WANG; LI MIN

Patent Applications and Registrations

Patent applications and USPTO patent grants for WANG; LI MIN.The latest application filed is for "switching matrix system and operating method thereof for semiconductor characteristic measurement".

Company Profile

2.13.17

WANG; LI MIN - HSINCHU CITY TW
Wang; Li Min - Hsinchu TW
Wang; Li-Min - Tainan TW
WANG; Li-Min - TAINAN CITY TW
Wang; Li Min - Jhudong Township TW
Wang; Li Min - Hsinchu County TW
Wang; Li Min - Taichung TW
Wang; Li Min - Taichung City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Switching Matrix System And Operating Method Thereof For Semiconductor Characteristic Measurement App 20220206040 - LOU; CHOON LEONG ; et al.	2022-06-30
Testing apparatus Grant 11,209,462 - Lou , et al. December 28, 2	2021-12-28
Testing apparatus, holding assembly, and probe card carrier Grant 10,184,957 - Lou , et al. Ja	2019-01-22
Switching matrix and testing system for semiconductor characteristic measurement using the same Grant 9,885,746 - Lou , et al. February 6, 2	2018-02-06
Extrusion device and coating system Grant 9,873,133 - Hsu , et al. January 23, 2	2018-01-23
Testing Apparatus, Holding Assembly, And Probe Card Carrier App 20170370966 - LOU; CHOON LEONG ; et al.	2017-12-28
Test assembly Grant 9,739,830 - Lou , et al. August 22, 2	2017-08-22
Arc atmospheric pressure plasma device Grant 9,474,141 - Hong , et al. October 18, 2	2016-10-18
Optical Method For Monitoring Plasma Discharging Glow App 20160258816 - LEE; Ji-Yung ; et al.	2016-09-08
Plasma device Grant 9,320,125 - Hsu , et al. April 19, 2	2016-04-19
Extrusion Device And Coating System App 20150360251 - Hsu; Yi-Ming ; et al.	2015-12-17
Plasma Device App 20150303034 - Hsu; Yi-Ming ; et al.	2015-10-22
Test Assembly App 20140340105 - LOU; Choon Leong ; et al.	2014-11-20
Test Assembly App 20140340108 - LOU; Choon Leong ; et al.	2014-11-20
Switching Matrix And Testing System For Semiconductor Characteristic Measurement Using The Same App 20130082731 - LOU; CHOON LEONG ; et al.	2013-04-04
Testing apparatus for light-emitting devices with a design for a removable sensing module Grant 8,389,926 - Lou , et al. March 5, 2	2013-03-05
Sensing Module for Light-Emitting Devices and Testing Apparatus Using the Same App 20110063608 - Lou; Choon Leong ; et al.	2011-03-17
Testing Apparatus for Light-Emitting Devices App 20110062317 - Lou; Choon Leong ; et al.	2011-03-17
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism App 20100134130 - LOU; CHOON LEONG ; et al.	2010-06-03
Heating apparatus for semiconductor devices Grant 7,675,307 - Lou , et al. March 9, 2	2010-03-09
Integrated circuit probing apparatus having a temperature-adjusting mechanism Grant 7,616,018 - Lou , et al. November 10, 2	2009-11-10
Heating Apparatus For Semiconductor Devices App 20090237102 - Lou; Choon Leong ; et al.	2009-09-24
Integrated circuit probing apparatus having a temperature-adjusting mechanism Grant 7,576,553 - Lou , et al. August 18, 2	2009-08-18
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism App 20090015283 - LOU; CHOON LEONG ; et al.	2009-01-15
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism App 20080150567 - LOU; CHOON LEONG ; et al.	2008-06-26
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism App 20080048700 - Lou; Choon Leong ; et al.	2008-02-28
Pressure tank having a connector that may be assembled rapidly and tightly App 20020066731 - Wang, Li-Min	2002-06-06

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