Sasajima; Masahiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sasajima; Masahiro.The latest application filed is for "charged particle beam device".
- Sasajima; Masahiro - Tokyo JP
- Sasajima; Masahiro - Hitachinaka N/A JP
| Patent | Date |
|---|---|
| Charged particle beam device and method for adjusting position of detector of charged particle beam device Grant 11,342,155 - Imai , et al. May 24, 2 | 2022-05-24 |
| Charged Particle Beam Device App 20220013326 - Takaguchi; Katsura ; et al. | 2022-01-13 |
| Charged particle beam apparatus and sample observation method using the same Grant 11,183,362 - Takaguchi , et al. November 23, 2 | 2021-11-23 |
| Charged Particle Beam Device and Method for Adjusting Position of Detector of Charged Particle Beam Device App 20210296081 - IMAI; Yuta ; et al. | 2021-09-23 |
| Measuring apparatus and method of setting observation condition Grant 11,043,358 - Araki , et al. June 22, 2 | 2021-06-22 |
| Charged Particle Beam Device and Axis Adjustment Method Thereof App 20210151279 - IMAI; Yuta ; et al. | 2021-05-20 |
| Charged particle beam apparatus Grant 10,971,347 - Nakamura , et al. April 6, 2 | 2021-04-06 |
| Charged Particle Beam Apparatus App 20210020422 - NAKAMURA; Mitsuhiro ; et al. | 2021-01-21 |
| Charged Particle Beam Apparatus And Sample Observation Method Using The Same App 20200294764 - Takaguchi; Katsura ; et al. | 2020-09-17 |
| Measuring Apparatus And Method Of Setting Observation Condition App 20200111638 - ARAKI; Ryoko ; et al. | 2020-04-09 |
| Sample holder for an electron microscope Grant D794,816 - Koyama , et al. August 15, 2 | 2017-08-15 |
| Charged particle beam device Grant 9,349,567 - Takahoko , et al. May 24, 2 | 2016-05-24 |
| Charged Particle Beam Device App 20160086766 - TAKAHOKO; Yoshihiro ; et al. | 2016-03-24 |
| Inspection device Grant 8,816,712 - Nakamura , et al. August 26, 2 | 2014-08-26 |
| Semiconductor inspection method and device that consider the effects of electron beams Grant 8,309,922 - Ando , et al. November 13, 2 | 2012-11-13 |
| Semiconductor Inspection Method And Device That Consider The Effects Of Electron Beams App 20110291009 - Ando; Tohru ; et al. | 2011-12-01 |
| Sample inspection apparatus Grant 7,989,766 - Nara , et al. August 2, 2 | 2011-08-02 |
| Inspection Device App 20110140729 - Nakamura; Mitsuhiro ; et al. | 2011-06-16 |
| Apparatus for detecting defect by examining electric characteristics of a semiconductor device Grant 7,932,733 - Sasajima , et al. April 26, 2 | 2011-04-26 |
| Sample Inspection Apparatus App 20090250610 - NARA; Yasuhiko ; et al. | 2009-10-08 |
| Apparatus For Detecting Defect App 20090224788 - Sasajima; Masahiro ; et al. | 2009-09-10 |
| Sample holder Grant D579,120 - Suzuki , et al. October 21, 2 | 2008-10-21 |
| Sample holder Grant D578,655 - Suzuki , et al. October 14, 2 | 2008-10-14 |
| Sample holder Grant D578,653 - Suzuki , et al. October 14, 2 | 2008-10-14 |
| Sample Inspection Apparatus and Sample Inspection Method App 20080149848 - Suzuki; Hiroyuki ; et al. | 2008-06-26 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 