Diagnostic analyzer

Barton , et al. June 6, 2

Patent Grant D788617

U.S. patent number D788,617 [Application Number D/505,590] was granted by the patent office on 2017-06-06 for diagnostic analyzer. This patent grant is currently assigned to ABBOTT LABORATORIES. The grantee listed for this patent is Abbott Laboratories. Invention is credited to Christina A. Barton, Daniel Roger Nett, Ami Marie Verhalen, Rachel Elizabeth Wallace.


United States Patent D788,617
Barton ,   et al. June 6, 2017

Diagnostic analyzer

Claims

CLAIM The ornamental design for a "diagnostic analyzer," as shown and described.
Inventors: Barton; Christina A. (Irving, TX), Wallace; Rachel Elizabeth (Madison, WI), Verhalen; Ami Marie (Sun Prairie, WI), Nett; Daniel Roger (Sun Prairie, WI)
Applicant:
Name City State Country Type

Abbott Laboratories

Abbott Park

IL

US
Assignee: ABBOTT LABORATORIES (Abbott Park, IL)
Appl. No.: D/505,590
Filed: December 23, 2015

Current U.S. Class: D10/81; D24/216
Current International Class: 1004
Field of Search: ;D10/81 ;D24/216,219,232,233,234,107,169,185,217,218

References Cited [Referenced By]

U.S. Patent Documents
D319307 August 1991 Sakagami et al.
D346027 April 1994 Kobayashi
D351025 September 1994 Yamashita et al.
D354354 January 1995 Yamashita et al.
6521183 February 2003 Burri et al.
D662431 June 2012 Kimura
D672471 December 2012 Franco et al.
D676568 February 2013 Liu et al.
D715456 October 2014 Oonuma et al.
D716966 November 2014 Lizari Illarramendi
D721820 January 2015 Oonuma
D724753 March 2015 Gutmann et al.
D728124 April 2015 Oonuma et al.
D729399 May 2015 Oonuma
D736402 August 2015 Gutmann
2002/0169518 November 2002 Luoma, II et al.
2013/0034466 February 2013 Wakamiya et al.
2013/0288355 October 2013 DeWitte et al.
2015/0140577 May 2015 Li et al.
2015/0276566 October 2015 Berntsen et al.

Other References

Notice for Reasons for Rejection, English Language, issued by the Intellectual Property Office of Japan, in connection with Japanese application No. 2015-28871, on Jun. 14, 2016, 5 pages. cited by applicant .
Japanese Patent Office, "Notice of Reason for Rejection," issued in connection with Japanese Design Application No. 2016-1034, mailed Sep. 6, 2016, 5 pages. cited by applicant .
State Intellectual Property Office of China, "First Office Action," issued in connection with Chinese Patent Application No. 201530555269.1, dated Oct. 9, 2016, 3 pages. cited by applicant .
Japanese Patent Office, "Notice of Reason for Rejection," issued in connection with Japanese Design Application No. 2016-22301, mailed Nov. 8, 2016, 4 pages. cited by applicant .
Notification of First Corrections, issued by the State Intellectual Property Office of the P.R. China, in connection with Chinese Patent Application No. 201530555269.1, on Apr. 25, 2016, 4 pages. cited by applicant .
Notification of the Registration of the Community Designs, issued by the Office for Harmonization in The Internal Market, in connection with European Community Design Nos. 002930230-0001 through 002930230-0029, on Mar. 17, 2016, 6 pages. cited by applicant .
Notification of the Registration of the Community Designs, issued by the European Union Intellectual Property Office, in connection with European Community Design Nos. 003003631-0001 through 003003631-0014, on Apr. 28, 2016, 5 pages. cited by applicant .
United States Patent and Trademark Office, "Restriction and/or election requirement," issued in connection with U.S. Appl. No. 29/531,603, dated Mar. 6, 2017, 32 pages. cited by applicant.

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Hanley, Flight & Zimmerman, LLC

Description



FIG. 1 is a front left perspective view of a diagnostic analyzer.

FIG. 2 is a front view of the analyzer of FIG. 1.

FIG. 3 is a rear view of the analyzer of FIG. 1.

FIG. 4 is a right side view of the analyzer of FIG. 1.

FIG. 5 is a left side view of the analyzer of FIG. 1.

FIG. 6 is a top view of the analyzer of FIG. 1.

FIG. 7 is a bottom view of the analyzer of FIG. 1.

FIG. 8 is a front left perspective view of a diagnostic analyzer.

FIG. 9 is a front view of the analyzer of FIG. 8.

FIG. 10 is a rear view of the analyzer of FIG. 8.

FIG. 11 is a right side view of the analyzer of FIG. 8.

FIG. 12 is a left side view of the analyzer of FIG. 8.

FIG. 13 is a top view of the analyzer of FIG. 8; and,

FIG. 14 is a bottom view of the analyzer of FIG. 8.

* * * * *


uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed