Analysis system

Chang , et al. May 27, 2

Patent Grant D705944

U.S. patent number D705,944 [Application Number D/453,805] was granted by the patent office on 2014-05-27 for analysis system. This patent grant is currently assigned to Cepheid. The grantee listed for this patent is Cepheid. Invention is credited to Ron Chang, Steven M. Montgomery, Gregory E. Mote.


United States Patent D705,944
Chang ,   et al. May 27, 2014

Analysis system

Claims

CLAIM The ornamental design for an analysis system, as shown and described.
Inventors: Chang; Ron (Sunnyvale, CA), Montgomery; Steven M. (Sunnyvale, CA), Mote; Gregory E. (Sunnyvale, CA)
Applicant:
Name City State Country Type

Cepheid

Sunnyvale

CA

US
Assignee: Cepheid (Sunnyvale, CA)
Appl. No.: D/453,805
Filed: May 2, 2013

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
29412453 Feb 3, 2012 D684270

Current U.S. Class: D24/216
Current International Class: 2401
Field of Search: ;D24/216,217,219,223,231,232,233,107,169,186 ;D10/81 ;422/500,547,62-65,67 ;435/287.1,287.3 ;436/43,45,47

References Cited [Referenced By]

U.S. Patent Documents
D356967 April 1995 Takekoshi et al.
D599688 September 2009 Ito
D638952 May 2011 Oonuma et al.
D657068 April 2012 Shibata
D681845 May 2013 Matsuguma
D687561 August 2013 Iseki
D689621 September 2013 Morrow et al.
Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Kilpatrick Townsend & Stockton LLP

Description



FIG. 1 is a front perspective view of an analysis system showing our new design;

FIG. 2 is a rear perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a left side elevational view thereof; and,

FIG. 8 is a right side elevational view thereof.

The portions shown in broken lines form no part of the claimed design.

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