Probe handle
Burachynsky , et al. July 11, 2
U.S. patent number D791,941 [Application Number D/547,917] was granted by the patent office on 2017-07-11 for probe handle. This patent grant is currently assigned to Kyphon S RL. The grantee listed for this patent is Kyphon SARL. Invention is credited to Natalia Burachynsky, Larry Henan Chen, Neil Godara, Robert Harrison, Zhifeng Zhou.
| United States Patent | D791,941 |
| Burachynsky , et al. | July 11, 2017 |
Probe handle
Claims
CLAIM The ornamental design for a probe handle, as shown and described.
| Inventors: | Burachynsky; Natalia (Toronto, CA), Godara; Neil (Milton, CA), Zhou; Zhifeng (Toronto, CA), Chen; Larry Henan (Guelph, CA), Harrison; Robert (Milton, CA) | ||||||||||
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| Applicant: |
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| Assignee: | Kyphon S RL (Neuchatel,
CH) |
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| Appl. No.: | D/547,917 | ||||||||||
| Filed: | December 9, 2015 |
| Current U.S. Class: | D24/133 |
| Current International Class: | 2402 |
| Field of Search: | ;D24/108,117-118,132,133,137,138,222 ;D16/130,132,136 ;600/49,109,137-147 |
References Cited [Referenced By]
U.S. Patent Documents
| D285835 | September 1986 | Hanses |
| D450843 | November 2001 | McGuckin, Jr. |
| D476734 | July 2003 | Pavlu |
| D517388 | March 2006 | Hsieh |
| D667557 | September 2012 | Boudier |
| D671813 | December 2012 | Lin |
| D677785 | March 2013 | Stones |
| D679021 | March 2013 | Tani |
| D685100 | June 2013 | Shinohara |
| D691718 | October 2013 | Ryan |
| D692559 | October 2013 | Scheibel |
| D695089 | December 2013 | Nelson |
| D702848 | April 2014 | Mendoza |
| D708741 | July 2014 | Harrison |
| D733298 | June 2015 | Mujwid |
| D742007 | October 2015 | Schuetz |
| D746995 | January 2016 | Matsumura |
| D764657 | August 2016 | Bokelman |
| 2010/0042129 | February 2010 | Curry |
| 2014/0012229 | January 2014 | Bokelman |
| 2014/0018775 | January 2014 | Swords |
| 2015/0148603 | May 2015 | Holste |
| 2015/0359523 | December 2015 | Privitera |
Assistant Examiner: Robinson; Yolanda
Description
FIG. 1 is a left, front and top perspective view of a probe handle, showing our new design;
FIG. 2 is a right, back and bottom perspective view of the probe handle of FIG. 1;
FIG. 3 is a left side view of the probe handle of FIG. 1;
FIG. 4 is a front view of the probe handle of FIG. 1;
FIG. 5 is a right side view of the probe handle of FIG. 1;
FIG. 6 is a back view of the probe handle of FIG. 1;
FIG. 7 is a top view of the probe handle of FIG. 1; and,
FIG. 8 is a bottom view of the probe handle of FIG. 1.
The broken lines immediately adjacent the shaded areas represent the bounds of the claimed design; the broken lines form no part of the claimed design.
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