Mount for surgical microscope

Description

FIG. 1 is a left side elevation view of a mount for a surgical microscope of our new design;

FIG. 2 is a right side elevation view of the mount for a surgical microscope of FIG. 1;

FIG. 3 is a top plan view of the mount for the surgical microscope of FIG. 1;

FIG. 4 is a bottom plan view of the mount for the surgical microscope of FIG. 1;

FIG. 5 is a rear elevation view of the mount for the surgical microscope of FIG. 1;

FIG. 6 is a front elevation view of the mount for the surgical microscope of FIG. 1;

FIG. 7 is a perspective view of the mount for the surgical microscope of FIG. 1;

FIG. 8 is a left side elevation view of a second embodiment of a mount for a surgical microscope of our new design;

FIG. 9 is a right side elevation view of the mount for the surgical microscope of FIG. 8;

FIG. 10 is a top plan view of the mount for the surgical microscope of FIG. 8;

FIG. 11 is a bottom plan view of the mount for the surgical microscope of FIG. 8;

FIG. 12 is a rear elevation view of the mount for the surgical microscope of FIG. 8;

FIG. 13 is a front elevation view of the mount for the surgical microscope of FIG. 8; and,

FIG. 14 is a perspective view of the mount for the surgical microscope of FIG. 8.

The broken lines in FIGS. 2, 4, 9, 11 and 12 depict parts of the mount for a surgical microscope that form no part of the claimed design.

Claims

CLAIM The ornamental design for a mount for a surgical microscope, as shown and described.

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Inventors:	Matuschek; Walter (Aalen, DE), Chu; Zhenhua (Suzhou, CN), Zhang; Shuanghu (Suzhou, CN)
Applicant:	Name City State Country Type Carl Zeiss Meditec AG Jena N/A DE
Assignee:	Carl Zeiss Meditec AG (Jena, DE)
Appl. No.:	D/527,335
Filed:	May 18, 2015

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Foreign Application Priority Data

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Nov 19, 2014 [CN]			2014 3 0456635

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;248/123.2,292.11,281.11,280.11 ;359/382,384,388,362,363,368,372 ;D16/130-136,214,239,318,334

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References Cited [Referenced By]

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U.S. Patent Documents

D328088	July 1992	Horino
5173802	December 1992	Heller
D342272	December 1993	Saito
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D650405	December 2011	Nusser
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D746893	January 2016	Dong
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2002/0106137	August 2002	Chen

Primary Examiner: Hattan; Susan Bennett
Assistant Examiner: Wright; Jennifer
Attorney, Agent or Firm: Walter Ottesen, P.A.