U.S. patent number D917,315 [Application Number D/749,118] was granted by the patent office on 2021-04-27 for contour gauge with lock.
The grantee listed for this patent is Haihua Shen. Invention is credited to Haihua Shen.
United States Patent |
D917,315 |
Shen |
April 27, 2021 |
Contour gauge with lock
Claims
CLAIM The ornamental design for a contour gauge with lock, as shown
and described.
Inventors: |
Shen; Haihua (Zhejiang,
CN) |
Applicant: |
Name |
City |
State |
Country |
Type |
Shen; Haihua |
Zhejiang |
N/A |
CN |
|
|
Appl.
No.: |
D/749,118 |
Filed: |
September 3, 2020 |
Current U.S.
Class: |
D10/65 |
Current International
Class: |
1004 |
Field of
Search: |
;D8/99,100,105
;D10/65 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Description
FIG. 1 is a perspective view of a contour gauge with lock showing
my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is an enlarged view thereof.
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