Diagnostic analyzer

Barton , et al. February 27, 2

Patent Grant D811251

U.S. patent number D811,251 [Application Number D/587,977] was granted by the patent office on 2018-02-27 for diagnostic analyzer. This patent grant is currently assigned to ABBOTT LABORATORIES. The grantee listed for this patent is Abbott Laboratories. Invention is credited to Christina A. Barton, Christoper Alan Harris, Daniel Roger Nett, Ami Marie Verhalen, Rachel Elizabeth Wallace.


United States Patent D811,251
Barton ,   et al. February 27, 2018

Diagnostic analyzer

Claims

CLAIM The ornamental design for a "diagnostic analyzer," as shown and described.
Inventors: Barton; Christina A. (Irving, TX), Wallace; Rachel Elizabeth (Madison, WI), Verhalen; Ami Marie (Sun Prairie, WI), Harris; Christoper Alan (Madison, WI), Nett; Daniel Roger (Sun Prairie, WI)
Applicant:
Name City State Country Type

Abbott Laboratories

Abbott Park

IL

US
Assignee: ABBOTT LABORATORIES (Abbott Park, IL)
Appl. No.: D/587,977
Filed: December 16, 2016

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
29531576 Jun 26, 2015 D777048

Current U.S. Class: D10/81; D24/216
Current International Class: 1004
Field of Search: ;D10/81 ;D24/216,219,220,232,233,234

References Cited [Referenced By]

U.S. Patent Documents
D347396 May 1994 Ohnuma et al.
D755405 May 2016 Zhu
D773071 November 2016 Hakoda
D788617 June 2017 Barton

Other References

Japanese Patent Office, "Notice of Reasons for Rejection," issued in connection with Japanese Patent Application No. 2016-22305, dated Feb. 28, 2017, 3 pages. cited by applicant .
Japanese Patent Office, "Notice of Reasons for Rejection," issued in connection with Japanese Patent Application No. 2016-22306, dated Feb. 28, 2017, 3 pages. cited by applicant .
Japanese Patent Office, "Notice of Reasons for Rejection," issued in connection with Japanese Patent Application No. 2016-22307, dated Feb. 28, 2017, 3 pages. cited by applicant .
Intellectual Property Office of Japan, "Directive," issued in connection with Japanese Design Application No. 2015-28870, dated Oct. 25, 2016, 3 pages. cited by applicant .
State Intellectual Property Office of China, "First Office Action," issued in connection with Chinese Patent Application No. 201530555266.8, dated Oct. 9, 2016, 3 pages. cited by applicant .
State Intellectual Property Office of China, "Notification of First Correction," issued in connection with Chinese Patent Application No. 201530555266.8, dated Apr. 22, 2016, 3 pages. cited by applicant .
Intellectual Property Office of Japan, "Notice for Reasons for Rejection," issued in connection with Japanese Application No. 2015-28870, dated Jun. 14, 2016, 5 pages. cited by applicant .
Office for Harmonization in the Internal Market, "Notification of the Registration of the Community Designs," issued in connection with European Community Design Nos. 002930230-0001 through 002930230-0029, dated Mar. 17, 2016, 3 pages. cited by applicant .
United States Patent and Trademark Office, "Restriction and/or Election Requirement," issued in connection with U.S. Appl. No. 29/531,576, dated Jul. 6, 2016, 12 pages. cited by applicant .
United States Patent and Trademark Office, "Notice of Allowance," issued in connection with U.S. Appl. No. 29/531,576, dated Sep. 8, 2016, 13 pages. cited by applicant .
Japanese Patent Office, "Directive," issued in connection with Japanese Patent Application No. 2016-22305, dated May 23, 2017, 5 pages. cited by applicant .
Japanese Patent Office, "Directive," issued in connection with Japanese Patent Application No. 2016-22306, dated May 23, 2017, 5 pages. cited by applicant.

Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Hanley, Flight & Zimmerman, LLC

Description



FIG. 1 is a front left perspective view of a diagnostic analyzer.

FIG. 2 is a front view of the analyzer of FIG. 1.

FIG. 3 is a rear view of the analyzer of FIG. 1.

FIG. 4 is a right side view of the analyzer of FIG. 1.

FIG. 5 is a left side view of the analyzer of FIG. 1.

FIG. 6 is a top view of the analyzer of FIG. 1.

FIG. 7 is a bottom view of the analyzer of FIG. 1.

FIG. 8 is a front left perspective view of a diagnostic analyzer.

FIG. 9 is a front view of the analyzer of FIG. 8.

FIG. 10 is a rear view of the analyzer of FIG. 8.

FIG. 11 is a right side view of the analyzer of FIG. 8.

FIG. 12 is a left side view of the analyzer of FIG. 8.

FIG. 13 is a top view of the analyzer of FIG. 8; and,

FIG. 14 is a bottom view of the analyzer of FIG. 8.

The features shown in broken lines form no part of the claimed design.

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