Sample holder for an electron microscope
Koyama , et al. August 15, 2
U.S. patent number D794,816 [Application Number D/488,729] was granted by the patent office on 2017-08-15 for sample holder for an electron microscope. This patent grant is currently assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION. The grantee listed for this patent is Hitachi High-Technologies Corporation. Invention is credited to Kazuhiro Koyama, Masahiro Sasajima.
| United States Patent | D794,816 |
| Koyama , et al. | August 15, 2017 |
Sample holder for an electron microscope
Claims
CLAIM We claim the ornamental design for a sample holder for an electron microscope, as shown and described.
| Inventors: | Koyama; Kazuhiro (Tokyo, JP), Sasajima; Masahiro (Tokyo, JP) | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Applicant: |
|
||||||||||
| Assignee: | HITACHI HIGH-TECHNOLOGIES
CORPORATION (Tokyo, JP) |
||||||||||
| Appl. No.: | D/488,729 | ||||||||||
| Filed: | April 23, 2014 |
Foreign Application Priority Data
| Oct 24, 2013 [JP] | 2013-024760 | |||
| Current U.S. Class: | D24/224 |
| Current International Class: | 2402 |
| Field of Search: | ;D24/216,222-225,227,231-232 ;D10/75,80,81 ;250/310,311,440.11,441.11,442.11,443.1 ;73/864.91,862.474 ;206/557 ;228/136 ;D16/131,136 |
References Cited [Referenced By]
U.S. Patent Documents
| 3727051 | April 1973 | Page |
| D249708 | September 1978 | Smith |
| 4262194 | April 1981 | Hayward |
| D333187 | February 1993 | Omi |
| 5367171 | November 1994 | Aoyama |
| 5698856 | December 1997 | Frasca |
| 5753924 | May 1998 | Swann |
| D431300 | September 2000 | Fisch |
| 6246060 | June 2001 | Ackeret |
| 6388262 | May 2002 | Alani |
| 6414322 | July 2002 | Carroll |
| 6967335 | November 2005 | Dyer |
| 6989542 | January 2006 | Moses |
| 7230242 | June 2007 | Behar |
| D578653 | October 2008 | Suzuki |
| D578655 | October 2008 | Suzuki |
| D579120 | October 2008 | Suzuki |
| 7619225 | November 2009 | Shan |
| 7800077 | September 2010 | Moriya |
| D651226 | December 2011 | Nagakubo |
| 8143593 | March 2012 | Milas |
| D660335 | May 2012 | Nagakubo |
| 8338798 | December 2012 | Terada |
| D684274 | June 2013 | Hosoya |
| 8497487 | July 2013 | Milas |
| D692578 | October 2013 | Kikuhara |
| 8569714 | October 2013 | Han |
| 8575566 | November 2013 | Chen |
| D700711 | March 2014 | Kikuhara |
| D701782 | April 2014 | Lekgoathi |
| 8772736 | July 2014 | Feng |
| D711011 | August 2014 | Noda |
| 8835847 | September 2014 | Yaguchi |
| 8878144 | November 2014 | Yaguchi |
| 8969828 | March 2015 | Sakamoto |
| D730962 | June 2015 | Ominami |
| D731570 | June 2015 | Ominami |
| 9159530 | October 2015 | Hosoya |
| 9196457 | November 2015 | Grogan |
| D748706 | February 2016 | Ominami |
| 9343261 | May 2016 | Chang |
| 9437393 | September 2016 | Damiano, Jr. |
| 2002/0194938 | December 2002 | Koo |
| 2005/0035302 | February 2005 | Morrison |
| 2007/0125947 | June 2007 | Sprinzak |
Assistant Examiner: Cavanna; Mark
Attorney, Agent or Firm: Baker Botts L.L.P.
Description
FIG. 1 is a front, top and left side perspective view of a sample holder for an electron microscope showing our new design;
FIG. 2 is a rear, top and right side perspective view thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a top plan view thereof; and,
FIG. 8 is a bottom plan view thereof.
The broken lines are included for the purpose of illustrating unclaimed portions of the sample holder for an electron microscope and form no part of the claimed design.
* * * * *
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 