loadpatents
name:-0.073330879211426
name:-0.073799133300781
name:-0.029345035552979
Shobha; Hosadurga Patent Filings

Shobha; Hosadurga

Patent Applications and Registrations

Patent applications and USPTO patent grants for Shobha; Hosadurga.The latest application filed is for "copper interconnect structure with manganese barrier layer".

Company Profile
28.70.73
  • Shobha; Hosadurga - Niskayuna NY
  • Shobha; Hosadurga - Albany NY
  • Shobha; Hosadurga - Hopewell Junction NY
  • Shobha; Hosadurga - Yorktown Heights NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Skip via connection between metallization levels
Grant 11,315,827 - Huang , et al. April 26, 2
2022-04-26
Copper Interconnect Structure With Manganese Barrier Layer
App 20220115269 - Edelstein; Daniel C. ;   et al.
2022-04-14
Bottom Barrier Free Interconnects Without Voids
App 20220028797 - Cheng; Kenneth Chun Kuen ;   et al.
2022-01-27
Trapezoidal Interconnect at Tight BEOL Pitch
App 20220013406 - Lanzillo; Nicholas Anthony ;   et al.
2022-01-13
Trapezoidal interconnect at tight BEOL pitch
Grant 11,177,162 - Lanzillo , et al. November 16, 2
2021-11-16
Interconnects with gouged vias
Grant 11,177,169 - Cheng , et al. November 16, 2
2021-11-16
Barrier-less Prefilled Via Formation
App 20210343589 - Lanzillo; Nicholas Anthony ;   et al.
2021-11-04
Bottom barrier free interconnects without voids
Grant 11,164,815 - Cheng , et al. November 2, 2
2021-11-02
Hybrid selective dielectric deposition for aligned via integration
Grant 11,152,299 - Lanzillo , et al. October 19, 2
2021-10-19
Barrier-less prefilled via formation
Grant 11,152,257 - Lanzillo , et al. October 19, 2
2021-10-19
Wafer Backside Engineering For Wafer Stress Control
App 20210320036 - JAIN; Nikhil ;   et al.
2021-10-14
Hybrid Selective Dielectric Deposition For Aligned Via Integration
App 20210280510 - Lanzillo; Nicholas Anthony ;   et al.
2021-09-09
Skip Via Connection Between Metallization Levels
App 20210280456 - Huang; Huai ;   et al.
2021-09-09
Tall trenches for via chamferless and self forming barrier
Grant 11,101,175 - Mignot , et al. August 24, 2
2021-08-24
Barrier-less Prefilled Via Formation
App 20210225700 - Lanzillo; Nicholas Anthony ;   et al.
2021-07-22
Selective Ild Deposition For Fully Aligned Via With Airgap
App 20210217653 - Penny; Christopher J. ;   et al.
2021-07-15
Metallization interconnect structure formation
Grant 11,056,426 - Mignot , et al. July 6, 2
2021-07-06
Bottom Barrier Free Interconnects Without Voids
App 20210098388 - Cheng; Kenneth Chun Kuen ;   et al.
2021-04-01
Selective ILD deposition for fully aligned via with airgap
Grant 10,964,588 - Penny , et al. March 30, 2
2021-03-30
Trapezoidal Interconnect at Tight BEOL Pitch
App 20210082744 - Lanzillo; Nicholas Anthony ;   et al.
2021-03-18
Method and structure to construct cylindrical interconnects to reduce resistance
Grant 10,943,866 - Briggs , et al. March 9, 2
2021-03-09
Void-free metallic interconnect structures with self-formed diffusion barrier layers
Grant 10,903,116 - Maniscalco , et al. January 26, 2
2021-01-26
Interconnects With Gouged Vias
App 20200402844 - Cheng; Kenneth Chun Kuen ;   et al.
2020-12-24
Bottom-up Curing Of Dielectric Films In Integrated Circuits
App 20200388488 - Sil; Devika ;   et al.
2020-12-10
Selective Ild Deposition For Fully Aligned Via With Airgap
App 20200388525 - Penny; Christopher J. ;   et al.
2020-12-10
Metallization Interconnect Structure Formation
App 20200381354 - Mignot; Yann ;   et al.
2020-12-03
Techniques to improve critical dimension width and depth uniformity between features with different layout densities
Grant 10,832,945 - Saulnier , et al. November 10, 2
2020-11-10
Semiconductor Device With Selective Insulator For Improved Capacitance
App 20200303239 - Penny; Christopher J. ;   et al.
2020-09-24
Method and structure to construct cylindrical interconnects to reduce resistance
Grant 10,784,197 - Briggs , et al. Sept
2020-09-22
Semiconductor device with selective insulator for improved capacitance
Grant 10,763,160 - Penny , et al. Sep
2020-09-01
Techniques to Improve Critical Dimension Width and Depth Uniformity Between Features with Different Layout Densities
App 20200266100 - Saulnier; Nicole ;   et al.
2020-08-20
Forming High Carbon Content Flowable Dielectric Film With Low Processing Damage
App 20200234949 - Briggs; Benjamin D. ;   et al.
2020-07-23
Selective deposition of dielectrics on ultra-low k dielectrics
Grant 10,692,755 - Shobha , et al.
2020-06-23
Capacitance reduction in sea of lines BEOL metallization
Grant 10,679,934 - Briggs , et al.
2020-06-09
Multi-buried ULK field in BEOL structure
Grant 10,679,892 - Mignot , et al.
2020-06-09
Tall Trenches For Via Chamferless And Self Forming Barrier
App 20200161180 - MIGNOT; Yann ;   et al.
2020-05-21
Selective ILD deposition for fully aligned via with airgap
Grant 10,651,078 - Penny , et al.
2020-05-12
Selective Deposition Of Dielectrics On Ultra-low K Dielectrics
App 20200135544 - Shobha; Hosadurga ;   et al.
2020-04-30
Dual-damascene formation with dielectric spacer and thin liner
Grant 10,629,478 - Briggs , et al.
2020-04-21
Dielectric gap fill evaluation for integrated circuits
Grant 10,622,250 - Chu , et al.
2020-04-14
Method And Structure To Construct Cylindrical Interconnects To Reduce Resistance
App 20200058590 - Briggs; Benjamin D. ;   et al.
2020-02-20
Method And Structure To Construct Cylindrical Interconnects To Reduce Resistance
App 20200058591 - Briggs; Benjamin D. ;   et al.
2020-02-20
Void-free Metallic Interconnect Structures With Self-formed Diffusion Barrier Layers
App 20200020581 - Maniscalco; Joseph F. ;   et al.
2020-01-16
Void-free Metallic Interconnect Structures With Self-formed Diffusion Barrier Layers
App 20200020577 - Maniscalco; Joseph F. ;   et al.
2020-01-16
Method and structure to construct cylindrical interconnects to reduce resistance
Grant 10,529,662 - Briggs , et al. J
2020-01-07
Void-free metallic interconnect structures with self-formed diffusion barrier layers
Grant 10,529,622 - Maniscalco , et al. J
2020-01-07
Selective Ild Deposition For Fully Aligned Via With Airgap
App 20190267278 - Penny; Christopher J. ;   et al.
2019-08-29
Method And Structure To Construct Cylindrical Interconnects To Reduce Resistance
App 20190237402 - Briggs; Benjamin D. ;   et al.
2019-08-01
Selective ILD deposition for fully aligned via with airgap
Grant 10,361,117 - Penny , et al.
2019-07-23
Dielectric Gap Fill Evaluation For Integrated Circuits
App 20190189503 - Chu; Isabel Cristina ;   et al.
2019-06-20
Dielectric Gap Fill Evaluation For Integrated Circuits
App 20190189504 - Chu; Isabel Cristina ;   et al.
2019-06-20
Selective Ild Deposition For Fully Aligned Via With Airgap
App 20190181033 - Penny; Christopher J. ;   et al.
2019-06-13
Capacitance Reduction In Sea Of Lines Beol Metallization
App 20190172783 - Briggs; Benjamin D. ;   et al.
2019-06-06
ROBUST HIGH PERFORMANCE LOW HYDROGEN SILICON CARBON NITRIDE (SiCNH) DIELECTRICS FOR NANO ELECTRONIC DEVICES
App 20190172704 - Haigh, JR.; Thomas J. ;   et al.
2019-06-06
Dielectric gap fill evaluation for integrated circuits
Grant 10,312,140 - Chu , et al.
2019-06-04
Robust high performance low hydrogen silicon carbon nitride (SiCNH) dielectrics for nano electronic devices
Grant 10,242,865 - Haigh, Jr. , et al.
2019-03-26
Rework of patterned dielectric and metal hardmask films
Grant 10,242,872 - Arnold , et al.
2019-03-26
Robust high performance low hydrogen silicon carbon nitride (SiCNH) dielectrics for nano electronic devices
Grant 10,236,176 - Haigh, Jr. , et al.
2019-03-19
Dual-damascene Formation With Dielectric Spacer And Thin Liner
App 20190067087 - Briggs; Benjamin D. ;   et al.
2019-02-28
Rework Of Patterned Dielectric And Metal Hardmask Films
App 20180277369 - Arnold; John C. ;   et al.
2018-09-27
Integration of super via structure in BEOL
Grant 10,020,254 - Bao , et al. July 10, 2
2018-07-10
Integration of super via structure in BEOL
Grant 10,020,255 - Bao , et al. July 10, 2
2018-07-10
Selective and non-selective barrier layer wet removal
Grant 10,002,831 - Briggs , et al. June 19, 2
2018-06-19
Ultrathin superlattice of MnO/Mn/MnN and other metal oxide/metal/metal nitride liners and caps for copper low dielectric constant interconnects
Grant 9,947,622 - Canaperi , et al. April 17, 2
2018-04-17
Selective And Non-selective Barrier Layer Wet Removal
App 20170317026 - Briggs; Benjamin D. ;   et al.
2017-11-02
Selective and non-selective barrier layer wet removal
Grant 9,806,023 - Briggs , et al. October 31, 2
2017-10-31
Selective And Non-selective Barrier Layer Wet Removal
App 20170301624 - Briggs; Benjamin D. ;   et al.
2017-10-19
ROBUST HIGH PERFORMANCE LOW HYDROGEN SILICON CARBON NITRIDE (SiCNH) DIELECTRICS FOR NANO ELECTRONIC DEVICES
App 20170263451 - Haigh, JR.; Thomas J. ;   et al.
2017-09-14
ROBUST HIGH PERFORMANCE LOW HYDROGEN SILICON CARBON NITRIDE (SiCNH) DIELECTRICS FOR NANO ELECTRONIC DEVICES
App 20170263449 - Haigh, JR.; Thomas J. ;   et al.
2017-09-14
Robust high performance low hydrogen silicon carbon nitride (SiCNH) dielectrics for nano electronic devices
Grant 9,735,005 - Haigh, Jr. , et al. August 15, 2
2017-08-15
Ultrathin superlattice of MnO/Mn/MnN and other metal oxide/metal/metal nitride liners and caps for copper low dielectric constant interconnects
Grant 9,691,705 - Canaperi , et al. June 27, 2
2017-06-27
Selective and non-selective barrier layer wet removal
Grant 9,685,406 - Briggs , et al. June 20, 2
2017-06-20
Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
Grant 9,607,825 - Canaperi , et al. March 28, 2
2017-03-28
Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
Grant 9,558,934 - Canaperi , et al. January 31, 2
2017-01-31
Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
Grant 9,558,935 - Canaperi , et al. January 31, 2
2017-01-31
ULTRATHIN SUPERLATTICE OF MnO/Mn/MnN AND OTHER METAL OXIDE/METAL/METAL NITRIDE LINERS AND CAPS FOR COPPER LOW DIELECTRIC CONSTANT INTERCONNECTS
App 20170005040 - Canaperi; Donald F. ;   et al.
2017-01-05
Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
Grant 9,536,733 - Canaperi , et al. January 3, 2
2017-01-03
Method of forming an interconnect structure
Grant 9,502,288 - Nguyen , et al. November 22, 2
2016-11-22
Ultrathin superlattice of MnO/Mn/MnN and other metal oxide/metal/metal nitride liners and caps for copper low dielectric constant interconnects
Grant 9,472,503 - Canaperi , et al. October 18, 2
2016-10-18
Hydrogen-free silicon-based deposited dielectric films for nano device fabrication
Grant 9,449,812 - Canaperi , et al. September 20, 2
2016-09-20
ULTRATHIN SUPERLATTICE OF MnO/Mn/MnN AND OTHER METAL OXIDE/METAL/METAL NITRIDE LINERS AND CAPS FOR COPPER LOW DIELECTRIC CONSTANT INTERCONNECTS
App 20160133576 - Canaperi; Donald F. ;   et al.
2016-05-12
Interconnect structure containing a porous low k interconnect dielectric/dielectric cap
Grant 9,312,224 - Canaperi , et al. April 12, 2
2016-04-12
Hydrogen-free Silicon-based Deposited Dielectric Films For Nano Device Fabrication
App 20160064218 - Canaperi; Donald Francis ;   et al.
2016-03-03
Hydrogen-free Silicon-based Deposited Dielectric Films For Nano Device Fabrication
App 20160064509 - Canaperi; Donald Francis ;   et al.
2016-03-03
Ultrathin superlattice of MnO/Mn/MnN and other metal oxide/metal/metal nitride liners and caps for copper low dielectric constant interconnects
Grant 9,275,952 - Canaperi , et al. March 1, 2
2016-03-01
Hydrogen-free Silicon-based Deposited Dielectric Films For Nano Device Fabrication
App 20160056111 - Canaperi; Donald Francis ;   et al.
2016-02-25
Hydrogen-free Silicon-based Deposited Dielectric Films For Nano Device Fabrication
App 20160047038 - Canaperi; Donald Francis ;   et al.
2016-02-18
ULTRATHIN SUPERLATTICE OF MnO/Mn/MnN AND OTHER METAL OXIDE/METAL/METAL NITRIDE LINERS AND CAPS FOR COPPER LOW DIELECTRIC CONSTANT INTERCONNECTS
App 20160035618 - Canaperi; Donald F. ;   et al.
2016-02-04
Composite dielectric materials with improved mechanical and electrical properties
Grant 9,214,332 - Canaperi , et al. December 15, 2
2015-12-15
Self-aligned fine pitch permanent on-chip interconnect structures and method of fabrication
Grant 9,209,126 - Lin , et al. December 8, 2
2015-12-08
Hydrogen-free Silicon-based Deposited Dielectric Films For Nano Device Fabrication
App 20150287593 - Canaperi; Donald Francis ;   et al.
2015-10-08
Composite Dielectric Materials With Improved Mechanical And Electrical Properties
App 20150270124 - Canaperi; Donald F. ;   et al.
2015-09-24
ULTRATHIN SUPERLATTICE OF MnO/Mn/MnN AND OTHER METAL OXIDE/METAL/METAL NITRIDE LINERS AND CAPS FOR COPPER LOW DIELECTRIC CONSTANT INTERCONNECTS
App 20150214157 - Canaperi; Donald F. ;   et al.
2015-07-30
Improved SiCOH Hardmask with Graded Transition Layers
App 20150028491 - ANGYAL; MATTHEW S. ;   et al.
2015-01-29
SiCOH hardmask with graded transition layers
Grant 8,927,442 - Angyal , et al. January 6, 2
2015-01-06
Self-aligned fine pitch permanent on-chip interconnect structures and method of fabrication
Grant 8,822,137 - Lin , et al. September 2, 2
2014-09-02
ADHESION LAYER AND MULTIPHASE ULTRA-LOW k DIELECTRIC MATERIAL
App 20140203336 - GRILL; ALFRED ;   et al.
2014-07-24
Process to form an adhesion layer and multiphase ultra-low k dielectric material using PECVD
Grant 8,637,412 - Grill , et al. January 28, 2
2014-01-28
MODULATED COMPOSITIONAL AND STRESS CONTROLLED MULTILAYER ULTRATHIN CONFORMAL SiNx DIELECTRICS USED IN NANO DEVICE FABRICATION
App 20130333923 - Balseanu; Mihaela ;   et al.
2013-12-19
Method of fabricating semiconductor capacitor
Grant 8,518,773 - Horak , et al. August 27, 2
2013-08-27
Semiconductor Capacitor
App 20130065376 - Horak; David Vaclav ;   et al.
2013-03-14
Method for fabricating air gap interconnect structures
Grant 8,383,507 - Chanda , et al. February 26, 2
2013-02-26
Multiphase Ultra Low K Dielectric Material
App 20130043514 - Grill; Alfred ;   et al.
2013-02-21
Interconnect structure with an oxygen-doped SiC antireflective coating and method of fabrication
Grant 8,373,271 - Goldfarb , et al. February 12, 2
2013-02-12
Self-aligned Fine Pitch Permanent On-chip Interconnect Structures And Method Of Fabrication
App 20130032945 - Lin; Qinghuang ;   et al.
2013-02-07
Self-aligned Fine Pitch Permanent On-chip Interconnect Structures And Method Of Fabrication
App 20130032949 - Lin; Qinghuang ;   et al.
2013-02-07
Engineered interconnect dielectric caps having compressive stress and interconnect structures containing same
Grant 8,362,596 - Cohen , et al. January 29, 2
2013-01-29
Semiconductor capacitor
Grant 8,354,703 - Horak , et al. January 15, 2
2013-01-15
Self-aligned composite M-MOx/dielectric cap for Cu interconnect structures
Grant 8,299,365 - Nguyen , et al. October 30, 2
2012-10-30
SELF-ALIGNED COMPOSITE M-MOx/DIELECTRIC CAP FOR Cu INTERCONNECT STRUCTURES
App 20120175023 - Nguyen; Son Van ;   et al.
2012-07-12
Air Gap Interconnect Structures And Methods For Forming The Same
App 20120111825 - Chanda; Kaushik ;   et al.
2012-05-10
Air gap interconnect structures and methods for forming the same
Grant 8,120,179 - Chanda , et al. February 21, 2
2012-02-21
Semiconductor Capacitor
App 20120012980 - HORAK; DAVID VACLAV ;   et al.
2012-01-19
Semiconductor Capacitor
App 20120012979 - Horak; David Vaclav ;   et al.
2012-01-19
INTERCONNECT STRUCTURE WITH AN OXYGEN-DOPED SiC ANTIREFLECTIVE COATING AND METHOD OF FABRICATION
App 20110291284 - Goldfarb; Dario L. ;   et al.
2011-12-01
SELF-ALIGNED COMPOSITE M-MOx/DIELECTRIC CAP FOR Cu INTERCONNECT STRUCTURES
App 20110162874 - Nguyen; Son Van ;   et al.
2011-07-07
Air Gap Interconnect Structures And Methods For Forming The Same
App 20110108992 - Chanda; Kaushik ;   et al.
2011-05-12
Engineered Interconnect Dielectric Caps Having Compressive Stress And Interconnect Structures Containing Same
App 20110012238 - Cohen; Stephan A. ;   et al.
2011-01-20
Underfilling with acid-cleavable acetal and ketal epoxy oligomers
Grant 7,776,993 - Buchwalter , et al. August 17, 2
2010-08-17
Treatment of plasma damaged layer for critical dimension retention, pore sealing and repair
Grant 7,750,479 - Purushothaman , et al. July 6, 2
2010-07-06
Advanced multilayer dielectric cap with improved mechanical and electrical properties
Grant 7,737,052 - Bhatia , et al. June 15, 2
2010-06-15
Methods of forming metal interconnect structures on semiconductor substrates using oxygen-removing plasmas and interconnect structures formed thereby
Grant 7,737,029 - Kim , et al. June 15, 2
2010-06-15
Methods of Forming Metal Interconnect Structures on Semiconductor Substrates Using Oxygen-Removing Plasmas and Interconnect Structures Formed Thereby
App 20090239374 - Kim; Jae hak ;   et al.
2009-09-24
Advanced Multilayer Dielectric Cap With Improved Mechanical And Electrical Properties
App 20090224374 - Bhatia; Ritwik ;   et al.
2009-09-10
Method For Protecting Porous Low-k Dielectric Post Chemical Mechanical Planarization
App 20090142885 - OU; YA ;   et al.
2009-06-04
Treatment Of Plasma Damaged Layer For Critical Dimension Retention, Pore Sealing And Repair
App 20080042283 - Purushothaman; Sampath ;   et al.
2008-02-21
Reworkable b-stageable adhesive and use in waferlevel underfill
App 20050250248 - Buchwalter, Stephen Leslie ;   et al.
2005-11-10
Acid-cleavable acetal and ketal based epoxy oligomers
Grant 6,919,420 - Buchwalter , et al. July 19, 2
2005-07-19
Reworkable b-stageable adhesive and use in waferlevel underfill
App 20040110010 - Buchwalter, Stephen Leslie ;   et al.
2004-06-10

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed