Layout of contacts
Jovanovic , et al. Feb
U.S. patent number D875,579 [Application Number D/686,859] was granted by the patent office on 2020-02-18 for layout of contacts. This patent grant is currently assigned to AEHR TEST SYSTEMS. The grantee listed for this patent is AEHR TEST SYSTEMS. Invention is credited to David S. Hendrickson, Jovan Jovanovic, Scott E. Lindsey, Steven C. Steps.
| United States Patent | D875,579 |
| Jovanovic , et al. | February 18, 2020 |
Layout of contacts
Claims
CLAIM The ornamental design of a layout of contacts, as shown and described.
| Inventors: | Jovanovic; Jovan (Santa Clara, CA), Lindsey; Scott E. (Brentwood, CA), Steps; Steven C. (Saratoga, CA), Hendrickson; David S. (San Jose, CA) | ||||||||||
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| Applicant: |
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| Assignee: | AEHR TEST SYSTEMS (Fremont,
CA) |
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| Appl. No.: | D/686,859 | ||||||||||
| Filed: | April 8, 2019 |
Related U.S. Patent Documents
| Application Number | Filing Date | Patent Number | Issue Date | ||
|---|---|---|---|---|---|
| 29612040 | Jul 27, 2017 | D850309 | |||
| Current U.S. Class: | D10/80; D10/103; D13/182; D13/173 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/75,80,103 ;D13/173,182 |
References Cited [Referenced By]
U.S. Patent Documents
| D810706 | February 2018 | Soyano et al. |
| 10243108 | March 2019 | Chou |
Attorney, Agent or Firm: De Klerk; Stephen M.
Description
FIG. 1 is a bottom view of a portion of an electronics tester showing a layout of contacts according to an embodiment of our design with non-essential features shown in dotted lines; and,
FIG. 2 is a bottom view of a portion of the layout of contacts according to the embodiment of our design.
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