U.S. patent application number 10/961910 was filed with the patent office on 2005-04-21 for mold with compensating base.
This patent application is currently assigned to STMICROELECTRONICS, INC.. Invention is credited to Hundt, Michael J., Zhou, Tiao.
Application Number | 20050082718 10/961910 |
Document ID | / |
Family ID | 29419396 |
Filed Date | 2005-04-21 |
United States Patent
Application |
20050082718 |
Kind Code |
A1 |
Hundt, Michael J. ; et
al. |
April 21, 2005 |
Mold with compensating base
Abstract
The bottom mold portion for a transfer molding system is covered
with a deformable material. During mold clamping, the deformable
material contacts the bottom surface of the packaging substrate on
which the integrated circuit die is mounted. Deformation of this
relatively soft covering on the bottom mold portion accommodates
thickness variations in the packaging substrate, as well as
non-planarity of the adhesive layer between the integrated circuit
die and packaging substrate in exposed active area integrated
circuits.
Inventors: |
Hundt, Michael J.; (Double
Oak, TX) ; Zhou, Tiao; (Irving, TX) |
Correspondence
Address: |
STMICROELECTRONICS, INC.
MAIL STATION 2346
1310 ELECTRONICS DRIVE
CARROLLTON
TX
75006
US
|
Assignee: |
STMICROELECTRONICS, INC.
Carrollton
TX
|
Family ID: |
29419396 |
Appl. No.: |
10/961910 |
Filed: |
October 8, 2004 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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10961910 |
Oct 8, 2004 |
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10151323 |
May 20, 2002 |
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6817854 |
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Current U.S.
Class: |
264/272.17 ;
257/E21.504; 257/E23.125 |
Current CPC
Class: |
H01L 24/73 20130101;
H01L 23/3121 20130101; H01L 2924/00 20130101; H01L 21/565 20130101;
H01L 2224/73265 20130101; H01L 2224/48227 20130101; Y10S 425/044
20130101; H01L 2224/32225 20130101; H01L 2924/14 20130101; H01L
2924/14 20130101; H01L 2224/73265 20130101; H01L 2224/48227
20130101; H01L 2924/00012 20130101; H01L 2224/32225 20130101 |
Class at
Publication: |
264/272.17 |
International
Class: |
B29C 031/00 |
Claims
What is claimed is:
1. A mold for use in packaging integrated circuits comprising: an
upper mold portion and a lower mold portion adapted to receive an
integrated circuit die mounted on an upper surface of a packaging
substrate, the upper and lower mold portions contacting upper and
lower surfaces of the packaging substrate, respectively, during
mold clamping; and a deformable material on at least a portion of a
surface of the lower mold portion contacting the bottom surface of
the packaging substrate during mold clamping.
2. The mold according to claim 1, wherein the deformable material
deforms during mold clamping to accommodate thickness variations in
the packaging substrate.
3. The mold according to claim 1, wherein the deformable material
deforms during mold clamping to accommodate non-planarity of an
adhesive between the integrated circuit die and the packaging
substrate.
4. The mold according to claim 1, wherein the upper mold portion
includes a cavity receiving the integrated circuit die, the upper
mold portion contacting the upper surface of the packaging
substrate around a periphery of the cavity during mold
clamping.
5. The mold according to claim 4, wherein the upper mold portion
includes a projection having a surface contacting an active area of
the integrated circuit die during mold clamping.
6. The mold according to claim 5, wherein the deformable material
deforms during mold clamping to accommodate thickness variations in
the packaging substrate, non-planarity of an adhesive between the
integrated circuit die and the packaging substrate, or both.
7. The mold according to claim 1, wherein the deformable material
has a variable upper surface contacting the bottom of the packaging
substrate during mold clamping.
8. A mold for use in packaging integrated circuits comprising: a
hardened steel lower mold portion; a hardened steel upper mold
portion having a cavity for receiving an integrated circuit die
therein, wherein the upper and lower mold portions are adapted to
contact opposing surfaces of a packaging substrate on which the
integrated circuit die is mounted during mold clamping; and a
deformable material on at least a portion of a surface of the lower
mold portion contacting the bottom surface of the packaging
substrate during mold clamping.
9. The mold according to claim 8, wherein the deformable material
deforms during mold clamping to accommodate thickness variations in
the packaging substrate.
10. The mold according to claim 8, wherein the deformable material
deforms during mold clamping to accommodate non-planarity of an
adhesive between the integrated circuit die and the packaging
substrate.
11. The mold according to claim 8, wherein the upper mold portion
includes a cavity receiving the integrated circuit die, the upper
mold portion contacting the upper surface of the packaging
substrate around a periphery of the cavity during mold
clamping.
12. The mold according to claim 11, wherein the upper mold portion
includes a projection having a surface contacting an active area of
the integrated circuit die during mold clamping.
13. The mold according to claim 12, wherein the deformable material
deforms during mold clamping to accommodate thickness variations in
the packaging substrate, non-planarity of an adhesive between the
integrated circuit die and the packaging substrate, or both.
14. The mold according to claim 8, wherein the deformable material
has a variable upper surface contacting the bottom of the packaging
substrate during mold clamping.
15. A method of packaging integrated circuits comprising: clamping
an upper mold portion and a lower mold portion around an integrated
circuit die mounted on an upper surface of a packaging substrate,
the upper and lower mold portions contacting upper and lower
surfaces of the packaging substrate, respectively, during clamping,
wherein a deformable material on a surface of the lower mold
portion contacts the bottom surface of the packaging substrate
during mold clamping.
16. The method according to claim 15, wherein the deformable
material deforms during mold clamping to accommodate thickness
variations in the packaging substrate.
17. The method according to claim 15, wherein the deformable
material deforms during mold clamping to accommodate non-planarity
of an adhesive between the integrated circuit die and the packaging
substrate.
18. The method according to claim 15, further comprising: receiving
the integrated circuit die within a cavity in the upper mold
portion during clamping, wherein the upper mold portion contacts
the upper surface of the packaging substrate around a periphery of
the cavity during mold clamping.
19. The method according to claim 18, further comprising: bringing
a surface on a projection within the upper mold portion into
contact with an active area of the integrated circuit die during
mold clamping.
20. The method according to claim 19, wherein the deformable
material deforms during mold clamping to accommodate thickness
variations in the packaging substrate, non-planarity of an adhesive
between the integrated circuit die and the packaging substrate, or
both.
Description
TECHNICAL FIELD OF THE INVENTION
[0001] The present invention is directed, in general, to transfer
molding during integrated circuit packaging and, more specifically,
to transfer molding tolerating localized lead frame or packaging
substrate thickness variations.
BACKGROUND OF THE INVENTION
[0002] Conventional transfer molding systems employed for
integrated circuit packaging generally utilize hardened steel mold
surfaces to clamp onto the lead frame or packaging substrate,
forming the mold cavity as shown in FIG. 4. Mold system 400
includes a lower mold portion 401 and an upper mold portion 402
receiving an integrated circuit die 403 affixed to a packaging
substrate 404 by an adhesive, electrically connected by wire bonds
to conductive traces on the packaging substrate.
[0003] The lower mold portion 401 has an upper surface that
contacts the bottom surface of packaging substrate 404 while the
upper mold portion 402 defines a cavity 405 around integrated
circuit die 403, the wire bonds and a portion of the upper surface
of packaging substrate 404, contacting the upper surface of the
packaging substrate 404 only around a periphery of the cavity 405.
Once the mold portions 401 and 402 are assembled with an integrated
circuit die 403 and packaging substrate 404 received therein as
shown in FIG. 4, encapsulating material such as epoxy or
thermosetting resin is injected into the cavity 405, forming the
packaged integrated circuit.
[0004] Such transfer molding systems, however, are poorly suited
where the lead frame or-packaging substrate has local thickness
variations. Either leakage of the encapsulating material or damage
to the packaging substrate 404 (e.g., damage to the conductive
traces thereon) may result.
[0005] When the integrated circuit die being packaged requires an
exposed active area after packaging (e.g., for capacitive or light
sensors therein), similar problems arise. As illustrated in FIG. 5,
the mold system 500 for packaging exposed active area integrated
circuits typically includes lower and upper mold portions 501 and
502, respectively, receiving an integrated circuit die 503 mounted
on a packaging substrate 504. Upper mold 502 defines a cavity 505
around integrated circuit die 503 and a portion of packaging
substrate 504, with a portion of the upper mold 502 contacting the
active area 506 to prevent injected encapsulating material from
contacting that surface, leaving the active area 506 exposed after
packaging.
[0006] When packaging exposed active area integrated circuits
utilizing a mold system of this type, non-uniformity or
non-planarity of the adhesive employed to affix the integrated
circuit die (exaggerated in FIG. 5) can cause imperfect contact of
the upper mold with the active area, resulting of leakage of the
encapsulating material onto the active area or damage to the
integrated circuit die active area.
[0007] There is, therefore, a need in the art for a transfer
molding system tolerating thickness variations in the lead frame or
packaging substrate, and additionally tolerating non-planarity of
the integrated circuit die for circuits requiring exposed active
areas after packaging.
SUMMARY OF THE INVENTION
[0008] To address the above-discussed deficiencies of the prior
art, it is a primary object of the present invention to provide,
for use in transfer molding system, a bottom mold portion that is
covered with a deformable material. During mold clamping, the
deformable material contacts the bottom surface of the packaging
substrate on which the integrated circuit die is mounted.
Deformation of this relatively soft covering on the bottom mold
portion accommodates thickness variations in the packaging
substrate, as well as non-planarity of the adhesive layer between
the integrated circuit die and packaging substrate in exposed
active area integrated circuits.
[0009] The foregoing has outlined rather broadly the features and
technical advantages of the present invention so that those skilled
in the art may better understand the detailed description of the
invention that follows. Additional features and advantages of the
invention will be described hereinafter that form the subject of
the claims of the invention. Those skilled in the art will
appreciate that they may readily use the conception and the
specific embodiment disclosed as a basis for modifying or designing
other structures for carrying out the same purposes of the present
invention. Those skilled in the art will also realize that such
equivalent constructions do not depart from the spirit and scope of
the invention in its broadest form.
[0010] Before undertaking the DETAILED DESCRIPTION OF THE INVENTION
below, it may be advantageous to set forth definitions of certain
words or phrases used throughout this patent document: the terms
"include" and "comprise," as well as derivatives thereof, mean
inclusion without limitation; the term "or" is inclusive, meaning
and/or; the phrases "associated with" and "associated therewith,"
as well as derivatives thereof, may mean to include, be included
within, interconnect with, contain, be contained within, connect to
or with, couple to or with, be communicable with, cooperate with,
interleave, juxtapose, be proximate to, be bound to or with, have,
have a property of, or the like; and the term "controller" means
any device system or part thereof that controls at least one
operation, whether such a device is implemented in hardware,
firmware, software or some combination of at least two of the same.
It should be noted that the functionality associated with any
particular controller may be centralized or distributed, whether
locally or remotely. Definitions for certain words and phrases are
provided throughout this patent document, and those of ordinary
skill in the art will understand that such definitions apply in
many, if not most, instances to prior as well as future uses of
such defined words and phrases.
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] For a more complete understanding of the present invention,
and the advantages thereof, reference is now made to the following
descriptions taken in conjunction with the accompanying drawings,
wherein like numbers designate like objects, and in which:
[0012] FIG. 1 depicts a transfer molding system that tolerates
thickness variations in the lead frame or packaging substrate
according to one embodiment of the present invention;
[0013] FIG. 2 depicts a transfer molding system that tolerates
non-planarity of the exposed active area integrated circuit die
when mounted on the lead frame or packaging substrate according to
one embodiment of the present invention;
[0014] FIG. 3 depicts a lower mold portion for a transfer molding
system according to an alternative embodiment of the present
invention;
[0015] FIG. 4 depicts a transfer molding system; and
[0016] FIG. 5 depicts a transfer molding system for exposed active
area integrated circuits.
DETAILED DESCRIPTION OF THE INVENTION
[0017] FIGS. 1 through 3, discussed below, and the various
embodiments used to describe the principles of the present
invention in this patent document are by way of illustration only
and should not be construed in any way to limit the scope of the
invention. Those skilled in the art will understand that the
principles of the present invention may be implemented in any
suitably arranged device.
[0018] FIG. 1 depicts a transfer molding system that tolerates
thickness variations in the lead frame or packaging substrate
according to one embodiment of the present invention. Mold system
100 includes a lower mold portion 101 and an upper mold portion 102
that are adapted to receive, between the two portions 101 and 102,
an integrated circuit die 103 affixed to a packaging substrate 104
(e.g., a plastic sheet) by an adhesive such as epoxy. In the
example shown, wire bonds electrically connect integrated circuit
die 103 to conductive traces on the packaging substrate 104.
[0019] The lower mold portion 101 has an upper surface that
contacts the bottom surface of packaging substrate 104, while the
upper mold portion 102 defines a cavity 105 around integrated
circuit die 103, the wire bonds and at least a portion of the upper
surface of packaging substrate 104. The upper mold portion 102
contacts the upper surface of the packaging substrate 104 only
around a periphery of the cavity 105. The lower mold portion 101
contacts the bottom surface of the packaging substrate 104 over at
least an area corresponding to the contact area of upper mold
portion 102 on the upper surface of the packaging substrate
104.
[0020] Once the mold portions 101 and 102 are assembled with an
integrated circuit die 103 and packaging substrate 104 received
therein as shown in FIG. 1, encapsulating material such as epoxy or
thermosetting resin is injected into the cavity 105 via injection
conduits (not shown) through the upper mold portion 102 to cavity
105. The injected encapsulating material adheres to and hardens
around the integrated circuit die 103, any wire bonds, and the
portion of packaging substrate 104 underlying cavity 105, forming
the packaged integrated circuit.
[0021] In the present invention, the lower mold portion 101
includes hardened steel 107 covered by an elastomeric, deformable
material 108 (e.g., neoprene rubber). The deformable material 108
contacts the bottom surface of packaging substrate 104 during mold
clamping (closure), and compensates for non-planarity (e.g.,
general or localized thickness variations) of the packaging
substrate 104.
[0022] FIG. 2 depicts a transfer molding system that tolerates
non-planarity of the exposed active area integrated circuit die
when mounted on the lead frame or packaging substrate according to
one embodiment of the present invention. Mold system 200 for
packaging exposed active area integrated circuits includes lower
and upper mold portions 201 and 202, respectively, receiving an
integrated circuit die 203 mounted on a packaging substrate 204.
Upper mold portion 202 defines a cavity 205 around integrated
circuit die 203 and a portion of packaging substrate 204. Wire
bonds (not shown) may optionally connect the integrated circuit die
203 to conductive traces on the packaging substrate 204.
[0023] As with the example of FIG. 1, encapsulating material is
injected into the cavity 205 to adhere to and harden around
portions of the integrated circuit die 203, any wire bonds, and the
packaging substrate 204 without or exposed to the cavity 205.
However, a portion of the upper mold portion 202 in mold system 200
contacts the active area 206 of the integrated circuit die 203 to
prevent injected encapsulating material from contacting that
surface 206. The active area 206 is thus left exposed after
packaging.
[0024] In the present invention, lower mold portion 201 comprises
hardened steel 207 covered by a relatively soft, deformable 208.
Therefore non-planarity of the adhesive between the integrated
circuit die 203 and the packaging substrate 204, and consequent
"tilt" of the integrated circuit die 203 with respect to the
packaging substrate 204 and the surface of upper mold portion 202
that contacts the active area 206, is compensated by deformation of
the relatively soft material 208 (and possibly minor, localized
deformation of packaging substrate 204). No gap between the active
area 206 and upper mold surface contacting the active area remains
into which injected encapsulating material may flow.
[0025] FIG. 3 depicts a lower mold portion for a transfer molding
system according to an alternative embodiment of the present
invention. To promote adaptation of thickness variation or
deformation required in order to accommodate non-planar adhesive
layers, the lower mold portion 301 may optionally comprise a steel
base 307 covered with a deformable material 308 having a variable
upper surface.
[0026] Although the present invention has been described in detail,
those skilled in the art will understand that various changes,
substitutions, variations, enhancements, nuances, gradations,
lesser forms, alterations, revisions, improvements and knock-offs
of the invention disclosed herein may be made without departing
from the spirit and scope of the invention in its broadest
form.
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