Sheath and endoscope with oblique tips

Description

FIG. 1 is a perspective view of a sheath and endoscope with oblique tips showing our new design;

FIG. 2 is a partial enlarged view of the claim corresponding to the section shown in FIG. 1.

FIG. 3 is a front view of the endoscope thereof;

FIG. 4 is a back view of the endoscope thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a bottom plan view thereof.

The dashed broken lines in the drawing depict environmental subject matter only and form no part of the claimed design. The dash-dot-dash lines represent the border for the enlarged partial view and form no part of the claimed design.

The sheath and endoscope with oblique tips is shown with a symbolic break in its length. The appearance of any portion of the article between the break lines forms no part of the claimed design.

Claims

CLAIM The ornamental design for a sheath and endoscope with oblique tips, as shown and described.

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Inventors:	Bresco Torras; Pere (Barcelona, ES), Degollada Bastos; Maria (Barcelona, ES), Mateu Prununosa; Juan Carles (Barcelona, ES), Guerra Garcia; Angel (Barcelona, ES), Akilian; Mireille (Somerville, MA), An; Allen (Winchester, MA), Begg; Nikolai (Wayland, MA)
Applicant:	Name City State Country Type COVIDIEN LP Mansfield MA US
Assignee:	COVIDIEN LP (Mansfield, MA)
Appl. No.:	D/534,851
Filed:	July 31, 2015

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Current U.S. Class:	D24/138
Current International Class:	2402
Field of Search:	;D24/108,117,118,133,135,137-138,141,222 ;600/131,132,145-147

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References Cited [Referenced By]

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U.S. Patent Documents

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D583470	December 2008	Kupferschmid
D583471	December 2008	Kupferschmid
D666719	September 2012	Becker
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D743028	November 2015	Teufel
D743029	November 2015	Mesle
D753822	April 2016	Teufel
D757263	May 2016	Hofer
D757264	May 2016	Eisenlauer
D757265	May 2016	Eisenlauer
2003/0032860	February 2003	Markowski et al.
2003/0125607	July 2003	Boebel
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2016/0235286	August 2016	Chiang
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2016/0317219	November 2016	Germain

Foreign Patent Documents

	1261275		Feb 1968		DE
	2436300		Apr 2012		EP
	2013188375		Sep 2013		JP

Primary Examiner: Matharu; Manpreet
Assistant Examiner: Robinson; Yolanda