
current I.sub.Ref (generated in any suitable way known to the art)
and (b) the ratio of the dimensions of transistors M6 and M5 that
forms a current mirror (where M5 mirrors M6). In FIG. 7, the
calibration magnetic field keeps the same amplitude and the same
polarity throughout the 0 deg phase and the first sub-phase of the
90 deg phase. This may be realized with the circuit of FIG. 12 when
the transistor switch M1 is closed and allows the current I.sub.Cal
to flow from a power supply, through the transistor switch M1,
through the coil 98 and through transistor M5. The calibration
magnetic field is cancelled curing the second sub-phase of the 90
deg phase: this is realized by opening the transistor switch M1.
Opening and closing of transistor switch M1 may be controlled by
e.g. the processing element or calculator 96.
[0100] In a more general case, the current source 99 may be a
current digital to analog converter translating a digital code
determined by the processing element or calculator 96 into a
current I.sub.cal.
[0101] The processing element or calculator 96 is a controller
adapted for controlling correct functioning of the hardware
illustrated in FIG. 10. Besides performing calculations on the
output signals of the magnetic sensor device, and determining the
parameters of the reference magnetic field B.sub.Cal (by e.g.
controlling the biasing element 99), the processing element or
calculator 96 may also determine the moment in time at which the
amplified Hall voltage at the output of amplifier 94 must be
sampled, e.g. converted by the ADC 95. FIG. 13A shows for the
second embodiment, as also illustrated in FIG. 7, the signal CLK
determining whether the system is in a first or in a second phase,
e.g. 0 deg or 90 deg phase, a signal SubPhi, which is a signal that
divides the first and second phases, e.g. the 0 deg and the 90 deg
phases, each into two sub-phases (1) and (2), and the corresponding
reference magnetic field B.sub.Cal. The CLK and the sub-Phi signals
can be combined (in a number of ways, known to a person skilled in
the art) into signal indicating that the (amplified) Hall voltage
must be measured, e.g. converted by the ADC 95 for acquisition by
the processing element or calculator 96. For instance, the signals
CLK and Sub-Phi as illustrated in FIG. 13A are combined according
to the truth table here below to determine when to activate and
when to cancel the calibration magnetic field B.sub.Cal and the
sub-phases within which A to D conversion is required:
TABLE-US-00001 TABLE 1 CLK Sub-Phi Bcal* ADC_Req 0 deg H L H H H H
H L 90 deg L L H H L H L H
[0102] When the digital signal Bcal* is high, a calibration
magnetic field B.sub.Cal is generated by the coil 98. This
corresponds on FIG. 13A to the entire 0 deg phase (CLK signal is H)
and the first sub-phase of the 90 deg phase (CLK signal is L and
Sub-Phi signal is L). When the digital signal Bcal* is low, the
calibration magnetic field B.sub.Cal is cancelled. This corresponds
on FIG. 13A to the second sub-phase of the 90 deg phase (CLK signal
is L and Sub-Phi signal is H).
[0103] When the digital signal ADC_Req is high, it indicates that a
signal acquisition and Analog to Digital conversion of that signal
is required (i.e. around the instants t1, t2 and t3 on FIG. 13A).
On FIG. 13A, this happens once during the 0 deg phase (instant
t.sub.1) when CLK is H and Sub-Phi is low and it happens twice
during the 90 deg. An example of digital circuit that will generate
signals according to Table 1 is given in FIG. 13B. The processing
element or calculator 96 will check the value of both signals Bcal*
and ADC_Req within each sub-phase and take action accordingly.
Alternatively, the processing element 96 may use table 1 as a
look-up table to generate the signals Bcal* and ADC_Req.
[0104] For the second embodiment, the amplified Hall voltage
G*V.sub.H is converted by the ADC 95 and acquired by the processing
element or calculator 96 once during the first phase, e.g. 0 deg
phase, (at e.g. time t.sub.1 on FIG. 13A) and twice during the
second phase, e.g. 90 deg phase, (once in sub-phase (1) of the 90
deg phase--at e.g. time t.sub.2--and once in sub-phase (2) of the
90 deg phase at e.g. time t.sub.3). For each measurement, an
equation similar to one of the equations Eq. 6, Eq. 7 or Eq. 8 can
be written:
G*V.sub.H1=G*(SB.sub.Ext+SB.sub.Cal+V.sub.op) (Eq. 17)
G*V.sub.H2=G*(SB.sub.Ext+SB.sub.Cal-V.sub.op) (Eq. 18)
G*V.sub.H3=G*(SB.sub.Ext-V.sub.op) (Eq. 19)
[0105] Having acquired the measurements G*V.sub.H1, G*V.sub.H2,
G*V.sub.H3 the processing element or calculator 96 proceeds and
computes S B.sub.Cal and S B.sub.Ext as follows:
2*G*S B.sub.Ext=2*G*V.sub.H3+(G*V.sub.H1-G*V.sub.H2) (Eq. 20)
G*SB.sub.Cal=G*V.sub.H2-G*V.sub.H3 (Eq. 21)
[0106] Be G*S B.sub.Cal|0 (=G*S.sub.0 B.sub.Cal) the value of the
quantity G*S B.sub.Cal evaluated at a given moment in the past
(e.g. right after assembly and power-up of the hardware of FIG. 10)
and at a temperature T.sub.0 (S.sub.0 being the sensitivity of the
Hall sensor 91 at that moment and at that temperature). If the
quantity G*S B.sub.Cal varies from one evaluation moment (according
to Eq. 21) to another, the amplitude of the reference magnetic
field B.sub.Cal and the gain G being constant, it means that the
sensitivity S of the Hall sensor has varied. Knowledge of the
variations of S through knowledge of variations of G*S B.sub.Cal as
computed by the processing element or calculator 96 according to
equation 21 can be used to correct the measurements made for the
external magnetic field B.sub.Ext through scaling, for
instance.
[0107] Comparison of the actual value for the quantity G*S
B.sub.Cal with G*S B.sub.Cal|0 makes the determination of a
correction factor .alpha.=G*S B.sub.Cal|0/G*S B.sub.Cal possible.
The correction factor is computed by the processing element or
calculator 96. The processing element or calculator 96 corrects the
variation of the sensitivity S affecting the product 2*G*S
B.sub.Ext by multiplying it by .alpha.. This correction ensures
that the measurements made for the external magnetic field will not
be affected by sensitivity drift and this without a priori
knowledge of the dependency of the sensitivity S on external
factors such as temperature, stress, and without actual measurement
of these external factors such as e.g. the temperature, the stress,
the operation of addition, subtraction, division, may be carried
out by processing element or calculator 96 in any convenient way
known to the art. The storage of the measurement results
G*V.sub.H1, G*V.sub.H2, G*V.sub.H3 in a format usable by the
processing element or calculator 96 may be done with the help of
registers, memory elements, available for that purpose in any
suitable way known to the art. In a general case, one has not to
assume that the gain G of amplifier 94 has remained constant. The
compensation for drift of the gain G will be compensated together
with the variation of sensitivity, the correction factor alpha now
including the gain G. In this embodiment a calibration phase
comprises the generation of a reference magnetic field that varies
as illustrated e.g. on FIG. 13A, taking three measurements of the
Hall voltage at three time instants t.sub.1, t.sub.2, t.sub.3
spread over one cycle (first and second phase) of the CLK signal
generated for the purpose of isolating the contribution of an
external magnetic field B.sub.Ext to the Hall voltage V.sub.H from
an offset Vop affecting that Hall voltage V.sub.H, evaluating the
quantity G*S B.sub.Cal, and determining a correction factor
.alpha.=G*S B.sub.Cal|0/G*S B.sub.Cal. The correction factor
.alpha. is then used to correct the measurement of the external
magnetic field B.sub.Ext until the next calibration phase where an
updated correction factor .alpha. will be computed. The processing
element or calculator 96 may be programmed to perform the
calibration phase continuously (i.e. every CLK cycle), on a regular
basis but at a slower rate than the CLK signal (e.g. once every
plurality of CLK cycles, e.g. once every 10 CLK cycles) or on a
need-to basis, in which case the processing element or calculator
96 may receive an input signal, e.g. a user supplied or other
externally supplied signal, indicating that a calibration process
needs to be performed. The processing element or calculator 96 may
operate on a need-to basis when it has e.g. access to the readings
of a temperature sensor (not shown) sensing the temperature of the
Hall sensor or the surrounding of the Hall sensor (assuming then
that the temperature of the Hall sensor follows the temperature
measured by the temperature sensor). A variation of the temperature
as indicated by the temperature sensor will be accompanied by
variation of the sensitivity S and will indicate that a calibration
of the sensor is required. Outside of the calibration phases, the
same hardware is used and the signal S B.sub.Ext is isolated from
an offset Vop contributing to the total Hall voltage V.sub.H at the
output of the Hall sensor 91 with a dynamic offset compensation
technique known from the art.
[0108] In some cases, e.g. when the processing element or
calculator 96 is a state machine of limited size and complexity, it
may be advantageous to limit the role of the processing element or
calculator 96 to the determination of G*S B.sub.Cal (not 2*G*S
B.sub.Ext) and its comparison with G*S B.sub.Cal|0. In that case,
the result of the comparison may be used to vary a parameter of the
biasing element 93 e.g. the amplitude of the bias current
I.sub.Bias. For instance, if the processing element or calculator
96 computes the ratio .alpha.=G*S B.sub.Cal|0/G*S B.sub.Cal, the
bias current with amplitude I.sub.Bias is modified according to the
ratio .alpha.:I.sub.Bias=I.sub.Bias( )/.alpha. (where I.sub.Bias( )
is the amplitude of the bias current in the reference conditions
where G*S B.sub.Cal|0 was determined). When the biasing element 93
is a DAC current source, the modification of bias current merely
requires the processing element or calculator 96 to issue a digital
code updated according to I.sub.Bias=I.sub.Bias( )/.alpha. and
program the DAC accordingly.
[0109] As said earlier, there is one notable instance in which the
temperature might vary within the time interval necessary to take
the measurements V.sub.H1, V.sub.H2, V.sub.H3 (and optionally
V.sub.H4). The magnetic field generator, e.g. the coil 98, used to
generate the reference magnetic field B.sub.Cal and the Hall sensor
91 may be integrated together in the same semiconductor substrate.
The magnetic field generator, e.g. coil 98, may be realized using
one or more metallic layers available for connecting different
devices integrated in the semiconductor substrate. Those metallic
layers having a non-zero resistivity, the coil 98 presents a
parasitic resistance R.sub.Coil and hence it dissipates heat (Joule
heating) when the reference current I.sub.Cal circulates through
it. The higher the parasitic resistance and/or the higher the
amplitude of the reference current I.sub.Cal (and hence the
amplitude of the reference magnetic field B.sub.Cal), the higher
the Joule heating. At the scale of the integrated Hall sensor 91
and the integrated coil 98, the time constants may be as low as
fraction of ms which is of the same order of magnitude as the
typical frequency of the signal CLK that determines in which phase
(0 deg or 90 deg) the Hall sensor 91 is.
[0110] Reducing the resistance of the coil 98 is not always
possible and therefore, there are cases where one needs to reduce
the amplitude of the reference current I.sub.Cal and hence the
amplitude of the reference magnetic field B.sub.Cal. In those
cases, the effect of noise (1/f noise, transients introduced by the
switches) may render the evaluation of S B.sub.Cal difficult even
after amplification. To palliate to that inconvenient, the proposed
invention may be adapted/improved with minor modifications as
described here below.
[0111] Instead of generating the calibration magnetic field that
varies in a stepwise manner as e.g. on FIG. 13A, the reference
magnetic field B.sub.Cal may vary as seen on FIG. 14. The
fundamental frequency of the reference magnetic field B.sub.Cal is
the same as that of the CLK signal, the amplitude of the reference
magnetic field B.sub.Cal is zero during sub-phase (1) of the first
phase, e.g. 0 deg phase, and during the entire second phase, e.g.
90 deg phase, while it varies linearly from 0 to a pre-determined
value Bcal0.noteq.0 during sub-phase (2) of the first phase, e.g. 0
deg phase. Such a variation of the amplitude of the reference
magnetic field B.sub.Cal prior to measurement at time t.sub.2 is
less abrupt than the stepwise variation considered earlier and will
introduce less noise (e.g. by capacitive coupling between the
magnetic field generator, e.g. the coil 98, and the Hall sensor
91).
[0112] A further improvement, of application with a step-like or
slope-like variation for the reference magnetic field B.sub.Cal, is
achieved by adding a correlated double sampling (CDS) stage 900
between the amplifier 94 and the ADC 95. FIG. 15A and FIG. 15B give
an example of such a CDS stage and illustrates the operation
thereof. The CDS stage 900 comprises a first memory element, e.g.
capacitor 903, coupled between the output of the amplification
stage 94 and a buffer 906. The capacitor 903 is provided with a
first and a second resetting element, e.g. a first switch 901 and a
clamp switch 902. The output of the buffer 906 is coupled to a
sample and hold circuit comprising a sampling element, e.g. sample
switch 904, and a memory element, e.g. capacitor 905.
[0113] As illustrated in FIG. 15A, for a brief instant after the
reference time instant t.sub.0 and before a first measurement time
instant t.sub.1, the clamp switch 902 is briefly closed so that the
capacitor 903 is coupled to ground and the amplified Hall voltage
G*V.sub.H is stored across the capacitor 903:
G*V.sub.H(t.sub.1)=G*(SB.sub.Ext+Vop).
Thereafter, the clamp switch 902 is opened again, the amplified
Hall voltage G*V.sub.H remaining stored across the capacitor
903.
[0114] After the first measurement time instant t.sub.1 and before
a second time instant t.sub.2 (or on the second measurement time
instant t.sub.2 when reference magnetic field B.sub.Cal increases
linearly between time instants t.sub.1 and t.sub.2, as illustrated
in FIG. 14) that signals the end of the 0 deg phase (i.e. right
before the beginning of the second phase, e.g. 90 deg phase), while
the amplified Hall voltage is equal to G*V.sub.H2=G*(S B.sub.Ext S
B.sub.Cal+V.sub.op), the sample switch 904 is closed, resulting in
an output voltage VCDS proportional to the difference between
G*V.sub.H2 and G*V.sub.H1 being stored on the memory element such
as e.g. capacitor 905, as illustrated in FIG. 15B.
[0115] It has been assumed that all time constant associated with
the switches are negligible when compared to the sampling interval
and the clamping interval. The clamp and sample capacitors being
subject to reset noise (also known as "kTC" noise), it has been
assumed that they have sufficiently large capacitances to avoid
introducing substantial additional noise contributions. After
conversion by the ADC 95, the quantity V.sub.CDS=G*S B.sub.Cal is
available to the calculator 96 to evaluate the ratio .alpha.=G*S
B.sub.Cal|0/G*S B.sub.Cal. The ratio .alpha. can be used as
discussed above to compensate for variations of the sensitivity S.
In order not to lose one clock cycle for the measurement of the
external magnetic field, the (amplified) Hall voltage may be
measured at time t1 and t3:
G*V.sub.H(t.sub.1)=G*(SB.sub.Ext+Vop)
G*V.sub.H(t.sub.3)=G*(SB.sub.Ext-Vop)
[0116] Based on those two measurements, the calculator 96 may
calculate G*S B.sub.Ext:
G*SB.sub.Ext=1/2(G*V.sub.H(t.sub.1)+G*V.sub.H(t.sub.3))
When the CDS stage is not required the switch 901 is closed
together with the sample switch 904 to e.g. guarantee the
availability of the signals G* V.sub.H(t.sub.1) and G*
V.sub.H(t.sub.3) that allows dynamic offset compensation. The CDS
is then configured as seen on FIG. 16.
[0117] It is to be understood that although preferred embodiments,
specific constructions and configurations, as well as materials,
have been discussed herein for devices according to the present
invention, various changes or modifications in form and detail may
be made without departing from the scope of this invention as
defined by the appended claims. For example, any formulas given
above are merely representative of procedures that may be used.
Functionality may be added or deleted from the block diagrams and
operations may be interchanged among functional blocks. Steps may
be added or deleted to methods described within the scope of the
present invention.
* * * * *