Electron microscope

Description

FIG. 1 is a front, top and right side perspective view of an electron microscope according to the design;

FIG. 2 is a front view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a rear view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlarged view of the portion shown in BOX 8 in FIG. 1;

FIG. 9 is cross-sectional view taken along line 9-9 of FIG. 2; and,

FIG. 10 is an enlarged view of the portion shown in BOX 10 in FIG. 9.

The dashed broken lines in the drawings show portions of the electron microscope that form no part of the claimed design. The dot-dash broken lines in the drawings indicate boundaries of the claimed subject matter that form no part of the claimed design. The dot-dot-dash broken lines in the drawings indicate boundaries of the view indicators that form no part of the claimed design.

Claims

CLAIM The ornamental design for an electron microscope, as shown and described.

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Inventors:	Kojima; Akira (Tokyo, JP), Hokari; Junpei (Tokyo, JP), Masuda; Ai (Tokyo, JP), Yamamoto; Takashi (Tokyo, JP), Hirato; Tatsuya (Tokyo, JP), Chinone; Noriyasu (Tokyo, JP)
Applicant:	Name City State Country Type Hitachi High-Technologies Corporation Tokyo N/A JP
Assignee:	Hitachi High-Tech Corporation (Tokyo, JP)
Appl. No.:	D/699,268
Filed:	July 24, 2019

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Foreign Application Priority Data

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Jan 29, 2019 [JP]			2019-001638

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D10/70,109.1,109.2,81 ;D16/134,130,131,132,135,136,137,202-208,245,219 ;D24/120,113,118,119,121,122,124,125,128

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References Cited [Referenced By]

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U.S. Patent Documents

D591864	May 2009	Schmidt
D636005	April 2011	Oonuma
D657407	April 2012	Okamoto
D715843	October 2014	Kawai
D723079	February 2015	Nauli
D750989	March 2016	Shimizu
D766762	September 2016	Kawai
D841069	February 2019	Ihara
D872789	January 2020	Haavisto
D886653	June 2020	Sugie
D887295	June 2020	Carney
D895462	September 2020	Kimura
D933730	October 2021	Kang

Primary Examiner: Kearney; Richard
Assistant Examiner: Weeks; Benjamin M
Attorney, Agent or Firm: Crowell & Moring LLP