Inspection system
Zhan , et al. June 8, 2
U.S. patent number D921,497 [Application Number D/690,204] was granted by the patent office on 2021-06-08 for inspection system. This patent grant is currently assigned to BAKER HUGHES OILFIELD OPERATIONS LLC. The grantee listed for this patent is Baker Hughes Oilfield Operations LLC. Invention is credited to Wenhan Fu, Xiaoyu Jiang, Najie Jiao, Sanmao Xiong, Yanmin Zhan.
| United States Patent | D921,497 |
| Zhan , et al. | June 8, 2021 |
Inspection system
Claims
CLAIM The ornamental design for an inspection system, as shown and described.
| Inventors: | Zhan; Yanmin (Shanghai, CN), Jiao; Najie (Shanghai, CN), Xiong; Sanmao (Xi'an, CN), Fu; Wenhan (Shanghai, CN), Jiang; Xiaoyu (Shanghai, CN) | ||||||||||
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| Applicant: |
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| Assignee: | BAKER HUGHES OILFIELD OPERATIONS
LLC (Houston, TX) |
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| Appl. No.: | D/690,204 | ||||||||||
| Filed: | May 6, 2019 |
| Current U.S. Class: | D10/46; D24/186; D10/81; D10/75; D10/102 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/46,49,75,81,102 ;D13/163 ;D14/302,307,388,900,902 ;D24/185,186,232,233,234 |
References Cited [Referenced By]
U.S. Patent Documents
| D556914 | December 2007 | Okamoto |
| D775365 | December 2016 | Mathers |
| D834724 | November 2018 | Mathers |
| D888705 | June 2020 | Saito |
| D909605 | February 2021 | Mathers |
Other References
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"High Performance X-Ray Inspection Solution", Baker Hughes a GE Company, Inspection Technologies, Sales Brochure--Micromex and Nanomex, 2019, 1-8. cited by applicant . Electronics Testing Solutions--NDT for Semiconductors, PCBs and More, High-performance premium nanofocus and microfocus inspection for electronics:, https://www.bakerhughesds.com/industrial-x-ray-ct-scanners/phoenix-microm- ex-neo-nanomex-neo, Waygate Technologies, 2021. cited by applicant. |
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Mintz Levin Cohn Ferris Glovsky and Popeo, PC Adams; Lisa
Description
FIG. 1 is a front view of an inspection system;
FIG. 2 is a side view thereof;
FIG. 3 is another side view thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a bottom view thereof;
FIG. 6 is a front perspective view thereof;
FIG. 7 is a back perspective view thereof; and,
FIG. 8 is another front perspective view thereof.
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References
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