U.S. patent number D875,579 [Application Number D/686,859] was granted by the patent office on 2020-02-18 for layout of contacts.
This patent grant is currently assigned to AEHR TEST SYSTEMS. The grantee listed for this patent is AEHR TEST SYSTEMS. Invention is credited to David S. Hendrickson, Jovan Jovanovic, Scott E. Lindsey, Steven C. Steps.
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United States Patent |
D875,579 |
Jovanovic , et al. |
February 18, 2020 |
Layout of contacts
Claims
CLAIM The ornamental design of a layout of contacts, as shown and
described.
Inventors: |
Jovanovic; Jovan (Santa Clara,
CA), Lindsey; Scott E. (Brentwood, CA), Steps; Steven
C. (Saratoga, CA), Hendrickson; David S. (San Jose,
CA) |
Applicant: |
Name |
City |
State |
Country |
Type |
AEHR TEST SYSTEMS |
Fremont |
CA |
US |
|
|
Assignee: |
AEHR TEST SYSTEMS (Fremont,
CA)
|
Appl.
No.: |
D/686,859 |
Filed: |
April 8, 2019 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
|
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29612040 |
Jul 27, 2017 |
D850309 |
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Current U.S.
Class: |
D10/80; D10/103;
D13/182; D13/173 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/75,80,103
;D13/173,182 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: De Klerk; Stephen M.
Description
FIG. 1 is a bottom view of a portion of an electronics tester
showing a layout of contacts according to an embodiment of our
design with non-essential features shown in dotted lines; and,
FIG. 2 is a bottom view of a portion of the layout of contacts
according to the embodiment of our design.
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