| Patent | Date |
|---|
Probe Card Device
App 20220221491 - LOU; CHOON LEONG | 2022-07-14 |
High Speed Signal Transmitting And Receiving Detection Device
App 20220221488 - LOU; CHOON LEONG | 2022-07-14 |
Probing Apparatus With Temperature-adjusting Mechanism
App 20220221508 - Lou; Choon Leong ; et al. | 2022-07-14 |
Test Probe Module
App 20220221490 - LOU; CHOON LEONG | 2022-07-14 |
Probing System
App 20220221492 - LOU; Choon Leong | 2022-07-14 |
Switching Matrix System And Operating Method Thereof For Semiconductor Characteristic Measurement
App 20220206040 - LOU; CHOON LEONG ; et al. | 2022-06-30 |
Semiconductor Structure
App 20220199488 - LOU; Choon Leong | 2022-06-23 |
Probe Device And Method Of Assembling The Same
App 20220178969 - LOU; Choon Leong ; et al. | 2022-06-09 |
Probing apparatus and method of operating the same
Grant 11,307,246 - Lou , et al. April 19, 2 | 2022-04-19 |
Probing device
Grant 11,293,975 - Lou April 5, 2 | 2022-04-05 |
Shielding for probing system
Grant 11,262,400 - Lou March 1, 2 | 2022-03-01 |
Method of testing and analyzing display panel
Grant 11,217,649 - Lou January 4, 2 | 2022-01-04 |
Testing apparatus
Grant 11,209,462 - Lou , et al. December 28, 2 | 2021-12-28 |
Method Of Analyzing And Manufacturing Display Panel
App 20210313408 - LOU; Choon Leong | 2021-10-07 |
Shielding For Probing System
App 20210311111 - LOU; CHOON LEONG | 2021-10-07 |
Probe Card, Probing System And Probing Method
App 20210208182 - LOU; CHOON LEONG | 2021-07-08 |
Method of operating a probing apparatus
Grant 11,054,465 - Lou , et al. July 6, 2 | 2021-07-06 |
Probing Device
App 20210199711 - LOU; CHOON LEONG | 2021-07-01 |
Probing device
Grant 11,047,880 - Lou , et al. June 29, 2 | 2021-06-29 |
Probe Apparatus
App 20210173003 - LIN; CHANG-MING ; et al. | 2021-06-10 |
Method Of Operating A Probing Apparatus
App 20210116496 - LOU; CHOON LEONG ; et al. | 2021-04-22 |
Probing Apparatus And Method Of Operating The Same
App 20210088581 - LOU; CHOON LEONG ; et al. | 2021-03-25 |
Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test
Grant 10,890,614 - Lou , et al. January 12, 2 | 2021-01-12 |
Method For Determining A Junction Temperature Of A Device Under Test And Method For Controlling A Junction Temperature Of A Device Under Test
App 20200326366 - LOU; CHOON LEONG ; et al. | 2020-10-15 |
Probing Device
App 20200225266 - LOU; CHOON LEONG ; et al. | 2020-07-16 |
Testing apparatus, holding assembly, and probe card carrier
Grant 10,184,957 - Lou , et al. Ja | 2019-01-22 |
Test assembly and method of manufacturing the same
Grant 10,088,502 - Chen , et al. October 2, 2 | 2018-10-02 |
Switching matrix and testing system for semiconductor characteristic measurement using the same
Grant 9,885,746 - Lou , et al. February 6, 2 | 2018-02-06 |
Testing Apparatus, Holding Assembly, And Probe Card Carrier
App 20170370966 - LOU; CHOON LEONG ; et al. | 2017-12-28 |
Test assembly
Grant 9,739,830 - Lou , et al. August 22, 2 | 2017-08-22 |
Testing device
Grant 9,535,114 - Lou , et al. January 3, 2 | 2017-01-03 |
Test Assembly And Method Of Manufacturing The Same
App 20160252548 - CHEN; Ho Yeh ; et al. | 2016-09-01 |
High-precision semiconductor device probing apparatus and system thereof
Grant 9,329,205 - Lou , et al. May 3, 2 | 2016-05-03 |
Test Probe Card
App 20150109016 - LOU; Choon Leong ; et al. | 2015-04-23 |
Test Assembly
App 20140340105 - LOU; Choon Leong ; et al. | 2014-11-20 |
Test Assembly
App 20140340108 - LOU; Choon Leong ; et al. | 2014-11-20 |
Testing Device
App 20140145740 - LOU; CHOON LEONG ; et al. | 2014-05-29 |
Probe card for testing high-frequency signals
Grant 8,692,570 - Lou , et al. April 8, 2 | 2014-04-08 |
High-precision Semiconductor Device Probing Apparatus And System Thereof
App 20130249584 - LOU; CHOON LEONG ; et al. | 2013-09-26 |
Testing Apparatus For Performing Avalanche Test
App 20130229199 - LOU; CHOON LEONG | 2013-09-05 |
Testing Apparatus For Performing An Avalanche Test And Method Thereof
App 20130229200 - LOU; CHOON LEONG ; et al. | 2013-09-05 |
Switching Matrix And Testing System For Semiconductor Characteristic Measurement Using The Same
App 20130082731 - LOU; CHOON LEONG ; et al. | 2013-04-04 |
Testing apparatus for light-emitting devices with a design for a removable sensing module
Grant 8,389,926 - Lou , et al. March 5, 2 | 2013-03-05 |
High Frequency Circuit Board
App 20130048344 - LOU; CHOON LEONG | 2013-02-28 |
Calibration System Of Electronic Devices
App 20130030766 - LOU; CHOON LEONG ; et al. | 2013-01-31 |
Method for configuring combinational switching matrix and testing system for semiconductor devices using the same
Grant 8,310,264 - Lou , et al. November 13, 2 | 2012-11-13 |
Probing apparatus with on-probe device-mapping function
Grant 8,279,451 - Liu , et al. October 2, 2 | 2012-10-02 |
Heat sink and integrated circuit assembly using the same
Grant 8,198,725 - Lou June 12, 2 | 2012-06-12 |
Enclosed probe station
Grant 8,188,758 - Lou May 29, 2 | 2012-05-29 |
Probing apparatus with multiaxial stages for testing semiconductor devices
Grant 8,169,227 - Lou May 1, 2 | 2012-05-01 |
Probe Card for Testing Semiconductor Devices and Vertical Probe Thereof
App 20120043987 - Lou; Choon Leong ; et al. | 2012-02-23 |
Probing Apparatus with On-Probe Device-Mapping Function
App 20110304857 - Liu; Yong Yu ; et al. | 2011-12-15 |
Probe Card For Testing High-frequency Signals
App 20110279139 - LOU; CHOON LEONG ; et al. | 2011-11-17 |
Semiconductor devices testing apparatus with temperature-adjusting design
Grant 8,035,405 - Lou October 11, 2 | 2011-10-11 |
Heat Sink And Integrated Circuit Assembly Using The Same
App 20110156244 - LOU; CHOON LEONG | 2011-06-30 |
Vertical probe comprising slots and probe card for integrated circuit devices using the same
Grant 7,928,749 - Lou April 19, 2 | 2011-04-19 |
Testing Apparatus for Light-Emitting Devices
App 20110062317 - Lou; Choon Leong ; et al. | 2011-03-17 |
Sensing Module for Light-Emitting Devices and Testing Apparatus Using the Same
App 20110063608 - Lou; Choon Leong ; et al. | 2011-03-17 |
Probing Apparatus With Multiaxial Stages For Testing Semiconductor Devices
App 20100301890 - LOU; CHOON LEONG | 2010-12-02 |
Method For Configuring Combinational Switching Matrix And Testing System For Semiconductor Devices Using The Same
App 20100231254 - LOU; Choon Leong ; et al. | 2010-09-16 |
Low temperature probing apparatus
Grant 7,791,363 - Lou September 7, 2 | 2010-09-07 |
Probing Apparatus With Temperature-adjusting Modules For Testing Semiconductor Devices
App 20100182013 - LOU; CHOON LEONG | 2010-07-22 |
Probe And Probe Card For Integrated Circuit Devices Using The Same
App 20100171519 - LOU; CHOON LEONG | 2010-07-08 |
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism
App 20100134130 - LOU; CHOON LEONG ; et al. | 2010-06-03 |
Microscope Having Multiple Image-outputting Devices And Probing Apparatus For Integrated Circuit Devices Using The Same
App 20100118297 - LIU; YONG YU ; et al. | 2010-05-13 |
Heating apparatus for semiconductor devices
Grant 7,675,307 - Lou , et al. March 9, 2 | 2010-03-09 |
Enclosed Probe Station
App 20100052716 - LOU; CHOON LEONG | 2010-03-04 |
Apparatus For Testing Semiconductor Devices
App 20100052720 - LOU; CHOON LEONG | 2010-03-04 |
Low Temperature Probing Apparatus
App 20100052717 - LOU; CHOON LEONG | 2010-03-04 |
Probe And Probe Card For Integrated Circuit Devices Using The Same
App 20090315578 - LOU; CHOON LEONG | 2009-12-24 |
Integrated circuit probing apparatus having a temperature-adjusting mechanism
Grant 7,616,018 - Lou , et al. November 10, 2 | 2009-11-10 |
Heating Apparatus For Semiconductor Devices
App 20090237102 - Lou; Choon Leong ; et al. | 2009-09-24 |
Integrated circuit probing apparatus having a temperature-adjusting mechanism
Grant 7,576,553 - Lou , et al. August 18, 2 | 2009-08-18 |
Microscope Having Multiple Image- Outputting Devices And Probing Apparatus For Integrated Circuit Devices Using The Same
App 20090128897 - Liu; Yong Yu ; et al. | 2009-05-21 |
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism
App 20090015283 - LOU; CHOON LEONG ; et al. | 2009-01-15 |
Apparatus for probing multiple integrated circuit devices
Grant 7,436,171 - Lou , et al. October 14, 2 | 2008-10-14 |
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism
App 20080150567 - LOU; CHOON LEONG ; et al. | 2008-06-26 |
Apparatus for probing multiple integrated circuit devices
App 20080074121 - Lou; Choon-Leong ; et al. | 2008-03-27 |
Integrated Circuit Probing Apparatus Having A Temperature-adjusting Mechanism
App 20080048700 - Lou; Choon Leong ; et al. | 2008-02-28 |
Probe card
Grant 7,295,023 - Lou , et al. November 13, 2 | 2007-11-13 |
Probe card with tunable stage and at least one replaceable probe
Grant 7,253,646 - Lou , et al. August 7, 2 | 2007-08-07 |
Probe Card For Integrated Circuits
App 20070069745 - Lou; Choon-Leong ; et al. | 2007-03-29 |
Probe Card
App 20060186908 - Lou; Choon-Leong ; et al. | 2006-08-24 |
Apparatus for probing multiple integrated circuit devices
App 20050280427 - Lou, Choon-Leong ; et al. | 2005-12-22 |
Probe Card
App 20050174133 - Lou, Choon-Leong ; et al. | 2005-08-11 |
Probe card for electrical testing a chip in a wide temperature range
Grant 6,906,543 - Lou , et al. June 14, 2 | 2005-06-14 |
Probe card for testing a semiconductor
App 20040119463 - Lou, Choon-Leong ; et al. | 2004-06-24 |
Probe card and method for manufacturing the same
App 20030122563 - Lou, Choon-Leong ; et al. | 2003-07-03 |
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