Eldridge; Benjamin N.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Eldridge; Benjamin N..The latest application filed is for "direct metalized guide plate".

Company Profile

5.200.198

Eldridge; Benjamin N. - Danville CA
Eldridge; Benjamin N. - Livermore CA
Eldridge; Benjamin N - Danville CA
Eldridge; Benjamin N. - Hopewell Junction NY
Eldridge, Benjamin N. - US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Shielding for vertical probe heads Grant 10,598,697 - Eldridge	2020-03-24
Vertical probe array having a tiled membrane space transformer Grant 10,578,649 - Eldridge , et al.	2020-03-03
Probe head with inductance reducing structure Grant 10,527,647 - Eldridge , et al. J	2020-01-07
Direct Metalized Guide Plate App 20190120876 - Cosman; Jason William ; et al.	2019-04-25
Contactor devices with carbon nanotube probes embedded in a flexible film and processes of making such Grant 10,266,402 - Yaglioglu , et al.	2019-04-23
Vertical probe array having a tiled membrane space transformer App 20190064220 - Eldridge; Benjamin N. ; et al.	2019-02-28
Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates Grant 10,132,833 - Eldridge November 20, 2	2018-11-20
Probe Head with Inductance Reducing Structure App 20180299486 - Eldridge; Benjamin N. ; et al.	2018-10-18
Shielding for Vertical Probe Heads App 20180196086 - Eldridge; Benjamin N.	2018-07-12
Floating nest for a test socket Grant 9,958,476 - Eldridge May 1, 2	2018-05-01
Non-linear vertical leaf spring Grant 9,702,904 - Breinlinger , et al. July 11, 2	2017-07-11
Floating Nest for a Test Socket App 20170146566 - Eldridge; Benjamin N.	2017-05-25
Sharpened, oriented contact tip structures Grant 9,030,222 - Eldridge , et al. May 12, 2	2015-05-12
Multipath Electrical Probe And Probe Assemblies With Signal Paths Through Secondary Paths Between Electrically Conductive Guide Plates App 20150015289 - Eldridge; Benjamin N.	2015-01-15
Testing techniques for through-device vias Grant 8,896,336 - Eldridge November 25, 2	2014-11-25
Contactor Devices With Carbon Nanotube Probes Embedded In A Flexible Film And Processes Of Making Such App 20140139250 - Yaglioglu; Onnik ; et al.	2014-05-22
Fuel cell using carbon nanotubes Grant 8,697,301 - Eldridge , et al. April 15, 2	2014-04-15
Apparatus and method of testing singulated dies Grant 8,513,969 - Dozier, II , et al. August 20, 2	2013-08-20
Method of forming a probe substrate by layering probe row structures and probe substrates formed thereby Grant 8,513,942 - Eldridge , et al. August 20, 2	2013-08-20
Method of wirebonding that utilizes a gas flow within a capillary from which a wire is played out Grant 8,485,418 - Eldridge , et al. July 16, 2	2013-07-16
Wiring substrate with customization layers Grant 8,476,538 - Eldridge , et al. July 2, 2	2013-07-02
Probe card assembly having an actuator for bending the probe substrate Grant 8,427,183 - Mathieu , et al. April 23, 2	2013-04-23
Method to build robust mechanical structures on substrate surfaces Grant 8,383,958 - Grube , et al. February 26, 2	2013-02-26
Probe card assembly and kit, and methods of making same Grant 8,373,428 - Eldridge , et al. February 12, 2	2013-02-12
Carbon nanotube columns and methods of making and using carbon nanotube columns as probes Grant 8,354,855 - Eldridge , et al. January 15, 2	2013-01-15
Non-Linear Vertical Leaf Spring App 20120242363 - Breinlinger; Keith J. ; et al.	2012-09-27
Probing apparatus with guarded signal traces Grant 8,203,351 - Eldridge , et al. June 19, 2	2012-06-19
Probe card assembly with carbon nanotube probes having a spring mechanism therein Grant 8,130,007 - Eldridge , et al. March 6, 2	2012-03-06
Testing Techniques For Through-device Vias App 20120007626 - Eldridge; Benjamin N.	2012-01-12
Microelectronic contact structure Grant 8,033,838 - Eldridge , et al. October 11, 2	2011-10-11
Wiring Substrate With Customization Layers App 20110214910 - Eldridge; Benjamin N. ; et al.	2011-09-08
Methods For Planarizing A Semiconductor Contactor App 20110193583 - Mathieu; Gaetan L. ; et al.	2011-08-11
Fuel Cell Using Carbon Nanotubes App 20110189564 - Eldridge; Benjamin N. ; et al.	2011-08-04
Method of designing a probe card apparatus with desired compliance characteristics Grant 7,990,164 - Eldridge August 2, 2	2011-08-02
Method and apparatus for probe card alignment in a test system Grant 7,977,956 - Breinlinger , et al. July 12, 2	2011-07-12
Electrical contactor, especially wafer level contactor, using fluid pressure Grant 7,967,621 - Eldridge June 28, 2	2011-06-28
Stacked guard structures Grant 7,956,633 - Eldridge June 7, 2	2011-06-07
AC coupled parameteric test probe Grant 7,952,375 - Eldridge , et al. May 31, 2	2011-05-31
Multilayered probe card Grant 7,948,252 - Grube , et al. May 24, 2	2011-05-24
Providing an electrically conductive wall structure adjacent a contact structure of an electronic device Grant 7,936,177 - Breinlinger , et al. May 3, 2	2011-05-03
Method and system for designing a probe card Grant 7,930,219 - Eldridge , et al. April 19, 2	2011-04-19
Remote test facility with wireless interface to local test facilities Grant 7,920,989 - Khandros , et al. April 5, 2	2011-04-05
Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out App 20110057018 - Eldridge; Benjamin N. ; et al.	2011-03-10
Re-assembly process for MEMS structures Grant 7,897,435 - Eldridge , et al. March 1, 2	2011-03-01
Probe card assembly with an interchangeable probe insert Grant 7,898,242 - Eldridge , et al. March 1, 2	2011-03-01
Method to build a wirebond probe card in a many at a time fashion Grant 7,884,006 - Eldridge , et al. February 8, 2	2011-02-08
Printing of redistribution traces on electronic component Grant 7,880,489 - Eldridge , et al. February 1, 2	2011-02-01
Composite motion probing Grant 7,868,632 - Cooper , et al. January 11, 2	2011-01-11
Sharpened, Oriented Contact Tip Structures App 20100323551 - Eldridge; Benjamin N. ; et al.	2010-12-23
Sharing resources in a system for testing semiconductor devices Grant 7,852,094 - Chraft , et al. December 14, 2	2010-12-14
Method and apparatus for adjusting a multi-substrate probe structure Grant 7,845,072 - Hobbs , et al. December 7, 2	2010-12-07
Spring interconnect structures Grant 7,841,863 - Mathieu , et al. November 30, 2	2010-11-30
Electrical Contactor, Especially Wafer Level Contactor, Using Fluid Pressure App 20100297863 - Eldridge; Benjamin N.	2010-11-25
Probe card configuration for low mechanical flexural strength electrical routing substrates Grant 7,825,674 - Shinde , et al. November 2, 2	2010-11-02
Method And Apparatus For Probe Card Alignment In A Test System App 20100271062 - Breinlinger; Keith J. ; et al.	2010-10-28
Test system with wireless communications Grant 7,821,255 - Khandros , et al. October 26, 2	2010-10-26
Methods For Planarizing A Semiconductor Contactor App 20100263432 - Mathieu; Gaetan L. ; et al.	2010-10-21
Component assembly and alignment Grant 7,808,259 - Eldridge , et al. October 5, 2	2010-10-05
Apparatus And Method Of Testing Singulated Dies App 20100244873 - Dozier, II; Thomas H. ; et al.	2010-09-30
Microelectronic contact structures Grant 7,798,822 - Eldridge , et al. September 21, 2	2010-09-21
Probing Apparatus With Guarded Signal Traces App 20100225344 - Eldridge; Benjamin N. ; et al.	2010-09-09
Method To Build Robust Mechanical Structures On Substrate Surfaces App 20100224303 - Grube; Gary W. ; et al.	2010-09-09
Methods for planarizing a semiconductor contactor Grant 7,737,709 - Mathieu , et al. June 15, 2	2010-06-15
Carbon nanotube contact structures Grant 7,731,503 - Eldridge , et al. June 8, 2	2010-06-08
Apparatus and method of testing singulated dies Grant 7,733,106 - Dozier, II , et al. June 8, 2	2010-06-08
Method to build robust mechanical structures on substrate surfaces Grant 7,732,713 - Grube , et al. June 8, 2	2010-06-08
Probing apparatus with guarded signal traces Grant 7,724,004 - Eldridge , et al. May 25, 2	2010-05-25
Electrical contactor, especially wafer level contactor, using fluid pressure Grant 7,722,371 - Eldridge May 25, 2	2010-05-25
Wafer Level Interposer App 20100120267 - Eldridge; Benjamin N. ; et al.	2010-05-13
Predictive, adaptive power supply for an integrated circuit under test Grant 7,714,603 - Eldridge , et al. May 11, 2	2010-05-11
Contact carriers (tiles) for populating larger substrates with spring contacts Grant 7,714,598 - Eldridge , et al. May 11, 2	2010-05-11
Printing Of Redistribution Traces On Electronic Component App 20100109688 - Eldridge; Benjamin N. ; et al.	2010-05-06
Carbon Nanotube Contact Structures App 20100112828 - Eldridge; Benjamin N. ; et al.	2010-05-06
High density planar electrical interface Grant 7,699,616 - Miller , et al. April 20, 2	2010-04-20
Electronic device testing using a probe tip having multiple contact features Grant 7,701,243 - Cooper , et al. April 20, 2	2010-04-20
Lithographic Contact Elements App 20100088888 - Mathieu; Gaetan L. ; et al.	2010-04-15
Microelectronic Contact Structure And Method Of Making Same App 20100093229 - Eldridge; Benjamin N. ; et al.	2010-04-15
Carbon Nanotube Columns And Methods Of Making And Using Carbon Nanotube Columns As Probes App 20100083489 - Eldridge; Benjamin N. ; et al.	2010-04-08
Sawing tile corners on probe card substrates Grant 7,692,433 - Eldridge , et al. April 6, 2	2010-04-06
Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out App 20100065963 - Eldridge; Benjamin N. ; et al.	2010-03-18
Resilient contact element and methods of fabrication Grant 7,674,112 - Gritters , et al. March 9, 2	2010-03-09
Wireless test system Grant 7,675,311 - Khandros , et al. March 9, 2	2010-03-09
Electronic components with plurality of contoured microelectronic spring contacts Grant 7,675,301 - Eldridge , et al. March 9, 2	2010-03-09
Apparatus and method for adjusting an orientation of probes Grant 7,671,614 - Eldridge , et al. March 2, 2	2010-03-02
Remote Test Facility With Wireless Interface To Local Test Facilities App 20100049356 - Khandros; Igor Y. ; et al.	2010-02-25
Mechanically reconfigurable vertical tester interface for IC probing Grant 7,659,736 - Eldridge , et al. February 9, 2	2010-02-09
Wafer level interposer Grant 7,649,368 - Eldridge , et al. January 19, 2	2010-01-19
Method And System For Designing A Probe Card App 20100011334 - Eldridge; Benjamin N. ; et al.	2010-01-14
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20100000080 - Eldridge; Benjamin N. ; et al.	2010-01-07
Method and system for compensating thermally induced motion of probe cards Grant 7,642,794 - Eldridge , et al. January 5, 2	2010-01-05
Method of assembling and testing an electronics module Grant 7,634,849 - Eldridge December 22, 2	2009-12-22
Probe Card Assembly And Kit, And Methods Of Making Same App 20090291573 - Eldridge; Benjamin N. ; et al.	2009-11-26
Probe card assembly with a mechanically decoupled wiring substrate Grant 7,622,935 - Hobbs , et al. November 24, 2	2009-11-24
Method of manufacturing a resilient contact Grant 7,621,044 - Eldridge , et al. November 24, 2	2009-11-24
Microelectronic Contact Structures, And Methods Of Making Same App 20090286429 - Eldridge; Benjamin N. ; et al.	2009-11-19
Interconnect assemblies and methods Grant 7,618,281 - Eldridge November 17, 2	2009-11-17
Probe card assembly and kit Grant 7,616,016 - Eldridge , et al. November 10, 2	2009-11-10
Remote test facility with wireless interface to local facilities Grant 7,613,591 - Khandros , et al. November 3, 2	2009-11-03
Spring Interconnect Structures App 20090263986 - Mathieu; Gaetan L. ; et al.	2009-10-22
Microelectronic contact structure and method of making same Grant 7,601,039 - Eldridge , et al. October 13, 2	2009-10-13
Wireless Test Cassette App 20090251162 - Khandros; Igor Y. ; et al.	2009-10-08
Method and system for designing a probe card Grant 7,593,872 - Eldridge , et al. September 22, 2	2009-09-22
Apparatus and method for managing thermally induced motion of a probe card assembly Grant 7,592,821 - Eldridge , et al. September 22, 2	2009-09-22
Providing An Electrically Conductive Wall Structure Adjacent A Contact Structure Of An Electronic Device App 20090224785 - Breinlinger; Keith J. ; et al.	2009-09-10
Microelectronic spring contact elements Grant 7,579,269 - Eldridge , et al. August 25, 2	2009-08-25
Method and system for compensating thermally induced motion of probe cards Grant 7,560,941 - Martens , et al. July 14, 2	2009-07-14
Method of making lithographic contact elements Grant 7,555,836 - Mathieu , et al. July 7, 2	2009-07-07
Test assembly including a test die for testing a semiconductor product die Grant 7,557,596 - Eldridge , et al. July 7, 2	2009-07-07
Spring interconnect structures Grant 7,553,165 - Mathieu , et al. June 30, 2	2009-06-30
Method And Apparatus For Adjusting A Multi-substrate Probe Structure App 20090158586 - Hobbs; Eric D. ; et al.	2009-06-25
Probe Card Assembly With An Interchangeable Probe Insert App 20090160432 - Eldridge; Benjamin N. ; et al.	2009-06-25
Integrated circuit assembly Grant 7,550,842 - Khandros , et al. June 23, 2	2009-06-23
Testing an electronic device using test data from a plurality of testers Grant 7,548,055 - Khandros , et al. June 16, 2	2009-06-16
Method To Build A Wirebond Probe Card In A Many At A Time Fashion App 20090142707 - Eldridge; Benjamin N. ; et al.	2009-06-04
Probe Array And Method Of Its Manufacture App 20090139965 - Mathieu; Gaetan L. ; et al.	2009-06-04
Apparatus And Method For Limiting Over Travel In A Probe Card Assembly App 20090134897 - Cooper; Timothy E. ; et al.	2009-05-28
Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component Grant 7,534,654 - Pedersen , et al. May 19, 2	2009-05-19
Lithographic type microelectronic spring structures with improved contours Grant 7,524,194 - Eldridge , et al. April 28, 2	2009-04-28
Probing A Device App 20090085592 - Cooper; Timothy E. ; et al.	2009-04-02
Component Assembly And Alignment App 20090079452 - Eldridge; Benjamin N. ; et al.	2009-03-26
Electrical Contactor, Especially Wafer Level Contactor, Using Fluid Pressure App 20090072848 - Eldridge; Benjamin N.	2009-03-19
Making And Using Carbon Nanotube Probes App 20090066352 - Gritters; John K. ; et al.	2009-03-12
Probe card assembly with an interchangeable probe insert Grant 7,498,825 - Eldridge , et al. March 3, 2	2009-03-03
Electric discharge machining of a probe array Grant 7,488,917 - Mathieu , et al. February 10, 2	2009-02-10
Interconnect Assemblies And Methods App 20090035959 - Eldridge; Benjamin N. ; et al.	2009-02-05
Apparatus and method for limiting over travel in a probe card assembly Grant 7,482,822 - Cooper , et al. January 27, 2	2009-01-27
Method and apparatus for adjusting a multi-substrate probe structure Grant 7,471,094 - Hobbs , et al. December 30, 2	2008-12-30
Methods of probing an electronic device Grant 7,463,043 - Cooper , et al. December 9, 2	2008-12-09
Shaped spring Grant 7,458,816 - Mathieu , et al. December 2, 2	2008-12-02
Method to build a wirebond probe card in a many at a time fashion Grant 7,459,795 - Eldridge , et al. December 2, 2	2008-12-02
Electrical contactor, especially wafer level contactor, using fluid pressure Grant 7,455,540 - Eldridge November 25, 2	2008-11-25
Method Of Manufacturing A Probe Card App 20080272794 - Grube; Gary W. ; et al.	2008-11-06
Wafer Level Interposer App 20080265922 - Eldridge; Benjamin N. ; et al.	2008-10-30
Spring Interconnect Structures App 20080254651 - Mathieu; Gaetan L. ; et al.	2008-10-16
Variable width resilient conductive contact structures Grant 7,435,108 - Eldridge , et al. October 14, 2	2008-10-14
Method Of Designing A Probe Card Apparatus With Desired Compliance Characteristics App 20080238458 - Eldridge; Benjamin N.	2008-10-02
Contact Carriers (tiles) For Populating Larger Substrates With Spring Contacts App 20080231305 - Khandros; Igor Y. ; et al.	2008-09-25
Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes Grant 7,400,157 - Grube , et al. July 15, 2	2008-07-15
Wafer level interposer Grant 7,396,236 - Eldridge , et al. July 8, 2	2008-07-08
Resilient Contact Element And Methods Of Fabrication App 20080157799 - Gritters; John K. ; et al.	2008-07-03
High Density Planar Electrical Interface App 20080150571 - Miller; Charles A. ; et al.	2008-06-26
Sharing Resources In A System For Testing Semiconductor Devices App 20080136432 - Chraft; Matthew E. ; et al.	2008-06-12
Method of designing a probe card apparatus with desired compliance characteristics Grant 7,385,411 - Eldridge June 10, 2	2008-06-10
Interconnect For Microelectronic Structures With Enhanced Spring Characteristics App 20080120833 - Mathieu; Gaetan L. ; et al.	2008-05-29
Lithographic Contact Elements App 20080115353 - Mathieu; Gaetan L. ; et al.	2008-05-22
Contact Tip Structure For Microelectronic Interconnection Elements And Methods Of Making Same App 20080116927 - Dozier; Thomas H. ; et al.	2008-05-22
Spring interconnect structures Grant 7,371,072 - Mathieu , et al. May 13, 2	2008-05-13
Method and System for Compensating Thermally Induced Motion of Probe Cards App 20080094088 - Eldridge; Benjamin N. ; et al.	2008-04-24
Attaching And Interconnecting Dies To A Substrate App 20080088030 - Eldridge; Benjamin N. ; et al.	2008-04-17
Probe card assembly and kit Grant 7,352,196 - Khandros , et al. April 1, 2	2008-04-01
Contact carriers (tiles) for populating larger substrates with spring contacts Grant 7,347,702 - Eldridge , et al. March 25, 2	2008-03-25
Apparatus for reducing power supply noise in an integrated circuit Grant 7,342,405 - Eldridge , et al. March 11, 2	2008-03-11
Methods For Planarizing A Semiconductor Contactor App 20080048688 - Mathieu; Gaetan L. ; et al.	2008-02-28
High density planar electrical interface Grant 7,335,057 - Miller , et al. February 26, 2	2008-02-26
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20080042668 - Eldridge; Benjamin N. ; et al.	2008-02-21
Method of forming an interconnection element Grant 7,325,302 - Mathieu , et al. February 5, 2	2008-02-05
Method To Build Robust Mechanical Structures On Substrate Surfaces App 20080020227 - Grube; Gary W. ; et al.	2008-01-24
AC coupled parameteric test probe App 20070296435 - Eldridge; Benjamin N. ; et al.	2007-12-27
Method and system for compensating thermally induced motion of probe cards Grant 7,312,618 - Eldridge , et al. December 25, 2	2007-12-25
Sawing tile corners on probe card substrates App 20070290705 - Eldridge; Benjamin N. ; et al.	2007-12-20
Electrical Contactor, Espcecially Wafer Level Contactor, Using Fluid Pressure App 20070287304 - Eldridge; Benjamin N.	2007-12-13
Socket For Making With Electronic Component, Particularly Semiconductor Device With Spring Packaging, For Fixturing, Testing, Burning-In Or Operating Such A Component App 20070285114 - Pedersen; David V. ; et al.	2007-12-13
Electronic Components With Plurality Of Contoured Microelectronic Spring Contacts App 20070269997 - Eldridge; Benjamin N. ; et al.	2007-11-22
Remote Test Facility With Wireless Interface To Local Test Facilities App 20070271071 - Khandros; Igor Y. ; et al.	2007-11-22
Probing A Device App 20070262767 - Cooper; Timothy E. ; et al.	2007-11-15
Predictive, Adaptive Power Supply For An Integrated Circuit Under Test App 20070257696 - Eldridge; Benjamin N. ; et al.	2007-11-08
Lithographic contact elements Grant 7,287,322 - Mathieu , et al. October 30, 2	2007-10-30
Method of Manufacturing a Probe Card App 20070247176 - Grube; Gary W. ; et al.	2007-10-25
Apparatus and method for managing thermally induced motion of a probe card assembly Grant 7,285,968 - Eldridge , et al. October 23, 2	2007-10-23
Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out App 20070228110 - Eldridge; Benjamin N. ; et al.	2007-10-04
Mechanically Reconfigurable Vertical Tester Interface For Ic Probing App 20070229102 - Eldridge; Benjamin N. ; et al.	2007-10-04
Wireless Test System App 20070210822 - Khandros; Igor Y. ; et al.	2007-09-13
Stacked Guard Structures App 20070205780 - Eldridge; Benjamin N.	2007-09-06
Apparatuses and methods for planarizing a semiconductor contactor Grant 7,262,611 - Mathieu , et al. August 28, 2	2007-08-28
Method Of Assembling And Testing An Electronics Module App 20070194779 - Eldridge; Benjamin N.	2007-08-23
Wireless Test Cassette App 20070182438 - Khandros; Igor Y. ; et al.	2007-08-09
Method to build robust mechanical structures on substrate surfaces Grant 7,251,884 - Grube , et al. August 7, 2	2007-08-07
Remote test facility with wireless interface to local test facilities Grant 7,253,651 - Khandros , et al. August 7, 2	2007-08-07
Composite Motion Probing App 20070170941 - Cooper; Timothy E. ; et al.	2007-07-26
Test head assembly having paired contact structures Grant 7,245,137 - Eldridge , et al. July 17, 2	2007-07-17
Predictive, adaptive power supply for an integrated circuit under test Grant 7,245,120 - Eldridge , et al. July 17, 2	2007-07-17
A Probe Array Structure And A Method Of Making A Probe Array Structure App 20070152685 - Eldridge; Benjamin N. ; et al.	2007-07-05
Probing Apparatus With Guarded Signal Traces App 20070139061 - Eldridge; Benjamin N. ; et al.	2007-06-21
Method And System For Compensating Thermally Induced Motion Of Probe Cards App 20070139060 - Martens; Rod ; et al.	2007-06-21
Semiconductor Fuse Covering App 20070132478 - Eldridge; Benjamin N.	2007-06-14
Mechanically reconfigurable vertical tester interface for IC probing Grant 7,230,437 - Eldridge , et al. June 12, 2	2007-06-12
Method of Manufacturing A Probe Card App 20070126443 - Grube; Gary W. ; et al.	2007-06-07
Probe Card Assembly With A Mechanically Decoupled Wiring Substrate App 20070126440 - Hobbs; Eric D. ; et al.	2007-06-07
Apparatus And Method For Adjusting An Orientation Of Probes App 20070126435 - Eldridge; Benjamin N. ; et al.	2007-06-07
Interconnect Assemblies And Methods App 20070123082 - Eldridge; Benjamin N.	2007-05-31
Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component Grant 7,218,127 - Cooper , et al. May 15, 2	2007-05-15
Wireless test system Grant 7,218,094 - Khandros , et al. May 15, 2	2007-05-15
Method of making an electronics module Grant 7,204,008 - Eldridge April 17, 2	2007-04-17
Systems and methods for wireless semiconductor device testing Grant 7,202,687 - Khandros , et al. April 10, 2	2007-04-10
Composite motion probing Grant 7,202,682 - Cooper , et al. April 10, 2	2007-04-10
Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component Grant 7,202,677 - Pedersen , et al. April 10, 2	2007-04-10
Contact Carriers (Tiles) For Populating Larger Substrates With Spring Contacts App 20070075715 - Khandros; Igor Y. ; et al.	2007-04-05
Method of manufacturing a probe card Grant 7,196,531 - Grube , et al. March 27, 2	2007-03-27
Electrical contactor, especially wafer level contactor, using fluid pressure Grant 7,195,503 - Eldridge March 27, 2	2007-03-27
Apparatus And Method Of Testing Singulated Dies App 20070063721 - Dozier; Thomas H. II ; et al.	2007-03-22
Probe Array and Method of Its Manufacture App 20070062913 - Mathieu; Gaetan L. ; et al.	2007-03-22
Lithographic type microelectronic spring structures with improved contours Grant 7,189,077 - Eldridge , et al. March 13, 2	2007-03-13
Methods Of Fabricating And Using Shaped Springs App 20070054513 - Mathieu; Gaetan L. ; et al.	2007-03-08
Lithographic Type Microelectronic Spring Structures with Improved Contours App 20070045874 - Eldridge; Benjamin N. ; et al.	2007-03-01
Mounting Spring Elements on Semiconductor Devices, and Wafer-Level Testing Methodology App 20070046313 - Eldridge; Benjamin N. ; et al.	2007-03-01
Semiconductor fuse covering Grant 7,179,662 - Eldridge February 20, 2	2007-02-20
Method of manufacturing a probe card Grant 7,168,162 - Grube , et al. January 30, 2	2007-01-30
Interconnect assemblies and methods Grant 7,169,646 - Eldridge January 30, 2	2007-01-30
High Density Planar Electrical Interface App 20070007980 - Miller; Charles A. ; et al.	2007-01-11
Probe Card Assembly With An Interchangeable Probe Insert App 20070007977 - Eldridge; Benjamin N. ; et al.	2007-01-11
Method and apparatus for adjusting a multi-substrate probe structure App 20060290367 - Hobbs; Eric D. ; et al.	2006-12-28
Method And System For Designing A Probe Card App 20060294008 - Eldridge; Benjamin N. ; et al.	2006-12-28
Probe Card Assembly And Kit App 20060279300 - Khandros; Igor Y. ; et al.	2006-12-14
Mounting spring elements on semiconductor devices, and wafer-level testing methodology Grant 7,142,000 - Eldridge , et al. November 28, 2	2006-11-28
Contact carriers (tiles) for populating larger substrates with spring contacts Grant 7,140,883 - Khandros , et al. November 28, 2	2006-11-28
Apparatus And Method For Limiting Over Travel In A Probe Card Assembly App 20060261827 - Cooper; Timothy E. ; et al.	2006-11-23
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20060255814 - Eldridge; Benjamin N. ; et al.	2006-11-16
Probe card configuration for low mechanical flexural strength electrical routing substrates App 20060244470 - Shinde; Makarand S. ; et al.	2006-11-02
Probe card covering system and method Grant 7,128,587 - Eldridge , et al. October 31, 2	2006-10-31
Methods of fabricating and using shaped springs Grant 7,127,811 - Mathieu , et al. October 31, 2	2006-10-31
Microelectronic Contact Structure And Method Of Making Same App 20060237856 - Eldridge; Benjamin N. ; et al.	2006-10-26
Method And System For Compensating Thermally Induced Motion Of Probe Cards App 20060238211 - Eldridge; Benjamin N. ; et al.	2006-10-26
Using electric discharge machining to manufacture probes Grant 7,122,760 - Mathieu , et al. October 17, 2	2006-10-17
Method and system for compensating thermally induced motion of probe cards Grant 7,119,564 - Martens , et al. October 10, 2	2006-10-10
Sockets For "springed" Semiconductor Devices App 20060223345 - Dozier; Thomas H. II ; et al.	2006-10-05
Re-assembly Process For Mems Structures App 20060211234 - Eldridge; Benjamin N. ; et al.	2006-09-21
Interconnect for microelectronic structures with enhanced spring characteristics App 20060211278 - Mathieu; Gaetan L. ; et al.	2006-09-21
High density planar electrical interface Grant 7,108,546 - Miller , et al. September 19, 2	2006-09-19
Method Of Making Microelectronic Spring Contact Array App 20060191136 - Eldridge; Benjamin N. ; et al.	2006-08-31
Automated system for designing and testing a probe card Grant 7,092,902 - Eldridge , et al. August 15, 2	2006-08-15
Apparatus and method for limiting over travel in a probe card assembly Grant 7,084,650 - Cooper , et al. August 1, 2	2006-08-01
Re-assembly process for MEMS structures App 20060157839 - Eldridge; Benjamin N. ; et al.	2006-07-20
Method for mounting a plurality of spring contact elements Grant 7,073,254 - Eldridge , et al. July 11, 2	2006-07-11
Method and system for compensating for thermally induced motion of probe cards Grant 7,071,714 - Eldridge , et al. July 4, 2	2006-07-04
Probe card configuration for low mechanical flexural strength electrical routing substrates Grant 7,071,715 - Shinde , et al. July 4, 2	2006-07-04
Remote Test Facility With Wireless Interface To Local Test Facilities App 20060132161 - Khandros; Igor Y. ; et al.	2006-06-22
Probe card assembly and kit Grant 7,064,566 - Khandros , et al. June 20, 2	2006-06-20
Probe card assembly Grant 7,061,257 - Khandros , et al. June 13, 2	2006-06-13
Sockets for "springed" semiconductor devices Grant 7,059,047 - Dozier, II , et al. June 13, 2	2006-06-13
Method for testing signal paths between an integrated circuit wafer and a wafer tester Grant 7,053,637 - Whitten , et al. May 30, 2	2006-05-30
Method of making microelectronic spring contact array Grant 7,047,638 - Eldridge , et al. May 23, 2	2006-05-23
Interconnect for microelectronic structures with enhanced spring characteristics Grant 7,048,548 - Mathieu , et al. May 23, 2	2006-05-23
Electroform spring built on mandrel transferable to other surface App 20060085976 - Eldridge; Benjamin N. ; et al.	2006-04-27
Probe card covering system and method App 20060057875 - Eldridge; Benjamin N. ; et al.	2006-03-16
Re-assembly process for MEMS structures Grant 7,010,854 - Eldridge , et al. March 14, 2	2006-03-14
Method of designing a probe card apparatus with desired compliance characteristics App 20060043985 - Eldridge; Benjamin N.	2006-03-02
Method to build a wirebond probe card in a many at a time fashion App 20060040417 - Eldridge; Benjamin N. ; et al.	2006-02-23
Predictive, adaptive power supply for an integrated circuit under test App 20060022699 - Eldridge; Benjamin N. ; et al.	2006-02-02
Interconnect assemblies and methods App 20060024988 - Eldridge; Benjamin N.	2006-02-02
Method for forming microelectronic spring structures on a substrate App 20060019027 - Eldridge; Benjamin N. ; et al.	2006-01-26
Special contact points for accessing internal circuitry of an intergrated circuit App 20060006384 - Eldridge; Benjamin N. ; et al.	2006-01-12
Method and system for compensating thermally induced motion of probe cards App 20060001440 - Martens; Rod ; et al.	2006-01-05
Mechanically reconfigurable vertical tester interface for IC probing App 20050277323 - Eldridge, Benjamin N. ; et al.	2005-12-15
Method and system for compensating thermally induced motion of probe cards Grant 6,972,578 - Martens , et al. December 6, 2	2005-12-06
Method to build robust mechanical structures on substrate surfaces App 20050255408 - Grube, Gary W. ; et al.	2005-11-17
Probe card covering system and method Grant 6,960,923 - Eldridge , et al. November 1, 2	2005-11-01
Wireless test cassette App 20050225347 - Khandros, Igor Y. ; et al.	2005-10-13
Interconnect assemblies and methods Grant 6,948,941 - Eldridge September 27, 2	2005-09-27
Predictive, adaptive power supply for an integrated circuit under test Grant 6,949,942 - Eldridge , et al. September 27, 2	2005-09-27
Method for forming microelectronic spring structures on a substrate Grant 6,939,474 - Eldridge , et al. September 6, 2	2005-09-06
Special contact points for accessing internal circuitry of an integrated circuit Grant 6,940,093 - Eldridge , et al. September 6, 2	2005-09-06
Electronic components with plurality of contoured microelectronic spring contacts App 20050189956 - Eldridge, Benjamin N. ; et al.	2005-09-01
Probe card assembly for contacting a device with raised contact elements Grant 6,937,037 - Eldridge , et al. August 30, 2	2005-08-30
Probing a device App 20050179455 - Cooper, Timothy E. ; et al.	2005-08-18
Test assembly including a test die for testing a semiconductor product die App 20050156165 - Eldridge, Benjamin N. ; et al.	2005-07-21
Probe card configuration for low mechanical flexural strength electrical routing substrates App 20050156611 - Shinde, Makarand S. ; et al.	2005-07-21
Method of manufacturing a probe card App 20050146339 - Grube, Gary W. ; et al.	2005-07-07
Lithographic contact elements App 20050148214 - Mathieu, Gaetan L. ; et al.	2005-07-07
Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods Grant 6,913,468 - Dozier, II , et al. July 5, 2	2005-07-05
Test head assembly for electronic components with plurality of contoured microelectronic spring contacts Grant 6,888,362 - Eldridge , et al. May 3, 2	2005-05-03
Wireless test system App 20050086021 - Khandros, Igor Y. ; et al.	2005-04-21
Method of manufacturing a probe card Grant 6,864,105 - Grube , et al. March 8, 2	2005-03-08
Probe card assembly App 20050035347 - Khandros, Igor Y. ; et al.	2005-02-17
Forming tool for forming a contoured microelectronic spring mold App 20050016251 - Eldridge, Benjamin N. ; et al.	2005-01-27
Apparatus and method for cleaning test probes Grant 6,840,374 - Khandros , et al. January 11, 2	2005-01-11
Methods for planarizing a semiconductor contactor App 20040266089 - Mathieu, Gaetan L. ; et al.	2004-12-30
Electrical Contact Structures Formed By Configuring A Flexible Wire To Have A Springable Shape And Overcoating The Wire With At Least One Layer Of A Resilient Conductive Material, Methods Of Mounting The Contact Structures To Electronic Components, And Applications For Employing The Contact Structur Grant 6,835,898 - Eldridge , et al. December 28, 2	2004-12-28
Interconnect for microelectronic structures with enhanced spring characteristics Grant 6,827,584 - Mathieu , et al. December 7, 2	2004-12-07
Test assembly including a test die for testing a semiconductor product die Grant 6,825,052 - Eldridge , et al. November 30, 2	2004-11-30
Interconnection element with contact blade Grant 6,825,422 - Eldridge , et al. November 30, 2	2004-11-30
Microelectronic contact structures, and methods of making same Grant 6,807,734 - Eldridge , et al. October 26, 2	2004-10-26
Microelectronic spring contact elements App 20040198081 - Eldridge, Benjamin N. ; et al.	2004-10-07
Method of manufacturing a probe card App 20040194299 - Grube, Gary W. ; et al.	2004-10-07
Probe card designed by automated system App 20040181486 - Eldridge, Benjamin N. ; et al.	2004-09-16
Tested semiconductor device produced by an interconnection element with contact blade App 20040177499 - Eldridge, Benjamin N. ; et al.	2004-09-16
Lithographic contact elements Grant 6,791,176 - Mathieu , et al. September 14, 2	2004-09-14
Contact carriers (tiles) for populating larger substrates with spring contacts App 20040163252 - Khandros, Igor Y. ; et al.	2004-08-26
Forming tool for forming a contoured microelectronic spring mold Grant 6,780,001 - Eldridge , et al. August 24, 2	2004-08-24
Resilient contact structures for interconnecting electronic devices Grant 6,778,406 - Eldridge , et al. August 17, 2	2004-08-17
Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component App 20040152348 - Pedersen, David V. ; et al.	2004-08-05
Method for testing signal paths between an integrated circuit wafer and a wafer tester App 20040148122 - Whitten, Ralph G. ; et al.	2004-07-29
Spring interconnect structures App 20040142583 - Mathieu, Gaetan L. ; et al.	2004-07-22
Method of assembling and testing an electronics module Grant 6,764,869 - Eldridge July 20, 2	2004-07-20
Composite motion probing App 20040130312 - Cooper, Timothy E. ; et al.	2004-07-08
Fan out of interconnect elements attached to semiconductor wafer Grant 6,759,311 - Eldridge , et al. July 6, 2	2004-07-06
Interconnect assemblies and methods App 20040127074 - Eldridge, Benjamin N.	2004-07-01
Integrated circuit assembly App 20040113250 - Khandros, Igor Y. ; et al.	2004-06-17
Apparatus and method for limiting over travel in a probe card assembly App 20040113640 - Cooper, Timothy E. ; et al.	2004-06-17
Probe array and method of its manufacture App 20040099641 - Mathieu, Gaetan L. ; et al.	2004-05-27
Contact carriers (tiles) for populating larger substrates with spring contacts Grant 6,741,085 - Khandros , et al. May 25, 2	2004-05-25
Method and system for detecting an arc condition Grant 6,741,092 - Eldridge , et al. May 25, 2	2004-05-25
Method of assembling and testing an electronics module App 20040096994 - Eldridge, Benjamin N.	2004-05-20
Method of manufacturing a probe card Grant 6,729,019 - Grube , et al. May 4, 2	2004-05-04
Microelectronic spring contact elements Grant 6,727,580 - Eldridge , et al. April 27, 2	2004-04-27
Electrical Contact Structures Formed By Configuring A Flexible Wire To Have A Springable Shape And Overcoating The Wire With At Least One Layer Of A Resilient Conductive Material, Methods Of Mounting The Contact Structures To Electronic Components, And Applications For Employing The Contact Structur Grant 6,727,579 - Eldridge , et al. April 27, 2	2004-04-27
Predictive, adaptive power supply for an integrated circuit under test App 20040075459 - Eldridge, Benjamin N. ; et al.	2004-04-22
Method for testing signal paths between an integrated circuit wafer and a wafer tester Grant 6,724,209 - Whitten , et al. April 20, 2	2004-04-20
Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods App 20040072456 - Dozier, Thomas H. II ; et al.	2004-04-15
Microelectronic contact structures, and methods of making same App 20040072452 - Eldridge, Benjamin N. ; et al.	2004-04-15
Mounting spring elements on semiconductor devices, and wafer-level testing methodology App 20040068869 - Eldridge, Benjamin N. ; et al.	2004-04-15
Sockets for "springed" semiconductor device App 20040064941 - Dozier, Thomas H. II ; et al.	2004-04-08
Method and system for designing a probe card Grant 6,714,828 - Eldridge , et al. March 30, 2	2004-03-30
Interconnect assemblies and methods Grant 6,713,374 - Eldridge , et al. March 30, 2	2004-03-30
Electrical interconnect assemblies and methods Grant 6,705,876 - Eldridge March 16, 2	2004-03-16
Methods of fabricating and using shaped springs App 20040038560 - Mathieu, Gaetan L. ; et al.	2004-02-26
Method of making microelectronic spring contact array App 20040016119 - Eldridge, Benjamin N. ; et al.	2004-01-29
Test assembly including a test die for testing a semiconductor product die App 20040004216 - Eldridge, Benjamin N. ; et al.	2004-01-08
Spring interconnect structures Grant 6,672,875 - Mathieu , et al. January 6, 2	2004-01-06
Interposer, socket and assembly for socketing an electronic component and method of making and using same Grant 6,669,489 - Dozier, II , et al. December 30, 2	2003-12-30
Electronic component overlapping dice of unsingulated semiconductor wafer Grant 6,664,628 - Khandros , et al. December 16, 2	2003-12-16
Method and apparatus for burning-in semiconductor devices in wafer form Grant 6,655,023 - Eldridge , et al. December 2, 2	2003-12-02
Predictive, adaptive power supply for an integrated circuit under test Grant 6,657,455 - Eldridge , et al. December 2, 2	2003-12-02
Method of fabricating shaped springs Grant 6,640,432 - Mathieu , et al. November 4, 2	2003-11-04
Sockets for "springed" semiconductor devices Grant 6,642,625 - Dozier, II , et al. November 4, 2	2003-11-04
Contact tip structure for microelectronic interconnection elements and method of making same App 20030199179 - Dozier, Thomas H. II ; et al.	2003-10-23
Re-assembly process for MEMS structures App 20030192176 - Eldridge, Benjamin N. ; et al.	2003-10-16
Stacked semiconductor device assembly with microelectronic spring contacts Grant 6,627,980 - Eldridge September 30, 2	2003-09-30
Probe card assembly Grant 6,624,648 - Eldridge , et al. September 23, 2	2003-09-23
Special contact points for accessing internal circuitry of an integrated circuit Grant 6,621,260 - Eldridge , et al. September 16, 2	2003-09-16
Method of making lithographic contact springs Grant 6,616,966 - Mathieu , et al. September 9, 2	2003-09-09
Special contact points for accessing internal circuitry of an integrated circuit Grant 6,603,324 - Eldridge , et al. August 5, 2	2003-08-05
Apparatus and method for cleaning test probes App 20030138644 - Khandros, Igor Y. ; et al.	2003-07-24
Special contact points for accessing internal circuitry of an integrated circuit Grant 6,597,187 - Eldridge , et al. July 22, 2	2003-07-22
Method and system for detecting an arc condition App 20030122568 - Eldridge, Benjamin N. ; et al.	2003-07-03
Semiconductor fuse covering App 20030124750 - Eldridge, Benjamin N.	2003-07-03
Probe card covering system and method App 20030112001 - Eldridge, Benjamin N. ; et al.	2003-06-19
Forming tool for forming a contoured microelectronic spring mold App 20030099737 - Eldridge, Benjamin N. ; et al.	2003-05-29
Method and system for compensating thermally induced motion of probe cards App 20030085723 - Martens, Rod ; et al.	2003-05-08
Method and system for compensating thermally induced motion of probe cards App 20030085721 - Eldridge, Benjamin N. ; et al.	2003-05-08
Fan out of interconnect elements attached to semiconductor wafer App 20030082890 - Eldridge, Benjamin N. ; et al.	2003-05-01
Test assembly including a test die for testing a semiconductor product die Grant 6,551,844 - Eldridge , et al. April 22, 2	2003-04-22
Sockets for "springed" semiconductor devices App 20030067080 - Dozier, Thomas H. II ; et al.	2003-04-10
Method and system for designing a probe card App 20030055736 - Eldridge, Benjamin N. ; et al.	2003-03-20
Sockets for "springed" semiconductor devices Grant 6,534,856 - Dozier, II , et al. March 18, 2	2003-03-18
Microelectronic contact structures, and methods of making same App 20030049951 - Eldridge, Benjamin N. ; et al.	2003-03-13
Method of assembling and testing an electronics module App 20030049873 - Eldridge, Benjamin N.	2003-03-13
Probe card for probing wafers with raised contact elements App 20030038647 - Eldridge, Benjamin N. ; et al.	2003-02-27
Microelectronic contact structures, and methods of making same Grant 6,520,778 - Eldridge , et al. February 18, 2	2003-02-18
Method of manufacturing a probe card App 20030025172 - Grube, Gary W. ; et al.	2003-02-06
Interconnection element with contact blade App 20030015347 - Eldridge, Benjamin N. ; et al.	2003-01-23
Planarizer for a semiconductor contactor Grant 6,509,751 - Mathieu , et al. January 21, 2	2003-01-21
Method of manufacturing a probe card App 20030010976 - Grube, Gary W. ; et al.	2003-01-16
Electrical contractor, especially wafer level contactor, using fluid pressure App 20020197895 - Eldridge, Benjamin N.	2002-12-26
High density planar electrical interface App 20020195265 - Miller, Charles A. ; et al.	2002-12-26
Predictive, adaptive power supply for an integrated circuit under test App 20020186037 - Eldridge, Benjamin N. ; et al.	2002-12-12
Methods for making spring interconnect structures Grant 6,491,968 - Mathieu , et al. December 10, 2	2002-12-10
Probe card for probing wafers with raised contact elements Grant 6,483,328 - Eldridge , et al. November 19, 2	2002-11-19
Microelectronic spring contact element and electronic component having a plurality of spring contact elements Grant 6,482,013 - Eldridge , et al. November 19, 2	2002-11-19
Semiconductor fuse covering Grant 6,479,308 - Eldridge November 12, 2	2002-11-12
Interconnect For Microelectronic Structures With Enhanced Spring Characteristics App 20020164893 - MATHIEU, GAETAN L. ; et al.	2002-11-07
Method of making microelectronic contact structures Grant 6,475,822 - Eldridge , et al. November 5, 2	2002-11-05
Wafer level interposer App 20020132501 - Eldridge, Benjamin N. ; et al.	2002-09-19
Apparatus for reducing power supply noise in an integrated circuit App 20020125904 - Eldridge, Benjamin N. ; et al.	2002-09-12
Probe card assembly and kit, and methods of making same App 20020080588 - Eldridge, Benjamin N. ; et al.	2002-06-27
Electronic component overlapping dice of unsingulated semiconductor wafer App 20020074653 - Khandros, Igor Y. ; et al.	2002-06-20
Probe card assembly and kit, and methods of making same App 20020067181 - Eldridge, Benjamin N. ; et al.	2002-06-06
Probe card assembly and kit, and methods of making same App 20020053734 - Eldridge, Benjamin N. ; et al.	2002-05-09
Electronic components with plurality of contoured microelectronic spring contacts App 20020055282 - Eldridge, Benjamin N. ; et al.	2002-05-09
Apparatus for reducing power supply noise in an integrated circuit App 20020036515 - Eldridge, Benjamin N. ; et al.	2002-03-28
Microelectric Contact Structure App 20020019152 - ELDRIDGE, BENJAMIN N. ; et al.	2002-02-14
Attaratus For Socketably Receiving Interconnection Elements Of An Electronic Component App 20020004320 - PEDERSEN, DAVID V. ; et al.	2002-01-10
Probe Card Assembly And Kit App 20010054905 - KHANDROS, IGOR Y. ; et al.	2001-12-27
Special contact points for accessing internal circuitry of an integrated circuit App 20010052786 - Eldridge, Benjamin N. ; et al.	2001-12-20
Method for forming microelectronic spring structures on a substrate App 20010044225 - Eldridge, Benjamin N. ; et al.	2001-11-22
Lithographic contact elements App 20010039109 - Mathieu, Gaetan L. ; et al.	2001-11-08
Special contact points for accessing internal circuitry of an integrated circuit App 20010020743 - Eldridge, Benjamin N. ; et al.	2001-09-13
Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structur App 20010020545 - Eldridge, Benjamin N. ; et al.	2001-09-13
Special contact points for accessing internal circuitry of an integrated circuit App 20010020747 - Eldridge, Benjamin N. ; et al.	2001-09-13
Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structur App 20010020546 - Eldridge, Benjamin N. ; et al.	2001-09-13
Method of making and using lithographic contact springs App 20010021483 - Mathieu, Gaetan L. ; et al.	2001-09-13
Special contact points for accessing internal circuitry of an integrated circuit App 20010015773 - Eldridge, Benjamin N. ; et al.	2001-08-23
Interconnect Assemblies And Methods App 20010012704 - ELDRIDGE, BENJAMIN N.	2001-08-09
Method of making a product with improved material properties by moderate heat treatment of a metal incorporating a dilute additive App 20010009724 - Chen, Jimmy Kuo-Wei ; et al.	2001-07-26
Microelectronic contact structure, and method of making same. App 20010002340 - Eldridge, Benjamin N. ; et al.	2001-05-31
Microelectronic contact structure, and method of making same App 20010002341 - Eldridge, Benjamin N. ; et al.	2001-05-31
Interconnect assemblies and methods App 20010001080 - Eldridge, Benjamin N. ; et al.	2001-05-10

Company Registrations

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0001256952

ELDRIDGE BENJAMIN N