Digital multimeter

Description

FIG. 1 is a front elevation view of a digital multimeter showing my new design;

FIG. 2 is a rear elevation view thereof;

FIG. 3 is a left side elevation view thereof;

FIG. 4 is a right side elevation view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a bottom front right perspective view thereof;

FIG. 8 is a front elevation view of another embodiment of a digital multimeter showing my new design;

FIG. 9 is a rear elevation view thereof;

FIG. 10 is a left side elevation view thereof;

FIG. 11 is a right side elevation view thereof;

FIG. 12 is a top plan view thereof;

FIG. 13 is a bottom plan view thereof;

FIG. 14 is a bottom front right perspective view thereof;

FIG. 15 is a front elevation view of another embodiment of a digital multimeter showing my new design;

FIG. 16 is a rear elevation view thereof;

FIG. 17 is a left side elevation view thereof;

FIG. 18 is a right side elevation view thereof;

FIG. 19 is a top plan view thereof;

FIG. 20 is a bottom plan view thereof; and,

FIG. 21 is a bottom front right perspective view thereof.

Claims

CLAIM The ornamental design for a digital multimeter, as shown and described.

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Inventors:	Shen; Yurui (Shanghai, CN)
Applicant:	Name City State Country Type Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Shanghai N/A CN
Assignee:	Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. (Shanghai, CN)
Appl. No.:	D/476,733
Filed:	December 16, 2013

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Foreign Application Priority Data

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Jun 19, 2013 [CN]			2013 3 0263248

Current U.S. Class:	D10/78
Current International Class:	1004
Field of Search:	;D10/78 ;324/66,67,158P,539-542,72.5,556,133,149,503,543,555,72,754,115,141,114,145,156,508,116,99D ;379/21,60,66,96,106.01-106.11 ;340/635,687,654 ;73/866.5 ;200/11R,11DA,336,341 ;361/679.01

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References Cited [Referenced By]

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U.S. Patent Documents

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D684873	June 2013	Steinich et al.
8466671	June 2013	Worones
D704579	May 2014	Heishi et al.
D705099	May 2014	Heishi et al.
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Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: O'Connor; Christensen Johnson Kindness PLLC