Analysis system

Chang , et al. September 17, 2

Patent Grant D690023

U.S. patent number D690,023 [Application Number D/412,457] was granted by the patent office on 2013-09-17 for analysis system. This patent grant is currently assigned to Cepheid. The grantee listed for this patent is Ron Chang, Steven M. Montgomery, Gregory E. Mote. Invention is credited to Ron Chang, Steven M. Montgomery, Gregory E. Mote.


United States Patent D690,023
Chang ,   et al. September 17, 2013

Analysis system

Claims

CLAIM The ornamental design for an analysis system, as shown and described.
Inventors: Chang; Ron (Sunnyvale, CA), Montgomery; Steven M. (Sunnyvale, CA), Mote; Gregory E. (Sunnyvale, CA)
Applicant:
Name City State Country Type

Chang; Ron
Montgomery; Steven M.
Mote; Gregory E.

Sunnyvale
Sunnyvale
Sunnyvale

CA
CA
CA

US
US
US
Assignee: Cepheid (Sunnyvale, CA)
Appl. No.: D/412,457
Filed: February 3, 2012

Current U.S. Class: D24/216
Current International Class: 2401
Field of Search: ;D24/216,217,219,223-226,231,232,107,169,186 ;D10/81 ;422/500,547,62-65,67 ;435/287.1,287.3 ;436/43,45,47

References Cited [Referenced By]

U.S. Patent Documents
D320443 October 1991 Yokoyama et al.
D333007 February 1993 LaBarbera
D380273 June 1997 Emerson et al.
D419235 January 2000 Doms et al.
D454399 March 2002 Doms et al.
D522391 June 2006 Onuma et al.
D670401 November 2012 Tsuda et al.
Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Kilpatrick Townsend & Stockton LLP

Description



FIG. 1 is a perspective view of an analysis system showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The portions shown in broken lines form no part of the claimed design.

* * * * *


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