Diagnostic analyzer

Barton , et al.

Patent Grant D843251

U.S. patent number D843,251 [Application Number D/622,463] was granted by the patent office on 2019-03-19 for diagnostic analyzer. This patent grant is currently assigned to ABBOTT LABORATORIES. The grantee listed for this patent is Abbott Laboratories. Invention is credited to Christina A Barton, Christopher Alan Harris, Daniel Roger Nett, Ami Marie Verhalen, Rachel Elizabeth Wallace.


United States Patent D843,251
Barton ,   et al. March 19, 2019

Diagnostic analyzer

Claims

CLAIM The ornamental design for a diagnostic analyzer, as shown and described.
Inventors: Barton; Christina A (Irving, TX), Nett; Daniel Roger (Sun Prairie, WI), Wallace; Rachel Elizabeth (Madison, WI), Verhalen; Ami Marie (Sun Prairie, WI), Harris; Christopher Alan (Madison, WI)
Applicant:
Name City State Country Type

Abbott Laboratories

Abbott Park

IL

US
Assignee: ABBOTT LABORATORIES (Abbott Park, IL)
Appl. No.: D/622,463
Filed: October 17, 2017

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
29549332 Dec 21, 2015 D799999
29531576 Jan 24, 2017 D777048

Current U.S. Class: D10/81; D24/216
Current International Class: 1004
Field of Search: ;D24/216-219,231,232,233,107,169,186 ;D10/81

References Cited [Referenced By]

U.S. Patent Documents
D347396 May 1994 Ohnuma et al.
D755405 May 2016 Zhu
D773071 November 2016 Hakoda
D777048 January 2017 Barton
D799999 October 2017 Barton
D811251 February 2018 Barton

Other References

Japanese Patent Office, "Notice of Reasons for Rejection," issued in connection with Japanese Patent Application No. 2016-22305, dated Feb. 28, 2017, 3 pages. cited by applicant .
Japanese Patent Office, "Notice of Reasons for Rejection," issued in connection with Japanese Patent Application No. 2016-22306, dated Feb. 28, 2017, 3 pages. cited by applicant .
Japanese Patent Office, "Notice of Reasons for Rejection," issued in connection with Japanese Patent Application No. 2016-22307, dated Feb. 28, 2017, 3 pages. cited by applicant .
Intellectual Property Office of Japan, "Directive," issued in connection with Japanese Design Application No. 2015-28870, dated Oct. 25, 2016, 3 pages. cited by applicant .
State Intellectual Property Office of China, "First Office Action," issued in connection with Chinese Patent Application No. 201530555266.8, dated Oct. 9, 2016, 3 pages. cited by applicant .
State Intellectual Property Office of China, "Notification of First Correction," issued in connection with Chinese Patent Application No. 201530555266.8, dated Apr. 22, 2016, 3 pages. cited by applicant .
Intellectual Property Office of Japan, "Notice for Reasons for Rejection," issued in connection with Japanese Application No. 2015-28870, dated Jun. 14, 2016, 5 pages. cited by applicant .
Office for Harmonization in the Internal Market, "Notification of the Registration of the Community Designs," issued in connection with European Community Design Nos. 002930230-0001 through 002930230-0029, dated Mar. 17, 2016, 6 pages. cited by applicant .
United States Patent and Trademark Office, "Restriction and/or Election Requirement," issued in connection with U.S. Appl. No. 29/531,576, dated Jul. 6, 2016, 12 pages. cited by applicant .
United States Patent and Trademark Office, "Notice of Allowance," issued in connection with U.S. Appl. No. 29/531,576, dated Sep. 8, 2016,13 pages. cited by applicant.

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: McAndrews, Held & Malloy, Ltd.

Description



The file of this patent contains at least one drawing/photograph executed in color. Copies of this patent with color drawings(s)/photograph(s) will be provided by the Office upon request and payment of the necessary fee.

FIG. 1 is a front left perspective view of a first embodiment of a diagnostic analyzer showing our new design;

FIG. 2 is a front elevation view thereof;

FIG. 3 is a front left perspective view of a second embodiment of a diagnostic analyzer showing our new design;

FIG. 4 is a front elevation view thereof;

FIG. 5 is a rear elevation view thereof;

FIG. 6 is a right side elevation view thereof;

FIG. 7 is a left side elevation view thereof;

FIG. 8 is a top plan view thereof; and,

FIG. 9 is a bottom plan view thereof.

The portions of the diagnostic analyzer shown in broken lines form no part of the claimed design.

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Patent Diagrams and Documents

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