Window E-chip for an electron microscope

Description

FIG. 1 is a perspective view of the window E-chip for an electron microscope of the invention having a rectangular window.

FIG. 2 is a top plan view of the window E-chip for an electron microscope of FIG. 1.

FIG. 3 is a bottom view of the window E-chip for an electron microscope of FIG. 1.

FIG. 4 is side view of the window E-chip for an electron microscope of FIG. 1.

FIG. 5 is a perspective view of the window E-chip for an electron microscope of the invention having a square window.

FIG. 6 is a top plan view of the window E-chip for an electron microscope of FIG. 5.

FIG. 7 is a bottom view of the window E-chip for an electron microscope of FIG. 5.

FIG. 8 is a side view of the window E-chip for an electron microscope of FIG. 5.

FIG. 9 is a perspective view of the window E-chip for an electron microscope of FIG. 5 in a condition of use in one embodiment of an electron microscopy sample holder; and,

FIG. 10 is a perspective view of the window E-chip for an electron microscope of FIG. 1 in a condition of use in a second embodiment of an electron microscopy sample holder.

Broken lines, which form no part of the claimed design, are used for illustrative purposes to show an environment of the claimed design in a condition of use.

Claims

CLAIM We claim the ornamental design for a window E-chip for an electron microscope, as shown and described.

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Inventors:	Walden, II; Franklin Stampley (Raleigh, NC), Damiano, Jr.; John (Apex, NC), Nackashi; David P. (Raleigh, NC), Gardiner; Daniel S. (Wake Forest, NC)
Applicant:	Name City State Country Type PROTOCHIPS, INC. Morrisville NC US
Assignee:	PROTOCHIPS, INC. (Morrisville, NC)
Appl. No.:	D/557,335
Filed:	March 8, 2016

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Current U.S. Class:	D24/224
Current International Class:	2402
Field of Search:	;D24/224-227,216 ;378/45,78,79 ;250/441.11,442.11,443.1

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References Cited [Referenced By]

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U.S. Patent Documents

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D491273	June 2004	Biegler
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D566291	April 2008	Parunak
7713053	May 2010	Mick et al.
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8405047	March 2013	Chen
8466432	June 2013	Damiano, Jr. et al.
8513621	August 2013	Nackashi et al.
8575566	November 2013	Chen
8829469	September 2014	Damiano, Jr. et al.
8872129	October 2014	Damiano, Jr. et al.
8920723	December 2014	Damiano, Jr. et al.
9040939	May 2015	Damiano, Jr. et al.
9048065	June 2015	Damiano et al.
9064672	June 2015	Mick et al.
9275825	March 2016	Damiano et al.
9312097	April 2016	Nackashi et al.
9437393	September 2016	Damiano, Jr. et al.
9455117	September 2016	Fujiwara
D794816	August 2017	Koyama
D806892	January 2018	Walden, II
2013/0171044	July 2013	Nikonorov
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2015/0235805	August 2015	Gardiner et al.
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2016/0033355	February 2016	Gardiner et al.

Primary Examiner: Hattan; Susan Bennett
Assistant Examiner: Tsehaye; Rebecca
Attorney, Agent or Firm: NK Patent Law

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