Atomic force microscope and method for imaging surfaces with atomic resolution

Binnig October 16, 1

Patent Grant Re33387

U.S. patent number RE33,387 [Application Number 07/273,354] was granted by the patent office on 1990-10-16 for atomic force microscope and method for imaging surfaces with atomic resolution. This patent grant is currently assigned to International Business Machines Corporation. Invention is credited to Gerd K. Binnig.


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