Aspnes; David E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Aspnes; David E..The latest application filed is for "normal incidence rotating compensator ellipsometer".

Company Profile

0.20.6

Aspnes; David E. - Apex NC
Aspnes; David E. - Watchung NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Normal incidence rotating compensator ellipsometer Grant 7,355,708 - Aspnes April 8, 2	2008-04-08
Normal incidence rotating compensator ellipsometer App 20070091311 - Aspnes; David E.	2007-04-26
Normal incidence rotating compensator ellipsometer Grant 7,173,700 - Aspnes February 6, 2	2007-02-06
Normal incidence rotating compensator ellipsometer App 20050248763 - Aspnes, David E.	2005-11-10
Broadband spectroscopic rotating compensator ellipsometer Grant 6,831,743 - Aspnes , et al. December 14, 2	2004-12-14
Broadband spectroscopic rotating compensator ellipsometer App 20040042009 - Aspnes, David E. ; et al.	2004-03-04
Broadband spectroscopic rotating compensator ellipsometer Grant 6,650,415 - Aspnes , et al. November 18, 2	2003-11-18
Broadband spectroscopic rotating compensator ellipsometer App 20020191186 - Aspnes, David E. ; et al.	2002-12-19
Broadband spectroscopic rotating compensator ellipsometer Grant 6,449,043 - Aspnes , et al. September 10, 2	2002-09-10
Thin film optical measurement system and method with calibrating ellipsometer Grant 6,411,385 - Aspnes , et al. June 25, 2	2002-06-25
Broadband spectroscopic rotating compensator ellipsometer App 20020018205 - Aspnes, David E. ; et al.	2002-02-14
Thin film optical measurement system and method with calibrating ellipsometer App 20010046049 - Aspnes, David E. ; et al.	2001-11-29
Broadband spectroscopic rotating compensator ellipsometer Grant 6,320,657 - Aspnes , et al. November 20, 2	2001-11-20
Thin film optical measurement system and method with calibrating ellipsometer Grant 6,304,326 - Aspnes , et al. October 16, 2	2001-10-16
Broadband spectroscopic rotating compensator ellipsometer Grant 6,134,012 - Aspnes , et al. October 17, 2	2000-10-17
Broadband spectroscopic rotating compensator ellipsometer Grant 5,973,787 - Aspnes , et al. October 26, 1	1999-10-26
Thin film optical measurement system and method with calibrating ellipsometer Grant 5,900,939 - Aspnes , et al. May 4, 1	1999-05-04
Broadband spectroscopic rotating compensator ellipsometer Grant 5,877,859 - Aspnes , et al. March 2, 1	1999-03-02
Thin film optical measurement system and method with calibrating ellipsometer Grant 5,798,837 - Aspnes , et al. August 25, 1	1998-08-25
Extraction of spatially varying dielectric function from ellipsometric data Grant 5,277,747 - Aspnes January 11, 1	1994-01-11
Ellipsometric control of material growth Grant 5,091,320 - Aspnes , et al. February 25, 1	1992-02-25
Optical control of deposition of crystal monolayers Grant 4,931,132 - Aspnes , et al. June 5, 1	1990-06-05
Cylindrical grating monochromator for synchrotron radiation Grant 4,492,466 - Aspnes January 8, 1	1985-01-08
Method of preparing semiconductor surfaces Grant 4,380,490 - Aspnes , et al. April 19, 1	1983-04-19
Method for producing devices comprising high density amorphous silicon or germanium layers by low pressure CVD technique Grant 4,357,179 - Adams , et al. November 2, 1	1982-11-02
Method for optical monitoring in materials fabrication Grant 4,332,833 - Aspnes , et al. June 1, 1	1982-06-01

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