ALSHAREEF; Husam N.

Patent Applications and Registrations

Patent applications and USPTO patent grants for ALSHAREEF; Husam N..The latest application filed is for "compositions and methods of making metal-organic frameworks with redox-active centers".

Company Profile

3.29.36

ALSHAREEF; Husam N. - Thuwal SA
Alshareef; Husam N. - Murphy TX
Alshareef; Husam N. - Thurwal SA
Alshareef; Husam N. - Richardson TX
Alshareef; Husam N. - Austin TX
Alshareef; Husam N. - Plano TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Compositions And Methods Of Making Metal-organic Frameworks With Redox-active Centers App 20210151262 - MALLICK; Arijit ; et al.	2021-05-20
Compositions and methods of making metal-organic frameworks with redox-active centers Grant 10,903,019 - Mallick , et al. January 26, 2	2021-01-26
Compositions And Methods Of Making Metal-organic Frameworks With Redox-active Centers App 20200118768 - MALLICK; Arijit ; et al.	2020-04-16
Ferroelectric capacitor with improved fatigue and breakdown properties Grant 10,096,352 - Khan , et al. October 9, 2	2018-10-09
System and method for mitigating oxide growth in a gate dielectric Grant 10,068,771 - Bevan , et al. September 4, 2	2018-09-04
Non-volatile ferroelectric memory cells with multilevel operation Grant 10,068,630 - Park , et al. September 4, 2	2018-09-04
System And Method For Mitigating Oxide Growth In A Gate Dielectric App 20180130662 - Bevan; Malcolm J. ; et al.	2018-05-10
System and method for mitigating oxide growth in a gate dielectric Grant 9,892,927 - Bevan , et al. February 13, 2	2018-02-13
System and method for mitigating oxide growth in a gate dielectric Grant 9,779,946 - Bevan , et al. October 3, 2	2017-10-03
Non-volatile Ferroelectric Memory Cells With Multilevel Operation App 20170249983 - Park; Ji Hoon ; et al.	2017-08-31
System And Method For Mitigating Oxide Growth In A Gate Dielectric App 20170170022 - Bevan; Malcolm J. ; et al.	2017-06-15
System And Method For Mitigating Oxide Growth In A Gate Dielectric App 20170133228 - Bevan; Malcolm J. ; et al.	2017-05-11
System and method for mitigating oxide growth in a gate dielectric Grant 9,576,804 - Bevan , et al. February 21, 2	2017-02-21
Methods for producing a thin film ferroelectric device using a two-step temperature process on an organic polymeric ferroelectric precursor material stacked between two conductive materials Grant 9,543,322 - Park , et al. January 10, 2	2017-01-10
System And Method For Mitigating Oxide Growth In A Gate Dielectric App 20160300722 - Bevan; Malcolm J. ; et al.	2016-10-13
Use Of Ambient-robust Solution Processing For Preparing Nanoscale Organic Ferroelectric Films App 20160284714 - PARK; Ji Hoon ; et al.	2016-09-29
Methods For Producing A Thin Film Ferroelectric Device Using A Two-step Temperature Process App 20160225775 - PARK; Ji Hoon ; et al.	2016-08-04
System and method for mitigating oxide growth in a gate dielectric Grant 9,396,951 - Bevan , et al. July 19, 2	2016-07-19
System and method for mitigating oxide growth in a gate dielectric Grant 9,368,355 - Bevan , et al. June 14, 2	2016-06-14
System and Method for Mitigating Oxide Growth in a Gate Dielectric App 20160155641 - Bevan; Malcolm J. ; et al.	2016-06-02
System and method for mitigating oxide growth in a gate dielectric Grant 9,337,044 - Bevan , et al. May 10, 2	2016-05-10
System and method for mitigating oxide growth in a gate dielectric Grant 9,337,046 - Bevan , et al. May 10, 2	2016-05-10
System and Method for Mitigating Oxide Growth in a Gate Dielectric App 20160013061 - Bevan; Malcolm J. ; et al.	2016-01-14
System and Method for Mitigating Oxide Growth in a Gate Dielectric App 20160013082 - Bevan; Malcolm J. ; et al.	2016-01-14
System and Method for Mitigating Oxide Growth in a Gate Dielectric App 20160013083 - Bevan; Malcolm J. ; et al.	2016-01-14
System and method for mitigating oxide growth in a gate dielectric Grant 9,177,806 - Bevan , et al. November 3, 2	2015-11-03
Ferroelectric devices, interconnects, and methods of manufacture thereof Grant 8,994,014 - Bhansali , et al. March 31, 2	2015-03-31
Graphene-based composite materials, method of manufacture and applications thereof Grant 8,878,341 - Almadhoun , et al. November 4, 2	2014-11-04
Work Function Adjustment With The Implant Of Lanthanides App 20140315377 - Ramin; Manfred ; et al.	2014-10-23
Ferroelectric Capacitor With Improved Fatigue and Breakdown Properties App 20140268483 - Khan; Mohd Adnan ; et al.	2014-09-18
Work function adjustment with the implant of lanthanides Grant 8,802,519 - Ramin , et al. August 12, 2	2014-08-12
Resistive Memory Device Fabricated From Single Polymer Material App 20140097395 - Khan; Mohd Adnan ; et al.	2014-04-10
Graphene-based Composite Materials, Method Of Manufacture And Applications Thereof App 20140098458 - Almadhoun; Mahmoud N. ; et al.	2014-04-10
Ferroelectric Devices, Interconnects, And Methods Of Manufacture Thereof App 20130328026 - Bhansali; Unnat S. ; et al.	2013-12-12
Work Function Adjustment With The Implant Of Lanthanides App 20130224940 - Ramin; Manfred ; et al.	2013-08-29
System and Method for Mitigating Oxide Growth in a Gate Dielectric App 20110120374 - Bevan; Malcolm J. ; et al.	2011-05-26
System and method for mitigating oxide growth in a gate dielectric Grant 7,906,441 - Bevan , et al. March 15, 2	2011-03-15
Thermal treatment of nitrided oxide to improve negative bias thermal instability Grant 7,682,988 - Alshareef , et al. March 23, 2	2010-03-23
CMOS device having different amounts of nitrogen in the NMOS gate dielectric layers and PMOS gate dielectric layers Grant 7,514,308 - Varghese , et al. April 7, 2	2009-04-07
Post high voltage gate oxide pattern high-vacuum outgas surface treatment Grant 7,402,524 - Kirkpatrick , et al. July 22, 2	2008-07-22
Gate Dielectric Having a Flat Nitrogen Profile and Method of Manufacture Therefor App 20080116542 - Niimi; Hiroaki ; et al.	2008-05-22
Gate dielectric having a flat nitrogen profile and method of manufacture therefor Grant 7,345,001 - Niimi , et al. March 18, 2	2008-03-18
Dual-gate integrated circuit semiconductor device Grant 7,339,240 - Kirkpatrick , et al. March 4, 2	2008-03-04
System and Method for Mitigating Oxide Growth in a Gate Dielectric App 20080050882 - Bevan; Malcolm J. ; et al.	2008-02-28
Semiconductor Device Having Multiple Work Functions and Method of Manufacture Therefor App 20070284676 - Alshareef; Husam N. ; et al.	2007-12-13
Semiconductor device having multiple work functions and method of manufacture therefor Grant 7,226,826 - Alshareef , et al. June 5, 2	2007-06-05
Post high voltage gate dielectric pattern plasma surface treatment App 20060183337 - Kirkpatrick; Brian K. ; et al.	2006-08-17
Post high voltage gate dielectric pattern plasma surface treatment Grant 7,049,242 - Kirkpatrick , et al. May 23, 2	2006-05-23
Post high voltage gate oxide pattern high-vacuum outgas surface treatment App 20060084229 - Kirkpatrick; Brian K. ; et al.	2006-04-20
Post high voltage gate oxide pattern high-vacuum outgas surface treatment Grant 7,018,925 - Kirkpatrick , et al. March 28, 2	2006-03-28
Thermal treatment of nitrided oxide to improve negative bias thermal instability App 20060046514 - Alshareef; Husam N. ; et al.	2006-03-02
Gate dielectric having a flat nitrogen profile and method of manufacture therefor App 20050285211 - Niimi, Hiroaki ; et al.	2005-12-29
Semiconductor device having multiple work functions and method of manufacture therefor App 20050233533 - Alshareef, Husam N. ; et al.	2005-10-20
System and method for mitigating oxide growth in a gate dielectric App 20050221564 - Bevan, Malcolm J. ; et al.	2005-10-06
Method for removal of hydrocarbon contamination on gate oxide prior to non-thermal nitridation using "spike" radical oxidation Grant 6,924,239 - Niimi , et al. August 2, 2	2005-08-02
System and method for mitigating oxide growth in a gate dielectric Grant 6,921,703 - Bevan , et al. July 26, 2	2005-07-26
Method For Removal Of Hydrocarbon Contamination On Gate Oxide Prior To Non-thermal Nitridation Using "spike" Radical Oxidation App 20050079723 - Niimi, Hiroaki ; et al.	2005-04-14
Nitridation process for independent control of device gate leakage and drive current App 20040262701 - Alshareef, Husam N. ; et al.	2004-12-30
Post high voltage gate oxide pattern high-vacuum outgas surface treatment App 20040266113 - Kirkpatrick, Brian K. ; et al.	2004-12-30
System and method for mitigating oxide growth in a gate dielectric App 20040229475 - Bevan, Malcolm J. ; et al.	2004-11-18
Post high voltage gate dielectric pattern plasma surface treatment App 20040142570 - Kirkpatrick, Brian K. ; et al.	2004-07-22
Method for non-thermally nitrided gate formation for high voltage devices Grant 6,730,566 - Niimi , et al. May 4, 2	2004-05-04
Method For Non-thermally Nitrided Gate Formation For High Voltage Devices App 20040067619 - Niimi, Hiroaki ; et al.	2004-04-08

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