Probe pin

Teranishi , et al. July 18, 2

Patent Grant D792256

U.S. patent number D792,256 [Application Number D/563,351] was granted by the patent office on 2017-07-18 for probe pin. This patent grant is currently assigned to OMRON Corporation. The grantee listed for this patent is OMRON Corporation. Invention is credited to Makoto Kondo, Takahiro Sakai, Hirotada Teranishi.


United States Patent D792,256
Teranishi ,   et al. July 18, 2017

Probe pin

Claims

CLAIM The ornamental design for a probe pin, as shown and described.
Inventors: Teranishi; Hirotada (Osaka, JP), Sakai; Takahiro (Moriyama, JP), Kondo; Makoto (Moriyama, JP)
Applicant:
Name City State Country Type

OMRON Corporation

Kyoto-shi, Kyoto

N/A

JP
Assignee: OMRON Corporation (Kyoto-shi, JP)
Appl. No.: D/563,351
Filed: May 4, 2016

Foreign Application Priority Data

Nov 12, 2015 [JP] 2015-025357
Current U.S. Class: D10/78
Current International Class: 1004
Field of Search: ;D10/78,80

References Cited [Referenced By]

U.S. Patent Documents
3193765 July 1965 Bevins
5447450 September 1995 Woodward

Other References

US. Appl. No. 29/563,349, filed May 4, 2016; Teranishi et al. cited by applicant .
U.S. Appl. No. 29/563,354, filed May 4, 2016; Teranishi et al. cited by applicant.

Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Sterne, Kessler, Goldstein & Fox P.L.L.C.

Description



FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

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