Cabral, Jr.; Cyril

Patent Applications and Registrations

Patent applications and USPTO patent grants for Cabral, Jr.; Cyril.The latest application filed is for "machine learning-based circuit board inspection".

Company Profile

13.175.78

Cabral, Jr.; Cyril - Yorktown Heights NY
Cabral, Jr.; Cyril - Mahopac NY
Cabral, Jr.; Cyril - Mahaopac NY
Cabral, Jr.; Cyril - Ossining NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Machine Learning-based Circuit Board Inspection App 20220301134 - Stellari; Franco ; et al.	2022-09-22
Singulating Individual Chips From Wafers Having Small Chips And Small Separation Channels App 20220157657 - Cabral, JR.; Cyril ; et al.	2022-05-19
Integrated reactive material erasure element with phase change memory Grant 11,257,866 - BrightSky , et al. February 22, 2	2022-02-22
Chip carrier integrating power harvesting and regulation diodes and fabrication thereof Grant 11,158,759 - Libsch , et al. October 26, 2	2021-10-26
Chip Carrier Integrating Power Harvesting And Regulation Diodes And Fabrication Thereof App 20210328679 - Libsch; Frank Robert ; et al.	2021-10-21
Integrated Reactive Material Erasure Element With Phase Change Memory App 20210257410 - BrightSky; Matthew J. ; et al.	2021-08-19
Fragmenting computer chips Grant 10,943,875 - Cabral, Jr. , et al. March 9, 2	2021-03-09
Thin film interconnects with large grains Grant 10,727,121 - Bruce , et al.	2020-07-28
Integrated reactive material erasure element with phase change memory Grant 10,535,713 - BrightSky , et al. Ja	2020-01-14
Crystal oscillator and the use thereof in semiconductor fabrication Grant 10,446,421 - Cabral, Jr. , et al. Oc	2019-10-15
Activating reactions in integrated circuits through electrical discharge Grant 10,388,615 - Cabral, Jr. , et al. A	2019-08-20
Fragmenting Computer Chips App 20190214351 - Cabral, JR.; Cyril ; et al.	2019-07-11
Fragmenting computer chips Grant 10,290,594 - Cabral, Jr. , et al.	2019-05-14
Activating reactions in integrated circuits through electrical discharge Grant 10,262,955 - Cabral, Jr. , et al.	2019-04-16
Thin Film Interconnects With Large Grains App 20190096757 - Bruce; Robert L. ; et al.	2019-03-28
Energy release using tunable reactive materials Grant 10,214,809 - Cabral, Jr. , et al. Feb	2019-02-26
Energy Release Using Tunable Reactive Materials App 20190023963 - Cabral, JR.; Cyril ; et al.	2019-01-24
Thin film interconnects with large grains Grant 10,170,361 - Bruce , et al. J	2019-01-01
Crystal Oscillator And The Use Thereof In Semiconductor Fabrication App 20180231957 - CABRAL, JR.; Cyril ; et al.	2018-08-16
Damaging integrated circuit components Grant 10,043,765 - Cabral, Jr. , et al. August 7, 2	2018-08-07
Activating reactions in integrated circuits through electrical discharge Grant 9,991,214 - Cabral, Jr. , et al. June 5, 2	2018-06-05
Crystal oscillator and the use thereof in semiconductor fabrication Grant 9,971,341 - Cabral, Jr. , et al. May 15, 2	2018-05-15
Energy release using tunable reactive materials Grant 9,970,102 - Cabral, Jr. , et al. May 15, 2	2018-05-15
Integrated arming switch and arming switch activation layer for secure memory Grant 9,941,004 - BrightSky , et al. April 10, 2	2018-04-10
Fragmenting Computer Chips App 20180096954 - Cabral, Jr.; Cyril ; et al.	2018-04-05
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20180061782 - Cabral, JR.; Cyril ; et al.	2018-03-01
Damaging Integrated Circuit Components App 20180047679 - Cabral, JR.; Cyril ; et al.	2018-02-15
Damaging Integrated Circuit Components App 20180005962 - Cabral, JR.; Cyril ; et al.	2018-01-04
Damaging integrated circuit components Grant 9,859,227 - Cabral, Jr. , et al. January 2, 2	2018-01-02
Controlling fragmentation of chemically strengthened glass Grant 9,738,560 - Cabral, Jr. , et al. August 22, 2	2017-08-22
Energy Release Using Tunable Reactive Materials App 20170226633 - Cabral, JR.; Cyril ; et al.	2017-08-10
Integrated Arming Switch And Arming Switch Activation Layer For Secure Memory App 20170229173 - BrightSky; Matthew J. ; et al.	2017-08-10
Self-forming embedded diffusion barriers Grant 9,691,656 - Cabral, Jr. , et al. June 27, 2	2017-06-27
Integrated Reactive Material Erasure Element With Phase Change Memory App 20170092694 - BrightSky; Matthew J. ; et al.	2017-03-30
Controlling fragmentation of chemically strengthened glass Grant 9,586,857 - Cabral, Jr. , et al. March 7, 2	2017-03-07
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20160300802 - Cabral, JR.; Cyril ; et al.	2016-10-13
Controlling Fragmentation Of Chemically Strengthened Glass App 20160264456 - Cabral, JR.; Cyril ; et al.	2016-09-15
Activating reactions in integrated circuits through electrical discharge Grant 9,431,354 - Cabral, Jr. , et al. August 30, 2	2016-08-30
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20160163658 - Cabral, JR.; Cyril ; et al.	2016-06-09
Controlling Fragmentation Of Chemically Strengthened Glass App 20160137548 - Cabral, JR.; Cyril ; et al.	2016-05-19
Activating Reactions In Integrated Circuits Through Electrical Discharge App 20160133581 - Cabral, Jr.; Cyril ; et al.	2016-05-12
Patterning transition metals in integrated circuits Grant 9,299,638 - Cabral, Jr. , et al. March 29, 2	2016-03-29
Formation of alpha particle shields in chip packaging Grant 9,299,665 - Andry , et al. March 29, 2	2016-03-29
Patterning transition metals in integrated circuits Grant 9,299,639 - Cabral, Jr. , et al. March 29, 2	2016-03-29
Sputter and surface modification etch processing for metal patterning in integrated circuits Grant 9,263,393 - Cabral, Jr. , et al. February 16, 2	2016-02-16
Thin Film Interconnects With Large Grains App 20150348832 - Bruce; Robert L. ; et al.	2015-12-03
Self-forming Embedded Diffusion Barriers App 20150340323 - Cabral, JR.; Cyril ; et al.	2015-11-26
Self-forming embedded diffusion barriers Grant 9,190,321 - Cabral, Jr. , et al. November 17, 2	2015-11-17
Gate electrode with stabilized metal semiconductor alloy-semiconductor stack Grant 9,166,014 - Breil , et al. October 20, 2	2015-10-20
Sputter And Surface Modification Etch Processing For Metal Patterning In Integrated Circuits App 20150243602 - Cabral, JR.; Cyril ; et al.	2015-08-27
Crystal Oscillator And The Use Thereof In Semiconductor Fabrication App 20150194355 - CABRAL, Jr.; Cyril ; et al.	2015-07-09
Sputter and surface modification etch processing for metal patterning in integrated circuits Grant 9,064,727 - Cabral, Jr. , et al. June 23, 2	2015-06-23
Formation Of Alpha Particle Shields In Chip Packaging App 20150171023 - Andry; Paul S. ; et al.	2015-06-18
Gate electrode with stabilized metal semiconductor alloy-semiconductor stack Grant 9,034,749 - Breil , et al. May 19, 2	2015-05-19
Local Interconnects By Metal-iii-v Alloy Wiring In Semi-insulating Iii-v Substrates App 20150054092 - Cohen; Guy ; et al.	2015-02-26
Local interconnects by metal-III-V alloy wiring in semi-insulating III-V substrates Grant 8,941,123 - Cohen , et al. January 27, 2	2015-01-27
Formation of alpha particle shields in chip packaging Grant 8,928,145 - Andry , et al. January 6, 2	2015-01-06
Gate Electrode With Stabilized Metal Semiconductor Alloy-semiconductor Stack App 20140363964 - Breil; Nicolas L. ; et al.	2014-12-11
Gate Electrode With Stabilized Metal Semiconductor Alloy-semiconductor Stack App 20140361351 - Breil; Nicolas L. ; et al.	2014-12-11
Method for forming self-aligned airgap interconnect structures Grant 8,900,988 - Lin , et al. December 2, 2	2014-12-02
Self-forming Embedded Diffusion Barriers App 20140299988 - Cabral, JR.; Cyril ; et al.	2014-10-09
Semiconductor interconnect structure having enhanced performance and reliability Grant 8,841,770 - Cabral, Jr. , et al. September 23, 2	2014-09-23
Self aligned carbide source/drain FET Grant 8,841,652 - Cabral, Jr. , et al. September 23, 2	2014-09-23
Field effect transistor device having a hybrid metal gate stack Grant 8,836,048 - Cabral, Jr. , et al. September 16, 2	2014-09-16
Microstructure modification in copper interconnect structures Grant 8,828,870 - Cabral, Jr. , et al. September 9, 2	2014-09-09
Annealing copper interconnects Grant 8,772,161 - Cabral, Jr. , et al. July 8, 2	2014-07-08
Patterning Transition Metals In Integrated Circuits App 20140159227 - Cabral, JR.; Cyril ; et al.	2014-06-12
Patterning Transition Metals In Integrated Circuits App 20140159242 - Cabral, JR.; Cyril ; et al.	2014-06-12
Sputter And Surface Modification Etch Processing For Metal Patterning In Integrated Circuits App 20140127906 - Cabral, JR.; Cyril ; et al.	2014-05-08
Microstructure Modification In Copper Interconnect Structures App 20140127899 - Cabral, JR.; Cyril ; et al.	2014-05-08
Sputter And Surface Modification Etch Processing For Metal Patterning In Integrated Circuits App 20140124935 - CABRAL, JR.; CYRIL ; et al.	2014-05-08
Sputter And Surface Modification Etch Processing For Metal Patterning In Integrated Circuits App 20140124870 - Cabral, JR.; Cyril ; et al.	2014-05-08
Field Effect Transistor Device Having A Hybrid Metal Gate Stack App 20140103457 - Cabral, JR.; Cyril ; et al.	2014-04-17
Field Effect Transistor Device Having A Hybrid Metal Gate Stack App 20140106531 - Cabral, Jr.; Cyril ; et al.	2014-04-17
Semiconductor Interconnect Structure Having Enhanced Performance And Reliability App 20140070418 - Cabral, JR.; Cyril ; et al.	2014-03-13
Self aligned carbide source/drain FET Grant 8,658,461 - Cabral, Jr. , et al. February 25, 2	2014-02-25
Semiconductor interconnect structure having enhanced performance and reliability Grant 8,648,465 - Cabral, Jr. , et al. February 11, 2	2014-02-11
Microstructure Modification In Copper Interconnect Structures App 20130285245 - Cabral, Jr.; Cyril ; et al.	2013-10-31
Interconnect Structure For Improved Time Dependent Dielectric Breakdown App 20130234260 - Cabral, Jr.; Cyril ; et al.	2013-09-12
Method to electrodeposit nickel on silicon for forming controllable nickel silicide Grant 8,492,899 - Cabral, Jr. , et al. July 23, 2	2013-07-23
Microstructure modification in copper interconnect structures Grant 8,492,897 - Cabral, Jr. , et al. July 23, 2	2013-07-23
Interconnect structure for improved time dependent dielectric breakdown Grant 8,431,486 - Cabral, Jr. , et al. April 30, 2	2013-04-30
Method and structure of photovoltaic grid stacks by solution based processes Grant 8,426,236 - Cabral, Jr. , et al. April 23, 2	2013-04-23
Semiconductor Interconnect Structure Having Enhanced Performance And Reliability App 20130075908 - Cabral, JR.; Cyril ; et al.	2013-03-28
Microstructure Modification in Copper Interconnect Structures App 20130062769 - Cabral, JR.; Cyril ; et al.	2013-03-14
Annealing Copper Interconnects App 20130040454 - Cabral, JR.; Cyril ; et al.	2013-02-14
Method and structure to reduce soft error rate susceptibility in semiconductor structures Grant 8,362,600 - Cabral, Jr. , et al. January 29, 2	2013-01-29
Method And Structure Of Forming Silicide And Diffusion Barrier Layer With Direct Deposited Film On Si App 20130001784 - Cabral, JR.; Cyril ; et al.	2013-01-03
Large-grain, Low-resistivity Tungsten On A Conductive Compound App 20120326314 - Brown; Stephen L. ; et al.	2012-12-27
Self Aligned Carbide Source/drain Fet App 20120302005 - Cabral, JR.; Cyril ; et al.	2012-11-29
Formation Of Alpha Particle Shields In Chip Packaging App 20120267768 - Andry; Paul Stephen ; et al.	2012-10-25
Method and structure of forming silicide and diffusion barrier layer with direct deposited film on silicon Grant 8,293,643 - Cabral, Jr. , et al. October 23, 2	2012-10-23
Self-aligned Airgap Interconnect Structures And Methods Of Fabrication App 20120261788 - Lin; Qinghuang ; et al.	2012-10-18
Large-grain, Low-resistivity Tungsten On A Conductive Compound App 20120228773 - Brown; Stephen L. ; et al.	2012-09-13
Formation of alpha particle shields in chip packaging Grant 8,247,271 - Andry , et al. August 21, 2	2012-08-21
Dosimeter powered by passive RF absorption Grant 8,212,218 - Cabral, Jr. , et al. July 3, 2	2012-07-03
Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high-k dielectrics Grant 8,193,051 - Bojarczuk, Jr. , et al. June 5, 2	2012-06-05
Method To Electrodeposit Nickel On Silicon For Forming Controllable Nickel Silicide App 20120091589 - CABRAL, JR.; CYRIL ; et al.	2012-04-19
Particle emission analysis for semiconductor fabrication steps Grant 8,158,449 - Cabral, Jr. , et al. April 17, 2	2012-04-17
Self-aligned metal to form contacts to Ge containing substrates and structure formed thereby Grant 8,154,130 - Cabral, Jr. , et al. April 10, 2	2012-04-10
Alpha particle blocking wire structure and method fabricating same Grant 8,129,267 - Cabral, Jr. , et al. March 6, 2	2012-03-06
Reduction of silicide formation temperature on SiGe containing substrates Grant 8,125,082 - Cabral, Jr. , et al. February 28, 2	2012-02-28
Stabilized Nickel Silicide Interconnects App 20120038048 - Cabral, JR.; Cyril ; et al.	2012-02-16
Interconnect Structure For Improved Time Dependent Dielectric Breakdown App 20120038056 - Cabral, JR.; Cyril ; et al.	2012-02-16
Alpha Particle Blocking Wire Structure And Method Fabricating Same App 20120028458 - Cabral, JR.; Cyril ; et al.	2012-02-02
Method and process for forming a self-aligned silicide contact Grant 8,101,518 - Cabral, Jr. , et al. January 24, 2	2012-01-24
Implantless Dopant Segregation for Silicide Contacts App 20120009771 - Cabral, JR.; Cyril ; et al.	2012-01-12
Contact metallurgy structure Grant 8,089,157 - Cabral, Jr. , et al. January 3, 2	2012-01-03
Method and Structure of Forming Silicide and Diffusion Barrier Layer With Direct Deposited Film on Silicon App 20110309508 - Cabral, JR.; Cyril ; et al.	2011-12-22
Method And Structure Of Photovoltaic Grid Stacks By Solution Based Processes App 20110272009 - Cabral, JR.; Cyril ; et al.	2011-11-10
Opto-thermal annealing methods for forming metal gate and fully silicided gate-field effect transistors Grant 8,039,331 - Allen , et al. October 18, 2	2011-10-18
Microstructure modification in copper interconnect structure Grant 8,008,199 - Baker-O'Neal , et al. August 30, 2	2011-08-30
Atomic layer deposition metallic contacts, gates and diffusion barriers Grant 7,998,842 - Cabral, Jr. , et al. August 16, 2	2011-08-16
Method And Structure To Reduce Soft Error Rate Susceptibility In Semiconductor Structures App 20110175211 - Cabral, JR.; Cyril ; et al.	2011-07-21
SELECTIVE IMPLEMENTATION OF BARRIER LAYERS TO ACHIEVE THRESHOLD VOLTAGE CONTROL IN CMOS DEVICE FABRICATION WITH HIGH-k DIELECTRICS App 20110165767 - Bojarczuk, JR.; Nestor A. ; et al.	2011-07-07
Self Aligned Carbide Source/drain Fet App 20110127493 - Cabral, JR.; Cyril ; et al.	2011-06-02
Dosimeter Powered by Passive RF Absorption App 20110127438 - Cabral, JR.; Cyril ; et al.	2011-06-02
Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high-k dielectrics Grant 7,928,514 - Bojarczuk, Jr. , et al. April 19, 2	2011-04-19
Method Of Forming Electrodeposited Contacts App 20110084393 - Cabral, JR.; Cyril ; et al.	2011-04-14
Gate stack engineering by electrochemical processing utilizing through-gate-dielectric current flow Grant 7,868,410 - Vereecken , et al. January 11, 2	2011-01-11
High temperature processing compatible metal gate electrode for pFETS and methods for fabrication Grant 7,863,083 - Amos , et al. January 4, 2	2011-01-04
Microstructure Modification In Copper Interconnect Structure App 20100323517 - Baker-O'Neal; Brett C. ; et al.	2010-12-23
Method of forming electrodeposited contacts Grant 7,851,357 - Cabral, Jr. , et al. December 14, 2	2010-12-14
Microstructure modification in copper interconnect structure Grant 7,843,063 - Baker-O'Neal , et al. November 30, 2	2010-11-30
Changing an electrical resistance of a resistor Grant 7,804,391 - Ballantine , et al. September 28, 2	2010-09-28
Formation of fully silicided metal gate using dual self-aligned silicide process Grant 7,785,999 - Cabral, Jr. , et al. August 31, 2	2010-08-31
Structure for reduction of soft error rates in integrated circuits Grant 7,781,871 - Cabral, Jr. , et al. August 24, 2	2010-08-24
Silicide interconnect structure Grant 7,749,898 - Besser , et al. July 6, 2	2010-07-06
CMOS integration scheme employing a silicide electrode and a silicide-germanide alloy electrode Grant 7,749,847 - Cabral, Jr. , et al. July 6, 2	2010-07-06
Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high K dielectrics Grant 7,745,278 - Bojarczuk, Jr. , et al. June 29, 2	2010-06-29
Particle Emission Analysis For Semiconductor Fabrication Steps App 20100084656 - Cabral, JR.; Cyril ; et al.	2010-04-08
Self-aligned metal to form contacts to Ge containing substrates and structure formed thereby Grant 7,682,968 - Cabral, Jr. , et al. March 23, 2	2010-03-23
Metal carbide gate structure and method of fabrication Grant 7,667,278 - Cabral, Jr. , et al. February 23, 2	2010-02-23
CMOS silicide metal gate integration Grant 7,655,557 - Amos , et al. February 2, 2	2010-02-02
Silicide Interconnect Structure App 20090315182 - Besser; Paul R. ; et al.	2009-12-24
Mobility Enhanced FET Devices App 20090298244 - Doris; Bruce B. ; et al.	2009-12-03
Method for reduction of soft error rates in integrated circuits Grant 7,601,627 - Cabral, Jr. , et al. October 13, 2	2009-10-13
Structure For Reduction Of Soft Error Rates In Integrated Circuits App 20090243053 - Cabral, JR.; Cyril ; et al.	2009-10-01
Microstructure Modification In Copper Interconnect Structure App 20090206484 - Baker-O'Neal; Brett C. ; et al.	2009-08-20
Cmos Integration Scheme Employing A Silicide Electrode And A Silicide-germanide Alloy Electrode App 20090206413 - Cabral, JR.; Cyril ; et al.	2009-08-20
Deposition of hafnium oxide and/or zirconium oxide and fabrication of passivated electronic structures Grant 7,566,938 - Cabral, Jr. , et al. July 28, 2	2009-07-28
SELECTIVE IMPLEMENTATION OF BARRIER LAYERS TO ACHIEVE THRESHOLD VOLTAGE CONTROL IN CMOS DEVICE FABRICATION WITH HIGH-k DIELECTRICS App 20090152642 - Bojarczuk, JR.; Nestor A. ; et al.	2009-06-18
Method and process for forming a self-aligned silicide contact Grant 7,544,610 - Cabral, Jr. , et al. June 9, 2	2009-06-09
Direct Electrodeposition Of Copper Onto Ta-alloy Barriers App 20090130845 - Baker-O'Neal; Brett ; et al.	2009-05-21
Self-aligned silicide process for silicon sidewall source and drain contacts and structure formed thereby Grant 7,498,640 - Cabral, Jr. , et al. March 3, 2	2009-03-03
Large-area Alpha-particle Detector And Method For Use App 20090039270 - Cabral, JR.; Cyril ; et al.	2009-02-12
Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high-k dielectrics Grant 7,479,683 - Bojarczuk, Jr. , et al. January 20, 2	2009-01-20
Structure And Method Of Forming Electrodeposited Contacts App 20090014878 - Cabral, JR.; Cyril ; et al.	2009-01-15
Selective Implementation Of Barrier Layers To Achieve Treshold Voltage Control In Cmos Device Fabrication With High K Dielectrics App 20090011610 - Bojarczuk, JR.; Nestor A. ; et al.	2009-01-08
Formation Of Alpha Particle Shields In Chip Packaging App 20080318365 - Andry; Paul Stephen ; et al.	2008-12-25
High Temperature Processing Compatible Metal Gate Electrode For pFETS and Methods For Fabrication App 20080311745 - Amos; Ricky ; et al.	2008-12-18
Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high k dielectrics Grant 7,452,767 - Bojarczuk, Jr. , et al. November 18, 2	2008-11-18
Self-aligned metal to form contacts to Ge containing substrates and structure formed thereby Grant 7,449,782 - Cabral, Jr. , et al. November 11, 2	2008-11-11
CMOS silicide metal gate integration Grant 7,411,227 - Amos , et al. August 12, 2	2008-08-12
Opto-thermal annealing methods for forming metal gate and fully silicided gate field effect transistors Grant 7,410,852 - Allen , et al. August 12, 2	2008-08-12
Structure and method of forming electrodeposited contacts Grant 7,405,154 - Cabral, Jr. , et al. July 29, 2	2008-07-29
Reduction of silicide formation temperature on SiGe containing substrates Grant 7,384,868 - Cabral, Jr. , et al. June 10, 2	2008-06-10
Method and structure for reduction of soft error rates in integrated circuits Grant 7,381,635 - Cabral, Jr. , et al. June 3, 2	2008-06-03
Method of forming an interconnect structure diffusion barrier with high nitrogen content Grant 7,378,338 - Cabral, Jr. , et al. May 27, 2	2008-05-27
Gate stack engineering by electrochemical processing utilizing through-gate-dielectric current flow Grant 7,368,045 - Vereecken , et al. May 6, 2	2008-05-06
Process options of forming silicided metal gates for advanced CMOS devices Grant 7,326,610 - Amos , et al. February 5, 2	2008-02-05
Structure and method to generate local mechanical gate stress for MOSFET channel mobility modification Grant 7,314,789 - Cabral, Jr. , et al. January 1, 2	2008-01-01
Temperature stable metal nitride gate electrode Grant 7,282,403 - Park , et al. October 16, 2	2007-10-16
Changing an electrical resistance of a resistor Grant 7,271,699 - Ballantine , et al. September 18, 2	2007-09-18
Retarding agglomeration of Ni monosilicide using Ni alloys Grant 7,271,486 - Cabral, Jr. , et al. September 18, 2	2007-09-18
Formation of fully silicided metal gate using dual self-aligned silicide process Grant 7,271,455 - Cabral, Jr. , et al. September 18, 2	2007-09-18
Nitrogen-containing field effect transistor gate stack containing a threshold voltage control layer formed via deposition of a metal oxide Grant 7,242,055 - Bojarczuk, Jr. , et al. July 10, 2	2007-07-10
Method of forming low resistance and reliable via in inter-level dielectric interconnect Grant 7,223,691 - Cabral, Jr. , et al. May 29, 2	2007-05-29
Electroplated CoWP composite structures as copper barrier layers Grant 7,217,655 - Cabral, Jr. , et al. May 15, 2	2007-05-15
Electroplated CoWP composite structures as copper barrier layers Grant 7,193,323 - Cabral, Jr. , et al. March 20, 2	2007-03-20
Method and apparatus for fabricating CMOS field effect transistors Grant 7,183,182 - Cabral, Jr. , et al. February 27, 2	2007-02-27
High performance FET with laterally thin extension Grant 7,176,116 - Cabral, Jr. , et al. February 13, 2	2007-02-13
Structure and method to generate local mechanical gate stress for MOSFET channel mobility modification Grant 7,173,312 - Cabral, Jr. , et al. February 6, 2	2007-02-06
Metal gate MOSFET by full semiconductor metal alloy conversion Grant 7,151,023 - Nayfeh , et al. December 19, 2	2006-12-19
Method for forming self-aligned dual fully silicided gates in CMOS devices Grant 7,122,472 - Fang , et al. October 17, 2	2006-10-17
Field effect transistor with electroplated metal gate Grant 7,112,851 - Saenger , et al. September 26, 2	2006-09-26
Method for forming self-aligned dual salicide in CMOS technologies Grant 7,112,481 - Fang , et al. September 26, 2	2006-09-26
Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high k dielectrics Grant 7,105,889 - Bojarczuk, Jr. , et al. September 12, 2	2006-09-12
Method and structure for reduction of contact resistance of metal silicides using a metal-germanium alloy Grant 7,102,234 - Cabral, Jr. , et al. September 5, 2	2006-09-05
Interconnect structure diffusion barrier with high nitrogen content Grant 7,098,537 - Cabral, Jr. , et al. August 29, 2	2006-08-29
Structure for controlling the interface roughness of cobalt disilicide Grant 7,081,676 - Agnello , et al. July 25, 2	2006-07-25
Elevated source drain disposable spacer CMOS Grant 7,074,684 - Roy , et al. July 11, 2	2006-07-11
Method for forming self-aligned dual salicide in CMOS technologies Grant 7,067,368 - Fang , et al. June 27, 2	2006-06-27
Method for forming self-aligned dual salicide in CMOS technologies Grant 7,064,025 - Fang , et al. June 20, 2	2006-06-20
Metal carbide gate structure and method of fabrication Grant 7,064,050 - Cabral, Jr. , et al. June 20, 2	2006-06-20
CMOS silicide metal gate integration Grant 7,056,782 - Amos , et al. June 6, 2	2006-06-06
Process options of forming silicided metal gates for advanced CMOS devices Grant 7,029,966 - Amos , et al. April 18, 2	2006-04-18
Temperature stable metal nitride gate electrode Grant 7,023,064 - Park , et al. April 4, 2	2006-04-04
Method of forming ultra-thin silicidation-stop extensions in mosfet devices Grant 6,989,322 - Gluschenkov , et al. January 24, 2	2006-01-24
Self-aligned silicide (salicide) process for low resistivity contacts to thin film silicon-on-insulator and bulk MOSFETS and for shallow junctions Grant 6,987,050 - Cabral, Jr. , et al. January 17, 2	2006-01-17
Deposition of hafnium oxide and/or zirconium oxide and fabrication of passivated electronic structures Grant 6,982,230 - Cabral, Jr. , et al. January 3, 2	2006-01-03
Method for plating copper conductors and devices formed Grant 6,979,393 - Rodbell , et al. December 27, 2	2005-12-27
Method and structure for ultra-low contact resistance CMOS formed by vertically self-aligned CoSi2 on raised source drain Si/SiGe device Grant 6,972,250 - Cabral, Jr. , et al. December 6, 2	2005-12-06
Field effect transistor with electroplated metal gate Grant 6,967,131 - Saenger , et al. November 22, 2	2005-11-22
Atomic layer deposition of metallic contacts, gates and diffusion barriers Grant 6,943,097 - Cabral, Jr. , et al. September 13, 2	2005-09-13
High performance FET with laterally thin extension Grant 6,933,577 - Cabral, Jr. , et al. August 23, 2	2005-08-23
Method for integration of silicide contacts and silicide gate metals Grant 6,927,117 - Cabral, Jr. , et al. August 9, 2	2005-08-09
Method for forming metal replacement gate of high performance Grant 6,921,711 - Cabral, Jr. , et al. July 26, 2	2005-07-26
Metal spacer gate for CMOS FET Grant 6,909,145 - Cabral, Jr. , et al. June 21, 2	2005-06-21
Retarding agglomeration of Ni monosilicide using Ni alloys Grant 6,905,560 - Cabral, Jr. , et al. June 14, 2	2005-06-14
Pre-anneal of CoSi, to prevent formation of amorphous layer between Ti-O-N and CoSi Grant 6,878,624 - Bruley , et al. April 12, 2	2005-04-12
Method for changing an electrical resistance of a resistor Grant 6,862,799 - Ballantine , et al. March 8, 2	2005-03-08
Method and process to make multiple-threshold metal gates CMOS technology Grant 6,846,734 - Amos , et al. January 25, 2	2005-01-25
Semiconductor structure having in-situ formed unit resistors and method for fabrication Grant 6,831,369 - Cabral, Jr. , et al. December 14, 2	2004-12-14
Semiconductor structure having in-situ formed unit resistors and method for fabrication Grant 6,828,232 - Cabral, Jr. , et al. December 7, 2	2004-12-07
Method and structure for controlling the interface roughness of cobalt disilicide Grant 6,809,030 - Agnello , et al. October 26, 2	2004-10-26
Semiconductor device incorporating elements formed of refractory metal-silicon-nitrogen and method for fabrication Grant 6,794,226 - Cabral, Jr. , et al. September 21, 2	2004-09-21
Elevated source drain disposable spacer CMOS Grant 6,777,298 - Roy , et al. August 17, 2	2004-08-17
Feram cell with internal oxygen source and method of oxygen release Grant 6,773,982 - Black , et al. August 10, 2	2004-08-10
Method and structure for reduction of contact resistance of metal silicides using a metal-germanium alloy Grant 6,753,606 - Cabral, Jr. , et al. June 22, 2	2004-06-22
Self-aligned silicide process utilizing ion implants for reduced silicon consumption and control of the silicide formation temperature and structure formed thereby Grant 6,716,708 - Cabral, Jr. , et al. April 6, 2	2004-04-06
Method for forming refractory metal-silicon-nitrogen capacitors and structures formed Grant 6,707,097 - Cabral, Jr. , et al. March 16, 2	2004-03-16
Semiconductor structure having in-situ formed unit resistors Grant 6,700,203 - Cabral, Jr. , et al. March 2, 2	2004-03-02
Method and structure for ultra-low contact resistance CMOS formed by vertically self-aligned CoSi2 on raised source drain Si/SiGe device Grant 6,690,072 - Cabral, Jr. , et al. February 10, 2	2004-02-10
Method for changing an electrical resistance of a resistor Grant 6,647,614 - Ballantine , et al. November 18, 2	2003-11-18
Self-aligned silicide process for silicon sidewall source and drain contacts Grant 6,645,861 - Cabral, Jr. , et al. November 11, 2	2003-11-11
Self-aligned silicide process utilizing ion implants for reduced silicon consumption and control of the silicide formation temperature and structure formed thereby Grant 6,555,880 - Cabral, Jr. , et al. April 29, 2	2003-04-29
Semiconductor device incorporating elements formed of refractory metal-silicon-nitrogen and method for fabrication Grant 6,545,339 - Cabral, Jr. , et al. April 8, 2	2003-04-08
Self-aligned silicide (salicide) process for strained silicon MOSFET ON SiGe and structure formed thereby Grant 6,503,833 - Ajmera , et al. January 7, 2	2003-01-07
Method for increasing the capacitance of a trench capacitor Grant 6,448,131 - Cabral, Jr. , et al. September 10, 2	2002-09-10
Self-aligned silicide process for reduction of Si consumption in shallow junction and thin SOI electronic devices Grant 6,444,578 - Cabral, Jr. , et al. September 3, 2	2002-09-03
Method and structure for controlling the interface roughness of cobalt disilicide Grant 6,440,851 - Agnello , et al. August 27, 2	2002-08-27
Thin film metal barrier for electrical interconnections Grant 6,437,440 - Cabral, Jr. , et al. August 20, 2	2002-08-20
Method and materials for through-mask electroplating and selective base removal Grant 6,391,773 - Andricacos , et al. May 21, 2	2002-05-21
Method for plating copper conductors and devices formed Grant 6,344,129 - Rodbell , et al. February 5, 2	2002-02-05
Method and structure for reduction of contact resistance of metal silicides using a metal-germanium alloy Grant 6,331,486 - Cabral, Jr. , et al. December 18, 2	2001-12-18
Method for self-aligned formation of silicide contacts using metal silicon alloys for limited silicon consumption and for reduction of bridging Grant 6,323,130 - Brodsky , et al. November 27, 2	2001-11-27
Thin metal barrier for electrical interconnections Grant 6,291,885 - Cabral, Jr. , et al. September 18, 2	2001-09-18
Method for forming electromigration-resistant structures by doping Grant 6,268,291 - Andricacos , et al. July 31, 2	2001-07-31
Method and materials for through-mask electroplating and selective base removal Grant 6,188,120 - Andricacos , et al. February 13, 2	2001-02-13
Method for controlling tensile and compressive stresses and mechanical problems in thin films on substrates Grant 5,834,374 - Cabral, Jr. , et al. November 10, 1	1998-11-10
Low temperature formation of low resistivity titanium silicide Grant 5,828,131 - Cabral, Jr. , et al. October 27, 1	1998-10-27
Tasin oxygen diffusion barrier in multilayer structures Grant 5,796,166 - Agnello , et al. August 18, 1	1998-08-18
Tasin oxygen diffusion barrier in multilayer structures Grant 5,776,823 - Agnello , et al. July 7, 1	1998-07-07
Method of forming a film for a multilayer Semiconductor device for improving thermal stability of cobalt silicide using platinum or nitrogen Grant 5,624,869 - Agnello , et al. April 29, 1	1997-04-29
Thin film multi-layer oxygen diffusion barrier consisting of refractory metal, refractory metal aluminide, and aluminum oxide Grant 5,625,233 - Cabral, Jr. , et al. April 29, 1	1997-04-29
Tasin oxygen diffusion barrier in multilayer structures Grant 5,576,579 - Agnello , et al. November 19, 1	1996-11-19
Method for lowering the phase transformation temperature of a metal silicide Grant 5,510,295 - Cabral, Jr. , et al. April 23, 1	1996-04-23
Method of metal silicide formation in integrated circuit devices Grant 5,401,677 - Bailey , et al. March 28, 1	1995-03-28