U.S. patent number D792,256 [Application Number D/563,351] was granted by the patent office on 2017-07-18 for probe pin.
This patent grant is currently assigned to OMRON Corporation. The grantee listed for this patent is OMRON Corporation. Invention is credited to Makoto Kondo, Takahiro Sakai, Hirotada Teranishi.
United States Patent |
D792,256 |
Teranishi , et al. |
July 18, 2017 |
Probe pin
Claims
CLAIM The ornamental design for a probe pin, as shown and
described.
Inventors: |
Teranishi; Hirotada (Osaka,
JP), Sakai; Takahiro (Moriyama, JP), Kondo;
Makoto (Moriyama, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
OMRON Corporation |
Kyoto-shi, Kyoto |
N/A |
JP |
|
|
Assignee: |
OMRON Corporation (Kyoto-shi,
JP)
|
Appl.
No.: |
D/563,351 |
Filed: |
May 4, 2016 |
Foreign Application Priority Data
|
|
|
|
|
Nov 12, 2015 [JP] |
|
|
2015-025357 |
|
Current U.S.
Class: |
D10/78 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/78,80 |
References Cited
[Referenced By]
U.S. Patent Documents
Other References
US. Appl. No. 29/563,349, filed May 4, 2016; Teranishi et al. cited
by applicant .
U.S. Appl. No. 29/563,354, filed May 4, 2016; Teranishi et al.
cited by applicant.
|
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Sterne, Kessler, Goldstein &
Fox P.L.L.C.
Description
FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
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